JP2010541236A - 反応性ガスを空間的に分離するガス配送ヘッドを用い、配送ヘッドを通過する基板の移動を伴う、薄膜形成のための方法及び堆積装置 - Google Patents

反応性ガスを空間的に分離するガス配送ヘッドを用い、配送ヘッドを通過する基板の移動を伴う、薄膜形成のための方法及び堆積装置 Download PDF

Info

Publication number
JP2010541236A
JP2010541236A JP2010526893A JP2010526893A JP2010541236A JP 2010541236 A JP2010541236 A JP 2010541236A JP 2010526893 A JP2010526893 A JP 2010526893A JP 2010526893 A JP2010526893 A JP 2010526893A JP 2010541236 A JP2010541236 A JP 2010541236A
Authority
JP
Japan
Prior art keywords
deposition
substrate
phase material
gas
section
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2010526893A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010541236A5 (enExample
Inventor
ハワード レビー,デイビッド
スタンレー ケール,ロジャー
トッド キャリー,ジェフリー
Original Assignee
イーストマン コダック カンパニー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by イーストマン コダック カンパニー filed Critical イーストマン コダック カンパニー
Publication of JP2010541236A publication Critical patent/JP2010541236A/ja
Publication of JP2010541236A5 publication Critical patent/JP2010541236A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45544Atomic layer deposition [ALD] characterized by the apparatus
    • C23C16/45548Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction
    • C23C16/45551Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction for relative movement of the substrate and the gas injectors or half-reaction reactor compartments
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45519Inert gas curtains
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/54Apparatus specially adapted for continuous coating
    • C23C16/545Apparatus specially adapted for continuous coating for coating elongated substrates
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B33ADDITIVE MANUFACTURING TECHNOLOGY
    • B33YADDITIVE MANUFACTURING, i.e. MANUFACTURING OF THREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVE AGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING, STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
    • B33Y80/00Products made by additive manufacturing

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
JP2010526893A 2007-09-26 2008-09-16 反応性ガスを空間的に分離するガス配送ヘッドを用い、配送ヘッドを通過する基板の移動を伴う、薄膜形成のための方法及び堆積装置 Pending JP2010541236A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/861,359 US8398770B2 (en) 2007-09-26 2007-09-26 Deposition system for thin film formation
PCT/US2008/010752 WO2009042044A1 (en) 2007-09-26 2008-09-16 Process and deposition system for thin film formation with gas delivery head having spatial separation of reactive gases and movement of the substrate passed the delivery head

Publications (2)

Publication Number Publication Date
JP2010541236A true JP2010541236A (ja) 2010-12-24
JP2010541236A5 JP2010541236A5 (enExample) 2011-11-10

Family

ID=40099005

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010526893A Pending JP2010541236A (ja) 2007-09-26 2008-09-16 反応性ガスを空間的に分離するガス配送ヘッドを用い、配送ヘッドを通過する基板の移動を伴う、薄膜形成のための方法及び堆積装置

Country Status (6)

Country Link
US (1) US8398770B2 (enExample)
EP (1) EP2191037A1 (enExample)
JP (1) JP2010541236A (enExample)
CN (1) CN101809193A (enExample)
TW (1) TW200934886A (enExample)
WO (1) WO2009042044A1 (enExample)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010540774A (ja) * 2007-09-26 2010-12-24 イーストマン コダック カンパニー 光学膜の製造方法
JP2013506762A (ja) * 2009-09-30 2013-02-28 サイノス・テクノロジー・インコーポレイテツド 曲面上に薄膜を形成するための蒸着反応器
JP2014508221A (ja) * 2011-01-31 2014-04-03 ネーデルランドセ・オルガニサティ・フォール・トゥーヘパスト−ナトゥールウェテンスハッペライク・オンデルズーク・テーエヌオー 原子層成膜のための装置
JP2014508225A (ja) * 2011-03-01 2014-04-03 アプライド マテリアルズ インコーポレイテッド 原子層堆積のための装置及びプロセス
KR20150120400A (ko) * 2013-02-20 2015-10-27 어플라이드 머티어리얼스, 인코포레이티드 캐러셀 원자 층 증착을 위한 장치 및 방법들
KR101575844B1 (ko) 2014-05-09 2015-12-08 제주대학교 산학협력단 원자층 증착용 헤드 및 이를 구비하는 원자층 증착 장치
KR101787854B1 (ko) 2009-07-30 2017-10-18 네덜란제 오르가니자티에 포오르 토에게파스트-나투우르베텐샤펠리즈크 온데르조에크 테엔오 원자층 증착을 위한 장치 및 방법
WO2017222350A1 (ko) * 2016-06-24 2017-12-28 주식회사 넥서스비 원자층 증착 장비 가스 모듈, 원자층 증착 장비 및 그를 이용한 원자층 증착 방법
JP2018160619A (ja) * 2017-03-23 2018-10-11 東芝メモリ株式会社 半導体製造装置

