JP2011522348A5 - - Google Patents
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- JP2011522348A5 JP2011522348A5 JP2011511667A JP2011511667A JP2011522348A5 JP 2011522348 A5 JP2011522348 A5 JP 2011522348A5 JP 2011511667 A JP2011511667 A JP 2011511667A JP 2011511667 A JP2011511667 A JP 2011511667A JP 2011522348 A5 JP2011522348 A5 JP 2011522348A5
- Authority
- JP
- Japan
- Prior art keywords
- node
- memory cell
- circuit
- sensing
- sensing circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 claims 30
- 238000007599 discharging Methods 0.000 claims 4
- 230000008878 coupling Effects 0.000 claims 2
- 238000010168 coupling process Methods 0.000 claims 2
- 238000005859 coupling reaction Methods 0.000 claims 2
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/128,535 | 2008-05-28 | ||
| US12/128,535 US7957197B2 (en) | 2008-05-28 | 2008-05-28 | Nonvolatile memory with a current sense amplifier having a precharge circuit and a transfer gate coupled to a sense node |
| PCT/US2009/039082 WO2009146057A1 (en) | 2008-05-28 | 2009-04-01 | High speed sense amplifier array and method for nonvolatile memory |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011522348A JP2011522348A (ja) | 2011-07-28 |
| JP2011522348A5 true JP2011522348A5 (cg-RX-API-DMAC7.html) | 2012-05-24 |
Family
ID=40674075
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011511667A Pending JP2011522348A (ja) | 2008-05-28 | 2009-04-01 | 不揮発性メモリのための高速センスアンプアレイおよび方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US7957197B2 (cg-RX-API-DMAC7.html) |
| EP (1) | EP2289070B1 (cg-RX-API-DMAC7.html) |
| JP (1) | JP2011522348A (cg-RX-API-DMAC7.html) |
| KR (1) | KR101468886B1 (cg-RX-API-DMAC7.html) |
| CN (1) | CN102113057B (cg-RX-API-DMAC7.html) |
| TW (1) | TWI397921B (cg-RX-API-DMAC7.html) |
| WO (1) | WO2009146057A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (55)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104282086A (zh) | 2007-01-09 | 2015-01-14 | 功率监视器公司 | 用于智能电路断路器的方法和设备 |
| US9202383B2 (en) | 2008-03-04 | 2015-12-01 | Power Monitors, Inc. | Method and apparatus for a voice-prompted electrical hookup |
| US7957197B2 (en) * | 2008-05-28 | 2011-06-07 | Sandisk Corporation | Nonvolatile memory with a current sense amplifier having a precharge circuit and a transfer gate coupled to a sense node |
| US8710907B2 (en) | 2008-06-24 | 2014-04-29 | Sandisk Technologies Inc. | Clock generator circuit for a charge pump |
| US8446773B2 (en) * | 2009-02-25 | 2013-05-21 | Samsung Electronics Co., Ltd. | Memory system and programming method thereof |
| US8339183B2 (en) | 2009-07-24 | 2012-12-25 | Sandisk Technologies Inc. | Charge pump with reduced energy consumption through charge sharing and clock boosting suitable for high voltage word line in flash memories |
| US8773108B2 (en) | 2009-11-10 | 2014-07-08 | Power Monitors, Inc. | System, method, and apparatus for a safe powerline communications instrumentation front-end |
| KR101094944B1 (ko) * | 2009-12-24 | 2011-12-15 | 주식회사 하이닉스반도체 | 센싱 전압을 제어하는 비휘발성 반도체 집적 회로 |
| JP2011146100A (ja) * | 2010-01-15 | 2011-07-28 | Toshiba Corp | 半導体記憶装置及びその読出し方法 |
| US10060957B2 (en) | 2010-07-29 | 2018-08-28 | Power Monitors, Inc. | Method and apparatus for a cloud-based power quality monitor |
| EP2413105B1 (en) | 2010-07-29 | 2017-07-05 | Power Monitors, Inc. | Method and apparatus for a demand management monitoring system |
| US8294509B2 (en) | 2010-12-20 | 2012-10-23 | Sandisk Technologies Inc. | Charge pump systems with reduction in inefficiencies due to charge sharing between capacitances |
| US8339185B2 (en) | 2010-12-20 | 2012-12-25 | Sandisk 3D Llc | Charge pump system that dynamically selects number of active stages |
