JP2004111721A5 - - Google Patents

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Publication number
JP2004111721A5
JP2004111721A5 JP2002273409A JP2002273409A JP2004111721A5 JP 2004111721 A5 JP2004111721 A5 JP 2004111721A5 JP 2002273409 A JP2002273409 A JP 2002273409A JP 2002273409 A JP2002273409 A JP 2002273409A JP 2004111721 A5 JP2004111721 A5 JP 2004111721A5
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JP
Japan
Prior art keywords
semiconductor substrate
cavity
semiconductor
region
cavities
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2002273409A
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English (en)
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JP2004111721A (ja
JP4031329B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2002273409A priority Critical patent/JP4031329B2/ja
Priority claimed from JP2002273409A external-priority patent/JP4031329B2/ja
Priority to US10/665,614 priority patent/US7009273B2/en
Publication of JP2004111721A publication Critical patent/JP2004111721A/ja
Publication of JP2004111721A5 publication Critical patent/JP2004111721A5/ja
Priority to US11/315,796 priority patent/US7145215B2/en
Application granted granted Critical
Publication of JP4031329B2 publication Critical patent/JP4031329B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Claims (7)

  1. 半導体基板と、
    前記半導体基板内に形成された平板状の空洞と、
    前記半導体基板の表面内に、前記空洞の面内方向における端部に接するようにして形成された素子分離領域と
    を具備することを特徴とする半導体装置。
  2. 半導体基板と、
    前記半導体基板内に複数形成された平板状の空洞と、
    隣接する前記空洞間の前記半導体基板表面内に、前記空洞に接するようにして形成された素子分離領域と
    を具備することを特徴とする半導体装置。
  3. 前記空洞上面の面積は、該空洞上に位置する素子領域の底面の面積よりも大きい
    ことを特徴とする請求項1または2記載の半導体装置。
  4. 前記素子分離領域及び前記空洞は、前記空洞上に位置する素子領域の周囲を取り囲み、前記素子領域と前記半導体基板とを電気的に分離する
    ことを特徴とする請求項1乃至3いずれか1項記載の半導体装置。
  5. 1つの前記空洞上には、1つの素子領域のみが形成される
    ことを特徴とする請求項1乃至4いずれか1項記載の半導体装置。
  6. 半導体基板の第1領域上に形成された第1半導体層と、
    前記半導体基板の第2領域上に、空洞を介在して形成された第2半導体層と、
    前記第1、第2半導体層間の前記半導体基板上に、前記空洞に接するようにして形成され、前記第1、第2半導体層を電気的に分離する素子分離領域と
    を具備することを特徴とする半導体装置。
  7. 半導体基板中に、平板状の空洞を部分的に形成する工程と、
    隣接する前記空洞間の前記半導体基板表面に、該空洞の面内方向端部に接するように絶縁膜を形成して、隣接する空洞上に位置する素子領域間を電気的に分離する工程と、
    前記素子領域上に半導体素子を形成する工程と
    を具備することを特徴とする半導体装置の製造方法
JP2002273409A 2002-09-19 2002-09-19 半導体装置及びその製造方法 Expired - Fee Related JP4031329B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2002273409A JP4031329B2 (ja) 2002-09-19 2002-09-19 半導体装置及びその製造方法
US10/665,614 US7009273B2 (en) 2002-09-19 2003-09-19 Semiconductor device with a cavity therein and a method of manufacturing the same
US11/315,796 US7145215B2 (en) 2002-09-19 2005-12-22 Semiconductor device with a cavity therein and a method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002273409A JP4031329B2 (ja) 2002-09-19 2002-09-19 半導体装置及びその製造方法

Publications (3)

Publication Number Publication Date
JP2004111721A JP2004111721A (ja) 2004-04-08
JP2004111721A5 true JP2004111721A5 (ja) 2005-08-25
JP4031329B2 JP4031329B2 (ja) 2008-01-09

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Family Applications (1)

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JP2002273409A Expired - Fee Related JP4031329B2 (ja) 2002-09-19 2002-09-19 半導体装置及びその製造方法

Country Status (2)

Country Link
US (2) US7009273B2 (ja)
JP (1) JP4031329B2 (ja)

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