EP0268881A1 - Dispositif pour l'essai et le classement d'éléments électronique en particulier IC's - Google Patents

Dispositif pour l'essai et le classement d'éléments électronique en particulier IC's Download PDF

Info

Publication number
EP0268881A1
EP0268881A1 EP87116152A EP87116152A EP0268881A1 EP 0268881 A1 EP0268881 A1 EP 0268881A1 EP 87116152 A EP87116152 A EP 87116152A EP 87116152 A EP87116152 A EP 87116152A EP 0268881 A1 EP0268881 A1 EP 0268881A1
Authority
EP
European Patent Office
Prior art keywords
magazine
test
components
head
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP87116152A
Other languages
German (de)
English (en)
Inventor
Hans-Heinrich Willberg
Ekkehard Ueberreiter
Franz Schöttler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Multitest Elektronische Systeme GmbH
Original Assignee
Multitest Elektronische Systeme GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Multitest Elektronische Systeme GmbH filed Critical Multitest Elektronische Systeme GmbH
Publication of EP0268881A1 publication Critical patent/EP0268881A1/fr
Withdrawn legal-status Critical Current

Links

Images

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/36Sorting apparatus characterised by the means used for distribution
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B07SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07CPOSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34Sorting according to other particular properties
    • B07C5/344Sorting according to other particular properties according to electric or electromagnetic properties