| CN102881331A (zh) * | 2011-07-15 | 2013-01-16 | 复旦大学 | 灵敏放大器的控制电路及包括其的dram |
| US8699247B2 (en) | 2011-09-09 | 2014-04-15 | Sandisk Technologies Inc. | Charge pump system dynamically reconfigurable for read and program |
| US8514628B2 (en) | 2011-09-22 | 2013-08-20 | Sandisk Technologies Inc. | Dynamic switching approach to reduce area and power consumption of high voltage charge pumps |
| US8400212B1 (en) | 2011-09-22 | 2013-03-19 | Sandisk Technologies Inc. | High voltage charge pump regulation system with fine step adjustment |
| WO2013058960A2 (en) | 2011-10-20 | 2013-04-25 | Sandisk Technologies Inc. | Compact sense amplifier for non-volatile memory |
| US8630120B2 (en) | 2011-10-20 | 2014-01-14 | Sandisk Technologies Inc. | Compact sense amplifier for non-volatile memory |
| US8705293B2 (en) | 2011-10-20 | 2014-04-22 | Sandisk Technologies Inc. | Compact sense amplifier for non-volatile memory suitable for quick pass write |
| TWI463497B (zh) * | 2011-11-09 | 2014-12-01 | Macronix Int Co Ltd | 記憶體存取方法及應用其之快閃記憶體 |
| US8971141B2 (en) * | 2012-06-28 | 2015-03-03 | Sandisk Technologies Inc. | Compact high speed sense amplifier for non-volatile memory and hybrid lockout |
| US9293195B2 (en) | 2012-06-28 | 2016-03-22 | Sandisk Technologies Inc. | Compact high speed sense amplifier for non-volatile memory |
| US20140003176A1 (en) * | 2012-06-28 | 2014-01-02 | Man Lung Mui | Compact High Speed Sense Amplifier for Non-Volatile Memory with Reduced layout Area and Power Consumption |
| US9257154B2 (en) | 2012-11-29 | 2016-02-09 | Micron Technology, Inc. | Methods and apparatuses for compensating for source voltage |
| KR20140081027A (ko) * | 2012-12-21 | 2014-07-01 | 에스케이하이닉스 주식회사 | 비휘발성 메모리 장치 |
| JP2014186777A (ja) * | 2013-03-22 | 2014-10-02 | Toshiba Corp | 半導体記憶装置 |
| JP2015036998A (ja) * | 2013-08-13 | 2015-02-23 | 株式会社東芝 | 半導体記憶装置 |
| CN104575606B (zh) * | 2013-10-10 | 2018-05-22 | 无锡华润上华科技有限公司 | 一种带有自检测电路的读出电路及控制方法 |
| US9208895B1 (en) | 2014-08-14 | 2015-12-08 | Sandisk Technologies Inc. | Cell current control through power supply |
| US9349468B2 (en) | 2014-08-25 | 2016-05-24 | SanDisk Technologies, Inc. | Operational amplifier methods for charging of sense amplifier internal nodes |
| US9312018B1 (en) * | 2014-09-24 | 2016-04-12 | Intel Corporation | Sensing with boost |
| US10032509B2 (en) * | 2015-03-30 | 2018-07-24 | Toshiba Memory Corporation | Semiconductor memory device including variable resistance element |
| US9917507B2 (en) | 2015-05-28 | 2018-03-13 | Sandisk Technologies Llc | Dynamic clock period modulation scheme for variable charge pump load currents |
| US9647536B2 (en) | 2015-07-28 | 2017-05-09 | Sandisk Technologies Llc | High voltage generation using low voltage devices |
| US9520776B1 (en) | 2015-09-18 | 2016-12-13 | Sandisk Technologies Llc | Selective body bias for charge pump transfer switches |
| JP6490018B2 (ja) * | 2016-02-12 | 2019-03-27 | 東芝メモリ株式会社 | 半導体記憶装置 |
| CN105913875B (zh) * | 2016-03-31 | 2019-11-26 | 清华大学 | 控制电路、存储装置及操作方法 |
| CN106098098B (zh) * | 2016-06-22 | 2019-07-02 | 上海华虹宏力半导体制造有限公司 | 电流比较电路、存储器及电流比较方法 |
| US9786345B1 (en) | 2016-09-16 | 2017-10-10 | Micron Technology, Inc. | Compensation for threshold voltage variation of memory cell components |
| KR102662764B1 (ko) | 2016-11-17 | 2024-05-02 | 삼성전자주식회사 | 페이지 버퍼, 이를 포함하는 메모리 장치 및 이의 독출 방법 |
| US10366729B2 (en) | 2017-06-22 | 2019-07-30 | Sandisk Technologies Llc | Sense circuit with two-step clock signal for consecutive sensing |
| JP2019067474A (ja) | 2017-10-05 | 2019-04-25 | 東芝メモリ株式会社 | 半導体記憶装置 |
| US10460814B2 (en) * | 2017-12-12 | 2019-10-29 | Western Digital Technologies, Inc. | Non-volatile memory and method for power efficient read or verify using lockout control |
| KR102385569B1 (ko) * | 2018-01-03 | 2022-04-12 | 삼성전자주식회사 | 메모리 장치 |
| US10217496B1 (en) * | 2018-02-28 | 2019-02-26 | Arm Limited | Bitline write assist circuitry |
| CN110610738B (zh) * | 2018-06-15 | 2023-08-18 | 硅存储技术公司 | 用于闪存存储器系统的改进的感测放大器 |
| CN111462802B (zh) * | 2019-01-22 | 2022-05-13 | 上海汉容微电子有限公司 | 一种nor闪存的读取电路 |
| US11004501B2 (en) * | 2019-06-26 | 2021-05-11 | Macronix International Co., Ltd. | Sensing a memory device |
| KR102736213B1 (ko) | 2019-09-23 | 2024-12-02 | 에스케이하이닉스 주식회사 | 메모리 장치 및 그 동작 방법 |
| US11417400B2 (en) | 2020-01-31 | 2022-08-16 | Sandisk Technologies Llc | Controlling timing and ramp rate of program-inhibit voltage signal during programming to optimize peak current |
| US11074956B1 (en) * | 2020-03-02 | 2021-07-27 | Micron Technology, Inc. | Arbitrated sense amplifier |
| US11929125B2 (en) | 2021-06-23 | 2024-03-12 | Sandisk Technologies Llc | Window program verify to reduce data latch usage in memory device |
| US11901018B2 (en) * | 2021-12-27 | 2024-02-13 | Sandisk Technologies Llc | Sense amplifier structure for non-volatile memory with neighbor bit line local data bus data transfer |
| CN118969043B (zh) * | 2024-10-17 | 2025-02-28 | 苏州宽温电子科技有限公司 | 只读存储器单元阵列及其存储信息读取方法、系统、计算机设备、存储介质及程序产品 |
Family Cites Families (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4785427A (en) | 1987-01-28 | 1988-11-15 | Cypress Semiconductor Corporation | Differential bit line clamp |
| US5095344A (en) | 1988-06-08 | 1992-03-10 | Eliyahou Harari | Highly compact eprom and flash eeprom devices |
| US5070032A (en) | 1989-03-15 | 1991-12-03 | Sundisk Corporation | Method of making dense flash eeprom semiconductor memory structures |
| US5172338B1 (en) | 1989-04-13 | 1997-07-08 | Sandisk Corp | Multi-state eeprom read and write circuits and techniques |
| US5343063A (en) | 1990-12-18 | 1994-08-30 | Sundisk Corporation | Dense vertical programmable read only memory cell structure and processes for making them |
| JP3323868B2 (ja) * | 1991-07-22 | 2002-09-09 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| US6222762B1 (en) | 1992-01-14 | 2001-04-24 | Sandisk Corporation | Multi-state memory |
| US5313421A (en) | 1992-01-14 | 1994-05-17 | Sundisk Corporation | EEPROM with split gate source side injection |
| US5315541A (en) | 1992-07-24 | 1994-05-24 | Sundisk Corporation | Segmented column memory array |
| KR0169267B1 (ko) | 1993-09-21 | 1999-02-01 | 사토 후미오 | 불휘발성 반도체 기억장치 |
| US5661053A (en) | 1994-05-25 | 1997-08-26 | Sandisk Corporation | Method of making dense flash EEPROM cell array and peripheral supporting circuits formed in deposited field oxide with the use of spacers |
| US5721702A (en) * | 1995-08-01 | 1998-02-24 | Micron Quantum Devices, Inc. | Reference voltage generator using flash memory cells |
| US5903495A (en) | 1996-03-18 | 1999-05-11 | Kabushiki Kaisha Toshiba | Semiconductor device and memory system |
| US5768192A (en) | 1996-07-23 | 1998-06-16 | Saifun Semiconductors, Ltd. | Non-volatile semiconductor memory cell utilizing asymmetrical charge trapping |
| US6335149B1 (en) | 1997-04-08 | 2002-01-01 | Corning Incorporated | High performance acrylate materials for optical interconnects |
| US6768165B1 (en) | 1997-08-01 | 2004-07-27 | Saifun Semiconductors Ltd. | Two bit non-volatile electrically erasable and programmable semiconductor memory cell utilizing asymmetrical charge trapping |
| JP3883687B2 (ja) * | 1998-02-16 | 2007-02-21 | 株式会社ルネサステクノロジ | 半導体装置、メモリカード及びデータ処理システム |