Families Citing this family (103)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11136667B2 (en) * 2007-01-08 2021-10-05 Eastman Kodak Company Deposition system and method using a delivery head separated from a substrate by gas pressure
US20080166880A1 (en) * 2007-01-08 2008-07-10 Levy David H Delivery device for deposition
US8182608B2 (en) * 2007-09-26 2012-05-22 Eastman Kodak Company Deposition system for thin film formation
US7972898B2 (en) * 2007-09-26 2011-07-05 Eastman Kodak Company Process for making doped zinc oxide
US8398770B2 (en) * 2007-09-26 2013-03-19 Eastman Kodak Company Deposition system for thin film formation
US8211231B2 (en) * 2007-09-26 2012-07-03 Eastman Kodak Company Delivery device for deposition
US9238867B2 (en) 2008-05-20 2016-01-19 Asm International N.V. Apparatus and method for high-throughput atomic layer deposition
US20090291209A1 (en) 2008-05-20 2009-11-26 Asm International N.V. Apparatus and method for high-throughput atomic layer deposition
US9604245B2 (en) 2008-06-13 2017-03-28 Kateeva, Inc. Gas enclosure systems and methods utilizing an auxiliary enclosure
US10442226B2 (en) 2008-06-13 2019-10-15 Kateeva, Inc. Gas enclosure assembly and system
US8383202B2 (en) 2008-06-13 2013-02-26 Kateeva, Inc. Method and apparatus for load-locked printing
US10434804B2 (en) 2008-06-13 2019-10-08 Kateeva, Inc. Low particle gas enclosure systems and methods
US12018857B2 (en) 2008-06-13 2024-06-25 Kateeva, Inc. Gas enclosure assembly and system
US11975546B2 (en) 2008-06-13 2024-05-07 Kateeva, Inc. Gas enclosure assembly and system
US12064979B2 (en) 2008-06-13 2024-08-20 Kateeva, Inc. Low-particle gas enclosure systems and methods
US8899171B2 (en) 2008-06-13 2014-12-02 Kateeva, Inc. Gas enclosure assembly and system
US9048344B2 (en) 2008-06-13 2015-06-02 Kateeva, Inc. Gas enclosure assembly and system
GB0816186D0 (en) * 2008-09-05 2008-10-15 Aviza Technologies Ltd Gas delivery device
US20100037820A1 (en) * 2008-08-13 2010-02-18 Synos Technology, Inc. Vapor Deposition Reactor
US8470718B2 (en) * 2008-08-13 2013-06-25 Synos Technology, Inc. Vapor deposition reactor for forming thin film
EP2159304A1 (en) * 2008-08-27 2010-03-03 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Apparatus and method for atomic layer deposition
CN102308368B (zh) 2008-12-04 2014-02-12 威科仪器有限公司 用于化学气相沉积的进气口元件及其制造方法
FR2956869B1 (fr) * 2010-03-01 2014-05-16 Alex Hr Roustaei Systeme de production de film flexible a haute capacite destine a des cellules photovoltaiques et oled par deposition cyclique des couches
US8758512B2 (en) * 2009-06-08 2014-06-24 Veeco Ald Inc. Vapor deposition reactor and method for forming thin film
US8657959B2 (en) * 2009-07-31 2014-02-25 E I Du Pont De Nemours And Company Apparatus for atomic layer deposition on a moving substrate
US20110023775A1 (en) * 2009-07-31 2011-02-03 E.I. Du Pont De Nemours And Company Apparatus for atomic layer deposition
US20110097494A1 (en) * 2009-10-27 2011-04-28 Kerr Roger S Fluid conveyance system including flexible retaining mechanism
US20110097493A1 (en) * 2009-10-27 2011-04-28 Kerr Roger S Fluid distribution manifold including non-parallel non-perpendicular slots
US20110097488A1 (en) * 2009-10-27 2011-04-28 Kerr Roger S Fluid distribution manifold including mirrored finish plate
US20110097490A1 (en) * 2009-10-27 2011-04-28 Kerr Roger S Fluid distribution manifold including compliant plates
US20110097487A1 (en) * 2009-10-27 2011-04-28 Kerr Roger S Fluid distribution manifold including bonded plates
US20110097491A1 (en) * 2009-10-27 2011-04-28 Levy David H Conveyance system including opposed fluid distribution manifolds
US20110097489A1 (en) * 2009-10-27 2011-04-28 Kerr Roger S Distribution manifold including multiple fluid communication ports
US20110097492A1 (en) * 2009-10-27 2011-04-28 Kerr Roger S Fluid distribution manifold operating state management system
EP2360293A1 (en) 2010-02-11 2011-08-24 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Method and apparatus for depositing atomic layers on a substrate
