FR2456991B1 - Circuit generateur de tension de lecture de memoire permettant d'adapter des memoires mortes programmables effacables a des circuits utilisant une tension de polarisation du substrat - Google Patents

Circuit generateur de tension de lecture de memoire permettant d'adapter des memoires mortes programmables effacables a des circuits utilisant une tension de polarisation du substrat

Info

Publication number
FR2456991B1
FR2456991B1 FR8010598A FR8010598A FR2456991B1 FR 2456991 B1 FR2456991 B1 FR 2456991B1 FR 8010598 A FR8010598 A FR 8010598A FR 8010598 A FR8010598 A FR 8010598A FR 2456991 B1 FR2456991 B1 FR 2456991B1
Authority
FR
France
Prior art keywords
deadly
adapting
memories
delete
programmable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR8010598A
Other languages
English (en)
Other versions
FR2456991A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fairchild Semiconductor Corp
Original Assignee
Fairchild Camera and Instrument Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fairchild Camera and Instrument Corp filed Critical Fairchild Camera and Instrument Corp
Publication of FR2456991A1 publication Critical patent/FR2456991A1/fr
Application granted granted Critical
Publication of FR2456991B1 publication Critical patent/FR2456991B1/fr
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/30Power supply circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/26Sensing or reading circuits; Data output circuits
FR8010598A 1979-05-14 1980-05-12 Circuit generateur de tension de lecture de memoire permettant d'adapter des memoires mortes programmables effacables a des circuits utilisant une tension de polarisation du substrat Expired FR2456991B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US3861279A 1979-05-14 1979-05-14

Publications (2)

Publication Number Publication Date
FR2456991A1 FR2456991A1 (fr) 1980-12-12
FR2456991B1 true FR2456991B1 (fr) 1985-11-22

Family

ID=21900899

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8010598A Expired FR2456991B1 (fr) 1979-05-14 1980-05-12 Circuit generateur de tension de lecture de memoire permettant d'adapter des memoires mortes programmables effacables a des circuits utilisant une tension de polarisation du substrat

Country Status (5)

Country Link
JP (1) JPS59917B2 (fr)
DE (1) DE3017960C2 (fr)
FR (1) FR2456991B1 (fr)
GB (1) GB2049327B (fr)
IT (1) IT1129217B (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5693363A (en) * 1979-12-04 1981-07-28 Fujitsu Ltd Semiconductor memory
DE3279855D1 (en) * 1981-12-29 1989-09-07 Fujitsu Ltd Nonvolatile semiconductor memory circuit
EP0189594B1 (fr) * 1984-12-28 1992-08-12 Nec Corporation Dispositif de mémoire semi-conductrice non-volatile
JPS63149534A (ja) * 1986-12-13 1988-06-22 Hokutou Koki Kogyo Kk 重心検出器
US6545913B2 (en) 1987-06-29 2003-04-08 Kabushiki Kaisha Toshiba Memory cell of nonvolatile semiconductor memory device
US5877981A (en) * 1987-06-29 1999-03-02 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device having a matrix of memory cells
US5448517A (en) * 1987-06-29 1995-09-05 Kabushiki Kaisha Toshiba Electrically programmable nonvolatile semiconductor memory device with NAND cell structure
US6034899A (en) * 1987-06-29 2000-03-07 Kabushiki Kaisha Toshiba Memory cell of nonvolatile semiconductor memory device
JP3109736B2 (ja) * 1987-07-31 2000-11-20 株式会社東芝 半導体集積回路と浮遊ゲート型メモリセルの読み出し駆動方法

Also Published As

Publication number Publication date
GB2049327B (en) 1983-03-30
JPS55153195A (en) 1980-11-28
DE3017960C2 (de) 1984-08-30
FR2456991A1 (fr) 1980-12-12
IT1129217B (it) 1986-06-04
DE3017960A1 (de) 1980-11-20
IT8067601A0 (it) 1980-04-17
GB2049327A (en) 1980-12-17
JPS59917B2 (ja) 1984-01-09

Similar Documents

Publication Publication Date Title
FR2456991B1 (fr) Circuit generateur de tension de lecture de memoire permettant d'adapter des memoires mortes programmables effacables a des circuits utilisant une tension de polarisation du substrat
FR2667169B1 (fr) Circuit de production de haute tension pour un circuit de memoire a semiconducteur.
DE69125225D1 (de) Halbleiterspeicher mit Mehrfachtakt zum Eintritt im Prüfmodus
KR850000726A (ko) 가변 사이클로 리프레시를 행하는 회로를 갖는 반도체 메모리
DE69115952D1 (de) Abfühlschaltung zum Lesen von in nichtflüchtigen Speicherzellen gespeicherten Daten
FI885844A (fi) Menetelmä ja kytkentä EE-PROM-muistien manipuloinnilta suojatuksi arvon käyttämiseksi
KR860005446A (ko) 메모리 테스트 패턴 발생회로를 포함한 반도체 장치
DE69228399D1 (de) Speicherzellenmatrix der Multiporthalbleiterspeicheranordnungstype
ITMI922734A1 (it) Circuito per generare segnali di orologio per separare linee di bit in un dispositivo di memoria a semiconduttore.
KR880009376A (ko) 반도체 기억장치
ES461619A1 (es) Perfeccionamientos en aparatos semiconductores.
JPS5562588A (en) Semiconductor memory circuit
DE69119803D1 (de) Schreibeschaltung für eine nichtflüchtige Speicheranordnung
JPS5677968A (en) Hierarchy memory element
DE3766393D1 (de) Datenleseschaltung zum gebrauch in halbleiterspeichereinrichtungen.
DE69019414D1 (de) Halbleiterspeicher mit hoher Zelldichte.
DE69219961D1 (de) Statische Direktzugriffspeicheranordnung mit variablen Ladungsschaltungen für Bitleitungsparen
JPS53987A (en) Semiconductor device
ES2148963T3 (es) Dispositivo de memoria de semiconductores.
JPS55160393A (en) Read voltage setting system for semiconductor memory
JPS6435797A (en) Non-volatile semiconductor storage device
JPS5459822A (en) Recording device
JPS5622292A (en) Memory element
JPS5597641A (en) Address generator
JPS5472924A (en) Semiconductor memory inspection equipment

Legal Events

Date Code Title Description
ST Notification of lapse