DE69807780D1 - Trägerplatte mit einer Substrateserkennungseinrichtung für eine chemisch-mechanische Poliervorrichtung - Google Patents

Trägerplatte mit einer Substrateserkennungseinrichtung für eine chemisch-mechanische Poliervorrichtung

Info

Publication number
DE69807780D1
DE69807780D1 DE69807780T DE69807780T DE69807780D1 DE 69807780 D1 DE69807780 D1 DE 69807780D1 DE 69807780 T DE69807780 T DE 69807780T DE 69807780 T DE69807780 T DE 69807780T DE 69807780 D1 DE69807780 D1 DE 69807780D1
Authority
DE
Germany
Prior art keywords
mechanical polishing
carrier plate
chemical mechanical
substrate detection
detection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69807780T
Other languages
English (en)
Other versions
DE69807780T2 (de
Inventor
Gouzman Boris
Sasson Somekh
Steven Zuniga
Hung Chen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Application granted granted Critical
Publication of DE69807780D1 publication Critical patent/DE69807780D1/de
Publication of DE69807780T2 publication Critical patent/DE69807780T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/005Control means for lapping machines or devices
    • B24B37/0053Control means for lapping machines or devices detecting loss or breakage of a workpiece during lapping

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Bathtubs, Showers, And Their Attachments (AREA)
DE69807780T 1997-05-23 1998-05-22 Trägerplatte mit einer Substrateserkennungseinrichtung für eine chemisch-mechanische Poliervorrichtung Expired - Lifetime DE69807780T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/862,350 US5957751A (en) 1997-05-23 1997-05-23 Carrier head with a substrate detection mechanism for a chemical mechanical polishing system

Publications (2)

Publication Number Publication Date
DE69807780D1 true DE69807780D1 (de) 2002-10-17
DE69807780T2 DE69807780T2 (de) 2003-05-08

Family

ID=25338293

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69807780T Expired - Lifetime DE69807780T2 (de) 1997-05-23 1998-05-22 Trägerplatte mit einer Substrateserkennungseinrichtung für eine chemisch-mechanische Poliervorrichtung

Country Status (7)

Country Link
US (6) US5957751A (de)
EP (1) EP0879678B1 (de)
JP (1) JP3326109B2 (de)
KR (1) KR100366919B1 (de)
DE (1) DE69807780T2 (de)
SG (1) SG71109A1 (de)
TW (1) TW431938B (de)

