JP2003123496A - Ｗｏｒｍ記憶装置のための書き込みパルス制限 - Google Patents

Ｗｏｒｍ記憶装置のための書き込みパルス制限

Info

Publication number
JP2003123496A
JP2003123496A JP2002214851A JP2002214851A JP2003123496A JP 2003123496 A JP2003123496 A JP 2003123496A JP 2002214851 A JP2002214851 A JP 2002214851A JP 2002214851 A JP2002214851 A JP 2002214851A JP 2003123496 A JP2003123496 A JP 2003123496A
Authority
JP
Japan
Prior art keywords
pulse
voltage
write
output
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002214851A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003123496A5 (enExample
Inventor
Lung T Tran
ルン・ティー・トラン
Manish Sharma
マニシュ・シャーマ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JP2003123496A publication Critical patent/JP2003123496A/ja
Publication of JP2003123496A5 publication Critical patent/JP2003123496A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3468—Prevention of overerasure or overprogramming, e.g. by verifying whilst erasing or writing
    • G11C16/3486—Circuits or methods to prevent overprogramming of nonvolatile memory cells, e.g. by detecting onset or cessation of current flow in cells and using the detector output to terminate programming
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18—Auxiliary circuits, e.g. for writing into memory

Landscapes

  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
JP2002214851A 2001-07-31 2002-07-24 Ｗｏｒｍ記憶装置のための書き込みパルス制限 Pending JP2003123496A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/917,882 US6434060B1 (en) 2001-07-31 2001-07-31 Write pulse limiting for worm storage device
US09/917882 2001-07-31

Publications (2)

Publication Number Publication Date
JP2003123496A true JP2003123496A (ja) 2003-04-25
JP2003123496A5 JP2003123496A5 (enExample) 2005-04-21

Family

ID=25439461

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002214851A Pending JP2003123496A (ja) 2001-07-31 2002-07-24 Ｗｏｒｍ記憶装置のための書き込みパルス制限

Country Status (7)

Country Link
US (1) US6434060B1 (enExample)
EP (1) EP1282136B1 (enExample)
JP (1) JP2003123496A (enExample)
KR (1) KR20030011671A (enExample)
CN (1) CN1331153C (enExample)
DE (1) DE60222349D1 (enExample)
TW (1) TWI223269B (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007012038A (ja) * 2005-06-01 2007-01-18 Semiconductor Energy Lab Co Ltd 情報管理方法及び情報管理システム
US7388770B2 (en) 2005-01-13 2008-06-17 Kabushiki Kaisha Toshiba One-time programable memory with additional programming time to ensure hard breakdown of the gate insulating film
JP2008545276A (ja) * 2005-07-01 2008-12-11 サンディスク スリーディー，エルエルシー 逆バイアスプログラミングのための高誘電率アンチヒューズを備えるメモリセル
JP2009259385A (ja) * 2008-04-16 2009-11-05 Magnachip Semiconductor Ltd 不揮発性メモリ装置の書き込み方法
JP2010267368A (ja) * 2009-04-17 2010-11-25 Semiconductor Energy Lab Co Ltd 半導体記憶装置
JP2012033221A (ja) * 2010-07-29 2012-02-16 Renesas Electronics Corp 半導体記憶装置及びアンチヒューズのプログラム方法
JP2012522328A (ja) * 2009-12-16 2012-09-20 インテル コーポレイション アンチヒューズ型プログラマブルメモリアレイ

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6534841B1 (en) * 2001-12-14 2003-03-18 Hewlett-Packard Company Continuous antifuse material in memory structure
US8866121B2 (en) 2011-07-29 2014-10-21 Sandisk 3D Llc Current-limiting layer and a current-reducing layer in a memory device
US8659001B2 (en) 2011-09-01 2014-02-25 Sandisk 3D Llc Defect gradient to boost nonvolatile memory performance
US8637413B2 (en) 2011-12-02 2014-01-28 Sandisk 3D Llc Nonvolatile resistive memory element with a passivated switching layer
US8698119B2 (en) 2012-01-19 2014-04-15 Sandisk 3D Llc Nonvolatile memory device using a tunnel oxide as a current limiter element
US8686386B2 (en) 2012-02-17 2014-04-01 Sandisk 3D Llc Nonvolatile memory device using a varistor as a current limiter element
CN102810635A (zh) * 2012-08-09 2012-12-05 清华大学 一写多读式存储器件及其制造方法
US20140241031A1 (en) 2013-02-28 2014-08-28 Sandisk 3D Llc Dielectric-based memory cells having multi-level one-time programmable and bi-level rewriteable operating modes and methods of forming the same

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6382534A (ja) * 1986-09-26 1988-04-13 Matsushita Electric Ind Co Ltd メモリ保護装置
US5008855A (en) * 1989-07-18 1991-04-16 Actel Corporation Method of programming anti-fuse element
JPH03142779A (ja) * 1989-10-27 1991-06-18 Nec Corp センスアンプ駆動回路
US5257225A (en) * 1992-03-12 1993-10-26 Micron Technology, Inc. Method for programming programmable devices by utilizing single or multiple pulses varying in pulse width and amplitude
US5502395A (en) * 1994-05-25 1996-03-26 Allen; William J. Method for programming antifuses for reliable programmed links
US5684732A (en) * 1995-03-24 1997-11-04 Kawasaki Steel Corporation Semiconductor devices
JPH1166862A (ja) * 1997-08-14 1999-03-09 Nec Corp 半導体メモリ
TW387086B (en) * 1998-05-18 2000-04-11 Winbond Electronics Corp Pulsed word-line control circuit for memory device and its controlling method
US6052325A (en) * 1998-05-22 2000-04-18 Micron Technology, Inc. Method and apparatus for translating signals
DE19824524C2 (de) * 1998-06-02 2002-08-08 Honeywell Bv Regeleinrichtung für Gasbrenner
JP2000057772A (ja) * 1998-08-12 2000-02-25 Nec Corp 半導体記憶装置
KR100371022B1 (ko) * 1998-11-26 2003-07-16 주식회사 하이닉스반도체 다중비트 메모리셀의 데이터 센싱장치
DE69937559T2 (de) * 1999-09-10 2008-10-23 Stmicroelectronics S.R.L., Agrate Brianza Nicht-flüchtige Speicher mit Erkennung von Kurzschlüssen zwischen Wortleitungen
US6144606A (en) * 1999-10-14 2000-11-07 Advanced Micro Devices, Inc. Method and system for bi-directional voltage regulation detection
US6434048B1 (en) * 2001-07-20 2002-08-13 Hewlett-Packard Company Pulse train writing of worm storage device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7388770B2 (en) 2005-01-13 2008-06-17 Kabushiki Kaisha Toshiba One-time programable memory with additional programming time to ensure hard breakdown of the gate insulating film
JP2007012038A (ja) * 2005-06-01 2007-01-18 Semiconductor Energy Lab Co Ltd 情報管理方法及び情報管理システム
JP2008545276A (ja) * 2005-07-01 2008-12-11 サンディスク スリーディー，エルエルシー 逆バイアスプログラミングのための高誘電率アンチヒューズを備えるメモリセル
JP2009259385A (ja) * 2008-04-16 2009-11-05 Magnachip Semiconductor Ltd 不揮発性メモリ装置の書き込み方法
JP2014099243A (ja) * 2008-04-16 2014-05-29 Magnachip Semiconductor Ltd 不揮発性メモリ装置の書き込み方法
JP2010267368A (ja) * 2009-04-17 2010-11-25 Semiconductor Energy Lab Co Ltd 半導体記憶装置
US8964489B2 (en) 2009-04-17 2015-02-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor memory device capable of optimizing an operation time of a boosting circuit during a writing period
JP2012522328A (ja) * 2009-12-16 2012-09-20 インテル コーポレイション アンチヒューズ型プログラマブルメモリアレイ
JP2012033221A (ja) * 2010-07-29 2012-02-16 Renesas Electronics Corp 半導体記憶装置及びアンチヒューズのプログラム方法

Also Published As

Publication number Publication date
DE60222349D1 (de) 2007-10-25
KR20030011671A (ko) 2003-02-11
EP1282136B1 (en) 2007-09-12
US6434060B1 (en) 2002-08-13
TWI223269B (en) 2004-11-01
CN1400605A (zh) 2003-03-05
EP1282136A1 (en) 2003-02-05
CN1331153C (zh) 2007-08-08

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