JP2007263911A5 - - Google Patents

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Publication number
JP2007263911A5
JP2007263911A5 JP2006092792A JP2006092792A JP2007263911A5 JP 2007263911 A5 JP2007263911 A5 JP 2007263911A5 JP 2006092792 A JP2006092792 A JP 2006092792A JP 2006092792 A JP2006092792 A JP 2006092792A JP 2007263911 A5 JP2007263911 A5 JP 2007263911A5
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JP
Japan
Prior art keywords
light
optical information
sample
unit
wavelength
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Application number
JP2006092792A
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English (en)
Japanese (ja)
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JP4875391B2 (ja
JP2007263911A (ja
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Application filed filed Critical
Priority to JP2006092792A priority Critical patent/JP4875391B2/ja
Priority claimed from JP2006092792A external-priority patent/JP4875391B2/ja
Priority to EP07006541A priority patent/EP1840555A1/en
Priority to US11/730,225 priority patent/US8064061B2/en
Publication of JP2007263911A publication Critical patent/JP2007263911A/ja
Publication of JP2007263911A5 publication Critical patent/JP2007263911A5/ja
Application granted granted Critical
Publication of JP4875391B2 publication Critical patent/JP4875391B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2006092792A 2006-03-30 2006-03-30 検体分析装置 Expired - Fee Related JP4875391B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2006092792A JP4875391B2 (ja) 2006-03-30 2006-03-30 検体分析装置
EP07006541A EP1840555A1 (en) 2006-03-30 2007-03-29 Sample analyzer and sample analyzing method
US11/730,225 US8064061B2 (en) 2006-03-30 2007-03-30 Sample analyzer and sample analyzing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006092792A JP4875391B2 (ja) 2006-03-30 2006-03-30 検体分析装置

Publications (3)

Publication Number Publication Date
JP2007263911A JP2007263911A (ja) 2007-10-11
JP2007263911A5 true JP2007263911A5 (OSRAM) 2009-05-14
JP4875391B2 JP4875391B2 (ja) 2012-02-15

Family

ID=38180177

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006092792A Expired - Fee Related JP4875391B2 (ja) 2006-03-30 2006-03-30 検体分析装置

Country Status (3)

Country Link
US (1) US8064061B2 (OSRAM)
EP (1) EP1840555A1 (OSRAM)
JP (1) JP4875391B2 (OSRAM)

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KR102586862B1 (ko) 2016-10-28 2023-10-11 베크만 컬터, 인코포레이티드 물질 준비 평가 시스템
CN110178014B (zh) 2016-11-14 2023-05-02 美国西门子医学诊断股份有限公司 用于使用图案照明表征样本的方法和设备
US11815519B2 (en) 2017-07-19 2023-11-14 Siemens Healthcare Diagnostics Inc. Stray light compensating methods and apparatus for characterizing a specimen
EP3655757B1 (en) 2017-07-19 2025-04-16 Siemens Healthcare Diagnostics, Inc. Apparatus and method for specimen characterization using hyperspectral imaging
CN110914669A (zh) 2017-07-31 2020-03-24 美国西门子医学诊断股份有限公司 用于对样本和/或样品容器进行成像的方法和设备
CN113811774B (zh) * 2019-06-28 2025-03-04 深圳迈瑞生物医疗电子股份有限公司 料斗结构、理杯装置及试杯准备方法
CN115244382B (zh) * 2020-04-13 2025-12-02 深圳迈瑞生物医疗电子股份有限公司 一种样本分析方法和装置
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