Families Citing this family (111)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6183354B1 (en) 1996-11-08 2001-02-06 Applied Materials, Inc. Carrier head with a flexible membrane for a chemical mechanical polishing system
JP3705670B2 (ja) 1997-02-19 2005-10-12 株式会社荏原製作所 ポリッシング装置及び方法
US6398621B1 (en) * 1997-05-23 2002-06-04 Applied Materials, Inc. Carrier head with a substrate sensor
US5957751A (en) * 1997-05-23 1999-09-28 Applied Materials, Inc. Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
US6191038B1 (en) 1997-09-02 2001-02-20 Matsushita Electronics Corporation Apparatus and method for chemical/mechanical polishing
DE19755975A1 (de) * 1997-12-16 1999-06-17 Wolters Peter Werkzeugmasch Halter für flache Werkstücke, insbesondere Halbleiterwafer
US6200199B1 (en) * 1998-03-31 2001-03-13 Applied Materials, Inc. Chemical mechanical polishing conditioner
JPH11285966A (ja) * 1998-04-02 1999-10-19 Speedfam-Ipec Co Ltd キャリア及びcmp装置
FR2778129B1 (fr) * 1998-05-04 2000-07-21 St Microelectronics Sa Disque support de membrane d'une machine de polissage et procede de fonctionnement d'une telle machine
US6251215B1 (en) * 1998-06-03 2001-06-26 Applied Materials, Inc. Carrier head with a multilayer retaining ring for chemical mechanical polishing
US6159079A (en) 1998-09-08 2000-12-12 Applied Materials, Inc. Carrier head for chemical mechanical polishing a substrate
US6210255B1 (en) * 1998-09-08 2001-04-03 Applied Materials, Inc. Carrier head for chemical mechanical polishing a substrate
US6277014B1 (en) 1998-10-09 2001-08-21 Applied Materials, Inc. Carrier head with a flexible membrane for chemical mechanical polishing
US6244942B1 (en) * 1998-10-09 2001-06-12 Applied Materials, Inc. Carrier head with a flexible membrane and adjustable edge pressure
US6132298A (en) * 1998-11-25 2000-10-17 Applied Materials, Inc. Carrier head with edge control for chemical mechanical polishing
US6136710A (en) * 1998-10-19 2000-10-24 Chartered Semiconductor Manufacturing, Ltd. Chemical mechanical polishing apparatus with improved substrate carrier head and method of use
US6358129B2 (en) * 1998-11-11 2002-03-19 Micron Technology, Inc. Backing members and planarizing machines for mechanical and chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods of making and using such backing members
US6165058A (en) * 1998-12-09 2000-12-26 Applied Materials, Inc. Carrier head for chemical mechanical polishing
SG82058A1 (en) * 1998-12-30 2001-07-24 Applied Materials Inc Carrier head with controllable pressure and loading area for chemical mechanical polishing
US6422927B1 (en) 1998-12-30 2002-07-23 Applied Materials, Inc. Carrier head with controllable pressure and loading area for chemical mechanical polishing
US6162116A (en) * 1999-01-23 2000-12-19 Applied Materials, Inc. Carrier head for chemical mechanical polishing
US6227955B1 (en) 1999-04-20 2001-05-08 Micron Technology, Inc. Carrier heads, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies
US6431968B1 (en) 1999-04-22 2002-08-13 Applied Materials, Inc. Carrier head with a compressible film
