FR2651330B1 - Appareil pour charger et decharger des manchons pour un dispositif de test de circuit integre. - Google Patents

Appareil pour charger et decharger des manchons pour un dispositif de test de circuit integre.

Info

Publication number
FR2651330B1
FR2651330B1 FR9010836A FR9010836A FR2651330B1 FR 2651330 B1 FR2651330 B1 FR 2651330B1 FR 9010836 A FR9010836 A FR 9010836A FR 9010836 A FR9010836 A FR 9010836A FR 2651330 B1 FR2651330 B1 FR 2651330B1
Authority
FR
France
Prior art keywords
loading
integrated circuit
test device
circuit test
unloading sleeves
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9010836A
Other languages
English (en)
Other versions
FR2651330A1 (fr
Inventor
Soo-Pil Lee
Ill-Sub Kim
Duk-Hee Lee
Yul Kim
Dong-Chol Ahn
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
Goldstar Electron Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1019890012565A external-priority patent/KR910005377A/ko
Priority claimed from KR1019890015372A external-priority patent/KR960015559B1/ko
Priority claimed from KR2019890015506U external-priority patent/KR930008125Y1/ko
Priority claimed from KR2019890017069U external-priority patent/KR940001273Y1/ko
Priority claimed from KR2019890017068U external-priority patent/KR940000547Y1/ko
Priority claimed from KR2019900003834U external-priority patent/KR950006931Y1/ko
Application filed by Goldstar Electron Co Ltd filed Critical Goldstar Electron Co Ltd
Publication of FR2651330A1 publication Critical patent/FR2651330A1/fr
Application granted granted Critical
Publication of FR2651330B1 publication Critical patent/FR2651330B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67276—Production flow monitoring, e.g. for increasing throughput

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Warehouses Or Storage Devices (AREA)
  • Filling Or Emptying Of Bunkers, Hoppers, And Tanks (AREA)
FR9010836A 1989-08-31 1990-08-30 Appareil pour charger et decharger des manchons pour un dispositif de test de circuit integre. Expired - Fee Related FR2651330B1 (fr)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
KR1019890012565A KR910005377A (ko) 1989-08-31 1989-08-31 슬리브의 분리, 수평유지, 낙하의 자동화 장치
KR1019890015372A KR960015559B1 (ko) 1989-10-25 1989-10-25 아이시(ic)테스트기의 슬리브 로딩 장치
KR2019890015506U KR930008125Y1 (ko) 1989-10-25 1989-10-25 슬리브 방향 검출장치
KR2019890017069U KR940001273Y1 (ko) 1989-11-18 1989-11-18 슬리이브속의 ic유무 검출장치
KR2019890017068U KR940000547Y1 (ko) 1989-11-18 1989-11-18 슬리이브의 낙하장치
KR2019900003834U KR950006931Y1 (ko) 1990-03-31 1990-03-31 Ic 테스트 슬리브의 솟터 장치

Publications (2)

Publication Number Publication Date
FR2651330A1 FR2651330A1 (fr) 1991-03-01
FR2651330B1 true FR2651330B1 (fr) 1994-10-28

Family

ID=37735089

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9010836A Expired - Fee Related FR2651330B1 (fr) 1989-08-31 1990-08-30 Appareil pour charger et decharger des manchons pour un dispositif de test de circuit integre.

Country Status (5)

