DE69730171D1 - Magnetoresistive Vorrichtung und magnetoresistiver Kopf - Google Patents
Magnetoresistive Vorrichtung und magnetoresistiver KopfInfo
- Publication number
- DE69730171D1 DE69730171D1 DE69730171T DE69730171T DE69730171D1 DE 69730171 D1 DE69730171 D1 DE 69730171D1 DE 69730171 T DE69730171 T DE 69730171T DE 69730171 T DE69730171 T DE 69730171T DE 69730171 D1 DE69730171 D1 DE 69730171D1
- Authority
- DE
- Germany
- Prior art keywords
- magnetoresistive
- head
- magnetoresistive head
- magnetoresistive device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/09—Magnetoresistive devices
- G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/3204—Exchange coupling of amorphous multilayers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Hall/Mr Elements (AREA)
- Thin Magnetic Films (AREA)
- Magnetic Heads (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3455696 | 1996-02-22 | ||
JP6051396 | 1996-03-18 | ||
JP8367496 | 1996-04-05 | ||
JP12674396 | 1996-05-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69730171D1 true DE69730171D1 (de) | 2004-09-16 |
Family
ID=27459947
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69730171T Expired - Lifetime DE69730171D1 (de) | 1996-02-22 | 1997-02-21 | Magnetoresistive Vorrichtung und magnetoresistiver Kopf |
Country Status (4)
Country | Link |
---|---|
US (3) | US5909345A (de) |
EP (1) | EP0791915B1 (de) |
KR (1) | KR100274108B1 (de) |
DE (1) | DE69730171D1 (de) |
Families Citing this family (68)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5909345A (en) | 1996-02-22 | 1999-06-01 | Matsushita Electric Industrial Co., Ltd. | Magnetoresistive device and magnetoresistive head |
JPH10241123A (ja) * | 1997-02-28 | 1998-09-11 | Nec Corp | 磁気抵抗効果ヘッド |
JP3255872B2 (ja) | 1997-04-17 | 2002-02-12 | アルプス電気株式会社 | スピンバルブ型薄膜素子及びその製造方法 |
US5966012A (en) * | 1997-10-07 | 1999-10-12 | International Business Machines Corporation | Magnetic tunnel junction device with improved fixed and free ferromagnetic layers |
JP3075253B2 (ja) * | 1998-03-31 | 2000-08-14 | 日本電気株式会社 | スピンバルブ型感磁素子及びこれを用いた磁気ヘッド並びに磁気ディスク装置 |
JPH11354860A (ja) * | 1998-06-10 | 1999-12-24 | Read Rite Smi Kk | スピンバルブ磁気変換素子及び磁気ヘッド |
US6195240B1 (en) * | 1998-07-31 | 2001-02-27 | International Business Machines Corporation | Spin valve head with diffusion barrier |
US6072671A (en) * | 1998-07-31 | 2000-06-06 | International Business Machines Corporation | Write head with high thermal stability material |
US6201671B1 (en) * | 1998-12-04 | 2001-03-13 | International Business Machines Corporation | Seed layer for a nickel oxide pinning layer for increasing the magnetoresistance of a spin valve sensor |
JP2000207714A (ja) * | 1999-01-13 | 2000-07-28 | Read Rite Smi Kk | 磁気抵抗効果型薄膜磁気ヘッド、並びに、その製造方法 |
DE19908054C2 (de) * | 1999-02-25 | 2001-06-28 | Forschungszentrum Juelich Gmbh | Ungekoppelter GMR-Sensor |
US6567246B1 (en) * | 1999-03-02 | 2003-05-20 | Matsushita Electric Industrial Co., Ltd. | Magnetoresistance effect element and method for producing the same, and magnetoresistance effect type head, magnetic recording apparatus, and magnetoresistance effect memory element |
