DE602006006353D1 - Mehrstufiger datenprozessor mit signal-repeater - Google Patents

Mehrstufiger datenprozessor mit signal-repeater

Info

Publication number
DE602006006353D1
DE602006006353D1 DE602006006353T DE602006006353T DE602006006353D1 DE 602006006353 D1 DE602006006353 D1 DE 602006006353D1 DE 602006006353 T DE602006006353 T DE 602006006353T DE 602006006353 T DE602006006353 T DE 602006006353T DE 602006006353 D1 DE602006006353 D1 DE 602006006353D1
Authority
DE
Germany
Prior art keywords
data processor
stage data
signal repeater
repeater
stage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602006006353T
Other languages
English (en)
Inventor
Juergen Serrer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Verigy Singapore Pte Ltd
Original Assignee
Verigy Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Verigy Singapore Pte Ltd filed Critical Verigy Singapore Pte Ltd
Publication of DE602006006353D1 publication Critical patent/DE602006006353D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31922—Timing generation or clock distribution
DE602006006353T 2006-02-07 2006-02-07 Mehrstufiger datenprozessor mit signal-repeater Active DE602006006353D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/EP2006/050727 WO2007090462A1 (en) 2006-02-07 2006-02-07 Multi-stage data processor with signal repeater

Publications (1)

Publication Number Publication Date
DE602006006353D1 true DE602006006353D1 (de) 2009-05-28

Family

ID=37102430

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602006006353T Active DE602006006353D1 (de) 2006-02-07 2006-02-07 Mehrstufiger datenprozessor mit signal-repeater

Country Status (7)

Country Link
US (1) US7921344B2 (de)
EP (1) EP1982204B1 (de)
JP (1) JP2009518637A (de)
CN (1) CN101384917B (de)
DE (1) DE602006006353D1 (de)
TW (1) TWI334542B (de)
WO (1) WO2007090462A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007062974B4 (de) * 2007-12-21 2010-04-08 Phoenix Contact Gmbh & Co. Kg Signalverarbeitungsvorrichtung
US9164859B2 (en) * 2009-09-25 2015-10-20 Qualcomm Incorporated Computing device for enabling concurrent testing
CN105807208A (zh) * 2016-04-25 2016-07-27 航天科工防御技术研究试验中心 一种基于Multi-port的异步复合测试方法
US10782348B2 (en) * 2017-03-10 2020-09-22 Keithley Instruments, Llc Automatic device detection and connection verification

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DK0864099T3 (da) * 1995-11-30 2002-12-30 Siemens Ag Fremgangsmåde og indretning til kontrol af elektriske drev
US6028439A (en) * 1997-10-31 2000-02-22 Credence Systems Corporation Modular integrated circuit tester with distributed synchronization and control
US6499121B1 (en) * 1999-03-01 2002-12-24 Formfactor, Inc. Distributed interface for parallel testing of multiple devices using a single tester channel
US6622103B1 (en) * 2000-06-20 2003-09-16 Formfactor, Inc. System for calibrating timing of an integrated circuit wafer tester
US7743304B2 (en) * 2006-02-17 2010-06-22 Verigy (Singapore) Pte. Ltd. Test system and method for testing electronic devices using a pipelined testing architecture

Also Published As

Publication number Publication date
TWI334542B (en) 2010-12-11
CN101384917B (zh) 2012-05-30
EP1982204B1 (de) 2009-04-15
US7921344B2 (en) 2011-04-05
CN101384917A (zh) 2009-03-11
WO2007090462A1 (en) 2007-08-16
EP1982204A1 (de) 2008-10-22
TW200739359A (en) 2007-10-16
JP2009518637A (ja) 2009-05-07
US20090282302A1 (en) 2009-11-12

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