EP2362002A1 (en) * 2010-02-18 2011-08-31 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Continuous patterned layer deposition
EP2362411A1 (en) 2010-02-26 2011-08-31 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Apparatus and method for reactive ion etching
NL2005049C2 (en) * 2010-07-07 2012-01-10 Levitech B V Method and apparatus for contactlessly advancing substrates.
FI20105905A0 (fi) * 2010-08-30 2010-08-30 Beneq Oy Suutinpää ja laite
US8486192B2 (en) 2010-09-30 2013-07-16 Soitec Thermalizing gas injectors for generating increased precursor gas, material deposition systems including such injectors, and related methods
US8133806B1 (en) 2010-09-30 2012-03-13 S.O.I.Tec Silicon On Insulator Technologies Systems and methods for forming semiconductor materials by atomic layer deposition
JP5496073B2 (ja) * 2010-12-21 2014-05-21 三菱電機株式会社 微結晶半導体薄膜製造装置および微結晶半導体薄膜製造方法
EP2481832A1 (en) 2011-01-31 2012-08-01 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Apparatus for atomic layer deposition
EP2481833A1 (en) * 2011-01-31 2012-08-01 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Apparatus for atomic layer deposition
US8840958B2 (en) * 2011-02-14 2014-09-23 Veeco Ald Inc. Combined injection module for sequentially injecting source precursor and reactant precursor
US20120225207A1 (en) * 2011-03-01 2012-09-06 Applied Materials, Inc. Apparatus and Process for Atomic Layer Deposition
US20120225203A1 (en) * 2011-03-01 2012-09-06 Applied Materials, Inc. Apparatus and Process for Atomic Layer Deposition
WO2012129358A1 (en) * 2011-03-23 2012-09-27 Pilkington Group Limited Method of depositing zinc oxide coatings by chemical vapor deposition
EP2688851B1 (en) 2011-03-23 2019-01-23 Pilkington Group Limited Apparatus for depositing thin film coatings and method of deposition utilizing such apparatus
US20120269967A1 (en) * 2011-04-22 2012-10-25 Applied Materials, Inc. Hot Wire Atomic Layer Deposition Apparatus And Methods Of Use
KR20190101506A (ko) * 2011-08-09 2019-08-30 카티바, 인크. 하향 인쇄 장치 및 방법
US9120344B2 (en) 2011-08-09 2015-09-01 Kateeva, Inc. Apparatus and method for control of print gap
EP2557198A1 (en) 2011-08-10 2013-02-13 Nederlandse Organisatie voor toegepast -natuurwetenschappelijk onderzoek TNO Method and apparatus for depositing atomic layers on a substrate
US9175393B1 (en) * 2011-08-31 2015-11-03 Alta Devices, Inc. Tiled showerhead for a semiconductor chemical vapor deposition reactor
US10066297B2 (en) * 2011-08-31 2018-09-04 Alta Devices, Inc. Tiled showerhead for a semiconductor chemical vapor deposition reactor
JP2013082959A (ja) * 2011-10-07 2013-05-09 Sony Corp 自己停止反応成膜装置及び自己停止反応成膜方法
WO2013108751A1 (ja) * 2012-01-16 2013-07-25 株式会社アルバック 成膜装置
NL2008592C2 (en) * 2012-04-03 2013-10-07 Solaytec B V Method for producing a photocell.
DE102012207172A1 (de) * 2012-04-30 2013-10-31 Osram Gmbh Vorrichtung und verfahren zur oberflächenbehandlung eines substrats und verfahren zum herstellen eines optoelektronischen bauelements
TWI565825B (zh) * 2012-06-07 2017-01-11 索泰克公司 沉積系統之氣體注入組件及相關使用方法
US9512519B2 (en) * 2012-12-03 2016-12-06 Taiwan Semiconductor Manufacturing Company, Ltd. Atomic layer deposition apparatus and method
TWI683382B (zh) * 2013-03-15 2020-01-21 應用材料股份有限公司 具有光學測量的旋轉氣體分配組件
NL2010471C2 (en) * 2013-03-18 2014-09-24 Levitech B V Substrate processing apparatus.
US9214254B2 (en) 2013-09-26 2015-12-15 Eastman Kodak Company Ultra-thin AZO with nano-layer alumina passivation
TWI480406B (zh) * 2013-11-28 2015-04-11 Metal Ind Res & Dev Ct 鍍膜設備及輸送模組
US10468279B2 (en) 2013-12-26 2019-11-05 Kateeva, Inc. Apparatus and techniques for thermal treatment of electronic devices
KR102092815B1 (ko) * 2014-01-14 2020-04-24 더 배터리즈 스폴카 제트 오그라닉조나 오드포비드지알노스시아 박막 코팅을 적용하기 위한 방법과 이를 구현하기 위한 제조라인
EP3975229A1 (en) 2014-01-21 2022-03-30 Kateeva, Inc. Apparatus and techniques for electronic device encapsulation
US9343678B2 (en) 2014-01-21 2016-05-17 Kateeva, Inc. Apparatus and techniques for electronic device encapsulation
KR102315014B1 (ko) 2014-04-30 2021-10-20 카티바, 인크. 가스 쿠션 장비 및 기판 코팅 기술
CN104046960B (zh) * 2014-06-24 2016-08-17 北京七星华创电子股份有限公司 一种应用于薄膜沉积技术的气体分配器
US11267012B2 (en) * 2014-06-25 2022-03-08 Universal Display Corporation Spatial control of vapor condensation using convection
US11220737B2 (en) 2014-06-25 2022-01-11 Universal Display Corporation Systems and methods of modulating flow during vapor jet deposition of organic materials
EP2960059B1 (en) 2014-06-25 2018-10-24 Universal Display Corporation Systems and methods of modulating flow during vapor jet deposition of organic materials
MX378928B (es) * 2014-10-30 2025-03-11 Centro De Investigacion En Mat Avanzados S C Tobera de inyeccion de aerosoles y su metodo de utilizacion para depositar diferentes recubrimientos mediante deposito quimico de vapor asistido por aerosol.
CN114273154B (zh) 2014-11-26 2023-05-23 科迪华公司 环境受控的涂层系统
KR102420015B1 (ko) * 2015-08-28 2022-07-12 삼성전자주식회사 Cs-ald 장치의 샤워헤드
US10566534B2 (en) 2015-10-12 2020-02-18 Universal Display Corporation Apparatus and method to deliver organic material via organic vapor-jet printing (OVJP)
CH712199A1 (de) * 2016-03-07 2017-09-15 Fofitec Ag Vorrichtung zur Abscheidung dünner Schichten auf einem Substrat und Rollenmaterial mit einem Substrat mit solchen Schichten.
US10294562B2 (en) 2016-04-05 2019-05-21 Aixtron Se Exhaust manifold in a CVD reactor
US11174548B2 (en) 2016-06-03 2021-11-16 The Batteries Sp .Z.O.O. Thin film coating method and the manufacturing line for its implementation
US10388721B2 (en) 2017-01-24 2019-08-20 International Business Machines Corporation Conformal capacitor structure formed by a single process
US11248292B2 (en) 2017-03-14 2022-02-15 Eastman Kodak Company Deposition system with moveable-position web guides
US10400332B2 (en) * 2017-03-14 2019-09-03 Eastman Kodak Company Deposition system with interlocking deposition heads
US10435788B2 (en) * 2017-03-14 2019-10-08 Eastman Kodak Deposition system with repeating motion profile
US10550476B2 (en) 2017-03-14 2020-02-04 Eastman Kodak Company Heated gas-bearing backer
US10501848B2 (en) 2017-03-14 2019-12-10 Eastman Kodak Company Deposition system with modular deposition heads
US20180265977A1 (en) 2017-03-14 2018-09-20 Eastman Kodak Company Deposition system with vacuum pre-loaded deposition head
US20180265970A1 (en) * 2017-03-14 2018-09-20 Eastman Kodak Company Porous gas-bearing backer
US10895011B2 (en) 2017-03-14 2021-01-19 Eastman Kodak Company Modular thin film deposition system
US10584413B2 (en) 2017-03-14 2020-03-10 Eastman Kodak Company Vertical system with vacuum pre-loaded deposition head
US10422038B2 (en) * 2017-03-14 2019-09-24 Eastman Kodak Company Dual gas bearing substrate positioning system
KR102595355B1 (ko) * 2017-12-28 2023-10-30 삼성디스플레이 주식회사 증착 장치 및 그것을 이용한 증착 방법
JP7296699B2 (ja) * 2018-07-02 2023-06-23 東京エレクトロン株式会社 ガス供給システム、プラズマ処理装置およびガス供給システムの制御方法
FR3084275B1 (fr) 2018-07-30 2020-07-31 Centre Nat Rech Scient Tete et systeme compacts de depot en phase vapeur
US11306396B2 (en) * 2018-11-30 2022-04-19 Meidensha Corporation Oxide film forming device
TW202045753A (zh) * 2019-06-04 2020-12-16 金碳洁股份有限公司 循環式磊晶沉積系統
CN110791748B (zh) * 2019-10-15 2024-05-28 江苏卓高新材料科技有限公司 一种微孔薄膜表面沉积装置及方法
CN115190820B (zh) * 2019-12-18 2024-12-20 无限纳米技术公司 用于薄膜沉积的设备和方法
JP7098677B2 (ja) 2020-03-25 2022-07-11 株式会社Kokusai Electric 基板処理装置、半導体装置の製造方法及びプログラム
CN115821229A (zh) * 2022-11-25 2023-03-21 江苏微导纳米科技股份有限公司 一种用于沉积薄膜的方法和设备以及薄膜
GB2638181A (en) 2024-02-14 2025-08-20 Nanoprint Innovations Ltd Gas manifold
CN120625016B (zh) * 2025-08-13 2025-10-10 太原师范学院 一种光催化材料制备装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63226917A (ja) * 1987-03-17 1988-09-21 Fujitsu Ltd 半導体気相処理装置
JPH08239295A (ja) * 1995-03-03 1996-09-17 Digital Ueebu:Kk 結晶製造方法及び結晶製造装置
JP2003324070A (ja) * 2002-04-30 2003-11-14 Suzuki Motor Corp 薄膜の製造方法およびその装置
JP2004319484A (ja) * 2003-04-11 2004-11-11 Eastman Kodak Co 透明防湿層を形成するための方法及び装置並びに防湿型oledデバイス
JP2005089781A (ja) * 2003-09-12 2005-04-07 Mitsui Eng & Shipbuild Co Ltd 薄膜形成装置
JP2005109041A (ja) * 2003-09-29 2005-04-21 Tadahiro Omi 製造装置システム