Definitions

  • the invention relates to a device for testing and sorting electronic components, in particular ICs, with at least one input magazine having a magazine channel for the components to be tested, with a test head having a socket with connecting contacts for the components to be tested one after the other, with a box-shaped one Test computer located in the housing, which supplies the test head with test signals for the components, with an output magazine which has at least one magazine channel for the components which are found to be good and at least one magazine channel for the components which are found to be defective or poor, and with at least one adjustable holder for which box-shaped housing of the test computer.
  • a device is described in DE-OS 33 40 183.
  • a holder for the test computer in the form of a manipulator is described in the older German patent applications P 36 15 941.7 and P 36 15 942.5 and in EP-OS 0 102 217.
  • the previously known test device is characterized by a high working speed. Its inclined input magazine has a large number of magazine channels and can be moved across the magazine channels in order to be able to bring a selected magazine channel into the unloading position. This feeds the components it contains to a fixed separating device, which consists of a belt conveyor with a light barrier. The isolated components then fall into a test channel up to a test head. This has finger-like spring elements which are connected to the test computer. After the test process, every component tested falls in a so-called sorting shuttle, which can be moved across the magazine channels of the fixed output magazine and unloads the component into one of the magazine channels according to the test result. The magazine channels are again arranged at an angle.
  • the filling of the magazine channels of the input magazine and the emptying of the filled magazine channels of the output magazine takes place by inserting magazine rods for the time of filling or unloading onto the inputs of the magazine channels of the input magazine or onto the outputs of the magazine channels of the output magazine.
  • the test device is located in a separate housing and is an independent device.
  • the test computer is also located in a separate box-shaped housing. Since it is very heavy on the one hand and the box-shaped housing is unwieldy and on the other hand the connection between the test computer and the test head of the test device must be established by means of appropriate plugs or plug contacts located on both devices, which are sensitive to mechanical damage, the housing of the test computer is placed in a manipulator clamped.
  • the manipulator is equipped with a weight compensation system and allows the housing of the test computer to be moved in several degrees of freedom, so that the plug contacts of the two devices can be brought into engagement safely and without damage.
  • test device Since the known test device was developed in the sense of a high working speed and with the aim of classifying the components found to be defective as finely as possible, it is obvious that this device requires a correspondingly large technical outlay and is accordingly expensive.
  • the invention has for its object a device for testing and sorting electronic components, in particular ICs, which requires considerably less technical effort and can therefore be manufactured more cheaply, with the fact that the operating speed is lower and the sorting is less finely classified.
  • the object is achieved in that the input magazine, the test head and the output magazine are attached to the housing of the test computer or the holder, and that a movable transmission element is provided, by means of which the components can be transported from the input magazine to the test head and from the test head to the output magazine are.
  • test device there is therefore no need to accommodate the test device in a separate housing. Rather, the device parts are, if necessary, detachably attached to the housing of the test computer or to the holder for the housing.
  • the manipulator allows the test computer housing to be positioned in any position, according to a further development of the invention it can also be positioned such that the input magazine and the output magazine are inclined or vertical, in such a way that the components sliding forward in the magazine channels by gravity.
  • the manipulator that is already available for handling the heavy test computer can also be used here to give the test device according to the invention a position that saves additional transport or displacement elements for the components, which would be necessary if the magazine channels were horizontal Direction would be aligned.
  • the manipulator even allows the bevel to be selected precisely, so that the components slide on the one hand, but on the other hand only meet at a moderate speed and damage is avoided in this way.
  • a crossbar which spans the output of the input magazine, the test head and the input of the output magazine, is attached to the housing of the test computer or the holder for the housing with a slide guide, that a slide is attached to the slide guide is movably arranged that the carriage carries a suction head that can be displaced against the magazines and the test head or away from them for the components to be transported and that a traversing drive for the carriage, a displacement drive for the suction head and a pneumatic control for the suction head are provided.
  • a separate storage opening for the tested components can be provided for each magazine channel, the traversing drive, the displacement drive and the pneumatic control being controlled by the computer or depending on the test result.
  • the suction head can have a laterally deflectable downward-pointing suction nipple, which permits lateral tolerance movements of the component.
  • the socket of the test head and the placement openings for the components on the output magazine can be conical be trained.
  • the suction head can be provided with at least one stop element which is to be placed on a corresponding one Counter-stop next to the removal opening of the input magazine, the version of the test head and the or the storage openings of the output magazine is determined, and that the teat is adjustable against the resistance of a restoring force on the suction head and against the forward displacement movement of the suction head.
  • the input magazine can have at least two magazine channels and can be displaceably arranged in such a way that the removal opening of each magazine channel is in a fixed removal position. In this way, one magazine channel can be filled and the other emptied.
  • Another development of the invention can consist in the fact that the magazine channels in the magazines are formed by magazine rods that can be inserted into the magazines. This is particularly advantageous because the components are normally transported in magazine bars anyway.
  • adjustable or resilient mounting or clamping elements can be provided.
  • the removal opening at the end of each magazine channel of the input magazine can be adjusted from the side or height Limiting elements are formed, which are set so that the removal opening is adapted to the length and width of the components to be removed.
  • the adjustable holder for the box-shaped housing of the test computer can be a manipulator.
  • this is not mandatory. It is also possible that the holder is only designed so that it allows the manipulator to be placed, preferably in an oblique orientation, on a table or the like.
  • a last development of the invention can consist in that the box-shaped housing of the test computer is surrounded by carrier cheeks and fastened in it, that the carrier cheeks sit in the adjustable holder or belong to it, that on opposite sides of the carrier cheeks protrude beyond the box-shaped housing Carrier elements are fastened, that the box-shaped housing-overlapping carrier rails for holding the magazines are fastened to the carrier elements, and that the cross member of the slide guide is also fastened to the carrier elements.
  • Fig. 1 the housing 1 containing the test computer is clamped in carrier cheeks 2a, 2b, which in turn are firmly connected to two plates, of which only plate 3a is visible.
  • the plate 3a lies against a further plate 4a and is connected to it by a pivot axis 5a.
  • the further plate 4 is provided with a semicircular slot 6a through which a screw 7a protrudes, which engages in the former plate 3a.
  • the plate 4a also carries two bearing bushes 8a and 9a, with which it sits on a rod 10a.
  • the test computer housing can be pivoted about the axis 5a and can be fixed in a certain inclined position with the screw 7a.
  • the parts 3a to 10a are present symmetrically on the other side (see FIG. 2), and are identified there with the same number but with "b".
  • the parts mentioned together with the carrier cheeks belong to a manipulator.
  • Carrier elements 11a, 11b which protrude beyond the box-shaped housing 1 of the test computer, are fastened to the carrier cheeks 2a, 2b.
  • Carrier rails 12, 13 and extend between the carrier elements 11a, 11b a cross member 14 with a slide guide 15.
  • An input magazine 16 and an output magazine 17 are attached to the carrier rails. Furthermore, holders 18, 19 for a test head 20 are fastened to the carrier rails 12, 13.
  • a slide 21 is arranged to be horizontally displaceable.
  • the drive takes place with a stepper motor 22 via a toothed belt drive which cannot be seen here.
  • the drive motor 22 sits on the crossmember 14.
  • the carriage 21 carries a suction head 23 which can be raised or lowered on guide rails 25 by means of a pneumatic lifting cylinder 24.
  • the pneumatic supply lines for the lifting cylinder 24 and the suction head 23 as well as the vacuum source and the corresponding control are not shown, since these are common parts.
  • the input magazine 16 has two conventional magazine bars 26, only one of which is shown in FIG. 1.
  • the components contained in the magazine bars 26 slide due to the oblique arrangement to the right to a removal opening 27.
  • the input magazine 16 is displaceable transversely to the magazine bars, in such a way that one of the two magazine bars can always be brought into the unloading position while the other is exchanged for a full magazine bar.
  • At least two magazine bars 26 are inserted into the output magazine 17, only one of which is shown in FIG. 1.
  • a storage opening 28 is provided for each of the exchangeable magazine bars 26.
  • Testing and sorting with the device shown in FIG. 1 proceeds as follows:
  • the slide 21 travels with the suction head 23 raised over the single removal opening 27 of the input magazine 16. Once there, the suction head 23 is lowered and grasps the component which is ready in the removal opening 27 .
  • the suction head with the sucked component is then raised.
  • the carriage is then moved into a position in which the suction head is located above the holder 29 of the test head 20.
  • the suction head 23 is now lowered with the component attached to it, such that the connection contacts of the component are brought into contact with the contacts of the socket 29.
  • the test computer now feeds test signals to the component and evaluates the reaction. While evaluating the test result, the suction head with the component located thereon is raised again and the slide is moved toward the exit magazine 17.
