JP2011029655A5 - - Google Patents
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- Publication number
- JP2011029655A5 JP2011029655A5 JP2010216895A JP2010216895A JP2011029655A5 JP 2011029655 A5 JP2011029655 A5 JP 2011029655A5 JP 2010216895 A JP2010216895 A JP 2010216895A JP 2010216895 A JP2010216895 A JP 2010216895A JP 2011029655 A5 JP2011029655 A5 JP 2011029655A5
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- exposure
- substrate
- illumination
- microlithographic projection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005286 illumination Methods 0.000 claims 30
- 230000003287 optical effect Effects 0.000 claims 25
- 239000000758 substrate Substances 0.000 claims 18
- 230000005855 radiation Effects 0.000 claims 12
- 238000000034 method Methods 0.000 claims 6
- 238000001393 microlithography Methods 0.000 claims 6
- 238000003384 imaging method Methods 0.000 claims 2
- 238000005259 measurement Methods 0.000 claims 1
- 238000011144 upstream manufacturing Methods 0.000 claims 1
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102004013886A DE102004013886A1 (de) | 2004-03-16 | 2004-03-16 | Verfahren zur Mehrfachbelichtung, Mikrolithografie-Projektionsbelichtungsanlage und Projektionssystem |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005059886A Division JP2005268781A (ja) | 2004-03-16 | 2005-03-04 | 多重露光方法、マイクロリソグラフィー投影露光装置および投影系 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011029655A JP2011029655A (ja) | 2011-02-10 |
| JP2011029655A5 true JP2011029655A5 (cg-RX-API-DMAC7.html) | 2011-03-24 |
Family
ID=34980701
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005059886A Pending JP2005268781A (ja) | 2004-03-16 | 2005-03-04 | 多重露光方法、マイクロリソグラフィー投影露光装置および投影系 |
| JP2010216895A Pending JP2011029655A (ja) | 2004-03-16 | 2010-09-28 | 多重露光方法、マイクロリソグラフィー投影露光装置および投影系 |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005059886A Pending JP2005268781A (ja) | 2004-03-16 | 2005-03-04 | 多重露光方法、マイクロリソグラフィー投影露光装置および投影系 |
Country Status (3)
| Country | Link |
|---|---|
| US (3) | US7561253B2 (cg-RX-API-DMAC7.html) |
| JP (2) | JP2005268781A (cg-RX-API-DMAC7.html) |
| DE (1) | DE102004013886A1 (cg-RX-API-DMAC7.html) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102004013886A1 (de) * | 2004-03-16 | 2005-10-06 | Carl Zeiss Smt Ag | Verfahren zur Mehrfachbelichtung, Mikrolithografie-Projektionsbelichtungsanlage und Projektionssystem |
| US20060109463A1 (en) * | 2004-11-22 | 2006-05-25 | Asml Netherlands B.V. | Latent overlay metrology |
| DE102005042005A1 (de) * | 2004-12-23 | 2006-07-06 | Carl Zeiss Smt Ag | Hochaperturiges Objektiv mit obskurierter Pupille |
| US7916270B2 (en) | 2006-03-03 | 2011-03-29 | Nikon Corporation | Exposure apparatus, exposure method, and device manufacturing method |
| TWI327257B (en) * | 2006-03-03 | 2010-07-11 | Chi Mei Optoelectronics Corp | Exposing method for manufacturing flat panel display |
| US7884921B2 (en) * | 2006-04-12 | 2011-02-08 | Nikon Corporation | Illumination optical apparatus, projection exposure apparatus, projection optical system, and device manufacturing method |