US6201672B1 (en) * | 1999-04-26 | 2001-03-13 | International Business Machines Corporation | Spin valve sensor having improved interface between pinning layer and pinned layer structure |
JP2001007420A (ja) * | 1999-06-17 | 2001-01-12 | Sony Corp | 磁気抵抗効果膜とこれを用いた磁気読取りセンサ |
JP3421281B2 (ja) * | 1999-08-11 | 2003-06-30 | ティーディーケイ株式会社 | 磁気変換素子、薄膜磁気ヘッドおよびそれらの製造方法 |
US6205052B1 (en) * | 1999-10-21 | 2001-03-20 | Motorola, Inc. | Magnetic element with improved field response and fabricating method thereof |
US6381105B1 (en) * | 1999-10-22 | 2002-04-30 | Read-Rite Corporation | Hybrid dual spin valve sensor and method for making same |
JP2001126219A (ja) * | 1999-10-28 | 2001-05-11 | Read Rite Corp | スピンバルブ型磁気抵抗センサ及び薄膜磁気ヘッド |
EP1115164B1 (de) * | 2000-01-07 | 2005-05-25 | Sharp Kabushiki Kaisha | Magnetoresistive Anordnung und diese verwendendes magnetisches Speicherelement |
US6317299B1 (en) * | 2000-02-17 | 2001-11-13 | International Business Machines Corporation | Seed layer for improving pinning field spin valve sensor |
US6381106B1 (en) * | 2000-04-12 | 2002-04-30 | International Business Machines Corporation | Top spin valve sensor that has a free layer structure with a cobalt iron boron (cofeb) layer |
US6700753B2 (en) | 2000-04-12 | 2004-03-02 | Seagate Technology Llc | Spin valve structures with specular reflection layers |
JP2001307308A (ja) * | 2000-04-24 | 2001-11-02 | Fujitsu Ltd | 磁気抵抗効果型ヘッドおよび情報再生装置 |
US6645614B1 (en) | 2000-07-25 | 2003-11-11 | Seagate Technology Llc | Magnetic recording media having enhanced coupling between magnetic layers |
US6473278B1 (en) * | 2000-07-31 | 2002-10-29 | International Business Machines Corporation | Giant magnetoresistive sensor with a high resistivity free layer |
US6538859B1 (en) * | 2000-07-31 | 2003-03-25 | International Business Machines Corporation | Giant magnetoresistive sensor with an AP-coupled low Hk free layer |
JP2002074619A (ja) | 2000-08-25 | 2002-03-15 | Alps Electric Co Ltd | 磁気ヘッド |
US6777112B1 (en) | 2000-10-10 | 2004-08-17 | Seagate Technology Llc | Stabilized recording media including coupled discontinuous and continuous magnetic layers |
US6737172B1 (en) | 2000-12-07 | 2004-05-18 | Seagate Technology Llc | Multi-layered anti-ferromagnetically coupled magnetic media |
US6689497B1 (en) | 2001-01-08 | 2004-02-10 | Seagate Technology Llc | Stabilized AFC magnetic recording media with reduced lattice mismatch between spacer layer(s) and magnetic layers |
US6665155B2 (en) | 2001-03-08 | 2003-12-16 | International Business Machines Corporation | Spin valve sensor with free layer structure having a cobalt niobium (CoNb) or cobalt niobium hafnium (CoNbHf) layer |
US7050274B2 (en) * | 2001-03-15 | 2006-05-23 | Seagate Technology Llc | Multilayer permanent magnet films |
US7289303B1 (en) | 2001-04-05 | 2007-10-30 | Western Digital (Fremont), Llc | Spin valve sensors having synthetic antiferromagnet for longitudinal bias |
JP2002368306A (ja) * | 2001-06-07 | 2002-12-20 | Canon Inc | 磁気抵抗効果膜およびそれを用いたメモリ |
DE10128135A1 (de) * | 2001-06-09 | 2002-12-19 | Bosch Gmbh Robert | Magnetoresistive Schichtanordnung und Gradiometer mit einer derartigen Schichtanordnung |
US6828036B1 (en) | 2001-08-21 | 2004-12-07 | Seagate Technology Llc | Anti-ferromagnetically coupled magnetic media with combined interlayer + first magnetic layer |
