JP2011503355A - 浸漬銀コーティング上の自己組織化分子 - Google Patents
浸漬銀コーティング上の自己組織化分子 Download PDFInfo
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- JP2011503355A JP2011503355A JP2010533315A JP2010533315A JP2011503355A JP 2011503355 A JP2011503355 A JP 2011503355A JP 2010533315 A JP2010533315 A JP 2010533315A JP 2010533315 A JP2010533315 A JP 2010533315A JP 2011503355 A JP2011503355 A JP 2011503355A
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- functional group
- composition according
- copper
- silver
- organic functional
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- 229910052709 silver Inorganic materials 0.000 title claims abstract description 94
- 239000004332 silver Substances 0.000 title claims abstract description 94
- 238000000576 coating method Methods 0.000 title claims abstract description 53
- 238000007654 immersion Methods 0.000 title abstract description 37
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 86
- 229910052802 copper Inorganic materials 0.000 claims abstract description 86
- 239000010949 copper Substances 0.000 claims abstract description 86
- 238000005260 corrosion Methods 0.000 claims abstract description 66
- 230000007797 corrosion Effects 0.000 claims abstract description 66
- 239000000203 mixture Substances 0.000 claims abstract description 63
- 239000011248 coating agent Substances 0.000 claims abstract description 48
- 125000000524 functional group Chemical group 0.000 claims abstract description 44
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- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 50
- 125000001183 hydrocarbyl group Chemical group 0.000 claims description 38
- 125000004432 carbon atom Chemical group C* 0.000 claims description 37
- 229910052757 nitrogen Inorganic materials 0.000 claims description 29
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 25
- 229910052717 sulfur Inorganic materials 0.000 claims description 25
- 150000003573 thiols Chemical class 0.000 claims description 25
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims description 22
- 239000011593 sulfur Substances 0.000 claims description 22
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- 229910052799 carbon Inorganic materials 0.000 claims description 7
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 claims description 7
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- 239000003002 pH adjusting agent Substances 0.000 claims description 4
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- 150000008044 alkali metal hydroxides Chemical class 0.000 claims description 2
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- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 10
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- 125000002252 acyl group Chemical group 0.000 description 7
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- 125000000468 ketone group Chemical group 0.000 description 7
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 7
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 7
- 229910052760 oxygen Inorganic materials 0.000 description 7
