JP4573524B2 - 走査型レーザー顕微鏡 - Google Patents

走査型レーザー顕微鏡 Download PDF

Info

Publication number
JP4573524B2
JP4573524B2 JP2003427415A JP2003427415A JP4573524B2 JP 4573524 B2 JP4573524 B2 JP 4573524B2 JP 2003427415 A JP2003427415 A JP 2003427415A JP 2003427415 A JP2003427415 A JP 2003427415A JP 4573524 B2 JP4573524 B2 JP 4573524B2
Authority
JP
Japan
Prior art keywords
optical system
scanning
confocal
scanning optical
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003427415A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005189290A5 (enExample
JP2005189290A (ja
Inventor
昭典 顕谷
竜男 中田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2003427415A priority Critical patent/JP4573524B2/ja
Publication of JP2005189290A publication Critical patent/JP2005189290A/ja
Publication of JP2005189290A5 publication Critical patent/JP2005189290A5/ja
Application granted granted Critical
Publication of JP4573524B2 publication Critical patent/JP4573524B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Microscoopes, Condenser (AREA)
JP2003427415A 2003-12-24 2003-12-24 走査型レーザー顕微鏡 Expired - Fee Related JP4573524B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003427415A JP4573524B2 (ja) 2003-12-24 2003-12-24 走査型レーザー顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003427415A JP4573524B2 (ja) 2003-12-24 2003-12-24 走査型レーザー顕微鏡

Publications (3)

Publication Number Publication Date
JP2005189290A JP2005189290A (ja) 2005-07-14
JP2005189290A5 JP2005189290A5 (enExample) 2007-02-15
JP4573524B2 true JP4573524B2 (ja) 2010-11-04

Family

ID=34786698

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003427415A Expired - Fee Related JP4573524B2 (ja) 2003-12-24 2003-12-24 走査型レーザー顕微鏡

Country Status (1)

Country Link
JP (1) JP4573524B2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020254303A1 (de) * 2019-06-19 2020-12-24 Abberior Instruments Gmbh Verfahren und vorrichtungen zur überprüfung der konfokalität einer scannenden und entscannenden mikroskopbaugruppe
US12216019B2 (en) 2021-12-22 2025-02-04 Abberior Instruments Gmbh Apparatuses for testing the lateral and axial confocality of a scanning and descanning microscope component group