DE10146546A1 (de) | 2001-09-21 | 2003-04-10 | Infineon Technologies Ag | Digitale magnetische Speicherzelleneinrichtung |
EP1580821B1 (de) * | 2001-10-12 | 2015-12-09 | Sony Corporation | Magnetowiderstandseffektelement, magnetisches speicherelement, magnetischer speicherbaustein und verfahren zu ihrer herstellung |
US6545906B1 (en) * | 2001-10-16 | 2003-04-08 | Motorola, Inc. | Method of writing to scalable magnetoresistance random access memory element |
US7842409B2 (en) | 2001-11-30 | 2010-11-30 | Seagate Technology Llc | Anti-ferromagnetically coupled perpendicular magnetic recording media with oxide |
WO2003049086A1 (en) | 2001-11-30 | 2003-06-12 | Seagate Technology Llc | Anti-ferromagnetically coupled perpendicular magnetic recording media |
JP3576145B2 (ja) * | 2002-03-29 | 2004-10-13 | 株式会社東芝 | 磁気抵抗効果膜を有する磁気ヘッドを用いた磁気ディスク装置 |
AU2003227448A1 (en) * | 2002-04-24 | 2003-11-10 | Matsushita Electric Industrial Co., Ltd. | Magnetoresistant element |
US7095646B2 (en) * | 2002-07-17 | 2006-08-22 | Freescale Semiconductor, Inc. | Multi-state magnetoresistance random access cell with improved memory storage density |
JP2004071897A (ja) * | 2002-08-07 | 2004-03-04 | Sony Corp | 磁気抵抗効果素子及び磁気メモリ装置 |
DE10236983A1 (de) * | 2002-08-13 | 2004-03-04 | Robert Bosch Gmbh | Magnetsensoranordnung |
US6831312B2 (en) * | 2002-08-30 | 2004-12-14 | Freescale Semiconductor, Inc. | Amorphous alloys for magnetic devices |
US20040061987A1 (en) * | 2002-09-27 | 2004-04-01 | International Business Machines Corporation | Self-stabilized giant magnetoresistive spin valve read sensor |
US6903909B2 (en) * | 2002-11-01 | 2005-06-07 | Hewlett-Packard Development Company, L.P. | Magnetoresistive element including ferromagnetic sublayer having smoothed surface |
JP2004234780A (ja) * | 2003-01-31 | 2004-08-19 | Toshiba Corp | 磁気記録再生装置及び磁気ヘッド |
US6956763B2 (en) * | 2003-06-27 | 2005-10-18 | Freescale Semiconductor, Inc. | MRAM element and methods for writing the MRAM element |
US6967366B2 (en) * | 2003-08-25 | 2005-11-22 | Freescale Semiconductor, Inc. | Magnetoresistive random access memory with reduced switching field variation |
US7098495B2 (en) * | 2004-07-26 | 2006-08-29 | Freescale Semiconducor, Inc. | Magnetic tunnel junction element structures and methods for fabricating the same |
US20060042938A1 (en) * | 2004-09-01 | 2006-03-02 | Heraeus, Inc. | Sputter target material for improved magnetic layer |
US7129098B2 (en) * | 2004-11-24 | 2006-10-31 | Freescale Semiconductor, Inc. | Reduced power magnetoresistive random access memory elements |
US20060228586A1 (en) * | 2005-04-06 | 2006-10-12 | Seagate Technology Llc | Ferromagnetically coupled magnetic recording media |
US20060286414A1 (en) * | 2005-06-15 | 2006-12-21 | Heraeus, Inc. | Enhanced oxide-containing sputter target alloy compositions |
JP4008478B2 (ja) * | 2005-07-13 | 2007-11-14 | Tdk株式会社 | 磁界検出素子、基体、ウエハ、ヘッドジンバルアセンブリ、ハードディスク装置、および磁界検出素子の製造方法 |
US7973349B2 (en) * | 2005-09-20 | 2011-07-05 | Grandis Inc. | Magnetic device having multilayered free ferromagnetic layer |
US7777261B2 (en) * | 2005-09-20 | 2010-08-17 | Grandis Inc. | Magnetic device having stabilized free ferromagnetic layer |
