JPS56168566A - Ic autohandler - Google Patents

Ic autohandler

Info

Publication number
JPS56168566A
JPS56168566A JP7287680A JP7287680A JPS56168566A JP S56168566 A JPS56168566 A JP S56168566A JP 7287680 A JP7287680 A JP 7287680A JP 7287680 A JP7287680 A JP 7287680A JP S56168566 A JPS56168566 A JP S56168566A
Authority
JP
Japan
Prior art keywords
ics
inspected
magazine
move
feed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7287680A
Other languages
Japanese (ja)
Inventor
Yutaka Shoji
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP7287680A priority Critical patent/JPS56168566A/en
Publication of JPS56168566A publication Critical patent/JPS56168566A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To eliminate the hang-up trouble of ICs in the process wherein a plurality of ICs in a feed magazine are successively inspected, and only good ICs are selected and automatically and continuously stored in a storage magazine, by allowing the ICs to move only straight. CONSTITUTION:A plurality of ICs 3a to be inspected have been stored in each of a plurality of lines 21a of a feed magazine 21, which is moved right and left by means of the rotation of a feed screw 28. A storage magazine 29 is arranged on the same plane as the magazine 21 and moved right and left by means of a feed screw 33. The ICs to be inspected are fed out being separated, one by one, by means of an IC separator 41 and inspected by means of an inspecting apparatus 4. Defective ICs are removed by means of a defective IC ejecting mechanism 42. When the inspection of the ICs 3a for one line has been finished, the magazines 21 and 29 move either left or right in synchronism with each other so as to set new ICs to be inspected. Thereby, the ICs to be inspected move into the inspecting apparatus and the storage magazine by means of only a straight movement, without moving right or left. Accordingly, there is no possibility of the hang-up trouble of ICs in their movement.
JP7287680A 1980-05-30 1980-05-30 Ic autohandler Pending JPS56168566A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7287680A JPS56168566A (en) 1980-05-30 1980-05-30 Ic autohandler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7287680A JPS56168566A (en) 1980-05-30 1980-05-30 Ic autohandler

Publications (1)

Publication Number Publication Date
JPS56168566A true JPS56168566A (en) 1981-12-24

Family

ID=13501966

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7287680A Pending JPS56168566A (en) 1980-05-30 1980-05-30 Ic autohandler

Country Status (1)

Country Link
JP (1) JPS56168566A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60141571U (en) * 1984-02-29 1985-09-19 ロ−ム株式会社 Heating equipment for electronic parts
JPS6154099A (en) * 1984-08-24 1986-03-18 Hitachi Ltd Automatic writing system for memory element
US4778063A (en) * 1985-11-11 1988-10-18 Ekkehard Ueberreiter Device for testing and sorting electronic components
JPS642170U (en) * 1987-06-22 1989-01-09
JPS6423170A (en) * 1987-07-17 1989-01-25 Tokyo Electron Ltd Positioning mechanism
JPS6433081U (en) * 1987-08-24 1989-03-01
US4908126A (en) * 1986-11-11 1990-03-13 Multitest, Elektronische Systeme Gmbh Apparatus for testing and sorting electronic components, in particular IC's

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60141571U (en) * 1984-02-29 1985-09-19 ロ−ム株式会社 Heating equipment for electronic parts
JPH0438304Y2 (en) * 1984-02-29 1992-09-08
JPS6154099A (en) * 1984-08-24 1986-03-18 Hitachi Ltd Automatic writing system for memory element
US4778063A (en) * 1985-11-11 1988-10-18 Ekkehard Ueberreiter Device for testing and sorting electronic components
US4908126A (en) * 1986-11-11 1990-03-13 Multitest, Elektronische Systeme Gmbh Apparatus for testing and sorting electronic components, in particular IC's
JPS642170U (en) * 1987-06-22 1989-01-09
JPS6423170A (en) * 1987-07-17 1989-01-25 Tokyo Electron Ltd Positioning mechanism
JPS6433081U (en) * 1987-08-24 1989-03-01

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