  • Fig. 2 shows parts that are hidden in Fig. 1. As far as these parts are provided in pairs with parts on the other side , they have been marked with "b" next to the same reference number.
  • gearwheel 30 of the drive motor 22 for the slide 21 can be seen. It is also easy to see how the entire device is inclined.
  • FIG. 3 shows, in addition to the gear 30 of the drive motor 22, the toothed belt 31 which meshes with the gear and which is connected to the carriage 21.
  • the suction head 23 has a replaceable part, which is shown in more detail in FIG. 8.
  • This interchangeable part comprises two stop elements 34, 35 which correspond to corresponding counter stops 36, 37 in addition to the socket 29 of the test head 20.
  • Similar counter-stops are also provided in addition to the removal opening of the input magazine 16 and the storage openings of the output magazine 17.
  • a component 33 inserted into the socket 29 of the test head 20 can also be seen.
  • FIG. 4 shows the input magazine with magazine bars 26 inserted. In FIG. 5, no magazine bars are inserted.
  • the input magazine consists of a base frame 134 with a U-profile placed on the rails 12, 13.
  • the base frame 134 is penetrated by a rod 135, which extends between side walls 136, 137.
  • Carrier plates 38, 39 are placed on the side walls 136, 137.
  • Adjustable limiting elements 40 for the magazine rods 26 to be inserted sit on the latter.
  • the rod 135 is provided at one end with a knob 41 which is used for gripping by hand. By pressing against the knob 41, the parts 46 to 49 formed attachment are laterally displaced relative to the base frame 134 (Fig. 5 upwards).
  • a magnetic body 42 is connected to the base frame and interacts with magnetic counterparts 43, 44 on the two side walls 136, 137. In the case shown in FIG. 5, the magnetic body 42 adheres to the counterpart 43, thereby preventing the magazine attachment formed by the parts 46 to 49 from being inadvertently displaced. The same applies if the attachment is in the other position.
  • a removal base plate 45 On the base frame 134 there is also a removal base plate 45.
  • Two adjustable limiting elements 46, 47 are arranged on this and are set to the prescribed distance by interposing a component 33.
  • Above the inlet channel formed by the two lateral limiting elements 46, 47 is an upper limiting element 48 which is adjustable in a holder 49 parallel to the inlet channel and also in height above the inlet channel, as indicated by the double arrows in FIG. 4.
  • a stop 50 in the inlet channel.
  • the length of the removal opening can be adapted to the components to be removed by appropriately setting the distance of the upper limiting element 48 from the stop 50. By adjusting the height of the limiting element 48, the height of the components can be adjusted.
  • a component 33 is also shown in the removal opening.
  • the components therefore run obliquely downwards from the magazine bar aligned with the inlet channel due to their gravity into the inlet channel to the removal opening.
  • An upper limiting part 51 for the front end of the magazine rod 26 to be unloaded is also fastened to the holder 49, which, as indicated by the double arrow is adjustable in height.
  • the output magazine shown in FIGS. 6 and 7 has three support rails 52, 53, 54 which are fastened on the cross rails 12, 13. Extension rails 55, 56, 57 are fastened to the carrier rails 52, 53, 54. A continuous plate 58 is placed on the carrier rails 52, 53, 54. On the extensions 55, 56, 57, two partial plates 59a, 59b and two partial plates 60a and 60b are placed.
  • lateral limiting elements 61 are arranged on the continuous plate 58, which limit two storage channels.
  • the side delimiting elements 61 are, as indicated by the double arrows, laterally displaceable and thus adaptable to the width of the components 33.
  • Further limiting elements 62 which are displaceable in the longitudinal direction, project into the storage channels. They are supported on plates 63 which are arranged on the cross plate 58.
  • Limiting elements 64 are arranged above the storage channel and are fastened to a holder 65 so as to be height-adjustable. This is indicated by the double arrow in Fig. 6. The holder 65 sits on the plate 58.
  • each of the two sub-plates 59a, 59b has a clamping body 67 which is seated on a crosspiece 68 which is fastened in a vertically displaceable manner with screws 69 on the plates 59a, 59b, as is indicated by the double arrow in FIG. 6.
  • a clamping body 67 On the underside of the clamping body 67 there is one Leaf spring 70, which presses on the inlet end of the magazine rod 26 and thus holds it in place.
  • a sensor 71 of a microswitch bears against the leaf spring 70.
  • the microswitch responds when the leaf spring 70 is not pushed up by a magazine rod. In this case, the test operation is interrupted in order to avoid that components inserted into the placement openings do not hit a magazine bar when they slide downwards.
  • the insert shown in FIG. 8 for the suction head consists of an insert body 73 to which a recessed hollow cylindrical receiving part 74 is attached.
  • a plunger 75 with the suction nipple 36 which can be connected to a vacuum / pressure source via a pneumatic connecting line 77.
  • the stamp 75 has an upwardly projecting pin 78 on which the compression coil spring 79 is seated, which is supported on the insert body 73.
  • a guide member 80 with a bore 81 through which the teat 36 extends with play. This game allows the teat 36 to be moved laterally and thus to compensate for tolerances when inserting the component 33 into the socket of the test head or into the deposit opening.
  • the stop elements 34, 35 already described in connection with FIG. 3 are located on the hollow cylindrical receiving body 74.

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
EP87116152A 1986-11-11 1987-11-03 Dispositif pour l'essai et le classement d'éléments électronique en particulier IC's Withdrawn EP0268881A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3638430 1986-11-11
DE19863638430 DE3638430A1 (de) 1986-11-11 1986-11-11 Vorrichtung zum testen und sortieren von elektronischen bauelementen, insbesondere ic's

Publications (1)

Publication Number Publication Date
EP0268881A1 true EP0268881A1 (fr) 1988-06-01

Family

ID=6313654

Family Applications (1)

Application Number Title Priority Date Filing Date
EP87116152A Withdrawn EP0268881A1 (fr) 1986-11-11 1987-11-03 Dispositif pour l'essai et le classement d'éléments électronique en particulier IC's

Country Status (3)

Country Link
US (1) US4908126A (fr)
EP (1) EP0268881A1 (fr)
DE (1) DE3638430A1 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106179991A (zh) * 2016-08-27 2016-12-07 江苏宏宝锻造股份有限公司 一种可实现物料自动检测收集整理装置
CN106216265A (zh) * 2016-07-27 2016-12-14 杭州德创电子有限公司 一种拆旧表检测设备及其检测方法
CN111792351A (zh) * 2020-07-24 2020-10-20 深圳碧林技术有限公司 一种无线模块自动化测试设备

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3820540A1 (de) * 1988-06-16 1989-12-21 Ekkehard Ueberreiter Vorrichtung zur vereinzelung von gleichartigen gegenstaenden, insbesondere elektronischen bauelementen, wie ic's
DE3912589A1 (de) * 1989-04-17 1990-10-25 Ekkehard Ueberreiter Einrichtung zum testen von elektronischen bauelementen mit einer ladestation, einer teststation und eine entladestation fuer die bauelemente
US4997552A (en) * 1989-08-03 1991-03-05 Motorola, Inc. Linear sorting machine and method
US5168218A (en) * 1990-06-01 1992-12-01 Rich Donald S Tray-to-tray circuit package handler
JP3093264B2 (ja) * 1990-09-24 2000-10-03 エトリウム・インコーポレーテッド 電子デバイス試験の制御装置
US5184068A (en) * 1990-09-24 1993-02-02 Symtek Systems, Inc. Electronic device test handler
JP2547022Y2 (ja) * 1990-10-12 1997-09-03 株式会社アドバンテスト Ic試験装置
US5307011A (en) * 1991-12-04 1994-04-26 Advantest Corporation Loader and unloader for test handler
US5568058A (en) * 1994-05-20 1996-10-22 Emerson Electric Co. Automatic motor tester
JP3245507B2 (ja) * 1994-09-27 2002-01-15 株式会社新川 試料検査装置における試料搬送方法及び試料搬送装置
DE19653780C2 (de) * 1996-12-21 1999-04-01 Mci Computer Gmbh Verfahren zum Sortieren von IC-Bauelementen
KR100269948B1 (ko) * 1998-08-07 2000-10-16 윤종용 반도체 번-인 공정의 반도체 디바이스 추출/삽입 및자동분류장치
KR100310706B1 (ko) * 1999-10-15 2001-10-18 윤종용 솔더볼 어탯치 시스템 및 그에 따른 솔더볼 어탯치 방법
US6396258B1 (en) * 2000-06-26 2002-05-28 Advanced Micro Devices, Inc. Sliding tray holder for ease in handling IC packages during testing of the IC packages
US7202693B1 (en) * 2006-03-01 2007-04-10 Intel Corporation Combined pick, place, and press apparatus
JP5183220B2 (ja) * 2008-01-18 2013-04-17 株式会社ヒューモラボラトリー 部品分類装置および前記装置を用いた電子部品特性検査分類装置
CN103785618A (zh) * 2012-11-01 2014-05-14 凯吉凯精密电子技术开发(苏州)有限公司 电路板用自动抓取检测设备及检测方法
TWI546240B (zh) * 2014-10-02 2016-08-21 All Ring Tech Co Ltd Electronic component sorting device
KR102325275B1 (ko) * 2015-07-07 2021-11-11 (주)테크윙 테스트핸들러용 푸셔 조립체 및 매치플레이트
CN105268651B (zh) * 2015-09-21 2018-02-23 杭州长川科技股份有限公司 集成电路分选机测试装置
CN107159590A (zh) * 2017-05-23 2017-09-15 四川大学 一种云母片自动分选装置
CN107583874B (zh) * 2017-08-25 2020-01-31 苏州浪潮智能科技有限公司 一种大批量硬盘可靠性性能筛选测试装置
KR102515453B1 (ko) * 2020-10-13 2023-03-29 주식회사 피티엠 전기차용 테스트 대상물 단자접속장치

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0102217A1 (fr) * 1982-08-25 1984-03-07 InTest Corporation Positionneur pour têtes d'essai électroniques à systèmes de test
EP0144715A1 (fr) * 1983-11-07 1985-06-19 Multitest Elektronische Systeme GmbH Dispositif de transfert de composants, particulièrement des puces intégrées, d'un bac d'entrée à un bac de sortie

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE225882C (fr) *
SU513538A1 (ru) * 1974-07-16 1976-05-05 Евгений Николаевич Панков Устройство дл контрол электрических параметров плоских модулей
US4124132A (en) * 1977-05-18 1978-11-07 Sola Basic Industries, Inc. Magazine apparatus for semiconductor processing device
JPS56168566A (en) * 1980-05-30 1981-12-24 Toshiba Corp Ic autohandler
JPS5722570A (en) * 1980-07-02 1982-02-05 Fujitsu Ltd Automatic handling tool for parts
JPS57199965A (en) * 1981-06-02 1982-12-08 Kyoei Sangyo Kk Automatic inspecting machine for printed wiring board
JPS5896258A (ja) * 1981-12-03 1983-06-08 Fujitsu Ltd 電子部品テスタ用オ−トハンドラにおける部品ケ−スドツキング機構
US4478352A (en) * 1982-05-19 1984-10-23 Micro Component Technology, Inc. Integrated circuit component handler singulation apparatus
US4527942A (en) * 1982-08-25 1985-07-09 Intest Corporation Electronic test head positioner for test systems
US4593820A (en) * 1984-03-28 1986-06-10 International Business Machines Corporation Robotic, in-transit, device tester/sorter
JPS6186665A (ja) * 1984-10-05 1986-05-02 Minatoerekutoronikusu Kk Icハンドラ
JPS61134684A (ja) * 1984-12-05 1986-06-21 Sanko Denshi Kogyo Kk Icテスタ
JPH0619408B2 (ja) * 1985-01-11 1994-03-16 日立電子エンジニアリング株式会社 Icハンドラの分類装置
JPS61228362A (ja) * 1985-04-03 1986-10-11 Fujitsu Ltd Ic自動試験装置
JPS61246675A (ja) * 1985-04-25 1986-11-01 Toshiba Seiki Kk 電子部品の測定装置
DE3615942A1 (de) * 1986-05-12 1987-11-19 Ekkehard Ueberreiter Vorrichtung zum kraftarmen handhaben und moeglichst genauem positionieren eines schweren elektronischen testgeraetes, insbesondere eines testcomputers
DE3615941A1 (de) * 1986-05-12 1987-11-19 Willberg Hans Heinrich Geraet zum pruefen von elektronischen bauelementen, insbesondere ic's

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0102217A1 (fr) * 1982-08-25 1984-03-07 InTest Corporation Positionneur pour têtes d'essai électroniques à systèmes de test
EP0144715A1 (fr) * 1983-11-07 1985-06-19 Multitest Elektronische Systeme GmbH Dispositif de transfert de composants, particulièrement des puces intégrées, d'un bac d'entrée à un bac de sortie

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
PATENT ABSTRACTS OF JAPAN, Band 6, Nr. 84 (P-117)[962], 22. Mai 1982; & JP - A - 57 22570 (FUJITSU) 05.02.1982 *
WERKSTATTSTECHNIK, Band 76, Nr. 10, Oktober 1986, Seiten 585-589, Berlin; D. SCHELLENBERGER et al.: "Möglichkeiten und Trends bei der automatischen Werkstückhandhabung mit Industrierobotern" *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106216265A (zh) * 2016-07-27 2016-12-14 杭州德创电子有限公司 一种拆旧表检测设备及其检测方法
CN106216265B (zh) * 2016-07-27 2018-08-07 杭州德创电子有限公司 一种拆旧表检测设备及其检测方法
CN106179991A (zh) * 2016-08-27 2016-12-07 江苏宏宝锻造股份有限公司 一种可实现物料自动检测收集整理装置
CN106179991B (zh) * 2016-08-27 2018-12-11 江苏宏宝锻造股份有限公司 一种可实现物料自动检测收集整理装置
CN111792351A (zh) * 2020-07-24 2020-10-20 深圳碧林技术有限公司 一种无线模块自动化测试设备
CN111792351B (zh) * 2020-07-24 2021-04-09 深圳碧林技术有限公司 一种无线模块自动化测试设备

Also Published As

Publication number Publication date
DE3638430A1 (de) 1988-05-19
US4908126A (en) 1990-03-13

Similar Documents

Publication Publication Date Title
EP0268881A1 (fr) Dispositif pour l'essai et le classement d'éléments électronique en particulier IC's
EP1111391B1 (fr) Dispositif de serrage d'un objet tel qu'une plaque de microtitration, et méthode d'utilisation du dispositif
EP0241024A2 (fr) Dispositif de préhension pour ramasser, transporter et déposer des petites pièces
DE2207914C3 (de) Vorrichtung zum Einsetzen elektrischer Bauteile
EP0204291B1 (fr) Dispositif à tester et trier des composants électroniques, en particulier des puces intégrées
EP0344793B1 (fr) Dispositif de montage et/ou de soudage ou de collage de composants électroniques, notamment de composants SMD sur circuits imprimés
DE1955193B2 (de) Halter zum Einsetzen und Entnehmen eines Werkzeuges in eine bzw. aus einer Maschine
DE3613462A1 (de) Vorrichtung zum be- und entladen eines stapellifts
EP0253015A1 (fr) Système de transport pour dispositif de test de composants électroniques
EP0402490B1 (fr) Manipulateur de sonde de mesure pour appareil de test de plaquette de circuit
DE3935930A1 (de) Bestueckungsgeraet
DE4127696A1 (de) Vorrichtung zum positionieren von smd-bauelementen, insbesondere smd-chips
DE3915368A1 (de) Vorrichtung zum schneiden von platten, kacheln, fliesen o. dgl.
DE3715671A1 (de) Einrichtung zum pruefen und sortieren von elektronischen bauelementen insbesondere chips mit integrierten schaltungen (ic's)
DE3021357C2 (de) Elastisches Verbindungsglied zwischen einem Arm und einer Magnethaltevorrichtung eines Handhabungsgerätes
DE3605932A1 (de) Vorrichtung zum einsetzen von bauelementen in gedruckte schaltungsplatinen
EP0822739A2 (fr) Appareil automatisé de test de cartes de circuit électronique
DE3531120C2 (de) Einrichtung zum Prüfen und Sortieren von elektronischen Bauelementen, insbesondere integrierten Chips
DE4313816B4 (de) Vorrichtung für die Handhabung von zu prüfenden elektronischen Leiterplatten, insbesondere in Fertigungslinien
DE10040095B4 (de) Vorrichtung zum Bestücken von Leiterplatten
DE2459365B1 (de) Vorrichtung zur gleichzeitigen abgabe bzw. entnahme dosierter fluessigkeitsmengen zur medizinischen verwendung
EP0139229A2 (fr) Outil pour câbler des connecteurs ou des câbles plats multicontacts électriques en technique de serrage et de coupe
DE2607124B2 (de) Münzsortiervorrichtung
EP0240709B1 (fr) Dispositif de stockage pour une machine-outil
EP0223189A1 (fr) Dispositif pour tester et trier des composants électroniques

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A1

Designated state(s): AT BE CH DE FR GB IT LI LU NL SE

17P Request for examination filed

Effective date: 19881103

17Q First examination report despatched

Effective date: 19900208

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN

18D Application deemed to be withdrawn

Effective date: 19920602

RIN1 Information on inventor provided before grant (corrected)

Inventor name: WILLBERG, HANS-HEINRICH

Inventor name: SCHOETTLER, FRANZ

Inventor name: UEBERREITER, EKKEHARD