JP2012518722A - インピーダンス整合回路網による物理的蒸着 - Google Patents
インピーダンス整合回路網による物理的蒸着 Download PDFInfo
- Publication number
- JP2012518722A JP2012518722A JP2011551211A JP2011551211A JP2012518722A JP 2012518722 A JP2012518722 A JP 2012518722A JP 2011551211 A JP2011551211 A JP 2011551211A JP 2011551211 A JP2011551211 A JP 2011551211A JP 2012518722 A JP2012518722 A JP 2012518722A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- capacitor
- vapor deposition
- physical vapor
- impedance matching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/088—Oxides of the type ABO3 with A representing alkali, alkaline earth metal or Pb and B representing a refractory or rare earth metal
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3435—Applying energy to the substrate during sputtering
- C23C14/345—Applying energy to the substrate during sputtering using substrate bias
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32651—Shields, e.g. dark space shields, Faraday shields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3444—Associated circuits
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Power Engineering (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/389,253 | 2009-02-19 | ||
| US12/389,253 US8540851B2 (en) | 2009-02-19 | 2009-02-19 | Physical vapor deposition with impedance matching network |
| PCT/US2010/024549 WO2010096533A1 (en) | 2009-02-19 | 2010-02-18 | Physical vapor deposition with impedance matching network |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012518722A true JP2012518722A (ja) | 2012-08-16 |
| JP2012518722A5 JP2012518722A5 (enExample) | 2013-03-28 |
Family
ID=42558973
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011551211A Abandoned JP2012518722A (ja) | 2009-02-19 | 2010-02-18 | インピーダンス整合回路網による物理的蒸着 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8540851B2 (enExample) |
| EP (1) | EP2398930B1 (enExample) |
| JP (1) | JP2012518722A (enExample) |
| KR (1) | KR101371003B1 (enExample) |
| WO (1) | WO2010096533A1 (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2018207577A1 (ja) * | 2017-05-09 | 2020-03-12 | 富士フイルム株式会社 | 成膜装置および圧電膜の成膜方法 |
| JP7036999B1 (ja) * | 2021-07-16 | 2022-03-15 | 株式会社アルバック | 成膜方法及び成膜装置 |
| WO2023286289A1 (ja) * | 2021-07-16 | 2023-01-19 | 株式会社アルバック | 成膜方法及び成膜装置 |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8557088B2 (en) * | 2009-02-19 | 2013-10-15 | Fujifilm Corporation | Physical vapor deposition with phase shift |
| US20100206713A1 (en) * | 2009-02-19 | 2010-08-19 | Fujifilm Corporation | PZT Depositing Using Vapor Deposition |
| DE102011086111B4 (de) * | 2011-11-10 | 2016-03-17 | Fhr Anlagenbau Gmbh | Anordnung zur Einspeisung von HF-Strom für Rohrkathoden |
| US20130284589A1 (en) * | 2012-04-30 | 2013-10-31 | Youming Li | Radio frequency tuned substrate biased physical vapor deposition apparatus and method of operation |
| KR102222902B1 (ko) | 2014-05-12 | 2021-03-05 | 삼성전자주식회사 | 플라즈마 장비 및 이를 이용한 반도체 소자의 제조 방법 |
| US12209302B2 (en) | 2018-12-19 | 2025-01-28 | Evatec Ag | Vacuum system and method to deposit a compound layer |
| CN112853286A (zh) | 2019-11-12 | 2021-05-28 | 应用材料公司 | 压电膜的物理气相沉积 |
| WO2021148195A1 (en) * | 2020-01-24 | 2021-07-29 | Evatec Ag | Phase shift controlled sputter system and process |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
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| JPS61276966A (ja) * | 1985-04-30 | 1986-12-06 | Oki Electric Ind Co Ltd | 帯電性材料の高周波スパツタリング法 |