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4834363B2 (ja) * 2005-09-16 2011-12-14 株式会社東芝 表面検査装置
JP5095935B2 (ja) 2005-11-15 2012-12-12 オリンパス株式会社 顕微鏡装置
EP3073308B1 (en) 2006-07-03 2020-12-30 Nikon Corporation Laser scanning microscope
EP2434327A1 (en) * 2006-12-22 2012-03-28 Nikon Corporation Laser scan confocal microscope
WO2012002542A1 (ja) * 2010-07-01 2012-01-05 株式会社ニコン 光学部材および顕微鏡
JP5722115B2 (ja) * 2011-05-11 2015-05-20 オリンパス株式会社 走査型顕微鏡装置
US9052500B2 (en) * 2011-11-01 2015-06-09 Intelligent Imaging Innovations, Inc. Fast pinhole changer for confocal microscopy or spatial filter
JP6037623B2 (ja) * 2012-02-24 2016-12-07 オリンパス株式会社 レーザ走査型共焦点顕微鏡、及び、レーザ走査型共焦点顕微鏡の光学系のアライメント調整方法
CN103698880B (zh) * 2013-12-26 2016-01-27 中国科学院苏州生物医学工程技术研究所 激光扫描共聚焦显微镜用二维针孔电动实时调整系统
WO2015109323A2 (en) * 2014-01-17 2015-07-23 The Trustees Of Columbia University In The City Of New York Systems and methods for three-dimensional imaging
US10061111B2 (en) 2014-01-17 2018-08-28 The Trustees Of Columbia University In The City Of New York Systems and methods for three dimensional imaging
US10835111B2 (en) 2016-07-10 2020-11-17 The Trustees Of Columbia University In The City Of New York Three-dimensional imaging using swept, confocally aligned planar excitation with an image relay
WO2021124999A1 (ja) * 2019-12-20 2021-06-24 ピンポイントフォトニクス株式会社 レーザ照射機能付き観察装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3917731B2 (ja) * 1996-11-21 2007-05-23 オリンパス株式会社 レーザ走査顕微鏡
JPH1152252A (ja) * 1997-08-06 1999-02-26 Nikon Corp 蛍光顕微鏡
JPH11231222A (ja) * 1998-01-27 1999-08-27 Carl Zeiss Jena Gmbh 走査ユニット付顕微鏡、そのための配置および操作方法
JPH11237554A (ja) * 1998-02-23 1999-08-31 Olympus Optical Co Ltd 走査型光学顕微鏡
JP4169396B2 (ja) * 1998-07-14 2008-10-22 オリンパス株式会社 走査型レーザ顕微鏡
JP4613396B2 (ja) * 2000-06-28 2011-01-19 株式会社ニコン 走査型共焦点顕微鏡及びその遮光板の位置調整方法
JP2002277746A (ja) * 2001-03-22 2002-09-25 Olympus Optical Co Ltd 走査型光学顕微鏡および該走査型光学顕微鏡の共焦点ピンホール調整方法
JP2003185927A (ja) * 2001-12-13 2003-07-03 Olympus Optical Co Ltd 走査型レーザー顕微鏡
JP4136440B2 (ja) * 2002-04-26 2008-08-20 オリンパス株式会社 顕微鏡装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020254303A1 (de) * 2019-06-19 2020-12-24 Abberior Instruments Gmbh Verfahren und vorrichtungen zur überprüfung der konfokalität einer scannenden und entscannenden mikroskopbaugruppe
US11493744B2 (en) 2019-06-19 2022-11-08 Abberior Instruments Gmbh Methods and apparatuses for checking the confocality of a scanning and descanning microscope assembly
US12216019B2 (en) 2021-12-22 2025-02-04 Abberior Instruments Gmbh Apparatuses for testing the lateral and axial confocality of a scanning and descanning microscope component group

Also Published As

Publication number Publication date
JP2005189290A (ja) 2005-07-14

Similar Documents

Publication Publication Date Title
US20190258040A1 (en) Laser scan confocal microscope
JP5897563B2 (ja) ライン走査式顕微鏡における同期用システム
US20020181096A1 (en) Laser microscope
EP2503371B1 (en) Microscope with misalignment correction means
JP2005189290A (ja) 走査型レーザー顕微鏡
JP2007506955A (ja) エバネッセント波照明を備えた走査顕微鏡
US6754003B2 (en) Scanning microscope and method for scanning a specimen
JP5307418B2 (ja) 走査型レーザ顕微鏡
US7428104B2 (en) Optical device for the combination of light beams
JP5058624B2 (ja) レーザ顕微鏡
US7733565B2 (en) Laser microscope
JP5162783B2 (ja) 走査型顕微鏡法における位置信号および検出信号の位相補正のための方法ならびに装置および走査型顕微鏡
US11500188B2 (en) Microscope with focusing system
JP2001255463A (ja) 走査型光学装置
JP4169396B2 (ja) 走査型レーザ顕微鏡
JP2002277746A (ja) 走査型光学顕微鏡および該走査型光学顕微鏡の共焦点ピンホール調整方法
JP2009036978A (ja) コンフォーカル顕微鏡
JP2008015030A (ja) レーザ走査顕微鏡
JP2005181891A (ja) レーザ顕微鏡
US20060050375A1 (en) Confocal microscope
US20070171502A1 (en) Beam deflector and scanning microscope
JP2011146463A (ja) レーザ発振装置
JPH0792392A (ja) 走査型光学顕微鏡
JP6326098B2 (ja) 顕微鏡装置
JP2007140196A (ja) 光源装置とこれを有するレーザ顕微鏡。

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20061222

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20061222

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20100203

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100302

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100506

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100720

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100817

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130827

Year of fee payment: 3

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees