IL108504A - Test sensor for liquid crystal display - Google Patents

Test sensor for liquid crystal display

Info

Publication number
IL108504A
IL108504A IL10850494A IL10850494A IL108504A IL 108504 A IL108504 A IL 108504A IL 10850494 A IL10850494 A IL 10850494A IL 10850494 A IL10850494 A IL 10850494A IL 108504 A IL108504 A IL 108504A
Authority
IL
Israel
Prior art keywords
flexible circuit
carrier block
free end
recess
circuit
Prior art date
Application number
IL10850494A
Other languages
English (en)
Hebrew (he)
Other versions
IL108504A0 (en
Original Assignee
Hughes Aircraft Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Aircraft Co filed Critical Hughes Aircraft Co
Publication of IL108504A0 publication Critical patent/IL108504A0/xx
Publication of IL108504A publication Critical patent/IL108504A/en

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Liquid Crystal (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
IL10850494A 1993-02-25 1994-01-31 Test sensor for liquid crystal display IL108504A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/023,019 US5378982A (en) 1993-02-25 1993-02-25 Test probe for panel having an overlying protective member adjacent panel contacts

Publications (2)

Publication Number Publication Date
IL108504A0 IL108504A0 (en) 1994-05-30
IL108504A true IL108504A (en) 1995-12-31

Family

ID=21812662

Family Applications (1)

Application Number Title Priority Date Filing Date
IL10850494A IL108504A (en) 1993-02-25 1994-01-31 Test sensor for liquid crystal display

Country Status (4)

Country Link
US (1) US5378982A (ja)
EP (1) EP0613014A1 (ja)
JP (1) JPH075071A (ja)
IL (1) IL108504A (ja)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5917707A (en) 1993-11-16 1999-06-29 Formfactor, Inc. Flexible contact structure with an electrically conductive shell
US7073254B2 (en) * 1993-11-16 2006-07-11 Formfactor, Inc. Method for mounting a plurality of spring contact elements
US5820014A (en) 1993-11-16 1998-10-13 Form Factor, Inc. Solder preforms
JP3491700B2 (ja) * 1994-03-18 2004-01-26 富士通株式会社 半導体集積回路装置の試験用キャリア
JPH10506459A (ja) * 1994-09-09 1998-06-23 マイクロモジュール・システムズ 回路のメンブレンプローブ
EP0779989A4 (en) * 1994-09-09 1998-01-07 Micromodule Systems Inc CONTROL OF MEMBRANE INTEGRATED CIRCUITS
KR100384265B1 (ko) * 1994-10-28 2003-08-14 클리크 앤드 소파 홀딩스 인코포레이티드 프로그램가능한고집적전자검사장치
US6144216A (en) * 1995-04-01 2000-11-07 Enplas Corporation Electric contact apparatus for inspecting a liquid crystal display panel
JP3001182B2 (ja) * 1995-08-29 2000-01-24 信越ポリマー株式会社 液晶パネル検査装置およびその製造方法
US5994152A (en) 1996-02-21 1999-11-30 Formfactor, Inc. Fabricating interconnects and tips using sacrificial substrates
US8033838B2 (en) * 1996-02-21 2011-10-11 Formfactor, Inc. Microelectronic contact structure
US6552563B1 (en) * 1996-11-14 2003-04-22 Si Diamond Technology, Inc. Display panel test device
US6281701B1 (en) * 1999-06-04 2001-08-28 Chi Mei Optoelectronics Corporation Apparatus for testing flat panel display
JP5051947B2 (ja) * 2001-05-14 2012-10-17 ヤマハファインテック株式会社 導通検査装置
JP2003344451A (ja) * 2002-05-30 2003-12-03 Advantest Corp プローブカード、プローブカード製造方法、及び接触子
US6765203B1 (en) * 2003-01-31 2004-07-20 Shimadzu Corporation Pallet assembly for substrate inspection device and substrate inspection device
JP5406790B2 (ja) * 2009-08-04 2014-02-05 株式会社日本マイクロニクス プローブユニット及びこれを用いる試験装置
JP2012233723A (ja) * 2011-04-28 2012-11-29 Micronics Japan Co Ltd プローブ装置及びプローブユニット
KR101946360B1 (ko) 2011-05-16 2019-02-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 프로그래머블 로직 디바이스
TWI451178B (zh) 2011-11-07 2014-09-01 Hannstar Display Corp 陣列基板與具有該陣列基板的液晶面板及其製造方法
CN102402030B (zh) * 2011-12-07 2013-11-13 苏州华兴源创电子科技有限公司 一种液晶面板检测治具
WO2014059633A1 (zh) * 2012-10-17 2014-04-24 Zhao Lin 一种压杆式液晶屏检测连接装置
CN104236445B (zh) * 2013-06-06 2017-03-29 纬创资通股份有限公司 检测工具及利用检测工具检测内凹变形程度的检测方法
US9435855B2 (en) 2013-11-19 2016-09-06 Teradyne, Inc. Interconnect for transmitting signals between a device and a tester
US9594114B2 (en) 2014-06-26 2017-03-14 Teradyne, Inc. Structure for transmitting signals in an application space between a device under test and test electronics
CN105093574B (zh) * 2015-06-05 2018-06-08 京东方科技集团股份有限公司 显示面板检测台
CN105929272A (zh) * 2016-04-25 2016-09-07 昆山瑞鸿诚自动化设备科技有限公司 一种前屏幕和触摸屏测试治具
US9977052B2 (en) 2016-10-04 2018-05-22 Teradyne, Inc. Test fixture
WO2018144878A1 (en) * 2017-02-02 2018-08-09 Brigham Young University Flexible electric probe
US10677815B2 (en) 2018-06-08 2020-06-09 Teradyne, Inc. Test system having distributed resources
US11363746B2 (en) 2019-09-06 2022-06-14 Teradyne, Inc. EMI shielding for a signal trace
US11862901B2 (en) 2020-12-15 2024-01-02 Teradyne, Inc. Interposer

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3832632A (en) * 1971-11-22 1974-08-27 F Ardezzone Multi-point probe head assembly
JPS5815245A (ja) * 1981-07-21 1983-01-28 Seiko Epson Corp プロ−ブカ−ド
US4571542A (en) * 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
US4585727A (en) * 1984-07-27 1986-04-29 Probe-Tronics, Inc. Fixed point method and apparatus for probing semiconductor devices
JPS63149576A (ja) * 1986-12-12 1988-06-22 Mitsubishi Electric Corp 基板検査装置
JPH0664086B2 (ja) * 1989-08-02 1994-08-22 武田産業株式会社 プローブカード
GB2239744B (en) * 1989-11-07 1994-03-16 Sharp Kk Tester head
JP2833093B2 (ja) * 1990-01-29 1998-12-09 株式会社島津製作所 キャピラリー電気泳動装置
JPH0458131A (ja) * 1990-06-27 1992-02-25 Sharp Corp 液晶表示パネルの検査装置
US5055776A (en) * 1990-07-10 1991-10-08 The United States Of America As Represented By The Secretary Of The Army Flexible membrane circuit tester
JPH04252964A (ja) * 1991-01-30 1992-09-08 Sharp Corp テスターヘッド
JPH04297050A (ja) * 1991-03-12 1992-10-21 Mitsubishi Electric Corp 半導体検査装置およびその平板状基板の製造方法
US5177438A (en) * 1991-08-02 1993-01-05 Motorola, Inc. Low resistance probe for semiconductor

Also Published As

Publication number Publication date
JPH075071A (ja) 1995-01-10
EP0613014A1 (en) 1994-08-31
IL108504A0 (en) 1994-05-30
US5378982A (en) 1995-01-03

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