| JPS6459920A (en) * | 1987-08-31 | 1989-03-07 | Hitachi Ltd | Device for forming thin film |
| JPH05206072A (ja) * | 1991-06-27 | 1993-08-13 | Applied Materials Inc | 誘導rf結合を用いたプラズマ加工装置とその方法 |
| JPH0715051A (ja) * | 1993-06-24 | 1995-01-17 | Mitsubishi Electric Corp | Ybco超電導薄膜の製造方法 |
| JPH08507196A (ja) * | 1994-01-31 | 1996-07-30 | アプライド マテリアルズ インコーポレイテッド | 共形な絶縁体フィルムを有する静電チャック |
| US6471830B1 (en) * | 2000-10-03 | 2002-10-29 | Veeco/Cvc, Inc. | Inductively-coupled-plasma ionized physical-vapor deposition apparatus, method and system |
| US20030042131A1 (en) * | 2000-02-25 | 2003-03-06 | Johnson Wayne L. | Method and apparatus for depositing films |
| JP2003166047A (ja) * | 2001-09-20 | 2003-06-13 | Shin Meiwa Ind Co Ltd | ハロゲン化合物の成膜方法及び成膜装置、並びにフッ化マグネシウム膜 |
| WO2007106660A2 (en) * | 2006-03-09 | 2007-09-20 | Applied Materials, Inc. | Method and apparatus for fabricating a high dielectric constant transistor gate using a low energy plasma system |
| JP2008187092A (ja) * | 2007-01-31 | 2008-08-14 | Matsushita Electric Ind Co Ltd | 圧電体薄膜素子及びその製造方法、インクジェットヘッド、並びにインクジェット式記録装置 |
| JP2008244145A (ja) * | 2007-03-27 | 2008-10-09 | Tokyo Electron Ltd | プラズマ処理装置 |
| JP2008266770A (ja) * | 2007-03-22 | 2008-11-06 | Fujifilm Corp | 強誘電体膜とその製造方法、強誘電体素子、及び液体吐出装置 |
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| US3617459A (en) * | 1967-09-15 | 1971-11-02 | Ibm | Rf sputtering method and apparatus for producing insulating films of varied physical properties |
| US4036723A (en) * | 1975-08-21 | 1977-07-19 | International Business Machines Corporation | RF bias sputtering method for producing insulating films free of surface irregularities |
| US4131533A (en) * | 1977-12-30 | 1978-12-26 | International Business Machines Corporation | RF sputtering apparatus having floating anode shield |
| US4584079A (en) * | 1983-10-11 | 1986-04-22 | Honeywell Inc. | Step shape tailoring by phase angle variation RF bias sputtering |
| US4622122A (en) * | 1986-02-24 | 1986-11-11 | Oerlikon Buhrle U.S.A. Inc. | Planar magnetron cathode target assembly |
| JPH03201713A (ja) * | 1989-12-28 | 1991-09-03 | Clarion Co Ltd | 圧電膜製造装置 |
| US5198090A (en) * | 1990-08-31 | 1993-03-30 | International Business Machines Corporation | Sputtering apparatus for producing thin films of material |
| JP3441746B2 (ja) | 1992-11-09 | 2003-09-02 | キヤノン株式会社 | バイアススパッタ方法およびその装置 |
| JP3490483B2 (ja) | 1993-10-08 | 2004-01-26 | アネルバ株式会社 | Pzt薄膜の作製方法 |
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| JP3890634B2 (ja) * | 1995-09-19 | 2007-03-07 | セイコーエプソン株式会社 | 圧電体薄膜素子及びインクジェット式記録ヘッド |
| JPH09176850A (ja) | 1995-12-22 | 1997-07-08 | Ulvac Japan Ltd | スパッタリング装置、及び誘電体膜製造方法 |
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| SE526857C2 (sv) * | 2003-12-22 | 2005-11-08 | Seco Tools Ab | Sätt att belägga ett skärverktyg med användning av reaktiv magnetronsputtering |
| US20060172536A1 (en) * | 2005-02-03 | 2006-08-03 | Brown Karl M | Apparatus for plasma-enhanced physical vapor deposition of copper with RF source power applied through the workpiece |
| JP4851108B2 (ja) | 2005-03-24 | 2012-01-11 | 富士フイルム株式会社 | 複合ペロブスカイト型化合物の膜の成膜方法、並びに、それを用いた液体吐出ヘッドの製造方法 |
| JP5063892B2 (ja) * | 2005-12-20 | 2012-10-31 | 富士フイルム株式会社 | 液体吐出ヘッドの製造方法 |
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| JP4317888B2 (ja) * | 2007-08-31 | 2009-08-19 | 富士フイルム株式会社 | スパッタ方法およびスパッタ装置 |
| US8066857B2 (en) * | 2008-12-12 | 2011-11-29 | Fujifilm Corporation | Shaped anode and anode-shield connection for vacuum physical vapor deposition |
| US8043487B2 (en) * | 2008-12-12 | 2011-10-25 | Fujifilm Corporation | Chamber shield for vacuum physical vapor deposition |
| US8557088B2 (en) * | 2009-02-19 | 2013-10-15 | Fujifilm Corporation | Physical vapor deposition with phase shift |
| US20100206713A1 (en) * | 2009-02-19 | 2010-08-19 | Fujifilm Corporation | PZT Depositing Using Vapor Deposition |
-
2009
- 2009-02-19 US US12/389,253 patent/US8540851B2/en active Active
-
2010
- 2010-02-18 WO PCT/US2010/024549 patent/WO2010096533A1/en not_active Ceased
- 2010-02-18 EP EP10744283.2A patent/EP2398930B1/en active Active
- 2010-02-18 JP JP2011551211A patent/JP2012518722A/ja not_active Abandoned
- 2010-02-18 KR KR1020117021524A patent/KR101371003B1/ko active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61276966A (ja) * | 1985-04-30 | 1986-12-06 | Oki Electric Ind Co Ltd | 帯電性材料の高周波スパツタリング法 |
| JPS6459920A (en) * | 1987-08-31 | 1989-03-07 | Hitachi Ltd | Device for forming thin film |
| JPH05206072A (ja) * | 1991-06-27 | 1993-08-13 | Applied Materials Inc | 誘導rf結合を用いたプラズマ加工装置とその方法 |
| JPH0715051A (ja) * | 1993-06-24 | 1995-01-17 | Mitsubishi Electric Corp | Ybco超電導薄膜の製造方法 |
| JPH08507196A (ja) * | 1994-01-31 | 1996-07-30 | アプライド マテリアルズ インコーポレイテッド | 共形な絶縁体フィルムを有する静電チャック |
| US20030042131A1 (en) * | 2000-02-25 | 2003-03-06 | Johnson Wayne L. | Method and apparatus for depositing films |
| US6471830B1 (en) * | 2000-10-03 | 2002-10-29 | Veeco/Cvc, Inc. | Inductively-coupled-plasma ionized physical-vapor deposition apparatus, method and system |
| JP2003166047A (ja) * | 2001-09-20 | 2003-06-13 | Shin Meiwa Ind Co Ltd | ハロゲン化合物の成膜方法及び成膜装置、並びにフッ化マグネシウム膜 |
| WO2007106660A2 (en) * | 2006-03-09 | 2007-09-20 | Applied Materials, Inc. | Method and apparatus for fabricating a high dielectric constant transistor gate using a low energy plasma system |
| JP2008187092A (ja) * | 2007-01-31 | 2008-08-14 | Matsushita Electric Ind Co Ltd | 圧電体薄膜素子及びその製造方法、インクジェットヘッド、並びにインクジェット式記録装置 |
| JP2008266770A (ja) * | 2007-03-22 | 2008-11-06 | Fujifilm Corp | 強誘電体膜とその製造方法、強誘電体素子、及び液体吐出装置 |
| JP2008244145A (ja) * | 2007-03-27 | 2008-10-09 | Tokyo Electron Ltd | プラズマ処理装置 |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPWO2018207577A1 (ja) * | 2017-05-09 | 2020-03-12 | 富士フイルム株式会社 | 成膜装置および圧電膜の成膜方法 |
| JP7036999B1 (ja) * | 2021-07-16 | 2022-03-15 | 株式会社アルバック | 成膜方法及び成膜装置 |
| WO2023286289A1 (ja) * | 2021-07-16 | 2023-01-19 | 株式会社アルバック | 成膜方法及び成膜装置 |
| KR20230117247A (ko) * | 2021-07-16 | 2023-08-07 | 가부시키가이샤 아루박 | 성막 방법 및 성막 장치 |
| CN116940705A (zh) * | 2021-07-16 | 2023-10-24 | 株式会社爱发科 | 成膜方法和成膜装置 |
| CN116940705B (zh) * | 2021-07-16 | 2024-03-08 | 株式会社爱发科 | 成膜方法和成膜装置 |
| KR102655337B1 (ko) * | 2021-07-16 | 2024-04-05 | 가부시키가이샤 아루박 | 성막 방법 및 성막 장치 |
| US11972932B2 (en) | 2021-07-16 | 2024-04-30 | Ulvac, Inc. | Deposition method and deposition apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| US20100206718A1 (en) | 2010-08-19 |
| EP2398930B1 (en) | 2015-06-24 |
| WO2010096533A1 (en) | 2010-08-26 |
| EP2398930A1 (en) | 2011-12-28 |
| KR20110120323A (ko) | 2011-11-03 |
| US8540851B2 (en) | 2013-09-24 |
| KR101371003B1 (ko) | 2014-03-10 |
| EP2398930A4 (en) | 2013-07-03 |
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