JP2002174669A5 - - Google Patents

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JP2002174669A5
JP2002174669A5 JP2001296088A JP2001296088A JP2002174669A5 JP 2002174669 A5 JP2002174669 A5 JP 2002174669A5 JP 2001296088 A JP2001296088 A JP 2001296088A JP 2001296088 A JP2001296088 A JP 2001296088A JP 2002174669 A5 JP2002174669 A5 JP 2002174669A5
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JP
Japan
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JP2001296088A
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JP2002174669A (ja
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Priority claimed from US09/260,463 external-priority patent/US6499121B1/en
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Publication of JP2002174669A publication Critical patent/JP2002174669A/ja
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JP2001296088A 1999-03-01 2001-09-27 Ｄｕｔ間及びｄｕｔ内比較を用いる、集積回路デバイスの同時テスト Pending JP2002174669A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/260,463 1999-03-01
US09/260,463 US6499121B1 (en) 1999-03-01 1999-03-01 Distributed interface for parallel testing of multiple devices using a single tester channel

Related Parent Applications (1)

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JP2000602649A Division JP2002538465A (ja) 1999-03-01 2000-02-24 単一のテスターチャンネルを使用して複数のデバイスの同時テストを行うための分散型インターフェース

Publications (2)

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JP2002174669A JP2002174669A (ja) 2002-06-21
JP2002174669A5 true JP2002174669A5 (ja) 2007-04-12

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JP2000602649A Pending JP2002538465A (ja) 1999-03-01 2000-02-24 単一のテスターチャンネルを使用して複数のデバイスの同時テストを行うための分散型インターフェース
JP2001296088A Pending JP2002174669A (ja) 1999-03-01 2001-09-27 Ｄｕｔ間及びｄｕｔ内比較を用いる、集積回路デバイスの同時テスト

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP2000602649A Pending JP2002538465A (ja) 1999-03-01 2000-02-24 単一のテスターチャンネルを使用して複数のデバイスの同時テストを行うための分散型インターフェース

Country Status (8)

Country Link
US (2) US6499121B1 (ja)
EP (2) EP1159630B1 (ja)
JP (2) JP2002538465A (ja)
KR (1) KR100599348B1 (ja)
AU (1) AU3245900A (ja)
DE (1) DE60005156T2 (ja)
TW (1) TW548420B (ja)
WO (1) WO2000052488A1 (ja)

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