JP2011502352A - 半導体デバイスのためのボンド・パッド・サポート構造 - Google Patents

半導体デバイスのためのボンド・パッド・サポート構造 Download PDF

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Publication number
JP2011502352A
JP2011502352A JP2010530988A JP2010530988A JP2011502352A JP 2011502352 A JP2011502352 A JP 2011502352A JP 2010530988 A JP2010530988 A JP 2010530988A JP 2010530988 A JP2010530988 A JP 2010530988A JP 2011502352 A JP2011502352 A JP 2011502352A
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Japan
Prior art keywords
bond pad
metallization layer
metal
passivation
passivation structure
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JP2010530988A
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Japanese (ja)
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JP2011502352A5 (enExample
Inventor
アントル，ジョゼ，エフ．
オーゼンバッハ，ジョン，ダブリュ．
ステイナー，カート，ジー．
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Agere Systems LLC
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Agere Systems LLC
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Publication of JP2011502352A publication Critical patent/JP2011502352A/ja
Publication of JP2011502352A5 publication Critical patent/JP2011502352A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
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    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/02—Bonding areas ; Manufacturing methods related thereto
    • H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
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    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
    • H01L23/528—Layout of the interconnection structure
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    • H01L2224/02—Bonding areas; Manufacturing methods related thereto
    • H01L2224/0212—Auxiliary members for bonding areas, e.g. spacers
    • H01L2224/02122—Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body
    • H01L2224/02163—Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body on the bonding area
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    • H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3157—Partial encapsulation or coating
    • H01L23/3171—Partial encapsulation or coating the coating being directly applied to the semiconductor body, e.g. passivation layer
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    • H01L2924/3025—Electromagnetic shielding

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Geometry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Wire Bonding (AREA)
JP2010530988A 2007-10-31 2007-10-31 半導体デバイスのためのボンド・パッド・サポート構造 Pending JP2011502352A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2007/083183 WO2009058143A1 (en) 2007-10-31 2007-10-31 Bond pad support structure for semiconductor device

Publications (2)

Publication Number Publication Date
JP2011502352A true JP2011502352A (ja) 2011-01-20
JP2011502352A5 JP2011502352A5 (enExample) 2011-10-20

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Country Link
US (1) US8183698B2 (enExample)
EP (2) EP2568498A3 (enExample)
JP (1) JP2011502352A (enExample)
KR (1) KR101360815B1 (enExample)
WO (1) WO2009058143A1 (enExample)

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EP2568498A2 (en) 2013-03-13
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EP2195837A1 (en) 2010-06-16
WO2009058143A1 (en) 2009-05-07
US8183698B2 (en) 2012-05-22
KR20100077161A (ko) 2010-07-07
US20100201000A1 (en) 2010-08-12

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