KR100335485B1 (ko) * 1999-07-02 2002-05-04 윤종용 화학적-기계적 폴리싱 장치 및 방법
JP2001018161A (ja) * 1999-07-07 2001-01-23 Ebara Corp 研磨装置
JP2001018169A (ja) 1999-07-07 2001-01-23 Ebara Corp 研磨装置
US6855043B1 (en) 1999-07-09 2005-02-15 Applied Materials, Inc. Carrier head with a modified flexible membrane
US6358121B1 (en) * 1999-07-09 2002-03-19 Applied Materials, Inc. Carrier head with a flexible membrane and an edge load ring
US6241593B1 (en) * 1999-07-09 2001-06-05 Applied Materials, Inc. Carrier head with pressurizable bladder
SG86415A1 (en) * 1999-07-09 2002-02-19 Applied Materials Inc Closed-loop control of wafer polishing in a chemical mechanical polishing system
US6494774B1 (en) 1999-07-09 2002-12-17 Applied Materials, Inc. Carrier head with pressure transfer mechanism
US6776692B1 (en) 1999-07-09 2004-08-17 Applied Materials Inc. Closed-loop control of wafer polishing in a chemical mechanical polishing system
KR20010030213A (ko) * 1999-09-02 2001-04-16 아끼모토 유미 연마 헤드, 이것을 이용한 연마 장치, 및 연마 상태 검출방법
US6663466B2 (en) * 1999-11-17 2003-12-16 Applied Materials, Inc. Carrier head with a substrate detector
US6386947B2 (en) 2000-02-29 2002-05-14 Applied Materials, Inc. Method and apparatus for detecting wafer slipouts
US6450868B1 (en) 2000-03-27 2002-09-17 Applied Materials, Inc. Carrier head with multi-part flexible membrane
US6361419B1 (en) 2000-03-27 2002-03-26 Applied Materials, Inc. Carrier head with controllable edge pressure
CN100433269C (zh) * 2000-05-12 2008-11-12 多平面技术公司 抛光装置以及与其一起使用的基片托架
US6602114B1 (en) * 2000-05-19 2003-08-05 Applied Materials Inc. Multilayer retaining ring for chemical mechanical polishing
US6436832B1 (en) 2000-05-23 2002-08-20 Applied Materials, Inc Method to reduce polish initiation time in a polish process
JP2001334458A (ja) * 2000-05-26 2001-12-04 Ebara Corp ポリッシング方法
JP2001345297A (ja) * 2000-05-30 2001-12-14 Hitachi Ltd 半導体集積回路装置の製造方法及び研磨装置
US6722965B2 (en) 2000-07-11 2004-04-20 Applied Materials Inc. Carrier head with flexible membranes to provide controllable pressure and loading area
TW458853B (en) * 2000-07-14 2001-10-11 Applied Materials Inc Diaphragm for a CMP machine
US7198561B2 (en) * 2000-07-25 2007-04-03 Applied Materials, Inc. Flexible membrane for multi-chamber carrier head
US6857945B1 (en) 2000-07-25 2005-02-22 Applied Materials, Inc. Multi-chamber carrier head with a flexible membrane
US20040005842A1 (en) * 2000-07-25 2004-01-08 Chen Hung Chih Carrier head with flexible membrane
US6592429B1 (en) * 2000-07-28 2003-07-15 Advanced Micro Devices, Inc. Method and apparatus for controlling wafer uniformity in a chemical mechanical polishing tool using carrier head signatures
DE60138343D1 (de) * 2000-07-31 2009-05-28 Ebara Corp Substrathalter und Poliervorrichtung
US6471571B2 (en) 2000-08-23 2002-10-29 Rodel Holdings, Inc. Substrate supporting carrier pad
US6527625B1 (en) * 2000-08-31 2003-03-04 Multi-Planar Technologies, Inc. Chemical mechanical polishing apparatus and method having a soft backed polishing head
WO2002042033A1 (en) 2000-11-21 2002-05-30 Memc Electronic Materials, S.P.A. Semiconductor wafer, polishing apparatus and method
US6652362B2 (en) * 2000-11-23 2003-11-25 Samsung Electronics Co., Ltd. Apparatus for polishing a semiconductor wafer and method therefor
US6544103B1 (en) * 2000-11-28 2003-04-08 Speedfam-Ipec Corporation Method to determine optimum geometry of a multizone carrier
DE10059345A1 (de) * 2000-11-29 2002-06-13 Infineon Technologies Ag Halbleitersubstrathalter für chemisch-mechanisches Polieren
JP3922887B2 (ja) * 2001-03-16 2007-05-30 株式会社荏原製作所 ドレッサ及びポリッシング装置
KR100437456B1 (ko) * 2001-05-31 2004-06-23 삼성전자주식회사 화학적 기계적 평탄화 기계의 폴리싱 헤드 및 그것을이용한 폴리싱방법
US6769973B2 (en) * 2001-05-31 2004-08-03 Samsung Electronics Co., Ltd. Polishing head of chemical mechanical polishing apparatus and polishing method using the same
KR100470227B1 (ko) * 2001-06-07 2005-02-05 두산디앤디 주식회사 화학기계적 연마장치의 캐리어 헤드
US6568991B2 (en) * 2001-08-28 2003-05-27 Speedfam-Ipec Corporation Method and apparatus for sensing a wafer in a carrier
KR100421445B1 (ko) * 2001-09-28 2004-03-09 삼성전자주식회사 연마 헤드 조립 방법 및 연마 헤드 조립 시의 공기 누설검사장치
US6712673B2 (en) 2001-10-04 2004-03-30 Memc Electronic Materials, Inc. Polishing apparatus, polishing head and method
US6739958B2 (en) 2002-03-19 2004-05-25 Applied Materials Inc. Carrier head with a vibration reduction feature for a chemical mechanical polishing system
US20030199112A1 (en) 2002-03-22 2003-10-23 Applied Materials, Inc. Copper wiring module control
JP3920720B2 (ja) * 2002-03-29 2007-05-30 株式会社荏原製作所 基板受渡し方法、基板受渡し機構及び基板研磨装置
TWI238754B (en) * 2002-11-07 2005-09-01 Ebara Tech Inc Vertically adjustable chemical mechanical polishing head having a pivot mechanism and method for use thereof
WO2004048038A1 (en) 2002-11-22 2004-06-10 Applied Materials Inc. Methods and apparatus for polishing control
JP2004193289A (ja) * 2002-12-10 2004-07-08 Ebara Corp ポリッシング方法
US7089782B2 (en) * 2003-01-09 2006-08-15 Applied Materials, Inc. Polishing head test station
US7001245B2 (en) * 2003-03-07 2006-02-21 Applied Materials Inc. Substrate carrier with a textured membrane
JP4718107B2 (ja) * 2003-05-20 2011-07-06 株式会社荏原製作所 基板保持装置及び研磨装置
US6887138B2 (en) * 2003-06-20 2005-05-03 Freescale Semiconductor, Inc. Chemical mechanical polish (CMP) conditioning-disk holder
US6905392B2 (en) * 2003-06-30 2005-06-14 Freescale Semiconductor, Inc. Polishing system having a carrier head with substrate presence sensing
US20050126708A1 (en) * 2003-12-10 2005-06-16 Applied Materials, Inc. Retaining ring with slurry transport grooves
KR100586018B1 (ko) * 2004-02-09 2006-06-01 삼성전자주식회사 연마 헤드용 플렉서블 멤브레인 및 이를 포함하는 연마 장치
US8037896B2 (en) 2004-03-09 2011-10-18 Mks Instruments, Inc. Pressure regulation in remote zones
US6986359B2 (en) * 2004-03-09 2006-01-17 Mks Instruments, Inc. System and method for controlling pressure in remote zones
US7255771B2 (en) 2004-03-26 2007-08-14 Applied Materials, Inc. Multiple zone carrier head with flexible membrane
JP4583207B2 (ja) * 2004-03-31 2010-11-17 不二越機械工業株式会社 研磨装置
US7201642B2 (en) * 2004-06-17 2007-04-10 Systems On Silicon Manufacturing Co. Pte. Ltd. Process for producing improved membranes
US7101272B2 (en) * 2005-01-15 2006-09-05 Applied Materials, Inc. Carrier head for thermal drift compensation
CN101238552B (zh) * 2005-08-05 2012-05-23 裴城焄 化学机械抛光设备
KR101199149B1 (ko) * 2006-02-24 2012-11-12 강준모 화학기계적 연마용 캐리어 및 플렉서블 멤브레인
US7418982B2 (en) * 2006-05-17 2008-09-02 Taiwan Semiconductor Manufacturing Co., Ltd. Substrate carrier and facility interface and apparatus including same
US7750657B2 (en) 2007-03-15 2010-07-06 Applied Materials Inc. Polishing head testing with movable pedestal
JP5248127B2 (ja) * 2008-01-30 2013-07-31 株式会社荏原製作所 研磨方法及び研磨装置
KR101619416B1 (ko) * 2008-03-25 2016-05-10 어플라이드 머티어리얼스, 인코포레이티드 개량된 캐리어 헤드 멤브레인
KR101607099B1 (ko) * 2008-08-29 2016-03-29 신에쯔 한도타이 가부시키가이샤 연마 헤드 및 연마 장치
US20100091094A1 (en) * 2008-10-14 2010-04-15 Marek Sekowski Mechanism for Directing a Three-Dimensional Camera System
US10160093B2 (en) 2008-12-12 2018-12-25 Applied Materials, Inc. Carrier head membrane roughness to control polishing rate
CN101972988B (zh) * 2010-06-28 2012-05-16 清华大学 一种抛光垫修整头
JP5677004B2 (ja) * 2010-09-30 2015-02-25 株式会社荏原製作所 研磨装置および方法
JP6017396B2 (ja) * 2012-12-18 2016-11-02 東京エレクトロン株式会社 薄膜形成方法および薄膜形成装置
KR101387921B1 (ko) * 2013-01-02 2014-04-29 주식회사 케이씨텍 화학 기계적 연마 장치의 캐리어 헤드용 멤브레인 및 이를 구비한 캐리어 헤드
KR101583816B1 (ko) * 2013-12-23 2016-01-08 주식회사 케이씨텍 화학 기계적 연마장치용 캐리어 헤드 및 화학 기계적 연마 장치의 제어 방법
US9434045B2 (en) * 2014-05-05 2016-09-06 Macronix International Co., Ltd. Planarization device and planarization method using the same
KR102173323B1 (ko) 2014-06-23 2020-11-04 삼성전자주식회사 캐리어 헤드, 화학적 기계식 연마 장치 및 웨이퍼 연마 방법
US9610672B2 (en) * 2014-06-27 2017-04-04 Applied Materials, Inc. Configurable pressure design for multizone chemical mechanical planarization polishing head
SG10201606197XA (en) * 2015-08-18 2017-03-30 Ebara Corp Substrate adsorption method, substrate holding apparatus, substrate polishing apparatus, elastic film, substrate adsorption determination method for substrate holding apparatus, and pressure control method for substrate holding apparatus
WO2017171262A1 (ko) * 2016-04-01 2017-10-05 강준모 기판수용부재를 포함하는 화학기계적연마장치용 캐리어헤드
KR101786484B1 (ko) * 2016-06-13 2017-10-18 주식회사 케이씨텍 연마 장치용 연마 헤드 및 그 제어 방법
US10930535B2 (en) * 2016-12-02 2021-02-23 Applied Materials, Inc. RFID part authentication and tracking of processing components
JP6757696B2 (ja) * 2017-04-21 2020-09-23 株式会社荏原製作所 漏れ検査方法、およびこの漏れ検査方法を実行するためのプログラムを記録したコンピュータ読み取り可能な記録媒体
CN108466118B (zh) * 2018-03-14 2019-11-05 郑州工程技术学院 一种基于物联网的数控加工管理系统和方法
CN113382825A (zh) 2019-02-14 2021-09-10 崇硕科技公司 基板载具头和加工系统
CN110142689B (zh) * 2019-04-17 2021-09-14 杭州众硅电子科技有限公司 一种晶圆装载支架、晶圆装载系统及晶圆装片方法
US11623320B2 (en) 2019-08-21 2023-04-11 Applied Materials, Inc. Polishing head with membrane position control
US11724355B2 (en) 2020-09-30 2023-08-15 Applied Materials, Inc. Substrate polish edge uniformity control with secondary fluid dispense
WO2022081398A1 (en) 2020-10-13 2022-04-21 Applied Materials, Inc. Substrate polishing apparatus with contact extension or adjustable stop
US11623321B2 (en) 2020-10-14 2023-04-11 Applied Materials, Inc. Polishing head retaining ring tilting moment control
CN113649945B (zh) * 2021-10-20 2022-04-15 杭州众硅电子科技有限公司 一种晶圆抛光装置

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4141180A (en) * 1977-09-21 1979-02-27 Kayex Corporation Polishing apparatus
US4373991A (en) * 1982-01-28 1983-02-15 Western Electric Company, Inc. Methods and apparatus for polishing a semiconductor wafer
FR2558095B1 (fr) * 1984-03-14 1988-04-08 Ribard Pierre Perfectionnements apportes aux tetes de travail des machines de polissage et analogues
JPS6125768A (ja) * 1984-07-13 1986-02-04 Nec Corp 平面研摩装置の被加工物保持機構
NL8503217A (nl) * 1985-11-22 1987-06-16 Hoogovens Groep Bv Preparaathouder.
JPS63300858A (ja) * 1987-05-29 1988-12-08 Hitachi Ltd 空気軸受式ワ−クホルダ
JPS63114870A (ja) * 1987-10-22 1988-05-19 Nippon Telegr & Teleph Corp <Ntt> ウェハの真空吸着方法
US4918869A (en) * 1987-10-28 1990-04-24 Fujikoshi Machinery Corporation Method for lapping a wafer material and an apparatus therefor
JPH01216768A (ja) * 1988-02-25 1989-08-30 Showa Denko Kk 半導体基板の研磨方法及びその装置
JPH079896B2 (ja) * 1988-10-06 1995-02-01 信越半導体株式会社 研磨装置
JPH02224263A (ja) * 1989-02-27 1990-09-06 Hitachi Ltd 半導体チップの冷却装置
JPH0569310A (ja) * 1991-04-23 1993-03-23 Mitsubishi Materials Corp ウエーハの鏡面研磨装置
US5230184A (en) * 1991-07-05 1993-07-27 Motorola, Inc. Distributed polishing head
US5193316A (en) * 1991-10-29 1993-03-16 Texas Instruments Incorporated Semiconductor wafer polishing using a hydrostatic medium
US5205082A (en) * 1991-12-20 1993-04-27 Cybeq Systems, Inc. Wafer polisher head having floating retainer ring
US5498199A (en) * 1992-06-15 1996-03-12 Speedfam Corporation Wafer polishing method and apparatus
EP0589433B1 (de) * 1992-09-24 1999-07-28 Ebara Corporation Poliergerät
JP3370112B2 (ja) * 1992-10-12 2003-01-27 不二越機械工業株式会社 ウエハーの研磨装置
US5443416A (en) * 1993-09-09 1995-08-22 Cybeq Systems Incorporated Rotary union for coupling fluids in a wafer polishing apparatus
US5584746A (en) * 1993-10-18 1996-12-17 Shin-Etsu Handotai Co., Ltd. Method of polishing semiconductor wafers and apparatus therefor
US5624299A (en) * 1993-12-27 1997-04-29 Applied Materials, Inc. Chemical mechanical polishing apparatus with improved carrier and method of use
US5643053A (en) * 1993-12-27 1997-07-01 Applied Materials, Inc. Chemical mechanical polishing apparatus with improved polishing control
US5449316A (en) * 1994-01-05 1995-09-12 Strasbaugh; Alan Wafer carrier for film planarization
US5423716A (en) * 1994-01-05 1995-06-13 Strasbaugh; Alan Wafer-handling apparatus having a resilient membrane which holds wafer when a vacuum is applied
US5423558A (en) * 1994-03-24 1995-06-13 Ipec/Westech Systems, Inc. Semiconductor wafer carrier and method
JP2616735B2 (ja) * 1995-01-25 1997-06-04 日本電気株式会社 ウェハの研磨方法およびその装置
JP3158934B2 (ja) * 1995-02-28 2001-04-23 三菱マテリアル株式会社 ウェーハ研磨装置
TW400567B (en) * 1995-04-10 2000-08-01 Matsushita Electric Ind Co Ltd The polishing device and its polishing method for the substrate
US5681215A (en) * 1995-10-27 1997-10-28 Applied Materials, Inc. Carrier head design for a chemical mechanical polishing apparatus
US5762544A (en) * 1995-10-27 1998-06-09 Applied Materials, Inc. Carrier head design for a chemical mechanical polishing apparatus
JP3663728B2 (ja) * 1996-03-28 2005-06-22 信越半導体株式会社 薄板の研磨機
US6183354B1 (en) * 1996-11-08 2001-02-06 Applied Materials, Inc. Carrier head with a flexible membrane for a chemical mechanical polishing system
US5851140A (en) * 1997-02-13 1998-12-22 Integrated Process Equipment Corp. Semiconductor wafer polishing apparatus with a flexible carrier plate
US5957751A (en) 1997-05-23 1999-09-28 Applied Materials, Inc. Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
US5961169A (en) 1998-07-27 1999-10-05 Strasbaugh Apparatus for sensing the presence of a wafer

Also Published As

Publication number Publication date
EP0879678B1 (de) 2002-09-11
SG71109A1 (en) 2000-03-21
US6517415B2 (en) 2003-02-11
US6244932B1 (en) 2001-06-12
US6705924B2 (en) 2004-03-16
EP0879678A1 (de) 1998-11-25
US20030139123A1 (en) 2003-07-24
DE69807780T2 (de) 2003-05-08
KR100366919B1 (ko) 2003-03-17
US6093082A (en) 2000-07-25
US6343973B1 (en) 2002-02-05
JP3326109B2 (ja) 2002-09-17
KR19980087271A (ko) 1998-12-05
US20020031981A1 (en) 2002-03-14
TW431938B (en) 2001-05-01
JPH10337658A (ja) 1998-12-22
US5957751A (en) 1999-09-28

Similar Documents

Publication Publication Date Title
DE69807780D1 (de) Trägerplatte mit einer Substrateserkennungseinrichtung für eine chemisch-mechanische Poliervorrichtung
DE69619074D1 (de) Substratträgervorrichtung für eine Beschichtungskammer
DE19681656T1 (de) Ausrichtvorrichtung für einen Substratträger
ATA50197A (de) Beschichtetes substrat für eine transparente anordnung mit hoher selektivität
DE69404778D1 (de) Thermische Behandlungsmodul für Beschichtungs/Entwicklungseinrichtung für Substrat
DE19781558T1 (de) C4-Substrat-Kontaktinsel mit einer Nib-Plattierschicht
DE19781572T1 (de) Substratabstützvorrichtung für ein Substratgehäuse
DE69428373D1 (de) Fehlererkennungsgerät für gravierer
DE69708463D1 (de) Photovoltaische Vorrichtung, die ein undurchsichtiges Substrat mit einer spezifischen unregelmässigen Oberflächenstruktur aufweist
DE69312636D1 (de) Anodisierungsapparat mit einer Trägervorrichtung für das zu behandelnde Substrat
FR2779751B1 (fr) Substrat a revetement photocatalytique
DE69740146D1 (de) Trägerplatte mit einer flexiblen Membran für eine chemisch-mechanische Poliervorrichtung
DE69513361D1 (de) Trägerbehälter für Substratscheiben
DK0792822T3 (da) Plastmodul til transportørunderlag
DE69802869D1 (de) Werkzeugspindel mit Arretiereinrichtung
DE69418395D1 (de) Chipträger mit einer Schutzschicht für die Schaltungsoberfläche
DE69828568D1 (de) Kontaktlose Messvorrichtung für Oberflächenrauheit
DE69531390D1 (de) Substrat, Halbleiteranordnung, Anordnung für Elementmontage
DE69835572D1 (de) Substrat für informationsträger
DE69802072D1 (de) Substrat mit einer zu behandelnden oberfläche
DE69834778D1 (de) Haltevorrichtung für Halbleiter
DK1068139T3 (da) Transportørunderlag
FI980370A (fi) Pipetointilaite
DK0794266T3 (da) Indretning til belægning af en substratflade
ES2024474B3 (es) Procedimiento y dispositivo para el encargo de un medio de recubrimiento sobre un sustrato.

Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: BOECK, TAPPE, KIRSCHNER RECHTSANWAELTE PATENTANWAELTE

8328 Change in the person/name/address of the agent

Representative=s name: PUSCHMANN & BORCHERT, 82041 OBERHACHING