JP2001014897A5 - - Google Patents

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Publication number
JP2001014897A5
JP2001014897A5 JP1999182334A JP18233499A JP2001014897A5 JP 2001014897 A5 JP2001014897 A5 JP 2001014897A5 JP 1999182334 A JP1999182334 A JP 1999182334A JP 18233499 A JP18233499 A JP 18233499A JP 2001014897 A5 JP2001014897 A5 JP 2001014897A5
Authority
JP
Japan
Prior art keywords
test mode
mode signals
competing
decoding circuits
signals
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1999182334A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001014897A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP11182334A priority Critical patent/JP2001014897A/ja
Priority claimed from JP11182334A external-priority patent/JP2001014897A/ja
Priority to US09/477,717 priority patent/US6288956B1/en
Publication of JP2001014897A publication Critical patent/JP2001014897A/ja
Publication of JP2001014897A5 publication Critical patent/JP2001014897A5/ja
Pending legal-status Critical Current

Links

JP11182334A 1999-06-28 1999-06-28 半導体装置 Pending JP2001014897A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP11182334A JP2001014897A (ja) 1999-06-28 1999-06-28 半導体装置
US09/477,717 US6288956B1 (en) 1999-06-28 2000-01-05 Semiconductor device having test function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11182334A JP2001014897A (ja) 1999-06-28 1999-06-28 半導体装置

Publications (2)

Publication Number Publication Date
JP2001014897A JP2001014897A (ja) 2001-01-19
JP2001014897A5 true JP2001014897A5 (enExample) 2005-10-27

Family

ID=16116502

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11182334A Pending JP2001014897A (ja) 1999-06-28 1999-06-28 半導体装置

Country Status (2)

Country Link
US (1) US6288956B1 (enExample)
JP (1) JP2001014897A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002358800A (ja) * 2001-05-28 2002-12-13 Mitsubishi Electric Corp 半導体装置
KR100951666B1 (ko) 2008-08-08 2010-04-07 주식회사 하이닉스반도체 테스트 모드를 제어하는 반도체 집적 회로
CN115206409B (zh) * 2022-07-08 2025-08-01 长鑫存储技术有限公司 模式控制结构、测试模式控制方法及存储器

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2955156B2 (ja) 1992-10-29 1999-10-04 三菱電機株式会社 半導体装置
JP2639319B2 (ja) * 1993-09-22 1997-08-13 日本電気株式会社 半導体装置
JP3753190B2 (ja) 1995-04-26 2006-03-08 三菱電機株式会社 半導体装置
JPH0991957A (ja) 1995-07-14 1997-04-04 Mitsubishi Electric Corp 半導体装置のモード選定回路

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