DE69809787D1 - Montagemethode für halbleiterbauteil auf einer leiterplatte - Google Patents
Montagemethode für halbleiterbauteil auf einer leiterplatteInfo
- Publication number
- DE69809787D1 DE69809787D1 DE69809787T DE69809787T DE69809787D1 DE 69809787 D1 DE69809787 D1 DE 69809787D1 DE 69809787 T DE69809787 T DE 69809787T DE 69809787 T DE69809787 T DE 69809787T DE 69809787 D1 DE69809787 D1 DE 69809787D1
- Authority
- DE
- Germany
- Prior art keywords
- pcb
- assembly method
- semiconductor components
- semiconductor
- components
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
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- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
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Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Wire Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Die Bonding (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP26966597 | 1997-10-02 | ||
PCT/JP1998/004401 WO1999018766A1 (en) | 1997-10-02 | 1998-09-30 | Method for mounting semiconductor element to circuit board, and semiconductor device |
Publications (2)
Publication Number | Publication Date |
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DE69809787D1 true DE69809787D1 (de) | 2003-01-09 |
DE69809787T2 DE69809787T2 (de) | 2003-09-18 |
Family
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Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69831100T Expired - Fee Related DE69831100T2 (de) | 1997-10-02 | 1998-09-30 | Montagemethode für Halbleiterbauteile auf einer Leiterplatte |
DE69831101T Expired - Fee Related DE69831101T2 (de) | 1997-10-02 | 1998-09-30 | Montagemethode für Halbleiterbauteile auf einer Leiterplatte |
DE69809787T Expired - Lifetime DE69809787T2 (de) | 1997-10-02 | 1998-09-30 | Montagemethode für halbleiterbauteil auf einer leiterplatte |
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Application Number | Title | Priority Date | Filing Date |
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DE69831100T Expired - Fee Related DE69831100T2 (de) | 1997-10-02 | 1998-09-30 | Montagemethode für Halbleiterbauteile auf einer Leiterplatte |
DE69831101T Expired - Fee Related DE69831101T2 (de) | 1997-10-02 | 1998-09-30 | Montagemethode für Halbleiterbauteile auf einer Leiterplatte |
Country Status (7)
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US (1) | US6651320B1 (de) |
EP (3) | EP1020104B1 (de) |
KR (1) | KR100395444B1 (de) |
CN (1) | CN1138460C (de) |
DE (3) | DE69831100T2 (de) |
TW (1) | TW398045B (de) |
WO (1) | WO1999018766A1 (de) |
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AT410882B (de) * | 2000-08-17 | 2003-08-25 | Datacon Semiconductor Equip | Verfahren und einrichtung zum befestigen von elektronischen schaltungen |
JP2002261262A (ja) * | 2001-03-01 | 2002-09-13 | Mitsubishi Heavy Ind Ltd | イメージセンサ及びその製造方法 |
DE10110999A1 (de) * | 2001-03-07 | 2002-10-02 | Infineon Technologies Ag | Anordnung mit elektronischem Bauteil und einer Leiterplatte |
US7656678B2 (en) * | 2001-10-26 | 2010-02-02 | Entorian Technologies, Lp | Stacked module systems |
WO2004010499A1 (ja) | 2002-07-19 | 2004-01-29 | Matsushita Electric Industrial Co., Ltd. | モジュール部品 |
US20050121806A1 (en) * | 2003-12-04 | 2005-06-09 | White Electronic Designs Corporation | Method for attaching circuit elements |
US8114158B2 (en) | 2004-08-03 | 2012-02-14 | Kspine, Inc. | Facet device and method |
US7202571B2 (en) * | 2004-08-16 | 2007-04-10 | Delphi Technologies, Inc. | Electronic module with form in-place pedestal |
CN100441069C (zh) * | 2005-01-21 | 2008-12-03 | 财团法人工业技术研究院 | 电子元件安装及安装方法 |
US20070235217A1 (en) * | 2006-03-29 | 2007-10-11 | Workman Derek B | Devices with microjetted polymer standoffs |
JP2008015403A (ja) * | 2006-07-10 | 2008-01-24 | Nec Lcd Technologies Ltd | フレキシブル配線シートおよびそれを備えた平面表示装置およびその製造方法 |
JP5018117B2 (ja) | 2007-02-15 | 2012-09-05 | 富士通セミコンダクター株式会社 | 電子部品の実装方法 |
JP2008218643A (ja) * | 2007-03-02 | 2008-09-18 | Fujitsu Ltd | 半導体装置及びその製造方法 |
US8828058B2 (en) | 2008-11-11 | 2014-09-09 | Kspine, Inc. | Growth directed vertebral fixation system with distractible connector(s) and apical control |
US8357183B2 (en) | 2009-03-26 | 2013-01-22 | Kspine, Inc. | Semi-constrained anchoring system |
US8397380B2 (en) * | 2009-06-01 | 2013-03-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | Controlling warpage in BGA components in a re-flow process |
US9168071B2 (en) | 2009-09-15 | 2015-10-27 | K2M, Inc. | Growth modulation system |
JP2011077108A (ja) * | 2009-09-29 | 2011-04-14 | Elpida Memory Inc | 半導体装置 |
CN103781429B (zh) | 2011-06-03 | 2017-02-15 | 科斯班公司 | 脊柱矫正系统致动器 |
WO2013033867A1 (en) * | 2011-09-09 | 2013-03-14 | Metrologic Instruments, Inc. | Imaging based barcode scanner engine with multiple elements supported on a common printed circuit board |
US9468469B2 (en) | 2011-11-16 | 2016-10-18 | K2M, Inc. | Transverse coupler adjuster spinal correction systems and methods |
US8920472B2 (en) | 2011-11-16 | 2014-12-30 | Kspine, Inc. | Spinal correction and secondary stabilization |
US9468468B2 (en) | 2011-11-16 | 2016-10-18 | K2M, Inc. | Transverse connector for spinal stabilization system |
WO2014172632A2 (en) | 2011-11-16 | 2014-10-23 | Kspine, Inc. | Spinal correction and secondary stabilization |
US9451987B2 (en) | 2011-11-16 | 2016-09-27 | K2M, Inc. | System and method for spinal correction |
CN103025145B (zh) * | 2012-12-04 | 2016-09-07 | 施耐德万高(天津)电气设备有限公司 | 一种导体组装固定装置 |
US9468471B2 (en) | 2013-09-17 | 2016-10-18 | K2M, Inc. | Transverse coupler adjuster spinal correction systems and methods |
DE102014211545A1 (de) * | 2014-06-17 | 2015-12-17 | Continental Automotive Gmbh | Verfahren zur Montage eines ungehäusten Halbleiterchips auf einem Substrat |
JP2016162908A (ja) * | 2015-03-03 | 2016-09-05 | アズビル株式会社 | 回路基板の接続構造 |
JP2016178196A (ja) * | 2015-03-19 | 2016-10-06 | 株式会社東芝 | 半導体装置及びその製造方法 |
JP6753725B2 (ja) * | 2016-08-08 | 2020-09-09 | 株式会社フジクラ | 実装体 |
CN108617084A (zh) * | 2018-06-19 | 2018-10-02 | 信利光电股份有限公司 | 一种抗电磁干扰软性电路板和制作方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4661192A (en) | 1985-08-22 | 1987-04-28 | Motorola, Inc. | Low cost integrated circuit bonding process |
US4774634A (en) | 1986-01-21 | 1988-09-27 | Key Tronic Corporation | Printed circuit board assembly |