Family Cites Families (56)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CH628600A5 (fr) * 1979-02-14 1982-03-15 Siv Soc Italiana Vetro Procede pour deposer en continu, sur la surface d'un substrat porte a haute temperature, une couche d'une matiere solide et installation pour la mise en oeuvre de ce procede.
FI57975C (fi) * 1979-02-28 1980-11-10 Lohja Ab Oy Foerfarande och anordning vid uppbyggande av tunna foereningshinnor
US4590042A (en) * 1984-12-24 1986-05-20 Tegal Corporation Plasma reactor having slotted manifold
EP0276796B1 (en) * 1987-01-27 1992-04-08 Asahi Glass Company Ltd. Gas feeding nozzle for a chemical vapor deposition apparatus
DE4011933C2 (de) * 1990-04-12 1996-11-21 Balzers Hochvakuum Verfahren zur reaktiven Oberflächenbehandlung eines Werkstückes sowie Behandlungskammer hierfür
CA2016970A1 (en) * 1990-05-16 1991-11-16 Prasad N. Gadgil Inverted diffusion stagnation point flow reactor for vapor deposition of thin films
US5136975A (en) * 1990-06-21 1992-08-11 Watkins-Johnson Company Injector and method for delivering gaseous chemicals to a surface
US5122391A (en) * 1991-03-13 1992-06-16 Watkins-Johnson Company Method for producing highly conductive and transparent films of tin and fluorine doped indium oxide by APCVD
EP0518524B1 (en) * 1991-05-30 1996-09-04 Hitachi, Ltd. Valve and semiconductor fabricating equipment using the same
US5393563A (en) * 1991-10-29 1995-02-28 Ellis, Jr.; Frank B. Formation of tin oxide films on glass substrates
US5413671A (en) * 1993-08-09 1995-05-09 Advanced Micro Devices, Inc. Apparatus and method for removing deposits from an APCVD system
US5589002A (en) * 1994-03-24 1996-12-31 Applied Materials, Inc. Gas distribution plate for semiconductor wafer processing apparatus with means for inhibiting arcing
US6022414A (en) * 1994-07-18 2000-02-08 Semiconductor Equipment Group, Llc Single body injector and method for delivering gases to a surface
US6200389B1 (en) * 1994-07-18 2001-03-13 Silicon Valley Group Thermal Systems Llc Single body injector and deposition chamber
US5688359A (en) * 1995-07-20 1997-11-18 Micron Technology, Inc. Muffle etch injector assembly
JPH0945624A (ja) * 1995-07-27 1997-02-14 Tokyo Electron Ltd 枚葉式の熱処理装置
US5728224A (en) * 1995-09-13 1998-03-17 Tetra Laval Holdings & Finance S.A. Apparatus and method for manufacturing a packaging material using gaseous phase atmospheric photo chemical vapor deposition to apply a barrier layer to a moving web substrate
JP3360265B2 (ja) * 1996-04-26 2002-12-24 東京エレクトロン株式会社 プラズマ処理方法及びプラズマ処理装置
US5938851A (en) * 1997-04-14 1999-08-17 Wj Semiconductor Equipment Group, Inc. Exhaust vent assembly for chemical vapor deposition systems
KR100505310B1 (ko) * 1998-05-13 2005-08-04 동경 엘렉트론 주식회사 성막 장치 및 방법
US6289842B1 (en) * 1998-06-22 2001-09-18 Structured Materials Industries Inc. Plasma enhanced chemical vapor deposition system
US6206973B1 (en) * 1999-04-23 2001-03-27 Silicon Valley Group Thermal System Llc Chemical vapor deposition system and method
US6245192B1 (en) * 1999-06-30 2001-06-12 Lam Research Corporation Gas distribution apparatus for semiconductor processing
JP4487338B2 (ja) * 1999-08-31 2010-06-23 東京エレクトロン株式会社 成膜処理装置及び成膜処理方法
KR20010062209A (ko) * 1999-12-10 2001-07-07 히가시 데쓰로 고내식성 막이 내부에 형성된 챔버를 구비하는 처리 장치
US6503330B1 (en) * 1999-12-22 2003-01-07 Genus, Inc. Apparatus and method to achieve continuous interface and ultrathin film during atomic layer deposition
JP3578398B2 (ja) * 2000-06-22 2004-10-20 古河スカイ株式会社 成膜用ガス分散プレート及びその製造方法
KR100516844B1 (ko) * 2001-01-22 2005-09-26 동경 엘렉트론 주식회사 처리 장치 및 처리 방법
SG94753A1 (en) * 2001-02-06 2003-03-18 Inst Of High Performance Compu Microvalve devices
SG104976A1 (en) * 2001-07-13 2004-07-30 Asml Us Inc Modular injector and exhaust assembly
KR20030038396A (ko) * 2001-11-01 2003-05-16 에이에스엠엘 유에스, 인코포레이티드 우선적인 화학 기상 증착 장치 및 방법
WO2003063222A1 (en) * 2002-01-24 2003-07-31 Sumitomo Precision Products Co., Ltd. Ozone-processing device
US6793733B2 (en) * 2002-01-25 2004-09-21 Applied Materials Inc. Gas distribution showerhead
US20040065255A1 (en) * 2002-10-02 2004-04-08 Applied Materials, Inc. Cyclical layer deposition system
US6821563B2 (en) * 2002-10-02 2004-11-23 Applied Materials, Inc. Gas distribution system for cyclical layer deposition
US7064089B2 (en) * 2002-12-10 2006-06-20 Semiconductor Energy Laboratory Co., Ltd. Plasma treatment apparatus and method for plasma treatment
US7601223B2 (en) * 2003-04-29 2009-10-13 Asm International N.V. Showerhead assembly and ALD methods
US20050103265A1 (en) * 2003-11-19 2005-05-19 Applied Materials, Inc., A Delaware Corporation Gas distribution showerhead featuring exhaust apertures
US7456429B2 (en) * 2006-03-29 2008-11-25 Eastman Kodak Company Apparatus for atomic layer deposition
US7413982B2 (en) * 2006-03-29 2008-08-19 Eastman Kodak Company Process for atomic layer deposition
US7789961B2 (en) * 2007-01-08 2010-09-07 Eastman Kodak Company Delivery device comprising gas diffuser for thin film deposition
US20080166880A1 (en) 2007-01-08 2008-07-10 Levy David H Delivery device for deposition
US11136667B2 (en) 2007-01-08 2021-10-05 Eastman Kodak Company Deposition system and method using a delivery head separated from a substrate by gas pressure
US8207063B2 (en) * 2007-01-26 2012-06-26 Eastman Kodak Company Process for atomic layer deposition
US7858144B2 (en) * 2007-09-26 2010-12-28 Eastman Kodak Company Process for depositing organic materials
US8017183B2 (en) * 2007-09-26 2011-09-13 Eastman Kodak Company Organosiloxane materials for selective area deposition of inorganic materials
US7851380B2 (en) * 2007-09-26 2010-12-14 Eastman Kodak Company Process for atomic layer deposition
US7972898B2 (en) * 2007-09-26 2011-07-05 Eastman Kodak Company Process for making doped zinc oxide
US8182608B2 (en) * 2007-09-26 2012-05-22 Eastman Kodak Company Deposition system for thin film formation
US8211231B2 (en) * 2007-09-26 2012-07-03 Eastman Kodak Company Delivery device for deposition
US20090079328A1 (en) * 2007-09-26 2009-03-26 Fedorovskaya Elena A Thin film encapsulation containing zinc oxide
US20090081356A1 (en) * 2007-09-26 2009-03-26 Fedorovskaya Elena A Process for forming thin film encapsulation layers
US8398770B2 (en) * 2007-09-26 2013-03-19 Eastman Kodak Company Deposition system for thin film formation
US7572686B2 (en) * 2007-09-26 2009-08-11 Eastman Kodak Company System for thin film deposition utilizing compensating forces
US8030212B2 (en) * 2007-09-26 2011-10-04 Eastman Kodak Company Process for selective area deposition of inorganic materials
US20090095222A1 (en) * 2007-10-16 2009-04-16 Alexander Tam Multi-gas spiral channel showerhead

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63226917A (ja) * 1987-03-17 1988-09-21 Fujitsu Ltd 半導体気相処理装置
JPH08239295A (ja) * 1995-03-03 1996-09-17 Digital Ueebu:Kk 結晶製造方法及び結晶製造装置
JP2003324070A (ja) * 2002-04-30 2003-11-14 Suzuki Motor Corp 薄膜の製造方法およびその装置
JP2004319484A (ja) * 2003-04-11 2004-11-11 Eastman Kodak Co 透明防湿層を形成するための方法及び装置並びに防湿型oledデバイス
JP2005089781A (ja) * 2003-09-12 2005-04-07 Mitsui Eng & Shipbuild Co Ltd 薄膜形成装置
JP2005109041A (ja) * 2003-09-29 2005-04-21 Tadahiro Omi 製造装置システム

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010540774A (ja) * 2007-09-26 2010-12-24 イーストマン コダック カンパニー 光学膜の製造方法
KR101787854B1 (ko) 2009-07-30 2017-10-18 네덜란제 오르가니자티에 포오르 토에게파스트-나투우르베텐샤펠리즈크 온데르조에크 테엔오 원자층 증착을 위한 장치 및 방법
KR101787773B1 (ko) 2009-07-30 2017-10-18 네덜란제 오르가니자티에 포오르 토에게파스트-나투우르베텐샤펠리즈크 온데르조에크 테엔오 원자층 증착을 위한 장치 및 방법
JP2013506762A (ja) * 2009-09-30 2013-02-28 サイノス・テクノロジー・インコーポレイテツド 曲面上に薄膜を形成するための蒸着反応器
JP2014508221A (ja) * 2011-01-31 2014-04-03 ネーデルランドセ・オルガニサティ・フォール・トゥーヘパスト−ナトゥールウェテンスハッペライク・オンデルズーク・テーエヌオー 原子層成膜のための装置
JP2014508225A (ja) * 2011-03-01 2014-04-03 アプライド マテリアルズ インコーポレイテッド 原子層堆積のための装置及びプロセス
JP2016510945A (ja) * 2013-02-20 2016-04-11 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated カルーセル原子層堆積のための装置および方法
KR20170084363A (ko) * 2013-02-20 2017-07-19 어플라이드 머티어리얼스, 인코포레이티드 캐러셀 원자 층 증착을 위한 장치 및 방법들
KR20150120400A (ko) * 2013-02-20 2015-10-27 어플라이드 머티어리얼스, 인코포레이티드 캐러셀 원자 층 증착을 위한 장치 및 방법들
KR102147372B1 (ko) 2013-02-20 2020-08-24 어플라이드 머티어리얼스, 인코포레이티드 캐러셀 원자 층 증착을 위한 장치 및 방법들
KR102201946B1 (ko) 2013-02-20 2021-01-11 어플라이드 머티어리얼스, 인코포레이티드 캐러셀 원자 층 증착을 위한 장치 및 방법들
KR101575844B1 (ko) 2014-05-09 2015-12-08 제주대학교 산학협력단 원자층 증착용 헤드 및 이를 구비하는 원자층 증착 장치
WO2017222350A1 (ko) * 2016-06-24 2017-12-28 주식회사 넥서스비 원자층 증착 장비 가스 모듈, 원자층 증착 장비 및 그를 이용한 원자층 증착 방법
JP2018160619A (ja) * 2017-03-23 2018-10-11 東芝メモリ株式会社 半導体製造装置

Also Published As

Publication number Publication date
CN101809193A (zh) 2010-08-18
EP2191037A1 (en) 2010-06-02
TW200934886A (en) 2009-08-16
WO2009042044A1 (en) 2009-04-02
US20090081885A1 (en) 2009-03-26
US8398770B2 (en) 2013-03-19

Similar Documents

Publication Publication Date Title
JP2010541236A (ja) 反応性ガスを空間的に分離するガス配送ヘッドを用い、配送ヘッドを通過する基板の移動を伴う、薄膜形成のための方法及び堆積装置
JP5346027B2 (ja) 薄膜形成のための堆積装置
US10351954B2 (en) Deposition system and method using a delivery head separated from a substrate by gas pressure
US8211231B2 (en) Delivery device for deposition
TWI419992B (zh) 用於薄膜沈積之輸送裝置
US20080166880A1 (en) Delivery device for deposition
US20110097493A1 (en) Fluid distribution manifold including non-parallel non-perpendicular slots
US20110097494A1 (en) Fluid conveyance system including flexible retaining mechanism
US20110097492A1 (en) Fluid distribution manifold operating state management system
US20110097489A1 (en) Distribution manifold including multiple fluid communication ports
US20110097488A1 (en) Fluid distribution manifold including mirrored finish plate
US20140206137A1 (en) Deposition system for thin film formation

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110916

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20110916

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20130424

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130507

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20131008