- 239000001301 oxygen Chemical group 0.000 description 7
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 7
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- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 6
- 239000010452 phosphate Substances 0.000 description 6
- UEZVMMHDMIWARA-UHFFFAOYSA-M phosphonate Chemical compound [O-]P(=O)=O UEZVMMHDMIWARA-UHFFFAOYSA-M 0.000 description 6
- VNDYJBBGRKZCSX-UHFFFAOYSA-L zinc bromide Chemical compound Br[Zn]Br VNDYJBBGRKZCSX-UHFFFAOYSA-L 0.000 description 6
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 5
- 239000008367 deionised water Substances 0.000 description 5
- 229910021641 deionized water Inorganic materials 0.000 description 5
- 229930195733 hydrocarbon Natural products 0.000 description 5
- 150000002430 hydrocarbons Chemical class 0.000 description 5
- 229910000037 hydrogen sulfide Inorganic materials 0.000 description 5
- 125000004433 nitrogen atom Chemical group N* 0.000 description 5
- 239000002094 self assembled monolayer Substances 0.000 description 5
- 239000013545 self-assembled monolayer Substances 0.000 description 5
- 238000002411 thermogravimetry Methods 0.000 description 5
- JPVYNHNXODAKFH-UHFFFAOYSA-N Cu2+ Chemical compound [Cu+2] JPVYNHNXODAKFH-UHFFFAOYSA-N 0.000 description 4
- SIKJAQJRHWYJAI-UHFFFAOYSA-N Indole Chemical compound C1=CC=C2NC=CC2=C1 SIKJAQJRHWYJAI-UHFFFAOYSA-N 0.000 description 4
- RAHZWNYVWXNFOC-UHFFFAOYSA-N Sulphur dioxide Chemical compound O=S=O RAHZWNYVWXNFOC-UHFFFAOYSA-N 0.000 description 4
- 150000001298 alcohols Chemical class 0.000 description 4
- 239000003093 cationic surfactant Substances 0.000 description 4
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- 239000011521 glass Substances 0.000 description 4
- LQBJWKCYZGMFEV-UHFFFAOYSA-N lead tin Chemical compound [Sn].[Pb] LQBJWKCYZGMFEV-UHFFFAOYSA-N 0.000 description 4
- 238000011056 performance test Methods 0.000 description 4
- 238000005486 sulfidation Methods 0.000 description 4
- GAMYYCRTACQSBR-UHFFFAOYSA-N 4-azabenzimidazole Chemical compound C1=CC=C2NC=NC2=N1 GAMYYCRTACQSBR-UHFFFAOYSA-N 0.000 description 3
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- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 3
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- 125000006615 aromatic heterocyclic group Chemical group 0.000 description 3
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 description 3
- 239000012964 benzotriazole Substances 0.000 description 3
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 3
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- 125000000623 heterocyclic group Chemical group 0.000 description 3
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- 238000001338 self-assembly Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- LFAGQMCIGQNPJG-UHFFFAOYSA-N silver cyanide Chemical compound [Ag+].N#[C-] LFAGQMCIGQNPJG-UHFFFAOYSA-N 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 229940079776 sodium cocoyl isethionate Drugs 0.000 description 1
- 235000019333 sodium laurylsulphate Nutrition 0.000 description 1
- 229940067741 sodium octyl sulfate Drugs 0.000 description 1
- 235000010339 sodium tetraborate Nutrition 0.000 description 1
- 239000004328 sodium tetraborate Substances 0.000 description 1
- 229940048842 sodium xylenesulfonate Drugs 0.000 description 1
- ZZMDMGNQUXYKQX-UHFFFAOYSA-L sodium;1-nonyl-2-(2-nonylphenoxy)benzene;sulfate Chemical compound [Na+].[O-]S([O-])(=O)=O.CCCCCCCCCC1=CC=CC=C1OC1=CC=CC=C1CCCCCCCCC ZZMDMGNQUXYKQX-UHFFFAOYSA-L 0.000 description 1
- OHESZEZYDPDAIH-UHFFFAOYSA-M sodium;2-(4-nonylphenoxy)ethyl sulfate Chemical compound [Na+].CCCCCCCCCC1=CC=C(OCCOS([O-])(=O)=O)C=C1 OHESZEZYDPDAIH-UHFFFAOYSA-M 0.000 description 1
- DGSDBJMBHCQYGN-UHFFFAOYSA-M sodium;2-ethylhexyl sulfate Chemical compound [Na+].CCCCC(CC)COS([O-])(=O)=O DGSDBJMBHCQYGN-UHFFFAOYSA-M 0.000 description 1
- QUCDWLYKDRVKMI-UHFFFAOYSA-M sodium;3,4-dimethylbenzenesulfonate Chemical compound [Na+].CC1=CC=C(S([O-])(=O)=O)C=C1C QUCDWLYKDRVKMI-UHFFFAOYSA-M 0.000 description 1
- KVCGISUBCHHTDD-UHFFFAOYSA-M sodium;4-methylbenzenesulfonate Chemical compound [Na+].CC1=CC=C(S([O-])(=O)=O)C=C1 KVCGISUBCHHTDD-UHFFFAOYSA-M 0.000 description 1
- WFRKJMRGXGWHBM-UHFFFAOYSA-M sodium;octyl sulfate Chemical compound [Na+].CCCCCCCCOS([O-])(=O)=O WFRKJMRGXGWHBM-UHFFFAOYSA-M 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 238000007655 standard test method Methods 0.000 description 1
- SFVFIFLLYFPGHH-UHFFFAOYSA-M stearalkonium chloride Chemical compound [Cl-].CCCCCCCCCCCCCCCCCC[N+](C)(C)CC1=CC=CC=C1 SFVFIFLLYFPGHH-UHFFFAOYSA-M 0.000 description 1
- PGWMQVQLSMAHHO-UHFFFAOYSA-N sulfanylidenesilver Chemical class [Ag]=S PGWMQVQLSMAHHO-UHFFFAOYSA-N 0.000 description 1
- RWSOTUBLDIXVET-UHFFFAOYSA-O sulfonium group Chemical group [SH3+] RWSOTUBLDIXVET-UHFFFAOYSA-O 0.000 description 1
- 150000003464 sulfur compounds Chemical class 0.000 description 1
- UZZYXUGECOQHPU-UHFFFAOYSA-N sulfuric acid monooctyl ester Natural products CCCCCCCCOS(O)(=O)=O UZZYXUGECOQHPU-UHFFFAOYSA-N 0.000 description 1
- 238000005987 sulfurization reaction Methods 0.000 description 1
- 150000003518 tetracenes Chemical class 0.000 description 1
- 229940073455 tetraethylammonium hydroxide Drugs 0.000 description 1
- LRGJRHZIDJQFCL-UHFFFAOYSA-M tetraethylazanium;hydroxide Chemical compound [OH-].CC[N+](CC)(CC)CC LRGJRHZIDJQFCL-UHFFFAOYSA-M 0.000 description 1
- 125000003396 thiol group Chemical group [H]S* 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 1
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 description 1
- YFNKIDBQEZZDLK-UHFFFAOYSA-N triglyme Chemical compound COCCOCCOCCOC YFNKIDBQEZZDLK-UHFFFAOYSA-N 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- 239000010969 white metal Substances 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000004711 α-olefin Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C22/00—Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals
- C23C22/02—Chemical surface treatment of metallic material by reaction of the surface with a reactive liquid, leaving reaction products of surface material in the coating, e.g. conversion coatings, passivation of metals using non-aqueous solutions