Country Link
JP (1) JPH0645406B2 (fr)
DE (1) DE4023772A1 (fr)
FR (1) FR2651330B1 (fr)
GB (1) GB2235581B (fr)
NL (1) NL195037C (fr)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR950001245Y1 (ko) * 1991-09-13 1995-02-24 금성일렉트론 주식회사 핸들러의 디바이스 자동 송출장치
DE4430846C2 (de) * 1994-08-31 1997-04-10 Jenoptik Jena Gmbh Einrichtung zur Umsetzung eines Transportobjektes zwischen zwei Endlagen
DE4430844C1 (de) * 1994-08-31 1996-02-22 Jenoptik Technologie Gmbh Beschickungseinrichtung für Halbleiterbearbeitungsanlagen
DE4443061A1 (de) * 1994-12-03 1996-06-05 Elmako Damm Gmbh Chip-Handling System
JP3063602B2 (ja) * 1995-12-22 2000-07-12 日立電子エンジニアリング株式会社 Ｉｃデバイスの移載装置
TW371347B (en) * 1995-12-27 1999-10-01 Advantest Corp Structure of rotary arm and device chuck part of a device handler
KR100481298B1 (ko) * 1997-08-04 2006-05-22 삼성전자주식회사 반도체디바이스이/삽입시스템및이를통한반도체디바이스이/삽입방법
DE19733937C1 (de) * 1997-08-06 1999-03-04 Multitest Elektronische Syst Führungsbahn für mikroelektronische Bauelemente
DE19813684C2 (de) 1998-03-27 2001-08-16 Brooks Automation Gmbh Einrichtung zur Aufnahme von Transportbehältern an einer Be- und Entladestation
CN108152778B (zh) * 2018-01-29 2024-01-30 苏州立讯技术有限公司 滤波器自动互调测试设备
CN115432423B (zh) * 2022-08-29 2023-08-18 深圳市博辉特科技有限公司 一种简便的物料分类机构
CN115870228B (zh) * 2022-12-21 2023-10-20 江苏晟銮电子科技有限公司 一种肖特基芯片检测系统和芯片检测方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0382264B1 (fr) * 1984-06-29 1994-06-15 Advantest Corporation Equipement d'essai pour IC (circuit intégré)
US4775279A (en) * 1985-12-11 1988-10-04 American Tech Manufacturing, Inc. Method and apparatus for loading/unloading dip devices
US4776747A (en) * 1986-01-03 1988-10-11 Motorola Inc. High speed integrated circuit handler
US4744799A (en) * 1986-06-06 1988-05-17 Usm Corporation Combined sequencer and insertion machine
US4850785A (en) * 1987-03-13 1989-07-25 Quality Automation, Inc. Eprom feed apparatus

Also Published As

Publication number Publication date
GB9017541D0 (en) 1990-09-26
JPH03238233A (ja) 1991-10-24
NL9001820A (nl) 1991-03-18
FR2651330A1 (fr) 1991-03-01
NL195037C (nl) 2003-06-25
DE4023772A1 (de) 1991-03-14
GB2235581B (en) 1993-06-09
JPH0645406B2 (ja) 1994-06-15
DE4023772C2 (fr) 1992-07-16
GB2235581A (en) 1991-03-06

Similar Documents

Publication Publication Date Title
FR2616917B1 (fr) Dispositif de test pour disjoncteur
FR2700063B1 (fr) Procédé de test de puces de circuit intégré et dispositif intégré correspondant.
DE69019402T2 (de) Prüfverfahren und -gerät für integrierte Schaltungen.
FR2523791B1 (fr) Dispositif et appareil de test d'equipements electroniques notamment de television
SG78283A1 (en) Method and apparatus for performing operative testing on an integrated circuit
EP0466939A4 (en) Ic testing device
EP0435586A3 (en) Heat transfer apparatus for an integrated circuit device
GB2217465B (en) Method and apparatus for measuring the speed of an integrated circuit device
FR2609811B1 (fr) Dispositif de commande pour un appareil de test automatique de circuits
EP0408299A3 (en) Semiconductor integrated circuit device and test method therefor
EP0458448A3 (en) An adapter and test fixture for an integrated circuit device package
FR2651330B1 (fr) Appareil pour charger et decharger des manchons pour un dispositif de test de circuit integre.
GB2182793B (en) Processing device for an ic card
GB2199265B (en) Developing device for an image-forming apparatus
FR2644579B1 (fr) Dispositif de detection de position pour appareil photographique
FR2665256B1 (fr) Dispositif et procede pour mesurer un angle.
FR2515623B1 (fr) Dispositif de tri de bobines defectueuses, pour bobinoirs
FR2622702B1 (fr) Appareil de mesure du courant de fuite des broches d'entree d'un dispositif sous test
FR2605112B1 (fr) Dispositif et procede de generation de vecteurs de test et procede de test pour circuit integre
FR2652205B1 (fr) Dispositif de fixation rapide pour appareil electrique, et appareillage electrique correspondant.
EP0414014A3 (en) Semiconductor device and method and apparatus for testing the same
EP0472938A3 (en) Method and device for testing and repairing an integrated circuit
FR2521814B1 (fr) Bac pour cartes de circuits, destine notamment aux coffrets et baies d'appareillages electroniques
FR2539476B1 (fr) Dispositif d'amortissement de coupelles utilisees dans un appareil automatique
EP0454052A3 (en) Data processing device with test circuit

Legal Events

Date Code Title Description
CA Change of address
CD Change of name or company name
TP Transmission of property
TP Transmission of property
ST Notification of lapse

Effective date: 20070430