HK1049215A1 - 用於綜合電路測試環境中的測試碼壓縮 - Google Patents
用於綜合電路測試環境中的測試碼壓縮Info
- Publication number
- HK1049215A1 HK1049215A1 HK03100614.3A HK03100614A HK1049215A1 HK 1049215 A1 HK1049215 A1 HK 1049215A1 HK 03100614 A HK03100614 A HK 03100614A HK 1049215 A1 HK1049215 A1 HK 1049215A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- test
- integrated circuit
- scan
- symbolic expressions
- symbolic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318335—Test pattern compression or decompression
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318544—Scanning methods, algorithms and patterns
- G01R31/318547—Data generators or compressors
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Compression, Expansion, Code Conversion, And Decoders (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16744699P | 1999-11-23 | 1999-11-23 | |
US09/619,985 US6327687B1 (en) | 1999-11-23 | 2000-07-20 | Test pattern compression for an integrated circuit test environment |
PCT/US2000/031377 WO2001038981A1 (en) | 1999-11-23 | 2000-11-15 | Test pattern compression for an integrated circuit test environment |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1049215A1 true HK1049215A1 (zh) | 2003-05-02 |
Family
ID=26863184
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK03100614.3A HK1049215A1 (zh) | 1999-11-23 | 2003-01-23 | 用於綜合電路測試環境中的測試碼壓縮 |
Country Status (7)
Country | Link |
---|---|
US (5) | US6327687B1 (zh) |
EP (1) | EP1236111B1 (zh) |
JP (1) | JP3920640B2 (zh) |
AT (2) | ATE340363T1 (zh) |
DE (2) | DE60030896T2 (zh) |
HK (1) | HK1049215A1 (zh) |
WO (1) | WO2001038981A1 (zh) |
Families Citing this family (133)
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-
2000
- 2000-07-20 US US09/619,985 patent/US6327687B1/en not_active Expired - Lifetime
- 2000-11-15 JP JP2001540467A patent/JP3920640B2/ja not_active Expired - Fee Related
- 2000-11-15 DE DE60030896T patent/DE60030896T2/de not_active Expired - Lifetime
- 2000-11-15 AT AT04017880T patent/ATE340363T1/de not_active IP Right Cessation
- 2000-11-15 DE DE60018101T patent/DE60018101T2/de not_active Expired - Lifetime
- 2000-11-15 AT AT00978684T patent/ATE289094T1/de not_active IP Right Cessation
- 2000-11-15 WO PCT/US2000/031377 patent/WO2001038981A1/en active IP Right Grant
- 2000-11-15 EP EP00978684A patent/EP1236111B1/en not_active Expired - Lifetime
-
2001
- 2001-09-04 US US09/947,160 patent/US6543020B2/en not_active Expired - Lifetime
-
2003
- 2003-01-23 HK HK03100614.3A patent/HK1049215A1/zh unknown
- 2003-01-31 US US10/355,941 patent/US7111209B2/en not_active Expired - Lifetime
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2006
- 2006-09-18 US US11/523,111 patent/US7509546B2/en not_active Expired - Fee Related
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WO2001038981A1 (en) | 2001-05-31 |
US20070016836A1 (en) | 2007-01-18 |
ATE340363T1 (de) | 2006-10-15 |
US7111209B2 (en) | 2006-09-19 |
EP1236111A1 (en) | 2002-09-04 |
US7900104B2 (en) | 2011-03-01 |
DE60030896D1 (de) | 2006-11-02 |
DE60018101T2 (de) | 2006-01-12 |
JP2003515809A (ja) | 2003-05-07 |
US7509546B2 (en) | 2009-03-24 |
US6327687B1 (en) | 2001-12-04 |
US20020053057A1 (en) | 2002-05-02 |
DE60030896T2 (de) | 2007-09-20 |
EP1236111B1 (en) | 2005-02-09 |
EP1236111A4 (en) | 2003-09-17 |
DE60018101D1 (de) | 2005-03-17 |
US20090259900A1 (en) | 2009-10-15 |
US20030131298A1 (en) | 2003-07-10 |
US6543020B2 (en) | 2003-04-01 |
ATE289094T1 (de) | 2005-02-15 |
JP3920640B2 (ja) | 2007-05-30 |
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