JP2001014897A - 半導体装置 - Google Patents

半導体装置

Info

Publication number
JP2001014897A
JP2001014897A JP11182334A JP18233499A JP2001014897A JP 2001014897 A JP2001014897 A JP 2001014897A JP 11182334 A JP11182334 A JP 11182334A JP 18233499 A JP18233499 A JP 18233499A JP 2001014897 A JP2001014897 A JP 2001014897A
Authority
JP
Japan
Prior art keywords
test mode
circuit
signal
test
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11182334A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001014897A5 (enExample
Inventor
Tetsushi Tanizaki
哲志 谷▲崎▼
Tetsuo Kato
哲夫 加藤
Mikio Asakura
幹雄 朝倉
Yasuhiro Konishi
康弘 小西
Takayuki Miyamoto
崇行 宮元
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP11182334A priority Critical patent/JP2001014897A/ja
Priority to US09/477,717 priority patent/US6288956B1/en
Publication of JP2001014897A publication Critical patent/JP2001014897A/ja
Publication of JP2001014897A5 publication Critical patent/JP2001014897A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/46—Test trigger logic

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP11182334A 1999-06-28 1999-06-28 半導体装置 Pending JP2001014897A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP11182334A JP2001014897A (ja) 1999-06-28 1999-06-28 半導体装置
US09/477,717 US6288956B1 (en) 1999-06-28 2000-01-05 Semiconductor device having test function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11182334A JP2001014897A (ja) 1999-06-28 1999-06-28 半導体装置

Publications (2)

Publication Number Publication Date
JP2001014897A true JP2001014897A (ja) 2001-01-19
JP2001014897A5 JP2001014897A5 (enExample) 2005-10-27

Family

ID=16116502

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11182334A Pending JP2001014897A (ja) 1999-06-28 1999-06-28 半導体装置

Country Status (2)

Country Link
US (1) US6288956B1 (enExample)
JP (1) JP2001014897A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002358800A (ja) * 2001-05-28 2002-12-13 Mitsubishi Electric Corp 半導体装置
KR100951666B1 (ko) * 2008-08-08 2010-04-07 주식회사 하이닉스반도체 테스트 모드를 제어하는 반도체 집적 회로

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115206409B (zh) * 2022-07-08 2025-08-01 长鑫存储技术有限公司 模式控制结构、测试模式控制方法及存储器

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2955156B2 (ja) 1992-10-29 1999-10-04 三菱電機株式会社 半導体装置
JP2639319B2 (ja) * 1993-09-22 1997-08-13 日本電気株式会社 半導体装置
JP3753190B2 (ja) 1995-04-26 2006-03-08 三菱電機株式会社 半導体装置
JPH0991957A (ja) 1995-07-14 1997-04-04 Mitsubishi Electric Corp 半導体装置のモード選定回路

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002358800A (ja) * 2001-05-28 2002-12-13 Mitsubishi Electric Corp 半導体装置
KR100951666B1 (ko) * 2008-08-08 2010-04-07 주식회사 하이닉스반도체 테스트 모드를 제어하는 반도체 집적 회로
US9368237B2 (en) 2008-08-08 2016-06-14 Hynix Semiconductor Inc. Semiconductor integrated circuit capable of controlling test modes without stopping test

Also Published As

Publication number Publication date
US6288956B1 (en) 2001-09-11

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