DE69724915D1 - Vorrichtung und Verfahren zum Waschen eines Substrats - Google Patents

Vorrichtung und Verfahren zum Waschen eines Substrats

Info

Publication number
DE69724915D1
DE69724915D1 DE69724915T DE69724915T DE69724915D1 DE 69724915 D1 DE69724915 D1 DE 69724915D1 DE 69724915 T DE69724915 T DE 69724915T DE 69724915 T DE69724915 T DE 69724915T DE 69724915 D1 DE69724915 D1 DE 69724915D1
Authority
DE
Germany
Prior art keywords
washing
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69724915T
Other languages
English (en)
Other versions
DE69724915T2 (de
Inventor
Hideya Tanaka
Kenichi Miyamoto
Minoru Kubota
Walter Swanson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of DE69724915D1 publication Critical patent/DE69724915D1/de
Application granted granted Critical
Publication of DE69724915T2 publication Critical patent/DE69724915T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
    • B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/30—Cleaning by methods involving the use of tools by movement of cleaning members over a surface
    • B08B1/32—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members
    • B08B1/36—Cleaning by methods involving the use of tools by movement of cleaning members over a surface using rotary cleaning members rotating about an axis orthogonal to the surface
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/50—Cleaning by methods involving the use of tools involving cleaning of the cleaning members
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/50—Cleaning by methods involving the use of tools involving cleaning of the cleaning members
    • B08B1/52—Cleaning by methods involving the use of tools involving cleaning of the cleaning members using fluids
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/50—Cleaning by methods involving the use of tools involving cleaning of the cleaning members
    • B08B1/54—Cleaning by methods involving the use of tools involving cleaning of the cleaning members using mechanical tools
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67011—Apparatus for manufacture or treatment
    • H01L21/67017—Apparatus for fluid treatment
    • H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S134/00—Cleaning and liquid contact with solids
    • Y10S134/902—Semiconductor wafer

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
DE69724915T 1996-11-19 1997-11-12 Vorrichtung und Verfahren zum Waschen eines Substrats Expired - Fee Related DE69724915T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP32340496 1996-11-19
JP32340496 1996-11-19

Publications (2)

Publication Number Publication Date
DE69724915D1 true DE69724915D1 (de) 2003-10-23
DE69724915T2 DE69724915T2 (de) 2004-07-15

Family

ID=18154342

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69724915T Expired - Fee Related DE69724915T2 (de) 1996-11-19 1997-11-12 Vorrichtung und Verfahren zum Waschen eines Substrats

Country Status (6)

Country Link
US (2) US6158075A (de)
EP (2) EP0843341B1 (de)
KR (1) KR100379650B1 (de)
DE (1) DE69724915T2 (de)
SG (1) SG67439A1 (de)
TW (1) TW353784B (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW353784B (en) * 1996-11-19 1999-03-01 Tokyo Electron Ltd Apparatus and method for washing substrate
JP3654779B2 (ja) * 1998-01-06 2005-06-02 東京エレクトロン株式会社 基板洗浄具及び基板洗浄方法
JP3990073B2 (ja) * 1999-06-17 2007-10-10 株式会社荏原製作所 基板洗浄装置及び基板洗浄方法
JP3991180B2 (ja) * 1999-07-29 2007-10-17 富士フイルム株式会社 ウエブの除塵装置
JP2001246331A (ja) * 2000-03-08 2001-09-11 Sharp Corp 洗浄装置
JP3875456B2 (ja) * 2000-06-29 2007-01-31 株式会社東芝 洗浄方法および洗浄装置
JP4079205B2 (ja) * 2000-08-29 2008-04-23 東京エレクトロン株式会社 基板洗浄装置及び基板洗浄方法
KR100376395B1 (ko) * 2000-09-19 2003-03-15 주식회사 케이씨텍 세정용 브러시 조립체
US6817057B2 (en) * 2001-08-30 2004-11-16 Micron Technology, Inc. Spindle chuck cleaner
US6651284B2 (en) * 2001-10-11 2003-11-25 Silicon Integrated Systems Corp. Scrubbing assembly for wafer-cleaning device
KR100468110B1 (ko) * 2002-07-12 2005-01-26 삼성전자주식회사 웨이퍼 처리 장치
US20040040576A1 (en) * 2002-08-29 2004-03-04 Yuxia Sun Wafer cleaning brush
US7655094B2 (en) * 2004-07-07 2010-02-02 Nano Om, Llc Systems and methods for charging a cleaning solution used for cleaning integrated circuit substrates
JP4486003B2 (ja) * 2005-07-07 2010-06-23 大日本スクリーン製造株式会社 基板洗浄ブラシ、ならびにこれを用いた基板処理装置および基板処理方法
US20070251035A1 (en) * 2006-05-01 2007-11-01 Taiwan Semiconductor Manufacturing Co., Ltd. Cleaning device
US20110296634A1 (en) * 2010-06-02 2011-12-08 Jingdong Jia Wafer side edge cleaning apparatus
JP4794685B1 (ja) * 2010-10-19 2011-10-19 ミクロ技研株式会社 基板処理装置及び基板処理方法
JP6054805B2 (ja) * 2013-04-25 2016-12-27 株式会社荏原製作所 基板洗浄装置
SG10201404086XA (en) * 2013-07-19 2015-02-27 Ebara Corp Substrate cleaning device, substrate cleaning apparatus, method for manufacturing cleaned substrate and substrate processing apparatus
JP6312534B2 (ja) * 2014-06-10 2018-04-18 株式会社荏原製作所 基板洗浄装置
JP2016082195A (ja) * 2014-10-22 2016-05-16 Ｔｏｗａ株式会社 切断装置及び切断方法
US9770092B2 (en) * 2015-08-20 2017-09-26 Taiwan Semiconductor Manufacturing Co., Ltd. Brush, back surface treatment assembly and method for cleaning substrate
CN107221491B (zh) * 2016-03-22 2021-10-22 东京毅力科创株式会社 基板清洗装置
JP6751634B2 (ja) * 2016-09-21 2020-09-09 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置
JP6875154B2 (ja) * 2017-03-06 2021-05-19 株式会社荏原製作所 セルフクリーニング装置、基板処理装置、および洗浄具のセルフクリーニング方法
JP7161418B2 (ja) * 2019-01-30 2022-10-26 株式会社荏原製作所 基板洗浄装置、基板処理装置、洗浄部材のセルフクリーニング方法
CN112845250A (zh) * 2019-11-26 2021-05-28 常德市联嘉机械有限公司 一种带清洁功能的机械加工用辅助装置

