JP2016516219A - ランダムアクセス誘導放出抑制(sted)顕微鏡 - Google Patents
ランダムアクセス誘導放出抑制(sted)顕微鏡 Download PDFInfo
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/29—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the position or the direction of light beams, i.e. deflection
- G02F1/33—Acousto-optical deflection devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0092—Polarisation microscopes
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- G—PHYSICS
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- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
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- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/58—Optics for apodization or superresolution; Optical synthetic aperture systems
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
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Abstract
Description
すなわち、光学スキャニングシステムは、
第1及び第2光ビームを案内する光学システムと、
前記第1及び第2光ビームを直接種々の方法で偏向する偏向手段と、
を備え、
前記偏向手段は、少なくとも1つの音響光学デフレクターを備え、前記光学システムは、前記第1及び第2光ビームが前記少なくとも1つの音響光学デフレクターを介して反対方向に伝播させるように配置され、前記少なくとも1つの音響光学デフレクターは、同時に又はパルスシーケンスで前記第1及び第2光ビームを偏向するために操作可能である。
本発明に係る光学スキャニングシステムであって、前記第1光ビームが前記分子を励起状態へと励起させるのに適しており、前記第2光ビームが前記励起状態の前記励起分子の数を抑制するのに適した光学スキャニングシステムと、
前記第1及び第2光ビームが前記ターゲット材料に、それぞれ移動可能で、部分的に重なる照射領域を形成するように、前記第1及び第2光ビームを前記ターゲット材料に方向付ける手段と、
を備える。
Claims (8)
- 第1及び第2光ビーム(110,110b)をガイドするための光学システム(81)と、
前記第1及び第2光ビームを、方向変更可能な手法で偏向するための偏向手段と、
を備え、
前記偏向手段は、少なくとも1つの音響光学デフレクター(100.1,100.2,100.3,100.4)を備え、
前記光学システムは、前記第1及び第2光ビームが前記少なくとも1つの音響光学デフレクターを介して反対方向に伝播させるように配置され、
前記少なくとも1つの音響光学デフレクターは、同時又はパルスシーケンスで、前記第1及び第2光ビームを偏向するために制御可能である光学スキャニングシステム(80)。 - 前記第1及び第2光ビームを生成するための生成手段(30)を備え、
前記生成手段は、第1及び第2光ビームが前記少なくとも1つの音響光学デフレクター内に進入する際、同一の波長と偏光を有するように設計されている請求項1に記載のシステム。 - ターゲット材料に含有される励起性化学種の分子を励起状態に励起させるために、ターゲット材料を照射するための装置であって、
前記第1光ビームが前記励起性化学種の分子を前記励起状態に励起させるのに適合し、前記第2光ビームが前記励起状態の励起分子の数を抑制するのに適合する請求項2に記載の光学スキャニングシステムと、
前記第1及び第2光ビームが前記ターゲット材料上にそれぞれ移動可能で部分的に重なった照射領域を形成するように、前記第1及び第2光ビームを前記ターゲット材料上に方向付けるための手段と、
を備えた装置。 - 誘導放出抑制(STED)光学顕微鏡のための装置を備え、
前記第1光ビームは短パルス励起ビームで構成され、前記第2光ビームは長パルス励起ビームで構成されている請求項3に記載の装置。 - 前記励起性ビームの波長は、励起性化学種の自発蛍光放射が可能であり、多重光子励起蛍光の断面は0ではないスペクトル窓内にある請求項4に記載の装置。
- 前記励起ビームのパルス長は1ps以下、好ましくは焦点で150fs以下であり、抑制ビームのパルス長は、50ps以上、好ましくは200ps及び2nsの間の範囲である請求項4又は5に記載の装置。
- 励起ビームと抑制ビームは共に、前記スキャニングシステム内への進入時、線形状に偏光されている請求項4から6のいずれか1項に記載の装置。
- 抑制ビームを整形し、好ましくは、光学スキャニングシステムの後と、前記第1及び第2光ビームが一緒になる前とで活性平面に配置されるビーム整形装置(40)を備えた請求項4から7のいずれか1項に記載の装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IT000229A ITTO20130229A1 (it) | 2013-03-22 | 2013-03-22 | Microscopia a deplezione mediante emissione stimolata (sted) ad accesso casuale |
ITTO2013A000229 | 2013-03-22 | ||
PCT/IB2014/060024 WO2014147590A1 (en) | 2013-03-22 | 2014-03-21 | Random access stimulated emission depletion (sted) microscopy |
Publications (2)
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JP2016516219A true JP2016516219A (ja) | 2016-06-02 |
JP6511433B2 JP6511433B2 (ja) | 2019-05-15 |
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Country Status (5)
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US (1) | US9810966B2 (ja) |
EP (1) | EP2976670B1 (ja) |
JP (1) | JP6511433B2 (ja) |
IT (1) | ITTO20130229A1 (ja) |
WO (1) | WO2014147590A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111879234A (zh) * | 2020-06-19 | 2020-11-03 | 浙江大学 | 基于偏振调制空心光斑照明的三维亚十纳米定位方法和装置 |
JP2022518162A (ja) * | 2019-01-25 | 2022-03-14 | ホーホシューレ、フューア、アンゲバント、ビッセンシャフテン、ミュンヘン | 誘導放出抑制顕微鏡法用パルス整形 |
Families Citing this family (9)
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WO2015020814A1 (en) * | 2013-08-08 | 2015-02-12 | Applied Materials, Inc. | Photonic activation of reactants for sub-micron feature formation using depleted beams |