DE4121449A1 (de) | 1991-06-28 | 1993-01-07 | Siemens Ag | Hoergeraet, insbesondere am kopf tragbares mini-hoergeraet, und verfahren zur herstellung |
US5162613A (en) | 1991-07-01 | 1992-11-10 | At&T Bell Laboratories | Integrated circuit interconnection technique |
JP3225062B2 (ja) * | 1991-08-05 | 2001-11-05 | ローム株式会社 | 熱硬化性樹脂シート及びそれを用いた半導体素子の実装方法 |
JPH06103707B2 (ja) * | 1991-12-26 | 1994-12-14 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 半導体チップの交換方法 |
EP0603928A1 (de) * | 1992-12-21 | 1994-06-29 | Delco Electronics Corporation | Hybridschaltung |
KR0171438B1 (ko) | 1993-09-29 | 1999-10-15 | 모리시따 요오이찌 | 반도체 장치를 회로 기판상에 장착하는 방법 및 반도체 장치가 장착된 회로 기판 |
US5820716A (en) | 1993-11-05 | 1998-10-13 | Micron Technology, Inc. | Method for surface mounting electrical components to a substrate |
JP2833996B2 (ja) * | 1994-05-25 | 1998-12-09 | 日本電気株式会社 | フレキシブルフィルム及びこれを有する半導体装置 |
JPH08236586A (ja) * | 1994-12-29 | 1996-09-13 | Nitto Denko Corp | 半導体装置及びその製造方法 |
JP3243956B2 (ja) * | 1995-02-03 | 2002-01-07 | 松下電器産業株式会社 | 半導体装置およびその製造方法 |
JP3012809B2 (ja) * | 1995-07-14 | 2000-02-28 | 松下電器産業株式会社 | 半導体装置の電極構造体の形成方法 |
JP3070473B2 (ja) * | 1996-02-28 | 2000-07-31 | 日本電気株式会社 | 半導体装置の実装方法及び構造 |
JP3409957B2 (ja) * | 1996-03-06 | 2003-05-26 | 松下電器産業株式会社 | 半導体ユニット及びその形成方法 |
US5773083A (en) * | 1996-08-02 | 1998-06-30 | Motorola, Inc. | Method for coating a substrate with a coating solution |
US6100112A (en) * | 1998-05-28 | 2000-08-08 | The Furukawa Electric Co., Ltd. | Method of manufacturing a tape carrier with bump |
-
1998
- 1998-09-30 CN CNB988094487A patent/CN1138460C/zh not_active Expired - Fee Related
- 1998-09-30 WO PCT/JP1998/004401 patent/WO1999018766A1/en not_active Application Discontinuation
- 1998-09-30 TW TW087116280A patent/TW398045B/zh not_active IP Right Cessation
- 1998-09-30 EP EP98945532A patent/EP1020104B1/de not_active Expired - Lifetime
- 1998-09-30 US US09/509,693 patent/US6651320B1/en not_active Expired - Fee Related
- 1998-09-30 DE DE69831100T patent/DE69831100T2/de not_active Expired - Fee Related
- 1998-09-30 DE DE69831101T patent/DE69831101T2/de not_active Expired - Fee Related
- 1998-09-30 DE DE69809787T patent/DE69809787T2/de not_active Expired - Lifetime
- 1998-09-30 EP EP01121358A patent/EP1194030B1/de not_active Expired - Lifetime
- 1998-09-30 KR KR10-2000-7003283A patent/KR100395444B1/ko not_active IP Right Cessation
- 1998-09-30 EP EP01121357A patent/EP1175138B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR20010024320A (ko) | 2001-03-26 |
DE69831101D1 (de) | 2005-09-08 |
WO1999018766A1 (en) | 1999-04-15 |
KR100395444B1 (ko) | 2003-08-21 |
EP1020104A1 (de) | 2000-07-19 |
DE69831100D1 (de) | 2005-09-08 |
DE69831101T2 (de) | 2006-06-08 |
EP1175138A2 (de) | 2002-01-23 |
CN1138460C (zh) | 2004-02-11 |
EP1020104B1 (de) | 2002-11-27 |
DE69831100T2 (de) | 2006-06-08 |
CN1271509A (zh) | 2000-10-25 |
DE69809787T2 (de) | 2003-09-18 |
EP1194030A1 (de) | 2002-04-03 |
EP1175138A3 (de) | 2002-03-13 |
TW398045B (en) | 2000-07-11 |
EP1194030B1 (de) | 2005-08-03 |
EP1175138B1 (de) | 2005-08-03 |
US6651320B1 (en) | 2003-11-25 |
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