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F11/00—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent
- C23F11/08—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent in other liquids
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F11/00—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent
- C23F11/08—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent in other liquids
- C23F11/10—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent in other liquids using organic inhibitors
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F11/00—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent
- C23F11/08—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent in other liquids
- C23F11/10—Inhibiting corrosion of metallic material by applying inhibitors to the surface in danger of corrosion or adding them to the corrosive agent in other liquids using organic inhibitors
- C23F11/14—Nitrogen-containing compounds
- C23F11/149—Heterocyclic compounds containing nitrogen as hetero atom
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
- H05K3/282—Applying non-metallic protective coatings for inhibiting the corrosion of the circuit, e.g. for preserving the solderability
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/12—Using specific substances
- H05K2203/122—Organic non-polymeric compounds, e.g. oil, wax or thiol
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/12—Using specific substances
- H05K2203/122—Organic non-polymeric compounds, e.g. oil, wax or thiol
- H05K2203/124—Heterocyclic organic compounds, e.g. azole, furan
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/244—Finish plating of conductors, especially of copper conductors, e.g. for pads or lands
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12535—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.] with additional, spatially distinct nonmetal component
- Y10T428/12556—Organic component
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- Chemical Kinetics & Catalysis (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Preventing Corrosion Or Incrustation Of Metals (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Abstract
【選択図】図1
Description
図面を通して、対応する参照符号は対応する部品を示す。
2−メルカプトベンズイミダゾール;
2−メルカプト−5−メチルベンズイミダゾール;
2−メルカプト−5−ニトロベンズイミダゾール;
5−アミノ−2−メルカプトベンズイミダゾール;
5−エトキシ−2−メルカプトベンズイミダゾール;
5−(ジフルオロメトキシ)−2−メルカプト−1H−ベンズイミダゾール;
2−メルカプト−1−メチルイミダゾール;
1−メチル−1H−ベンズイミダゾール−2−チオール;
1−[2−(ジメチルアミノ)エチル]−1H−テトラゾール−5−チオール、1−(4−ヒドロキシフェニル)−1H−テトラゾール−5−チオール;
1−(2−メトキシフェニル)−4−(4−ニトロフェニル)−1H−イミダゾール−2−チオール;
1−(2−メチルフェニル)−4−(4−メチルフェニル)−1H−イミダゾール−2−チオール;
4−フェニルチアゾール−2−チオール;
1H−1,2,4−トリアゾール−3−チオール;
2−チアゾリン−2−チオール;
4−アミノ−6−メルカプトピラゾロ[3,4−d]ピリミジン;
3−アミノ−1,2,4−トリアゾール−5−チオール;
4−アミノ−5−(4−ピリジル)−4H−1,2,4−トリアゾール−3−チオール;
4−アミノ−5−フェニル−4H−1,2,4−トリアゾール−3−チオール;
5−アミノ−1,3,4−チアジアゾール−2−チオール;
2−メルカプト−5−メチルアミノ−1,3,4−チアジアゾール;
5−メルカプト−1−メチルテトラゾール;
1−フェニル−1H−テトラゾール−5−チオール;及び
アゾール及びチオール官能基を有する他の浴相溶性分子。
以下の成分を有する耐食性組成物(およそ1リットル)を調製した。
1: 2−メルカプトベンズイミダゾール(0.1グラム、98%溶液、シグマ−アルドリッチ(セントルイス、ミズーリ州)から入手)
2: 3,3−ジクロロベンジルベンズイミダゾール(0.1グラム)
3: n−オクチルチオール(0.5グラム)
4: テトラヒドロフルフリルアルコール(390グラム、シグマ−アルドリッチ(セントルイス、ミズーリ州)から入手)
5: 臭化亜鉛(0.1g)
6: プルロニック(Plurinuc)P-65(2.0グラム、BASFから入手)
7: 水酸化カリウム(50%溶液の2.24グラム)
8: 1Lの水(およそ600mL)
示査走査熱量測定(DSC)及び熱重量分析(TGA)によって、活性化合物、2−メルカプトベンズイミダゾールの熱的安定性を分析した。
10枚の銅パネルをエントン社から入手のAlphaSTAR(登録商標)を用いて浸漬めっき銀の層で被覆した。浸漬めっき銀コーティングの厚さはおよそ6マイクロインチであった。試験片の寸法は、2インチ×3インチであった。
銅クラッドFR4ラミネートである6枚の銅試験片を、エントン社から入手のAlphaSTAR(登録商標)を用いた浸漬銀の層で被覆した。
次いで、試験片を最初に二酸化硫黄(ASTM B799)を含む空気に、続いて硫化水素を含む空気に暴露することによって腐食試験を行った。
銅試験片(2インチ×3インチの銅クラッドラミネート)をエントン社から入手のAlphaSTAR(登録商標)を用いた浸漬銀の層で被覆した。浸漬銀の層を有する銅試験片について性能試験を行った。
Claims (17)
- 銅表面と相互作用し、かつ保護する少なくとも1つの窒素含有有機官能基、及び銀表面と相互作用し、かつ保護する少なくとも1つの硫黄含有有機官能基を含む多官能性分子;
アルコール;
界面活性剤;並びに
アルカリ性pH調整剤
を含む、はんだ性銅基材上に蒸着した浸漬めっき銀コーティングの耐腐食性を向上させるための組成物。 - 前記窒素含有有機官能基が、アミンを含むことを特徴とする請求項1に記載の組成物。
- 前記窒素含有有機官能基が、第一級アミン、第二級アミン、第三級アミン、又は芳香族複素環の1つを含むことを特徴とする請求項1に記載の組成物。
- 前記窒素含有有機官能基が、アゾールを含むことを特徴とする請求項1に記載の組成物。
- 前記窒素含有有機官能基が、ベンズイミダゾールを含むことを特徴とする請求項1に記載の組成物。
- 前記硫黄含有有機官能基が、チオール、ジスルフィド、チオエーテル、チオアルデヒド、チオケトン、又は芳香族複素環を含むことを特徴とする請求項1に記載の組成物。
- 前記硫黄含有有機官能基が、チオールを含むことを特徴とする請求項1〜6のいずれかに記載の組成物。
- 前記硫黄含有有機官能基が、ジスルフィドを含むことを特徴とする請求項1〜6のいずれかに記載の組成物。
- 前記多官能性分子が、アゾール官能基及びチオール官能基を含むことを特徴とする請求項1〜6のいずれかに記載の組成物。
- 前記多官能性分子が、次の構造式の1つを有することを特徴とする請求項1〜6のいずれかに記載の組成物;
- 前記アルコールが、約10mL/L〜約500mL/Lの間の濃度で存在することを特徴とする請求項1〜11のいずれかに記載の組成物。
- 前記界面活性剤が、非イオン性であることを特徴とする請求項1〜11のいずれかに記載の組成物。
- 前記多官能性分子が、約0.1g/L〜約10g/Lの間の濃度で存在することを特徴とする請求項1〜12のいずれかに記載の組成物。
- 前記アルコールが、約10mL/L〜約500mL/Lの間の濃度で存在し;
前記界面活性剤が、約0.01g/L〜約2g/Lの間の濃度で存在し;かつ
前記多官能性分子が、約0.1g/L〜約10g/Lの間の濃度で存在することを特徴とする請求項1〜10のいずれかに記載の組成物。 - 前記組成物が、水酸化アルカリ金属を含まないことを特徴とする請求項1〜14のいずれかに記載の組成物。
- その上に銀コーティングを有する銅基材を、請求項1〜14のいずれかに記載の耐腐食性組成物に暴露する工程を含む、はんだ性銅基材上に蒸着した銀コーティングを含む物品の耐腐食性を向上させるための方法。
- その上に銀コーティングを有する銅基材を、請求項15に記載の耐腐食性組成物に暴露する工程を含む、はんだ性銅基材上に蒸着した銀コーティングを含む物品の耐腐食性を向上させるための方法。
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US98648107P | 2007-11-08 | 2007-11-08 | |
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PCT/US2008/082959 WO2009062139A1 (en) | 2007-11-08 | 2008-11-10 | Self assembled molecules on immersion silver coatings |
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JP7462543B2 (ja) | 2020-12-09 | 2024-04-05 | 三菱製紙株式会社 | 銀めっき塗装体の製造方法 |
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JP2022177000A (ja) * | 2015-03-31 | 2022-11-30 | コモンウェルス サイエンティフィック アンド インダストリアル リサーチ オーガニゼーション | 腐食を抑制するための組成物 |
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US11987726B2 (en) | 2015-03-31 | 2024-05-21 | The Boeing Company | Compositions for inhibiting corrosion |
JP7462543B2 (ja) | 2020-12-09 | 2024-04-05 | 三菱製紙株式会社 | 銀めっき塗装体の製造方法 |
Also Published As
Publication number | Publication date |
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JP5707135B2 (ja) | 2015-04-22 |
TW200936813A (en) | 2009-09-01 |
EP2222416A1 (en) | 2010-09-01 |
US20120276409A1 (en) | 2012-11-01 |
CN101909769A (zh) | 2010-12-08 |
TWI453301B (zh) | 2014-09-21 |
US20090121192A1 (en) | 2009-05-14 |
WO2009062139A1 (en) | 2009-05-14 |
EP2222416A4 (en) | 2016-01-27 |
CN101909769B (zh) | 2014-07-02 |
US8323741B2 (en) | 2012-12-04 |
US8216645B2 (en) | 2012-07-10 |
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