DK3207417T3 (da) * | 2014-10-15 | 2019-07-01 | Inst Nat Sante Rech Med | Fremgangsmåde til bestemmelse af karakteristiske egenskaber ved et system til generering af en rumlig lysmodulation i fase og amplitude ved høj opdateringsfrekvens |
US10788655B2 (en) | 2016-02-09 | 2020-09-29 | Japan Science And Technology Agency | Irradiation device, laser microscope system, irradiation method, and laser microscope detection method |
WO2017159821A1 (ja) * | 2016-03-17 | 2017-09-21 | 国立研究開発法人科学技術振興機構 | イメージング装置及びイメージング方法 |
US10914930B2 (en) | 2016-08-31 | 2021-02-09 | Arizona Board Of Regents On Behalf Of The University Of Arizona | Stimulated emission depletion nonlinear structured illumination microscopy (STED-NSIM) apparatus, methods, and applications |
MY196770A (en) * | 2017-07-03 | 2023-05-03 | Electro Scient Ind Inc | Optically contacted acousto-optic device and method of making the same |
WO2019138119A1 (de) * | 2018-01-15 | 2019-07-18 | Leica Microsystems Cms Gmbh | Akustooptische vorrichtung und verfahren |
CN108761755A (zh) * | 2018-05-28 | 2018-11-06 | 西北大学 | 一种受激辐射损耗显微镜系统及其控制方法 |
CN112764326A (zh) * | 2021-01-21 | 2021-05-07 | 浙江大学 | 一种具有高速轴向扫描能力的三维直写光刻方法及装置 |
Citations (1)
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JPH04331927A (ja) * | 1991-05-07 | 1992-11-19 | Laser Tec Kk | 偏向ビーム発生装置 |
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US4405237A (en) * | 1981-02-04 | 1983-09-20 | The United States Of America As Represented By The Secretary Of The Navy | Coherent anti-Stokes Raman device |
JP3410287B2 (ja) * | 1996-04-11 | 2003-05-26 | Kddi株式会社 | 光スイッチ |
EP1668394A1 (de) * | 2003-09-25 | 2006-06-14 | Leica Microsystems Heidelberg GmbH | Mikroskop mit evaneszenter beleuchtung |
US7227127B2 (en) * | 2004-10-06 | 2007-06-05 | Peter Saggau | High speed microscope with three-dimensional laser beam scanning including acousto-optic deflector for controlling the lateral position and collimation of the light beam |
EP1839037B1 (en) | 2005-01-16 | 2013-10-30 | Stephen C. Baer | Single wavelength stimulated emission depletion microscopy |
US20090219607A1 (en) * | 2008-01-17 | 2009-09-03 | Baylor College Of Medicine | Method and apparatus for enhanced resolution microscopy of living biological nanostructures |
US8053743B2 (en) | 2008-03-17 | 2011-11-08 | Baer Stephen C | Superresolution in devices with single wavelength illumination |
US8432543B2 (en) * | 2010-09-20 | 2013-04-30 | Robert D Frankel | Method and system for raman, fluorescence, lithographic, stimulated emission and photochemical imaging beyond the diffraction limit |
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- 2013-03-22 IT IT000229A patent/ITTO20130229A1/it unknown
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- 2014-03-21 EP EP14722337.4A patent/EP2976670B1/en active Active
- 2014-03-21 WO PCT/IB2014/060024 patent/WO2014147590A1/en active Application Filing
- 2014-03-21 US US14/778,217 patent/US9810966B2/en active Active
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JPH04331927A (ja) * | 1991-05-07 | 1992-11-19 | Laser Tec Kk | 偏向ビーム発生装置 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2022518162A (ja) * | 2019-01-25 | 2022-03-14 | ホーホシューレ、フューア、アンゲバント、ビッセンシャフテン、ミュンヘン | 誘導放出抑制顕微鏡法用パルス整形 |
CN111879234A (zh) * | 2020-06-19 | 2020-11-03 | 浙江大学 | 基于偏振调制空心光斑照明的三维亚十纳米定位方法和装置 |
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EP2976670A1 (en) | 2016-01-27 |
EP2976670B1 (en) | 2021-06-16 |
ITTO20130229A1 (it) | 2014-09-23 |
WO2014147590A1 (en) | 2014-09-25 |
JP6511433B2 (ja) | 2019-05-15 |
US20160274439A1 (en) | 2016-09-22 |
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