| WO2007119514A1 (ja) * | 2006-04-17 | 2007-10-25 | Nikon Corporation | 照明光学装置、露光装置、およびデバイス製造方法 |
| WO2008007633A1 (en) * | 2006-07-12 | 2008-01-17 | Nikon Corporation | Illuminating optical apparatus, exposure apparatus and device manufacturing method |
| JP4883482B2 (ja) * | 2006-08-18 | 2012-02-22 | 株式会社ニコン | 照明光学装置、露光装置、およびデバイス製造方法 |
| US20080085471A1 (en) * | 2006-10-10 | 2008-04-10 | Anderson Brent A | Photolithographic method using multiple photoexposure apparatus |
| DE102007032181B4 (de) | 2007-07-11 | 2012-02-16 | Karlsruher Institut für Technologie | Optische Anordnung und ihre Verwendung |
| US8107054B2 (en) | 2007-09-18 | 2012-01-31 | Carl Zeiss Smt Gmbh | Microlithographic projection exposure apparatus |
| US20100053588A1 (en) * | 2008-08-29 | 2010-03-04 | Nikon Corporation | Substrate Stage movement patterns for high throughput While Imaging a Reticle to a pair of Imaging Locations |
| JP5515323B2 (ja) * | 2009-02-25 | 2014-06-11 | 株式会社ニコン | 投影光学装置、露光装置、およびデバイス製造方法 |
| JP5360379B2 (ja) * | 2009-02-25 | 2013-12-04 | 株式会社ニコン | 投影光学系、露光装置、およびデバイス製造方法 |
| JP5353456B2 (ja) * | 2009-06-10 | 2013-11-27 | 株式会社ニコン | 投影光学装置、露光装置、露光方法およびデバイス製造方法 |
| US8417069B2 (en) * | 2009-06-30 | 2013-04-09 | Verizon Patent And Licensing Inc. | Multi dimension high security communication over multi mode fiber waveguide |
| JP2015510269A (ja) * | 2012-02-10 | 2015-04-02 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置及びシステム、リソグラフィ装置を較正する方法、及びデバイス製造方法 |
| JP5912654B2 (ja) * | 2012-02-24 | 2016-04-27 | 株式会社東芝 | 基板保持装置及びパターン転写装置並びにパターン転写方法 |
| CN103019041B (zh) * | 2012-11-26 | 2014-10-22 | 京东方科技集团股份有限公司 | 一种曝光机 |
| KR102275466B1 (ko) | 2013-09-25 | 2021-07-13 | 에이에스엠엘 네델란즈 비.브이. | 빔 전달 장치 및 방법 |
| US9746777B2 (en) * | 2014-01-09 | 2017-08-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Exposure apparatus and exposure method thereof |
| DE102014215088A1 (de) * | 2014-07-31 | 2016-02-04 | Carl Zeiss Smt Gmbh | Beleuchtungseinrichtung für ein Projektionsbelichtungssystem |
| DE102014221173A1 (de) * | 2014-10-17 | 2016-04-21 | Carl Zeiss Smt Gmbh | Strahlungsquellenmodul |
| DE102014226918A1 (de) * | 2014-12-23 | 2016-06-23 | Carl Zeiss Smt Gmbh | Optische Komponente |
| TWI701517B (zh) | 2014-12-23 | 2020-08-11 | 德商卡爾蔡司Smt有限公司 | 光學構件 |
| DE102015212878A1 (de) * | 2015-07-09 | 2017-01-12 | Carl Zeiss Smt Gmbh | Strahlführungsvorrichtung |
| DE102022205273B3 (de) | 2022-05-25 | 2023-01-26 | Carl Zeiss Smt Gmbh | Beleuchtungssystem, Projektionsbelichtungsanlage und Projektionsbelichtungsverfahren |
| DE102022205272A1 (de) | 2022-05-25 | 2023-11-30 | Carl Zeiss Smt Gmbh | Katadioptrisches Projektionsobjektiv, Projektionsbelichtungsanlage und Projektionsbelichtungsverfahren |
Family Cites Families (79)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5636566B2 (cg-RX-API-DMAC7.html) | 1973-06-18 | 1981-08-25 | ||
| JPS5211774A (en) | 1975-07-17 | 1977-01-28 | Canon Inc | Method of detecting relative position of patterns |
| FR2472208A1 (fr) | 1979-12-18 | 1981-06-26 | Thomson Csf | Systeme optique d'alignement de deux motifs et photorepeteur mettant en oeuvre un tel systeme |
| JPS59123230A (ja) | 1982-12-28 | 1984-07-17 | Toshiba Corp | 半導体素子の製造装置 |
| JPS59140420A (ja) * | 1983-02-01 | 1984-08-11 | Canon Inc | 半導体レ−ザ−を用いた光源装置 |
| JPS60154527A (ja) * | 1984-01-24 | 1985-08-14 | Canon Inc | 露光装置 |
| US4734746A (en) * | 1985-06-24 | 1988-03-29 | Nippon Kogaku K. K. | Exposure method and system for photolithography |
| US5473410A (en) | 1990-11-28 | 1995-12-05 | Nikon Corporation | Projection exposure apparatus |
| JP3115389B2 (ja) | 1991-12-25 | 2000-12-04 | 沖電気工業株式会社 | 位相差露光法 |
| JPH05198477A (ja) * | 1992-01-23 | 1993-08-06 | Seiko Epson Corp | 露光装置及び半導体装置の製造方法 |
| JPH06124873A (ja) | 1992-10-09 | 1994-05-06 | Canon Inc | 液浸式投影露光装置 |
| JP3348467B2 (ja) | 1993-06-30 | 2002-11-20 | 株式会社ニコン | 露光装置及び方法 |
| US5729331A (en) | 1993-06-30 | 1998-03-17 | Nikon Corporation | Exposure apparatus, optical projection apparatus and a method for adjusting the optical projection apparatus |
| JP3484684B2 (ja) | 1994-11-01 | 2004-01-06 | 株式会社ニコン | ステージ装置及び走査型露光装置 |
| US6721034B1 (en) | 1994-06-16 | 2004-04-13 | Nikon Corporation | Stage unit, drive table, and scanning exposure apparatus using the same |
| JPH08313842A (ja) | 1995-05-15 | 1996-11-29 | Nikon Corp | 照明光学系および該光学系を備えた露光装置 |
| JP2994232B2 (ja) | 1995-07-28 | 1999-12-27 | ウシオ電機株式会社 | マスクとマスクまたはマスクとワークの位置合わせ方法および装置 |
| JP3473268B2 (ja) * | 1996-04-24 | 2003-12-02 | 三菱電機株式会社 | レーザ加工装置 |
| US6312859B1 (en) | 1996-06-20 | 2001-11-06 | Nikon Corporation | Projection exposure method with corrections for image displacement |
| JP3695000B2 (ja) * | 1996-08-08 | 2005-09-14 | 株式会社ニコン | 露光方法及び露光装置 |
| US5825043A (en) | 1996-10-07 | 1998-10-20 | Nikon Precision Inc. | Focusing and tilting adjustment system for lithography aligner, manufacturing apparatus or inspection apparatus |
| US6628370B1 (en) * | 1996-11-25 | 2003-09-30 | Mccullough Andrew W. | Illumination system with spatially controllable partial coherence compensating for line width variances in a photolithographic system |
| JP4029183B2 (ja) | 1996-11-28 | 2008-01-09 | 株式会社ニコン | 投影露光装置及び投影露光方法 |
| JP4029182B2 (ja) | 1996-11-28 | 2008-01-09 | 株式会社ニコン | 露光方法 |
| CN1244021C (zh) | 1996-11-28 | 2006-03-01 | 株式会社尼康 | 光刻装置和曝光方法 |
| DE69735016T2 (de) | 1996-12-24 | 2006-08-17 | Asml Netherlands B.V. | Lithographisches Gerät mit zwei Objekthaltern |
| JPH10232497A (ja) | 1997-02-20 | 1998-09-02 | Nikon Corp | 露光装置 |
| JP3747566B2 (ja) | 1997-04-23 | 2006-02-22 | 株式会社ニコン | 液浸型露光装置 |
| JP4210871B2 (ja) | 1997-10-31 | 2009-01-21 | 株式会社ニコン | 露光装置 |
| US6020964A (en) | 1997-12-02 | 2000-02-01 | Asm Lithography B.V. | Interferometer system and lithograph apparatus including an interferometer system |
| US6897963B1 (en) | 1997-12-18 | 2005-05-24 | Nikon Corporation | Stage device and exposure apparatus |
| JP4264676B2 (ja) | 1998-11-30 | 2009-05-20 | 株式会社ニコン | 露光装置及び露光方法 |
| AU1890699A (en) * | 1998-01-16 | 1999-08-02 | Nikon Corporation | Exposure method and lithography system, exposure apparatus and method of producing the apparatus, and method of producing device |
| IL138374A (en) | 1998-03-11 | 2004-07-25 | Nikon Corp | An ultraviolet laser device and an exposure device that includes such a device |
| AU2747999A (en) | 1998-03-26 | 1999-10-18 | Nikon Corporation | Projection exposure method and system |
| JP2000047390A (ja) | 1998-05-22 | 2000-02-18 | Nikon Corp | 露光装置およびその製造方法 |
| JP2000021748A (ja) * | 1998-06-30 | 2000-01-21 | Canon Inc | 露光方法および露光装置 |
| JP2000021742A (ja) * | 1998-06-30 | 2000-01-21 | Canon Inc | 露光方法および露光装置 |
| JP2000284492A (ja) | 1999-03-30 | 2000-10-13 | Seiko Epson Corp | 露光装置、露光方法及びプログラムを記録した記憶媒体 |
| JP2000284494A (ja) * | 1999-03-31 | 2000-10-13 | Seiko Epson Corp | 露光装置 |
| US6600550B1 (en) * | 1999-06-03 | 2003-07-29 | Nikon Corporation | Exposure apparatus, a photolithography method, and a device manufactured by the same |
| TW490594B (en) * | 1999-06-09 | 2002-06-11 | Asm Lithography Bv | Lithographic projection method |
| EP1091252A3 (en) * | 1999-09-29 | 2004-08-11 | ASML Netherlands B.V. | Lithographic method and apparatus |
| TW587199B (en) * | 1999-09-29 | 2004-05-11 | Asml Netherlands Bv | Lithographic method and apparatus |
| JP2001291654A (ja) * | 2000-04-07 | 2001-10-19 | Canon Inc | 投影露光装置および方法 |
| JP2001297976A (ja) | 2000-04-17 | 2001-10-26 | Canon Inc | 露光方法及び露光装置 |
| DE10106861C1 (de) * | 2001-02-14 | 2003-02-06 | Infineon Technologies Ag | Verfahren zur Herstellung feiner Resiststrukturen bei der Herstellung mikroelektronischer Bauelemente |
| JP4714403B2 (ja) | 2001-02-27 | 2011-06-29 | エーエスエムエル ユーエス,インコーポレイテッド | デュアルレチクルイメージを露光する方法および装置 |
| EP1255162A1 (en) | 2001-05-04 | 2002-11-06 | ASML Netherlands B.V. | Lithographic apparatus |
| TW529172B (en) | 2001-07-24 | 2003-04-21 | Asml Netherlands Bv | Imaging apparatus |
| US6897455B2 (en) * | 2002-01-07 | 2005-05-24 | Taiwan Semiconductor Manufacturing Co., Ltd | Apparatus and method for repairing resist latent images |
| AU2003227607A1 (en) * | 2002-04-11 | 2003-10-20 | Heidelberg Instruments Mikrotechnik Gmbh | Method and device for imaging a mask onto a substrate |
| JP2005222963A (ja) * | 2002-06-12 | 2005-08-18 | Asml Netherlands Bv | リソグラフィ装置およびその装置の製造方法 |
| US7362508B2 (en) | 2002-08-23 | 2008-04-22 | Nikon Corporation | Projection optical system and method for photolithography and exposure apparatus and method using same |
| SG121818A1 (en) | 2002-11-12 | 2006-05-26 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
| CN101470360B (zh) | 2002-11-12 | 2013-07-24 | Asml荷兰有限公司 | 光刻装置和器件制造方法 |
| EP2495613B1 (en) | 2002-11-12 | 2013-07-31 | ASML Netherlands B.V. | Lithographic apparatus |
| FR2847037B1 (fr) | 2002-11-13 | 2005-03-04 | Thermoflux Sa | Dispositif de mesure d'un flux thermique |
| US7358507B2 (en) | 2002-12-13 | 2008-04-15 | Koninklijke Philips Electronics N.V. | Liquid removal in a method and device for irradiating spots on a layer |
| JP4316506B2 (ja) | 2002-12-13 | 2009-08-19 | パナソニック株式会社 | 光学的情報記録媒体およびその製造方法 |
| WO2004057590A1 (en) | 2002-12-19 | 2004-07-08 | Koninklijke Philips Electronics N.V. | Method and device for irradiating spots on a layer |
| EP2945016B1 (en) | 2003-02-26 | 2017-09-06 | Nikon Corporation | Exposure apparatus, exposure method, and method for producing device |
| JP2004304135A (ja) | 2003-04-01 | 2004-10-28 | Nikon Corp | 露光装置、露光方法及びマイクロデバイスの製造方法 |
| JP4775256B2 (ja) | 2003-04-10 | 2011-09-21 | 株式会社ニコン | 液浸リソグラフィ装置用の減圧排出を含む環境システム |
| US7348575B2 (en) | 2003-05-06 | 2008-03-25 | Nikon Corporation | Projection optical system, exposure apparatus, and exposure method |
| EP2722703A3 (en) | 2003-05-06 | 2014-07-23 | Nikon Corporation | Projection optical system, and exposure apparatus and exposure method |
| JP2005039211A (ja) | 2003-06-30 | 2005-02-10 | Canon Inc | 投影光学系、露光装置及びデバイスの製造方法 |
| CN1307456C (zh) | 2003-05-23 | 2007-03-28 | 佳能株式会社 | 投影光学系统、曝光装置及器件的制造方法 |
| WO2005029559A1 (ja) | 2003-09-19 | 2005-03-31 | Nikon Corporation | 露光装置及びデバイス製造方法 |
| KR101200654B1 (ko) | 2003-12-15 | 2012-11-12 | 칼 짜이스 에스엠티 게엠베하 | 고 개구율 및 평평한 단부면을 가진 투사 대물렌즈 |
| JP5102492B2 (ja) | 2003-12-19 | 2012-12-19 | カール・ツァイス・エスエムティー・ゲーエムベーハー | 結晶素子を有するマイクロリソグラフィー投影用対物レンズ |
| DE102004013886A1 (de) * | 2004-03-16 | 2005-10-06 | Carl Zeiss Smt Ag | Verfahren zur Mehrfachbelichtung, Mikrolithografie-Projektionsbelichtungsanlage und Projektionssystem |
| US7164465B2 (en) * | 2004-07-13 | 2007-01-16 | Anvik Corporation | Versatile maskless lithography system with multiple resolutions |
| DE102005042005A1 (de) | 2004-12-23 | 2006-07-06 | Carl Zeiss Smt Ag | Hochaperturiges Objektiv mit obskurierter Pupille |
| US7924406B2 (en) | 2005-07-13 | 2011-04-12 | Asml Netherlands B.V. | Stage apparatus, lithographic apparatus and device manufacturing method having switch device for two illumination channels |
| US7782442B2 (en) | 2005-12-06 | 2010-08-24 | Nikon Corporation | Exposure apparatus, exposure method, projection optical system and device producing method |
| US8982322B2 (en) * | 2006-03-17 | 2015-03-17 | Nikon Corporation | Exposure apparatus and device manufacturing method |
| US20080085471A1 (en) * | 2006-10-10 | 2008-04-10 | Anderson Brent A | Photolithographic method using multiple photoexposure apparatus |
| US7878418B2 (en) * | 2008-10-08 | 2011-02-01 | Early Vaughn Sevy | Integrated, essential-oil atomizer |
-
2004
- 2004-03-16 DE DE102004013886A patent/DE102004013886A1/de not_active Ceased
-
2005
- 2005-03-04 JP JP2005059886A patent/JP2005268781A/ja active Pending
- 2005-03-16 US US11/080,500 patent/US7561253B2/en active Active
-
2008
- 2008-06-19 US US12/142,138 patent/US7875418B2/en not_active Expired - Fee Related
-
2010
- 2010-03-16 US US12/725,223 patent/US8634060B2/en not_active Expired - Fee Related
- 2010-09-28 JP JP2010216895A patent/JP2011029655A/ja active Pending
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