ES2874279T3 - Gestión de actualización para memoria flash - Google Patents

Gestión de actualización para memoria flash Download PDF

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Publication number
ES2874279T3
ES2874279T3 ES17739376T ES17739376T ES2874279T3 ES 2874279 T3 ES2874279 T3 ES 2874279T3 ES 17739376 T ES17739376 T ES 17739376T ES 17739376 T ES17739376 T ES 17739376T ES 2874279 T3 ES2874279 T3 ES 2874279T3
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ES
Spain
Prior art keywords
update
flash memory
register
record
operations
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
ES17739376T
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English (en)
Spanish (es)
Inventor
Hyunsuk Shin
Robert Hardacker
Hung Vuong
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Qualcomm Inc
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Qualcomm Inc
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Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
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Publication of ES2874279T3 publication Critical patent/ES2874279T3/es
Active legal-status Critical Current
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Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02Addressing or allocation; Relocation
    • G06F12/0223User address space allocation, e.g. contiguous or non contiguous base addressing
    • G06F12/023Free address space management
    • G06F12/0238Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
    • G06F12/0246Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/34Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3431Circuits or methods to detect disturbed nonvolatile memory cells, e.g. which still read as programmed but with threshold less than the program verify threshold or read as erased but with threshold greater than the erase verify threshold, and to reverse the disturbance via a refreshing programming or erasing step

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Read Only Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Memory System (AREA)
  • Dram (AREA)
ES17739376T 2016-06-20 2017-06-07 Gestión de actualización para memoria flash Active ES2874279T3 (es)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201662352393P 2016-06-20 2016-06-20
US15/615,827 US10199115B2 (en) 2016-06-20 2017-06-06 Managing refresh for flash memory
PCT/US2017/036397 WO2017222818A1 (en) 2016-06-20 2017-06-07 Managing refresh for flash memory

Publications (1)

Publication Number Publication Date
ES2874279T3 true ES2874279T3 (es) 2021-11-04

Family

ID=60659776

Family Applications (1)

Application Number Title Priority Date Filing Date
ES17739376T Active ES2874279T3 (es) 2016-06-20 2017-06-07 Gestión de actualización para memoria flash

Country Status (9)

Country Link
US (2) US10199115B2 (enExample)
EP (2) EP3472840B1 (enExample)
JP (2) JP7213690B2 (enExample)
KR (1) KR102508868B1 (enExample)
CN (2) CN109328386B (enExample)
BR (1) BR112018075661A2 (enExample)
CA (1) CA3026804C (enExample)
ES (1) ES2874279T3 (enExample)
WO (1) WO2017222818A1 (enExample)

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KR102611382B1 (ko) 2018-09-19 2023-12-07 삼성디스플레이 주식회사 터치 감지 유닛과 그를 포함하는 표시 장치
US10761727B2 (en) * 2018-11-19 2020-09-01 Micron Technology, Inc. Scan frequency modulation based on memory density or block usage
US10725706B1 (en) * 2019-01-23 2020-07-28 Qualcomm Incorporated Apparatus and method of scheduling universal flash storage refresh operations according to a refresh handover mechanism
US10811076B1 (en) * 2019-06-29 2020-10-20 Intel Corporation Battery life based on inhibited memory refreshes
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US11037641B1 (en) * 2019-12-05 2021-06-15 Sandisk Technologies Llc Temperature and cycling dependent refresh operation for memory cells
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US12237031B2 (en) * 2022-06-01 2025-02-25 Micron Technology, Inc. Refresh rate selection for a memory built-in self-test
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JP5478855B2 (ja) 2008-08-08 2014-04-23 ルネサスエレクトロニクス株式会社 不揮発性メモリ制御方法及び半導体装置
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US10199115B2 (en) * 2016-06-20 2019-02-05 Qualcomm Incorporated Managing refresh for flash memory

Also Published As

Publication number Publication date
US10360987B2 (en) 2019-07-23
JP7213690B2 (ja) 2023-01-27
CA3026804A1 (en) 2017-12-28
KR102508868B1 (ko) 2023-03-09
BR112018075661A2 (pt) 2019-04-09
WO2017222818A1 (en) 2017-12-28
JP7348325B2 (ja) 2023-09-20
EP3472840A1 (en) 2019-04-24
CN109328386A (zh) 2019-02-12
JP2022070884A (ja) 2022-05-13
CN114758711A (zh) 2022-07-15
KR20190016968A (ko) 2019-02-19
CN109328386B (zh) 2022-04-29
EP3472840B1 (en) 2021-02-24
EP3594952A1 (en) 2020-01-15
US20170365352A1 (en) 2017-12-21
US10199115B2 (en) 2019-02-05
JP2019522284A (ja) 2019-08-08
US20190066811A1 (en) 2019-02-28
CA3026804C (en) 2023-09-05

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