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58182234A (ja) * 1982-04-17 1983-10-25 Dainippon Screen Mfg Co Ltd 複数種のブラシ使用可能な洗浄装置
JPS58182830A (ja) * 1982-04-20 1983-10-25 Toshiba Corp ジエツトスクラバ洗浄装置
FR2589089B3 (fr) * 1985-10-25 1987-10-30 Bertholet Louis Appareil pour le nettoyage des tuiles
JP2746670B2 (ja) * 1989-07-20 1998-05-06 東京エレクトロン株式会社 洗浄装置
US5169408A (en) * 1990-01-26 1992-12-08 Fsi International, Inc. Apparatus for wafer processing with in situ rinse
US5375291A (en) * 1992-05-18 1994-12-27 Tokyo Electron Limited Device having brush for scrubbing substrate
US5345639A (en) * 1992-05-28 1994-09-13 Tokyo Electron Limited Device and method for scrubbing and cleaning substrate
JPH06190346A (ja) * 1992-12-28 1994-07-12 Toshiba Corp 基板洗浄装置
US5311634A (en) * 1993-02-03 1994-05-17 Nicholas Andros Sponge cleaning pad
JP2862754B2 (ja) * 1993-04-19 1999-03-03 東京エレクトロン株式会社 処理装置及び回転部材
US5518542A (en) * 1993-11-05 1996-05-21 Tokyo Electron Limited Double-sided substrate cleaning apparatus
JP3066422B2 (ja) * 1993-11-05 2000-07-17 東京エレクトロン株式会社 枚葉式両面洗浄装置
JP3328426B2 (ja) * 1994-05-12 2002-09-24 東京エレクトロン株式会社 洗浄装置
EP1080797A3 (de) * 1994-06-28 2005-10-05 Ebara Corporation Verfahren und Vorrichtung für die Reinigung von Werkstücken
KR0150595B1 (ko) * 1994-06-30 1998-12-01 이시다 아키라 브러쉬 세정장치 및 브러쉬 세정방법 및 브러쉬 부착/분리방법
JP3044277B2 (ja) * 1994-12-21 2000-05-22 信越半導体株式会社 ウェーハの洗浄及び洗浄乾燥装置
TW297910B (de) * 1995-02-02 1997-02-11 Tokyo Electron Co Ltd
JPH08238463A (ja) * 1995-03-03 1996-09-17 Ebara Corp 洗浄方法及び洗浄装置
KR100213992B1 (ko) * 1995-05-12 1999-08-02 히가시 데쓰로 세정장치
US5624501A (en) * 1995-09-26 1997-04-29 Gill, Jr.; Gerald L. Apparatus for cleaning semiconductor wafers
US5778481A (en) * 1996-02-15 1998-07-14 International Business Machines Corporation Silicon wafer cleaning and polishing pads
JP3278590B2 (ja) * 1996-08-23 2002-04-30 株式会社東芝 超音波洗浄装置及び超音波洗浄方法
JP2875213B2 (ja) * 1996-09-10 1999-03-31 芝浦メカトロニクス株式会社 洗浄用スポンジブラシ
TW353784B (en) * 1996-11-19 1999-03-01 Tokyo Electron Ltd Apparatus and method for washing substrate
US5870792A (en) * 1997-03-31 1999-02-16 Speedfam Corporation Apparatus for cleaning wafers and discs
US5870793A (en) * 1997-05-02 1999-02-16 Integrated Process Equipment Corp. Brush for scrubbing semiconductor wafers
US6006391A (en) * 1997-11-10 1999-12-28 Speedfam-Ipec Corporation Workpiece cleaning element with improved rib configuration

Also Published As

Publication number Publication date
EP0843341A2 (de) 1998-05-20
EP0843341B1 (de) 2003-09-17
KR19980042583A (ko) 1998-08-17
US6379469B1 (en) 2002-04-30
EP1341212A2 (de) 2003-09-03
DE69724915T2 (de) 2004-07-15
EP1341212A3 (de) 2005-10-12
SG67439A1 (en) 1999-09-21
TW353784B (en) 1999-03-01
US6158075A (en) 2000-12-12
EP0843341A3 (de) 1999-12-29
KR100379650B1 (ko) 2003-07-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee