JPS5722570A - Automatic handling tool for parts - Google Patents

Automatic handling tool for parts

Info

Publication number
JPS5722570A
JPS5722570A JP9038480A JP9038480A JPS5722570A JP S5722570 A JPS5722570 A JP S5722570A JP 9038480 A JP9038480 A JP 9038480A JP 9038480 A JP9038480 A JP 9038480A JP S5722570 A JPS5722570 A JP S5722570A
Authority
JP
Japan
Prior art keywords
ics
components
characteristic inspection
trays
selection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9038480A
Inventor
Seiichi Iwasaki
Kenji Takatsuka
Kyohei Tamaki
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP9038480A priority Critical patent/JPS5722570A/en
Publication of JPS5722570A publication Critical patent/JPS5722570A/en
Application status is Pending legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2893Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]

Abstract

PURPOSE:To automatize the characteristic inspection and selection of electronic components by treating the components as specified which is held with a three- dimensionally moving retaining mechanism while placed on a moving tray. CONSTITUTION:Trays 4 carrying ICs 3A...are fed to a conveyor 2 in sequence through a magazine elevator 5. As detected with a photoelectric sensor or the like, the ICs 3A are grasped and placed onto a measuring socket 9 with a handling arm 10 which performs a vacuum chucking three-dimensionally moving with cylinders 11, 13 and 15 or the like. A characteristic inspection is performed with a test head 21 or the like. Likewise, accepted components are turned to the trays 4 while rejected ones excluded with an arm 10 or the like. This enables continuous characteristic inspection and selection of electronic components such as ICs automatically.
JP9038480A 1980-07-02 1980-07-02 Automatic handling tool for parts Pending JPS5722570A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9038480A JPS5722570A (en) 1980-07-02 1980-07-02 Automatic handling tool for parts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9038480A JPS5722570A (en) 1980-07-02 1980-07-02 Automatic handling tool for parts

Publications (1)

Publication Number Publication Date
JPS5722570A true JPS5722570A (en) 1982-02-05

Family

ID=13997071

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9038480A Pending JPS5722570A (en) 1980-07-02 1980-07-02 Automatic handling tool for parts

Country Status (1)

Country Link
JP (1) JPS5722570A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59114817U (en) * 1983-01-24 1984-08-03
JPS6080237A (en) * 1983-10-07 1985-05-08 Mitsutoyo Mfg Co Ltd Automatic inspection apparatus of package type circuit element
JPS60207790A (en) * 1984-03-28 1985-10-19 Ibm Testing selecting device by robot arm
EP0166448A2 (en) * 1984-06-29 1986-01-02 Advantest Corporation IC test equipment
JPS61139768A (en) * 1984-12-12 1986-06-27 Matsushita Electric Ind Co Ltd Inspection of electronic parts
US4686468A (en) * 1984-12-10 1987-08-11 Aseco Corporation Contact set for test apparatus for testing integrated circuit package
EP0268881A1 (en) * 1986-11-11 1988-06-01 Multitest Elektronische Systeme GmbH Device for testing and sorting electronic compounds such as IC's
US5125503A (en) * 1989-04-17 1992-06-30 Ekkehard Ueberreiter Apparatus for testing electronic components having a loading station a testing station and an unloading station for the components
WO1995028737A1 (en) * 1994-04-18 1995-10-26 Micron Technology, Inc. Method and apparatus for automatically positioning electronic die within component packages

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59114817U (en) * 1983-01-24 1984-08-03
JPS6326094Y2 (en) * 1983-01-24 1988-07-15
JPS6080237A (en) * 1983-10-07 1985-05-08 Mitsutoyo Mfg Co Ltd Automatic inspection apparatus of package type circuit element
JPH0450156B2 (en) * 1984-03-28 1992-08-13 Intaanashonaru Bijinesu Mashiinzu Corp
JPS60207790A (en) * 1984-03-28 1985-10-19 Ibm Testing selecting device by robot arm
EP0166448A2 (en) * 1984-06-29 1986-01-02 Advantest Corporation IC test equipment
US4715501A (en) * 1984-06-29 1987-12-29 Takeda Riken Co., Ltd. IC test equipment
US4686468A (en) * 1984-12-10 1987-08-11 Aseco Corporation Contact set for test apparatus for testing integrated circuit package
JPS61139768A (en) * 1984-12-12 1986-06-27 Matsushita Electric Ind Co Ltd Inspection of electronic parts
EP0268881A1 (en) * 1986-11-11 1988-06-01 Multitest Elektronische Systeme GmbH Device for testing and sorting electronic compounds such as IC's
US4908126A (en) * 1986-11-11 1990-03-13 Multitest, Elektronische Systeme Gmbh Apparatus for testing and sorting electronic components, in particular IC's
US5125503A (en) * 1989-04-17 1992-06-30 Ekkehard Ueberreiter Apparatus for testing electronic components having a loading station a testing station and an unloading station for the components
WO1995028737A1 (en) * 1994-04-18 1995-10-26 Micron Technology, Inc. Method and apparatus for automatically positioning electronic die within component packages
EP1251550A1 (en) * 1994-04-18 2002-10-23 Micron Technology, Inc. Method and apparatus for automatically positioning electronic die within component packages

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