FR2609811B1 - Dispositif de commande pour un appareil de test automatique de circuits - Google Patents
Dispositif de commande pour un appareil de test automatique de circuitsInfo
- Publication number
- FR2609811B1 FR2609811B1 FR888800057A FR8800057A FR2609811B1 FR 2609811 B1 FR2609811 B1 FR 2609811B1 FR 888800057 A FR888800057 A FR 888800057A FR 8800057 A FR8800057 A FR 8800057A FR 2609811 B1 FR2609811 B1 FR 2609811B1
- Authority
- FR
- France
- Prior art keywords
- control device
- test apparatus
- circuit test
- automatic circuit
- automatic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/3167—Testing of combined analog and digital circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
- G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31935—Storing data, e.g. failure memory
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/003,831 US4816750A (en) | 1987-01-16 | 1987-01-16 | Automatic circuit tester control system |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2609811A1 FR2609811A1 (fr) | 1988-07-22 |
FR2609811B1 true FR2609811B1 (fr) | 1992-06-19 |
Family
ID=21707795
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR888800057A Expired - Lifetime FR2609811B1 (fr) | 1987-01-16 | 1988-01-06 | Dispositif de commande pour un appareil de test automatique de circuits |
Country Status (6)
Country | Link |
---|---|
US (1) | US4816750A (fr) |
JP (1) | JPH0795088B2 (fr) |
CA (1) | CA1260536A (fr) |
DE (1) | DE3800757A1 (fr) |
FR (1) | FR2609811B1 (fr) |
GB (1) | GB2199957B (fr) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4922492A (en) * | 1988-05-13 | 1990-05-01 | National Semiconductor Corp. | Architecture and device for testable mixed analog and digital VLSI circuits |
US5369593A (en) | 1989-05-31 | 1994-11-29 | Synopsys Inc. | System for and method of connecting a hardware modeling element to a hardware modeling system |
US5353243A (en) * | 1989-05-31 | 1994-10-04 | Synopsys Inc. | Hardware modeling system and method of use |
US5025205A (en) * | 1989-06-22 | 1991-06-18 | Texas Instruments Incorporated | Reconfigurable architecture for logic test system |
CA2038295A1 (fr) * | 1990-03-16 | 1991-09-17 | Brian Jerrold Arkin | Processeur rapide d'information sur les defaillances |
US5289116A (en) * | 1990-05-31 | 1994-02-22 | Hewlett Packard Company | Apparatus and method for testing electronic devices |
US5063383A (en) * | 1990-06-04 | 1991-11-05 | National Semiconductor Corporation | System and method for testing analog to digital converter embedded in microcontroller |
JPH04104074A (ja) * | 1990-08-22 | 1992-04-06 | Mitsubishi Electric Corp | 電子基板検査装置 |
US5225772A (en) * | 1990-09-05 | 1993-07-06 | Schlumberger Technologies, Inc. | Automatic test equipment system using pin slice architecture |
US5295079A (en) * | 1991-07-18 | 1994-03-15 | National Semiconductor Corporation | Digital testing techniques for very high frequency phase-locked loops |
JP3163128B2 (ja) * | 1991-08-28 | 2001-05-08 | アジレント・テクノロジー株式会社 | 電子部品等試験装置および電子部品等試験方法 |
DE69100204T2 (de) * | 1991-11-11 | 1994-01-13 | Hewlett Packard Gmbh | Einrichtung zur Erzeugung von Testsignalen. |
WO1994002861A1 (fr) * | 1992-07-27 | 1994-02-03 | Credence Systems Corporation | Appareil d'essai automatique de dispositifs complexes |
JPH08184648A (ja) * | 1994-12-28 | 1996-07-16 | Advantest Corp | 半導体試験装置用テストパターンの高速転送装置 |
US5673295A (en) * | 1995-04-13 | 1997-09-30 | Synopsis, Incorporated | Method and apparatus for generating and synchronizing a plurality of digital signals |
US5720031A (en) * | 1995-12-04 | 1998-02-17 | Micron Technology, Inc. | Method and apparatus for testing memory devices and displaying results of such tests |
US5930735A (en) * | 1997-04-30 | 1999-07-27 | Credence Systems Corporation | Integrated circuit tester including at least one quasi-autonomous test instrument |
US6128754A (en) * | 1997-11-24 | 2000-10-03 | Schlumberger Technologies, Inc. | Tester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test program |
US6363507B1 (en) * | 1998-10-19 | 2002-03-26 | Teradyne, Inc. | Integrated multi-channel analog test instrument architecture providing flexible triggering |
US6154715A (en) * | 1999-01-15 | 2000-11-28 | Credence Systems Corporation | Integrated circuit tester with real time branching |
US6374379B1 (en) * | 1999-02-05 | 2002-04-16 | Teradyne, Inc. | Low-cost configuration for monitoring and controlling parametric measurement units in automatic test equipment |
JP4560187B2 (ja) * | 2000-08-30 | 2010-10-13 | 株式会社アドバンテスト | インターリーブad変換方式波形ディジタイザ装置 |
JP2002243808A (ja) * | 2001-02-09 | 2002-08-28 | Advantest Corp | アナログ・デジタル混成ic用テストシステム |
AU2003222702A1 (en) | 2002-05-03 | 2003-11-17 | Mcgill University | Method and device for use in dc parametric tests |
US7062678B2 (en) * | 2002-08-06 | 2006-06-13 | Lsi Logic Corporation | Diagnostic memory interface test |
KR20070011315A (ko) * | 2004-02-19 | 2007-01-24 | 조지아 테크 리서치 코오포레이션 | 병렬 통신을 위한 시스템 및 방법 |
US7454681B2 (en) * | 2004-11-22 | 2008-11-18 | Teradyne, Inc. | Automatic test system with synchronized instruments |
US7319936B2 (en) * | 2004-11-22 | 2008-01-15 | Teradyne, Inc. | Instrument with interface for synchronization in automatic test equipment |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4041386A (en) * | 1976-05-21 | 1977-08-09 | Data Test Corporation | Multifunctional circuit analyzer |
US4130795A (en) * | 1977-12-16 | 1978-12-19 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Versatile LDV burst simulator |
US4271515A (en) * | 1979-03-23 | 1981-06-02 | John Fluke Mfg. Co., Inc. | Universal analog and digital tester |
US4402055A (en) * | 1981-01-27 | 1983-08-30 | Westinghouse Electric Corp. | Automatic test system utilizing interchangeable test devices |
JPS58158566A (ja) * | 1982-03-17 | 1983-09-20 | Hitachi Ltd | 検査装置 |
DE3443967A1 (de) * | 1984-12-01 | 1986-06-05 | Robert Bosch Gmbh, 7000 Stuttgart | Vorrichtung zur pruefung von bauelementen |
-
1987
- 1987-01-16 US US07/003,831 patent/US4816750A/en not_active Expired - Lifetime
- 1987-12-15 CA CA000554302A patent/CA1260536A/fr not_active Expired
-
1988
- 1988-01-06 FR FR888800057A patent/FR2609811B1/fr not_active Expired - Lifetime
- 1988-01-13 DE DE3800757A patent/DE3800757A1/de active Granted
- 1988-01-14 GB GB8800781A patent/GB2199957B/en not_active Expired - Lifetime
- 1988-01-16 JP JP63007376A patent/JPH0795088B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US4816750A (en) | 1989-03-28 |
GB2199957A (en) | 1988-07-20 |
CA1260536A (fr) | 1989-09-26 |
DE3800757A1 (de) | 1988-07-28 |
DE3800757C2 (fr) | 1992-05-14 |
GB8800781D0 (en) | 1988-02-17 |
JPH0795088B2 (ja) | 1995-10-11 |
GB2199957B (en) | 1991-09-04 |
FR2609811A1 (fr) | 1988-07-22 |
JPS63215975A (ja) | 1988-09-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |
Effective date: 20070930 |