| DE69820246D1 (de) * | 1998-07-20 | 2004-01-15 | St Microelectronics Srl | Schaltung und Verfahren zum Lesen eines nichtflüchtigen Speichers |
| JP3983969B2 (ja) | 2000-03-08 | 2007-09-26 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| JP2001266585A (ja) * | 2000-03-23 | 2001-09-28 | Toshiba Lsi System Support Kk | Mrom回路 |
| ITRM20010001A1 (it) * | 2001-01-03 | 2002-07-03 | Micron Technology Inc | Circuiteria di rilevazione per memorie flash a bassa tensione. |
| KR100381956B1 (ko) | 2001-02-02 | 2003-04-26 | 삼성전자주식회사 | 플래시 메모리 장치의 감지 증폭 회로 |
| US7046568B2 (en) | 2002-09-24 | 2006-05-16 | Sandisk Corporation | Memory sensing circuit and method for low voltage operation |
| US7196931B2 (en) * | 2002-09-24 | 2007-03-27 | Sandisk Corporation | Non-volatile memory and method with reduced source line bias errors |
| US6657891B1 (en) | 2002-11-29 | 2003-12-02 | Kabushiki Kaisha Toshiba | Semiconductor memory device for storing multivalued data |
| JP3920768B2 (ja) | 2002-12-26 | 2007-05-30 | 株式会社東芝 | 不揮発性半導体メモリ |
| JP4322686B2 (ja) * | 2004-01-07 | 2009-09-02 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| JP2005293659A (ja) * | 2004-03-31 | 2005-10-20 | Nec Electronics Corp | メモリ装置とリファレンス電流設定方法 |
| US7095655B2 (en) * | 2004-08-12 | 2006-08-22 | Saifun Semiconductors Ltd. | Dynamic matching of signal path and reference path for sensing |
| US7120051B2 (en) | 2004-12-14 | 2006-10-10 | Sandisk Corporation | Pipelined programming of non-volatile memories using early data |
| US20060140007A1 (en) | 2004-12-29 | 2006-06-29 | Raul-Adrian Cernea | Non-volatile memory and method with shared processing for an aggregate of read/write circuits |
| KR100680486B1 (ko) * | 2005-03-30 | 2007-02-08 | 주식회사 하이닉스반도체 | 향상된 동작 성능을 가지는 플래시 메모리 장치의 페이지버퍼 회로 및 그 독출 및 프로그램 동작 제어 방법 |
| US7173854B2 (en) | 2005-04-01 | 2007-02-06 | Sandisk Corporation | Non-volatile memory and method with compensation for source line bias errors |
| ITRM20050353A1 (it) * | 2005-07-04 | 2007-01-05 | Micron Technology Inc | Amplificatore di rilevazione di piu' bit a bassa potenza. |
| US7447094B2 (en) | 2005-12-29 | 2008-11-04 | Sandisk Corporation | Method for power-saving multi-pass sensing in non-volatile memory |
| US7564718B2 (en) * | 2006-04-12 | 2009-07-21 | Infineon Technologies Flash Gmbh & Co. Kg | Method for programming a block of memory cells, non-volatile memory device and memory card device |
| US7580291B2 (en) * | 2006-06-08 | 2009-08-25 | Atmel Corporation | Data register with efficient erase, program verify, and direct bit-line memory access features |
| US7539060B2 (en) | 2007-04-05 | 2009-05-26 | Sandisk Corporation | Non-volatile storage using current sensing with biasing of source and P-Well |
| US7593265B2 (en) * | 2007-12-28 | 2009-09-22 | Sandisk Corporation | Low noise sense amplifier array and method for nonvolatile memory |
| US7957197B2 (en) | 2008-05-28 | 2011-06-07 | Sandisk Corporation | Nonvolatile memory with a current sense amplifier having a precharge circuit and a transfer gate coupled to a sense node |
-
2008
- 2008-05-28 US US12/128,535 patent/US7957197B2/en active Active
-
2009
- 2009-04-01 KR KR1020107026690A patent/KR101468886B1/ko active Active
- 2009-04-01 EP EP09755420.8A patent/EP2289070B1/en active Active
- 2009-04-01 JP JP2011511667A patent/JP2011522348A/ja active Pending
- 2009-04-01 CN CN200980129692.7A patent/CN102113057B/zh active Active
- 2009-04-01 WO PCT/US2009/039082 patent/WO2009146057A1/en not_active Ceased
- 2009-04-20 TW TW098113074A patent/TWI397921B/zh not_active IP Right Cessation
-
2011
- 2011-05-03 US US13/100,164 patent/US8169831B2/en not_active Expired - Fee Related
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