US20070253103A1 (en) * | 2006-04-27 | 2007-11-01 | Heraeus, Inc. | Soft magnetic underlayer in magnetic media and soft magnetic alloy based sputter target |
US7672089B2 (en) * | 2006-12-15 | 2010-03-02 | Hitachi Global Storage Technologies Netherlands B.V. | Current-perpendicular-to-plane sensor with dual keeper layers |
US7957179B2 (en) * | 2007-06-27 | 2011-06-07 | Grandis Inc. | Magnetic shielding in magnetic multilayer structures |
US7894248B2 (en) * | 2008-09-12 | 2011-02-22 | Grandis Inc. | Programmable and redundant circuitry based on magnetic tunnel junction (MTJ) |
US8685547B2 (en) | 2009-02-19 | 2014-04-01 | Seagate Technology Llc | Magnetic recording media with enhanced writability and thermal stability |
US9142240B2 (en) | 2010-07-30 | 2015-09-22 | Seagate Technology Llc | Apparatus including a perpendicular magnetic recording layer having a convex magnetic anisotropy profile |
US8508221B2 (en) | 2010-08-30 | 2013-08-13 | Everspin Technologies, Inc. | Two-axis magnetic field sensor having reduced compensation angle for zero offset |
KR102078849B1 (ko) * | 2013-03-11 | 2020-02-18 | 삼성전자 주식회사 | 자기저항 구조체, 이를 포함하는 자기 메모리 소자 및 자기저항 구조체의 제조 방법 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0536033A (ja) * | 1991-08-01 | 1993-02-12 | Hitachi Maxell Ltd | 磁気抵抗素子 |
JPH05205225A (ja) * | 1992-01-29 | 1993-08-13 | Nec Corp | 磁気抵抗効果ヘッド |
JPH05217123A (ja) * | 1992-02-03 | 1993-08-27 | Matsushita Electric Ind Co Ltd | 複合型薄膜磁気ヘッドの製造方法 |
JP2722991B2 (ja) * | 1993-04-27 | 1998-03-09 | 日本電気株式会社 | 磁気抵抗効果型ヘッド |
JPH0765329A (ja) | 1993-08-30 | 1995-03-10 | Hitachi Ltd | 多層磁気抵抗効果膜及び磁気ヘッド |
JP2785678B2 (ja) * | 1994-03-24 | 1998-08-13 | 日本電気株式会社 | スピンバルブ膜およびこれを用いた再生ヘッド |
JPH088473A (ja) | 1994-06-20 | 1996-01-12 | Matsushita Electric Ind Co Ltd | 磁気抵抗効果素子及び磁気抵抗効果型ヘッド |
JPH08167120A (ja) * | 1994-12-08 | 1996-06-25 | Hitachi Ltd | 多層磁気抵抗効果膜および磁気ヘッド |
JPH08213238A (ja) * | 1995-02-03 | 1996-08-20 | Sumitomo Metal Ind Ltd | 磁気抵抗センサ |
JPH08287422A (ja) * | 1995-04-07 | 1996-11-01 | Alps Electric Co Ltd | 磁気抵抗効果型ヘッド |
JP3293437B2 (ja) * | 1995-12-19 | 2002-06-17 | 松下電器産業株式会社 | 磁気抵抗効果素子、磁気抵抗効果型ヘッド及びメモリー素子 |
US5909345A (en) | 1996-02-22 | 1999-06-01 | Matsushita Electric Industrial Co., Ltd. | Magnetoresistive device and magnetoresistive head |
US5828529A (en) * | 1997-04-29 | 1998-10-27 | International Business Machines Corporation | Antiparallel pinned spin valve with read signal symmetry |
-
1997
- 1997-02-19 US US08/802,711 patent/US5909345A/en not_active Expired - Lifetime
- 1997-02-21 DE DE69730171T patent/DE69730171D1/de not_active Expired - Lifetime
- 1997-02-21 EP EP97102826A patent/EP0791915B1/de not_active Expired - Lifetime
- 1997-02-21 KR KR1019970006182A patent/KR100274108B1/ko not_active IP Right Cessation
-
1998
- 1998-12-30 US US09/223,663 patent/US6031692A/en not_active Expired - Lifetime
-
2000
- 2000-01-05 US US09/477,989 patent/US6198610B1/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US6198610B1 (en) | 2001-03-06 |
EP0791915B1 (de) | 2004-08-11 |
KR100274108B1 (ko) | 2001-01-15 |
US6031692A (en) | 2000-02-29 |
EP0791915A3 (de) | 1998-03-04 |
EP0791915A2 (de) | 1997-08-27 |
KR970063045A (ko) | 1997-09-12 |
US5909345A (en) | 1999-06-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |