DE69809787D1 - Montagemethode für halbleiterbauteil auf einer leiterplatte - Google Patents

Montagemethode für halbleiterbauteil auf einer leiterplatte

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Publication number
DE69809787D1
DE69809787D1 DE69809787T DE69809787T DE69809787D1 DE 69809787 D1 DE69809787 D1 DE 69809787D1 DE 69809787 T DE69809787 T DE 69809787T DE 69809787 T DE69809787 T DE 69809787T DE 69809787 D1 DE69809787 D1 DE 69809787D1
Authority
DE
Germany
Prior art keywords
pcb
assembly method
semiconductor components
semiconductor
components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69809787T
Other languages
English (en)
Other versions
DE69809787T2 (de
Inventor
Yoshihiko Yagi
Hiroyuki Otani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Publication of DE69809787D1 publication Critical patent/DE69809787D1/de
Application granted granted Critical
Publication of DE69809787T2 publication Critical patent/DE69809787T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • HELECTRICITY
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    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
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    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
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    • H01L21/563Encapsulation of active face of flip-chip device, e.g. underfilling or underencapsulation of flip-chip, encapsulation preform on chip or mounting substrate
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    • H05K3/321Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by conductive adhesives
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    • Y10T29/4913Assembling to base an electrical component, e.g., capacitor, etc.
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    • Y10T29/49144Assembling to base an electrical component, e.g., capacitor, etc. by metal fusion
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y10T29/49124On flat or curved insulated base, e.g., printed circuit, etc.
    • Y10T29/4913Assembling to base an electrical component, e.g., capacitor, etc.
    • Y10T29/49146Assembling to base an electrical component, e.g., capacitor, etc. with encapsulating, e.g., potting, etc.
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    • Y10T29/49147Assembling terminal to base
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    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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    • Y10T29/49169Assembling electrical component directly to terminal or elongated conductor
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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Wire Bonding (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Die Bonding (AREA)
DE69809787T 1997-10-02 1998-09-30 Montagemethode für halbleiterbauteil auf einer leiterplatte Expired - Lifetime DE69809787T2 (de)

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DE69831101D1 (de) 2005-09-08
WO1999018766A1 (en) 1999-04-15
KR100395444B1 (ko) 2003-08-21
EP1020104A1 (de) 2000-07-19
DE69831100D1 (de) 2005-09-08
DE69831101T2 (de) 2006-06-08
EP1175138A2 (de) 2002-01-23
CN1138460C (zh) 2004-02-11
EP1020104B1 (de) 2002-11-27
DE69831100T2 (de) 2006-06-08
CN1271509A (zh) 2000-10-25
DE69809787T2 (de) 2003-09-18
EP1194030A1 (de) 2002-04-03
EP1175138A3 (de) 2002-03-13
TW398045B (en) 2000-07-11
EP1194030B1 (de) 2005-08-03
EP1175138B1 (de) 2005-08-03
US6651320B1 (en) 2003-11-25

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