GB9017541D0 - Apparatus for loading and unloading sleeves for a ic tester - Google Patents

Apparatus for loading and unloading sleeves for a ic tester

Info

Publication number
GB9017541D0
GB9017541D0 GB909017541A GB9017541A GB9017541D0 GB 9017541 D0 GB9017541 D0 GB 9017541D0 GB 909017541 A GB909017541 A GB 909017541A GB 9017541 A GB9017541 A GB 9017541A GB 9017541 D0 GB9017541 D0 GB 9017541D0
Authority
GB
United Kingdom
Prior art keywords
tester
loading
unloading sleeves
sleeves
unloading
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB909017541A
Other versions
GB2235581A (en
GB2235581B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
Goldstar Electron Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1019890012565A external-priority patent/KR910005377A/en
Priority claimed from KR1019890015372A external-priority patent/KR960015559B1/en
Priority claimed from KR2019890015506U external-priority patent/KR930008125Y1/en
Priority claimed from KR2019890017069U external-priority patent/KR940001273Y1/en
Priority claimed from KR2019890017068U external-priority patent/KR940000547Y1/en
Priority claimed from KR2019900003834U external-priority patent/KR950006931Y1/en
Application filed by Goldstar Electron Co Ltd filed Critical Goldstar Electron Co Ltd
Publication of GB9017541D0 publication Critical patent/GB9017541D0/en
Publication of GB2235581A publication Critical patent/GB2235581A/en
Publication of GB2235581B publication Critical patent/GB2235581B/en
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67276—Production flow monitoring, e.g. for increasing throughput

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Warehouses Or Storage Devices (AREA)
  • Filling Or Emptying Of Bunkers, Hoppers, And Tanks (AREA)
GB9017541A 1989-08-31 1990-08-10 Apparatus for loading and unloading sleeves for a ic tester Expired - Fee Related GB2235581B (en)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
KR1019890012565A KR910005377A (en) 1989-08-31 1989-08-31 Automatic device for separating, leveling and dropping sleeves
KR2019890015506U KR930008125Y1 (en) 1989-10-25 1989-10-25 Detecting apparatus of slive direction
KR1019890015372A KR960015559B1 (en) 1989-10-25 1989-10-25 Sleeve loading apparatus of ic tester
KR2019890017068U KR940000547Y1 (en) 1989-11-18 1989-11-18 Dropping apparatus of sleeve
KR2019890017069U KR940001273Y1 (en) 1989-11-18 1989-11-18 I.c. detecting apparatus in sleeve
KR2019900003834U KR950006931Y1 (en) 1990-03-31 1990-03-31 Sorter for i.c tester

Publications (3)

Publication Number Publication Date
GB9017541D0 true GB9017541D0 (en) 1990-09-26
GB2235581A GB2235581A (en) 1991-03-06
GB2235581B GB2235581B (en) 1993-06-09

Family

ID=37735089

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9017541A Expired - Fee Related GB2235581B (en) 1989-08-31 1990-08-10 Apparatus for loading and unloading sleeves for a ic tester

Country Status (5)

Country Link
JP (1) JPH0645406B2 (en)
DE (1) DE4023772A1 (en)
FR (1) FR2651330B1 (en)
GB (1) GB2235581B (en)
NL (1) NL195037C (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115432423A (en) * 2022-08-29 2022-12-06 深圳市博辉特科技有限公司 Simple and convenient material classification mechanism
CN115870228A (en) * 2022-12-21 2023-03-31 江苏晟銮电子科技有限公司 Schottky chip detection system and chip detection method

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR950001245Y1 (en) * 1991-09-13 1995-02-24 금성일렉트론 주식회사 Apparatus for autotransmitting device of handler
DE4430846C2 (en) * 1994-08-31 1997-04-10 Jenoptik Jena Gmbh Device for the implementation of a transport object between two end positions
DE4430844C1 (en) * 1994-08-31 1996-02-22 Jenoptik Technologie Gmbh Feeding device for semiconductor processing systems
DE4443061A1 (en) * 1994-12-03 1996-06-05 Elmako Damm Gmbh Chip handling appts. for conveying chips from magazine to processing station or vice versa
JP3063602B2 (en) * 1995-12-22 2000-07-12 日立電子エンジニアリング株式会社 IC device transfer equipment
TW371347B (en) * 1995-12-27 1999-10-01 Advantest Corp Structure of rotary arm and device chuck part of a device handler
KR100481298B1 (en) * 1997-08-04 2006-05-22 삼성전자주식회사 Semiconductor device transfer / insertion system and semiconductor device transfer / insertion method through it
DE19733937C1 (en) * 1997-08-06 1999-03-04 Multitest Elektronische Syst Guide path for microelectronic component in automatic handling device
DE19813684C2 (en) 1998-03-27 2001-08-16 Brooks Automation Gmbh Device for receiving transport containers at a loading and unloading station
CN108152778B (en) * 2018-01-29 2024-01-30 苏州立讯技术有限公司 Automatic intermodulation test equipment of filter

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3584319D1 (en) * 1984-06-29 1991-11-14 Advantest Corp IC TEST DEVICE.
US4775279A (en) * 1985-12-11 1988-10-04 American Tech Manufacturing, Inc. Method and apparatus for loading/unloading dip devices
US4776747A (en) * 1986-01-03 1988-10-11 Motorola Inc. High speed integrated circuit handler
US4744799A (en) * 1986-06-06 1988-05-17 Usm Corporation Combined sequencer and insertion machine
US4850785A (en) * 1987-03-13 1989-07-25 Quality Automation, Inc. Eprom feed apparatus

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115432423A (en) * 2022-08-29 2022-12-06 深圳市博辉特科技有限公司 Simple and convenient material classification mechanism
CN115432423B (en) * 2022-08-29 2023-08-18 深圳市博辉特科技有限公司 Simple material classification mechanism
CN115870228A (en) * 2022-12-21 2023-03-31 江苏晟銮电子科技有限公司 Schottky chip detection system and chip detection method
CN115870228B (en) * 2022-12-21 2023-10-20 江苏晟銮电子科技有限公司 Schottky chip detection system and chip detection method

Also Published As

Publication number Publication date
FR2651330A1 (en) 1991-03-01
NL195037C (en) 2003-06-25
GB2235581A (en) 1991-03-06
JPH03238233A (en) 1991-10-24
NL9001820A (en) 1991-03-18
JPH0645406B2 (en) 1994-06-15
GB2235581B (en) 1993-06-09
FR2651330B1 (en) 1994-10-28
DE4023772C2 (en) 1992-07-16
DE4023772A1 (en) 1991-03-14

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20060810