JP2005509379A5 - - Google Patents

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Publication number
JP2005509379A5
JP2005509379A5 JP2003543326A JP2003543326A JP2005509379A5 JP 2005509379 A5 JP2005509379 A5 JP 2005509379A5 JP 2003543326 A JP2003543326 A JP 2003543326A JP 2003543326 A JP2003543326 A JP 2003543326A JP 2005509379 A5 JP2005509379 A5 JP 2005509379A5
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JP
Japan
Prior art keywords
test
receiving
signal
inspection
data
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Application number
JP2003543326A
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English (en)
Japanese (ja)
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JP4295110B2 (ja
JP2005509379A (ja
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Priority claimed from PCT/JP2002/011476 external-priority patent/WO2003041419A1/en
Publication of JP2005509379A publication Critical patent/JP2005509379A/ja
Publication of JP2005509379A5 publication Critical patent/JP2005509379A5/ja
Application granted granted Critical
Publication of JP4295110B2 publication Critical patent/JP4295110B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003543326A 2001-11-09 2002-11-01 ディスプレイ装置、受信装置、及び、試験装置 Expired - Fee Related JP4295110B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2001344282 2001-11-09
PCT/JP2002/011476 WO2003041419A1 (en) 2001-11-09 2002-11-01 Display device, receiver, and test apparatus

Publications (3)

Publication Number Publication Date
JP2005509379A JP2005509379A (ja) 2005-04-07
JP2005509379A5 true JP2005509379A5 (https=) 2006-01-05
JP4295110B2 JP4295110B2 (ja) 2009-07-15

Family

ID=19157831

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003543326A Expired - Fee Related JP4295110B2 (ja) 2001-11-09 2002-11-01 ディスプレイ装置、受信装置、及び、試験装置

Country Status (6)

Country Link
US (1) US7103800B2 (https=)
EP (1) EP1442615B1 (https=)
JP (1) JP4295110B2 (https=)
KR (1) KR20040053292A (https=)
CN (1) CN1305320C (https=)
WO (1) WO2003041419A1 (https=)

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JP4323873B2 (ja) * 2003-06-13 2009-09-02 富士通株式会社 入出力インタフェース回路
CN100489717C (zh) * 2004-03-22 2009-05-20 迪吉多电子股份有限公司 显示装置
FR2875309B1 (fr) * 2004-09-15 2006-12-22 Alstom Transport Sa Dispositif et procede de controle d'une console
DE102005024649B4 (de) * 2005-05-25 2007-04-12 Infineon Technologies Ag Vorrichtung und Verfahren zum Messen von Jitter
KR100711739B1 (ko) * 2005-07-21 2007-04-25 삼성전자주식회사 테스트 시스템 및 그것의 테스트 방법
US7546507B1 (en) * 2005-12-02 2009-06-09 Altera Corporation Method and apparatus for debugging semiconductor devices
CN100584046C (zh) * 2005-12-27 2010-01-20 鸿富锦精密工业（深圳）有限公司 多媒体装置测试系统及其方法
JP4923786B2 (ja) * 2006-06-30 2012-04-25 カシオ計算機株式会社 ディスプレイ検査装置
EP3200189B1 (en) * 2007-04-12 2021-06-02 Rambus Inc. Memory system with point-to-point request interconnect
US20080275662A1 (en) * 2007-05-01 2008-11-06 Vladimir Dmitriev-Zdorov Generating transmission-code compliant test sequences
CN101039443B (zh) * 2007-05-15 2010-08-18 中兴通讯股份有限公司 一种数字电视接收终端电视功能故障的定位和显示方法
JP5161484B2 (ja) * 2007-05-17 2013-03-13 オンセミコンダクター・トレーディング・リミテッド 映像信号処理集積回路
TW200924385A (en) 2007-11-28 2009-06-01 Realtek Semiconductor Corp Jitter generator for generating jittered clock signal
CN102006160B (zh) * 2007-12-24 2013-09-11 瑞昱半导体股份有限公司 用来产生抖动时钟信号的抖动产生器
TWI406216B (zh) * 2008-09-02 2013-08-21 Himax Tech Ltd 電壓寫入裝置及電壓寫入方法
KR101651285B1 (ko) * 2009-07-28 2016-08-26 삼성전자 주식회사 전자기기, 원격제어장치 및 오류검출방법
KR101918627B1 (ko) 2012-04-04 2018-11-15 삼성전자 주식회사 데이터 수신장치 및 그 테스트 방법
US9436543B2 (en) * 2012-09-13 2016-09-06 Freescale Semiconductor, Inc. Electronic device and method for protecting an electronic device against unauthorized use
CN103905513A (zh) * 2012-12-28 2014-07-02 鸿富锦精密工业（深圳）有限公司 电子装置远程控制系统及方法
TWI569238B (zh) * 2014-10-13 2017-02-01 群創光電股份有限公司 顯示面板及顯示面板自動化檢測方法
KR102317897B1 (ko) 2015-06-04 2021-10-28 삼성디스플레이 주식회사 테스트 보드 및 그의 구동방법
JP6726999B2 (ja) * 2016-03-30 2020-07-22 Ｄｘアンテナ株式会社 検査システム
CN109522165B (zh) * 2018-09-19 2020-05-15 昆山国显光电有限公司 显示模组测试平台
JP7102450B2 (ja) * 2020-01-31 2022-07-19 アンリツ株式会社 誤り率測定システム及び誤り率測定方法
CN115118958A (zh) * 2022-06-14 2022-09-27 国营芜湖机械厂 一种机载任务处理机的视频信号检测装置及其检测方法
CN114910733B (zh) * 2022-07-15 2022-09-30 深圳益实科技有限公司 一种基于人工智能的显示器故障智能诊断分析系统
CN115118961B (zh) * 2022-08-26 2022-10-28 北京数字光芯集成电路设计有限公司 视频数据测试系统、方法及其应用
KR20240114697A (ko) 2023-01-17 2024-07-24 연세대학교 산학협력단 중합 고분자 전해질 기반 고체 후막 전극 및 그 제조방법
KR20240125824A (ko) * 2023-02-10 2024-08-20 삼성디스플레이 주식회사 표시 장치

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US20030036866A1 (en) * 2001-08-14 2003-02-20 Dinesh Nair System and method for creating a test executive sequence to perform display inspection

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