JP2005189290A5 - - Google Patents

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Publication number
JP2005189290A5
JP2005189290A5 JP2003427415A JP2003427415A JP2005189290A5 JP 2005189290 A5 JP2005189290 A5 JP 2005189290A5 JP 2003427415 A JP2003427415 A JP 2003427415A JP 2003427415 A JP2003427415 A JP 2003427415A JP 2005189290 A5 JP2005189290 A5 JP 2005189290A5
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JP
Japan
Prior art keywords
scanning
optical system
confocal
pinhole
laser microscope
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Application number
JP2003427415A
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English (en)
Japanese (ja)
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JP2005189290A (ja
JP4573524B2 (ja
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Priority to JP2003427415A priority Critical patent/JP4573524B2/ja
Priority claimed from JP2003427415A external-priority patent/JP4573524B2/ja
Publication of JP2005189290A publication Critical patent/JP2005189290A/ja
Publication of JP2005189290A5 publication Critical patent/JP2005189290A5/ja
Application granted granted Critical
Publication of JP4573524B2 publication Critical patent/JP4573524B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003427415A 2003-12-24 2003-12-24 走査型レーザー顕微鏡 Expired - Fee Related JP4573524B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003427415A JP4573524B2 (ja) 2003-12-24 2003-12-24 走査型レーザー顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003427415A JP4573524B2 (ja) 2003-12-24 2003-12-24 走査型レーザー顕微鏡

Publications (3)

Publication Number Publication Date
JP2005189290A JP2005189290A (ja) 2005-07-14
JP2005189290A5 true JP2005189290A5 (enExample) 2007-02-15
JP4573524B2 JP4573524B2 (ja) 2010-11-04

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ID=34786698

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003427415A Expired - Fee Related JP4573524B2 (ja) 2003-12-24 2003-12-24 走査型レーザー顕微鏡

Country Status (1)

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JP (1) JP4573524B2 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4834363B2 (ja) * 2005-09-16 2011-12-14 株式会社東芝 表面検査装置
JP5095935B2 (ja) 2005-11-15 2012-12-12 オリンパス株式会社 顕微鏡装置
EP3073308B1 (en) 2006-07-03 2020-12-30 Nikon Corporation Laser scanning microscope
EP2434327A1 (en) * 2006-12-22 2012-03-28 Nikon Corporation Laser scan confocal microscope
WO2012002542A1 (ja) * 2010-07-01 2012-01-05 株式会社ニコン 光学部材および顕微鏡
JP5722115B2 (ja) * 2011-05-11 2015-05-20 オリンパス株式会社 走査型顕微鏡装置
US9052500B2 (en) * 2011-11-01 2015-06-09 Intelligent Imaging Innovations, Inc. Fast pinhole changer for confocal microscopy or spatial filter
JP6037623B2 (ja) * 2012-02-24 2016-12-07 オリンパス株式会社 レーザ走査型共焦点顕微鏡、及び、レーザ走査型共焦点顕微鏡の光学系のアライメント調整方法
CN103698880B (zh) * 2013-12-26 2016-01-27 中国科学院苏州生物医学工程技术研究所 激光扫描共聚焦显微镜用二维针孔电动实时调整系统
WO2015109323A2 (en) * 2014-01-17 2015-07-23 The Trustees Of Columbia University In The City Of New York Systems and methods for three-dimensional imaging
US10061111B2 (en) 2014-01-17 2018-08-28 The Trustees Of Columbia University In The City Of New York Systems and methods for three dimensional imaging
US10835111B2 (en) 2016-07-10 2020-11-17 The Trustees Of Columbia University In The City Of New York Three-dimensional imaging using swept, confocally aligned planar excitation with an image relay
DE102019116626B4 (de) * 2019-06-19 2021-03-18 Abberior Instruments Gmbh Verfahren und Vorrichtungen zur Überprüfung der Konfokalität einer scannenden und entscannenden Mikroskopbaugruppe
WO2021124999A1 (ja) * 2019-12-20 2021-06-24 ピンポイントフォトニクス株式会社 レーザ照射機能付き観察装置
DE102021134384A1 (de) 2021-12-22 2023-06-22 Abberior Instruments Gmbh Verfahren und Vorrichtungen zur Überprüfung der lateralen und axialen Konfokalität einer scannenden und entscannenden Mikroskopbaugruppe

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3917731B2 (ja) * 1996-11-21 2007-05-23 オリンパス株式会社 レーザ走査顕微鏡
JPH1152252A (ja) * 1997-08-06 1999-02-26 Nikon Corp 蛍光顕微鏡
JPH11231222A (ja) * 1998-01-27 1999-08-27 Carl Zeiss Jena Gmbh 走査ユニット付顕微鏡、そのための配置および操作方法
JPH11237554A (ja) * 1998-02-23 1999-08-31 Olympus Optical Co Ltd 走査型光学顕微鏡
JP4169396B2 (ja) * 1998-07-14 2008-10-22 オリンパス株式会社 走査型レーザ顕微鏡
JP4613396B2 (ja) * 2000-06-28 2011-01-19 株式会社ニコン 走査型共焦点顕微鏡及びその遮光板の位置調整方法
JP2002277746A (ja) * 2001-03-22 2002-09-25 Olympus Optical Co Ltd 走査型光学顕微鏡および該走査型光学顕微鏡の共焦点ピンホール調整方法
JP2003185927A (ja) * 2001-12-13 2003-07-03 Olympus Optical Co Ltd 走査型レーザー顕微鏡
JP4136440B2 (ja) * 2002-04-26 2008-08-20 オリンパス株式会社 顕微鏡装置

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