GB2239744B - Tester head - Google Patents

Tester head

Info

Publication number
GB2239744B
GB2239744B GB9024225A GB9024225A GB2239744B GB 2239744 B GB2239744 B GB 2239744B GB 9024225 A GB9024225 A GB 9024225A GB 9024225 A GB9024225 A GB 9024225A GB 2239744 B GB2239744 B GB 2239744B
Authority
GB
United Kingdom
Prior art keywords
tester head
tester
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB9024225A
Other versions
GB2239744A (en
GB9024225D0 (en
Inventor
Masao Tanaka
Hideyuki Inugai
Kazuya Kaida
Kimihiko Kajimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP28979389 priority Critical
Priority to JP29063689 priority
Priority to JP30003389 priority
Application filed by Sharp Corp filed Critical Sharp Corp
Publication of GB9024225D0 publication Critical patent/GB9024225D0/en
Publication of GB2239744A publication Critical patent/GB2239744A/en
Application granted granted Critical
Publication of GB2239744B publication Critical patent/GB2239744B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
GB9024225A 1989-11-07 1990-11-07 Tester head Expired - Fee Related GB2239744B (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP28979389 1989-11-07
JP29063689 1989-11-08
JP30003389 1989-11-17

Publications (3)

Publication Number Publication Date
GB9024225D0 GB9024225D0 (en) 1990-12-19
GB2239744A GB2239744A (en) 1991-07-10
GB2239744B true GB2239744B (en) 1994-03-16

Family

ID=27337533

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9024225A Expired - Fee Related GB2239744B (en) 1989-11-07 1990-11-07 Tester head

Country Status (1)

Country Link
GB (1) GB2239744B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7967621B2 (en) 1999-08-17 2011-06-28 Formfactor, Inc. Electrical contactor, especially wafer level contactor, using fluid pressure

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3253069B2 (en) * 1990-07-25 2002-02-04 キヤノン株式会社 Inspection method of part to be measured using electrical connection member
US5378982A (en) * 1993-02-25 1995-01-03 Hughes Aircraft Company Test probe for panel having an overlying protective member adjacent panel contacts
JP3001182B2 (en) * 1995-08-29 2000-01-24 信越ポリマー株式会社 Liquid crystal panel inspection apparatus and method of manufacturing the same

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0226995A2 (en) * 1985-12-23 1987-07-01 Tektronix, Inc. Multiple lead probe for integrated circuits
WO1988005544A1 (en) * 1987-01-20 1988-07-28 Hughes Aircraft Company Test connector for electrical devices
EP0294936A1 (en) * 1987-05-06 1988-12-14 Reflex Promotion A/S A method and a transfer for decorating textiles
EP0304868A2 (en) * 1987-08-28 1989-03-01 Tektronix Inc. Multiple lead probe for integrated circuits in wafer form
EP0331282A1 (en) * 1988-03-01 1989-09-06 Hewlett-Packard Company Membrane-based IC test probe with precisely positioned contacts
EP0361779A1 (en) * 1988-09-26 1990-04-04 Hewlett-Packard Company Micro-strip architecture for membrane test probe

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0226995A2 (en) * 1985-12-23 1987-07-01 Tektronix, Inc. Multiple lead probe for integrated circuits
WO1988005544A1 (en) * 1987-01-20 1988-07-28 Hughes Aircraft Company Test connector for electrical devices
EP0294936A1 (en) * 1987-05-06 1988-12-14 Reflex Promotion A/S A method and a transfer for decorating textiles
EP0304868A2 (en) * 1987-08-28 1989-03-01 Tektronix Inc. Multiple lead probe for integrated circuits in wafer form
EP0331282A1 (en) * 1988-03-01 1989-09-06 Hewlett-Packard Company Membrane-based IC test probe with precisely positioned contacts
EP0361779A1 (en) * 1988-09-26 1990-04-04 Hewlett-Packard Company Micro-strip architecture for membrane test probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7967621B2 (en) 1999-08-17 2011-06-28 Formfactor, Inc. Electrical contactor, especially wafer level contactor, using fluid pressure

Also Published As

Publication number Publication date
GB2239744A (en) 1991-07-10
GB9024225D0 (en) 1990-12-19

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20051107