DE69601292D1 - Plättchenbehandlungssystem - Google Patents
PlättchenbehandlungssystemInfo
- Publication number
- DE69601292D1 DE69601292D1 DE69601292T DE69601292T DE69601292D1 DE 69601292 D1 DE69601292 D1 DE 69601292D1 DE 69601292 T DE69601292 T DE 69601292T DE 69601292 T DE69601292 T DE 69601292T DE 69601292 D1 DE69601292 D1 DE 69601292D1
- Authority
- DE
- Germany
- Prior art keywords
- wafers
- support plate
- separating
- treatment system
- washing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 235000012431 wafers Nutrition 0.000 abstract 7
- 238000005406 washing Methods 0.000 abstract 3
- 239000000853 adhesive Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0076—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for removing dust, e.g. by spraying liquids; for lubricating, cooling or cleaning tool or work
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Medicines Containing Material From Animals Or Micro-Organisms (AREA)
- External Artificial Organs (AREA)
Applications Claiming Priority (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP22947695A JP3086639B2 (ja) | 1995-09-06 | 1995-09-06 | ワイヤソー装置により切断されたワークの剥離装置及び剥離方法 |
JP23558195A JP3254115B2 (ja) | 1995-09-13 | 1995-09-13 | 割れワーク検出装置及び割れワーク検出方法 |
JP30952095A JP3150888B2 (ja) | 1995-11-28 | 1995-11-28 | ウエハの分離搬送装置及び分離搬送方法 |
JP33734695 | 1995-12-25 | ||
JP4225196A JP3230566B2 (ja) | 1996-02-29 | 1996-02-29 | ウエハの分離搬送装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69601292D1 true DE69601292D1 (de) | 1999-02-18 |
DE69601292T2 DE69601292T2 (de) | 1999-08-26 |
Family
ID=27522242
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69601292T Expired - Fee Related DE69601292T2 (de) | 1995-09-06 | 1996-09-05 | Plättchenbehandlungssystem |
Country Status (5)
Country | Link |
---|---|
US (1) | US5950643A (de) |
EP (1) | EP0762483B1 (de) |
KR (1) | KR100230625B1 (de) |
AT (1) | ATE175520T1 (de) |
DE (1) | DE69601292T2 (de) |
Families Citing this family (92)
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JPH0936080A (ja) * | 1995-07-13 | 1997-02-07 | Toray Eng Co Ltd | 加工済シリコンインゴットの洗浄方法 |
WO2004075285A1 (ja) * | 1997-03-07 | 2004-09-02 | Takuya Shibao | 基板処理装置 |
US6240933B1 (en) * | 1997-05-09 | 2001-06-05 | Semitool, Inc. | Methods for cleaning semiconductor surfaces |
US6869487B1 (en) | 1997-05-09 | 2005-03-22 | Semitool, Inc. | Process and apparatus for treating a workpiece such as a semiconductor wafer |
US7264680B2 (en) * | 1997-05-09 | 2007-09-04 | Semitool, Inc. | Process and apparatus for treating a workpiece using ozone |
US7163588B2 (en) * | 1997-05-09 | 2007-01-16 | Semitool, Inc. | Processing a workpiece using water, a base, and ozone |
US7416611B2 (en) * | 1997-05-09 | 2008-08-26 | Semitool, Inc. | Process and apparatus for treating a workpiece with gases |
US20050215063A1 (en) * | 1997-05-09 | 2005-09-29 | Bergman Eric J | System and methods for etching a silicon wafer using HF and ozone |
US7378355B2 (en) * | 1997-05-09 | 2008-05-27 | Semitool, Inc. | System and methods for polishing a wafer |
US7404863B2 (en) * | 1997-05-09 | 2008-07-29 | Semitool, Inc. | Methods of thinning a silicon wafer using HF and ozone |
US6701941B1 (en) * | 1997-05-09 | 2004-03-09 | Semitool, Inc. | Method for treating the surface of a workpiece |
US20020157686A1 (en) * | 1997-05-09 | 2002-10-31 | Semitool, Inc. | Process and apparatus for treating a workpiece such as a semiconductor wafer |
US20050034745A1 (en) * | 1997-05-09 | 2005-02-17 | Semitool, Inc. | Processing a workpiece with ozone and a halogenated additive |
US6138694A (en) * | 1998-03-06 | 2000-10-31 | Scp Global Technologies | Multiple stage wet processing platform and method of use |
US6264404B1 (en) * | 1998-07-13 | 2001-07-24 | Seagate Technology, Inc. | System and method for hydrodynamic loading and unloading of objects into and out of substantially touchless hydrodynamic transport systems |
DE19900671C2 (de) * | 1999-01-11 | 2002-04-25 | Fraunhofer Ges Forschung | Verfahren und Vorrichtung zum Vereinzeln von scheibenförmigen Substraten, insbesondere zur Waferherstellung |
DE19904834A1 (de) * | 1999-02-07 | 2000-08-10 | Acr Automation In Cleanroom | Vorrichtung zum Ablösen, Vereinzeln und Einlagern von dünnen, bruchempfindlichen scheibenförmigen Substraten |
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DE19950068B4 (de) * | 1999-10-16 | 2006-03-02 | Schmid Technology Systems Gmbh | Verfahren und Vorrichtung zum Vereinzeln und Ablösen von Substratscheiben |
DE10108369A1 (de) * | 2001-02-21 | 2002-08-29 | B L E Lab Equipment Gmbh | Verfahren und Vorrichtung zum Ablösen eines Halbleiterwafers von einem Träger |
JP4149166B2 (ja) * | 2002-01-08 | 2008-09-10 | 東京エレクトロン株式会社 | 処理システム及び処理方法 |
US6881020B2 (en) * | 2002-04-26 | 2005-04-19 | Taiwan Semiconductor Manufacturing Co., Ltd | Pod transfer system having retractable mast and rotatable and vertically movable hoist |
JP3916148B2 (ja) * | 2002-11-15 | 2007-05-16 | Tdk株式会社 | ウェハーマッピング機能を備えるウェハー処理装置 |
KR100582202B1 (ko) | 2003-10-13 | 2006-05-23 | 엘지.필립스 엘시디 주식회사 | 박막트랜지스터 어레이 기판의 제조장치 및 방법 |
US7409263B2 (en) * | 2004-07-14 | 2008-08-05 | Applied Materials, Inc. | Methods and apparatus for repositioning support for a substrate carrier |
US7720558B2 (en) | 2004-09-04 | 2010-05-18 | Applied Materials, Inc. | Methods and apparatus for mapping carrier contents |
DE102005023618B3 (de) * | 2005-05-21 | 2006-12-07 | Aci-Ecotec Gmbh & Co.Kg | Einrichtung zum Vereinzeln von Silizium-Wafern von einem Stapel |
DE102005028112A1 (de) * | 2005-06-13 | 2006-12-21 | Schmid Technology Systems Gmbh | Verfahren zur Positionierung und Lageerhaltung von Substraten, insbesondere von dünnen Siliziumwafern nach dem Drahtsägen zu deren Vereinzelung |
DE102005033859B3 (de) * | 2005-07-12 | 2006-12-14 | Q-Cells Ag | Wafermagazin für Halbleiterwafer oder waferartige Gegenstände |
DE102005058269B4 (de) * | 2005-12-06 | 2011-12-01 | Stangl Semiconductor Equipment Ag | Vorrichtung zum Reinigen eines gesägten Waferblocks |
TWI262827B (en) * | 2005-12-13 | 2006-10-01 | Ind Tech Res Inst | Cleaning device and method of bubble reaction |
RU2380305C2 (ru) * | 2006-07-06 | 2010-01-27 | Рена Зондермашинен Гмбх | Устройство и способ разъединения и транспортировки подложек |
DE202006020339U1 (de) * | 2006-12-15 | 2008-04-10 | Rena Sondermaschinen Gmbh | Vorrichtung zum Reinigen von Gegenständen, insbesondere von dünnen Scheiben |
DE502006001352D1 (de) * | 2006-12-15 | 2008-09-25 | Rena Sondermaschinen Gmbh | Vorrichtung und Verfahren zum Vereinzeln und Transportieren von Substraten |
JP5388862B2 (ja) * | 2006-12-19 | 2014-01-15 | アールイーシー・ウェーハ・ピーティーイー・リミテッド | シリコンウェハを分離させるための方法および装置 |
KR100831263B1 (ko) | 2006-12-29 | 2008-05-22 | 동부일렉트로닉스 주식회사 | 웨이퍼 간격 조절 장치 및 이를 포함하는 기판 세정 장치 |
KR100929817B1 (ko) * | 2007-10-23 | 2009-12-07 | 세메스 주식회사 | 기판 처리 장치 및 기판 처리 장치의 제조 방법 |
DE102007061410A1 (de) * | 2007-12-11 | 2009-06-18 | Gebr. Schmid Gmbh & Co. | Verfahren und Vorrichtung zum Vereinzeln von Wafern von einem Waferstapel |
DE102008004548A1 (de) * | 2008-01-15 | 2009-07-16 | Rec Scan Wafer As | Waferstapelreinigung |
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DE102008060014A1 (de) * | 2008-11-24 | 2010-05-27 | Gebr. Schmid Gmbh & Co. | Verfahren und Vorrichtung zur Handhabung eines zersägten Waferblocks |
DE102008060012A1 (de) * | 2008-11-24 | 2010-05-27 | Gebr. Schmid Gmbh & Co. | Verfahren zum Drehen eines zersägten Waferblocks und Vorrichtung dafür |
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US8863957B2 (en) | 2009-01-13 | 2014-10-21 | Kabushiki Kaisha Watanabe Shoko | Wafer separation apparatus, wafer separation and transfer apparatus, wafer separation method, wafer separation and transfer method, and solar cell wafer separation and transfer method |
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CN105983552B (zh) * | 2015-02-15 | 2019-12-24 | 盛美半导体设备(上海)有限公司 | 一种防掉落的半导体清洗装置 |
JP6324917B2 (ja) * | 2015-03-03 | 2018-05-16 | 富士フイルム株式会社 | 液体供給装置及び画像形成装置 |
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CN105396855B (zh) * | 2015-12-08 | 2017-08-25 | 天津中环半导体股份有限公司 | 用于硅片清洗机的上料装置 |
CN105946127B (zh) * | 2016-05-23 | 2019-03-08 | 天通日进精密技术有限公司 | 单段式硅棒截断机及其截断方法 |
JP6568838B2 (ja) * | 2016-10-18 | 2019-08-28 | 上村工業株式会社 | 乾燥装置 |
CN107993963B (zh) * | 2017-11-21 | 2020-07-10 | 长江存储科技有限责任公司 | 用于晶圆检测的机械手臂 |
CN109382351B (zh) * | 2018-05-03 | 2021-06-04 | 徐州工程学院 | 一种工件清洗设备 |
CN108637871A (zh) * | 2018-06-28 | 2018-10-12 | 黄洪飞 | 一种高效除锈装置 |
KR101964567B1 (ko) * | 2018-11-29 | 2019-04-01 | 손귀욱 | 반도체 웨이퍼의 낱장분리장치 |
KR101964568B1 (ko) * | 2018-11-29 | 2019-04-01 | 손귀욱 | 반도체 웨이퍼의 낱장분리방법 및 반도체 웨이퍼를 낱장으로 분리하는 자동화 장치 |
JP7355618B2 (ja) * | 2018-12-04 | 2023-10-03 | 株式会社ディスコ | ウエーハ分割装置 |
CN109841554B (zh) * | 2019-03-25 | 2024-04-12 | 常州华数锦明智能装备技术研究院有限公司 | 一种硅片百片整形上料设备 |
CN110201962A (zh) * | 2019-06-28 | 2019-09-06 | 阜宁协鑫光伏科技有限公司 | 插片机用水系统 |
CN110173016A (zh) * | 2019-06-28 | 2019-08-27 | 阜宁协鑫光伏科技有限公司 | 插片机用水系统 |
CN110394708B (zh) * | 2019-07-30 | 2021-05-28 | 马鞍山市金韩防水保温工程有限责任公司 | 一种五金建筑装饰件加工用表面处理锁合装置 |
JP7353711B2 (ja) * | 2019-08-14 | 2023-10-02 | 株式会社ディスコ | ウェーハ搬送装置 |
KR102089225B1 (ko) * | 2019-10-22 | 2020-05-26 | 손귀욱 | 웨이퍼 낱장 분리장치 및 이를 이용한 웨이퍼 낱장 분리방법 |
KR102379163B1 (ko) * | 2020-01-31 | 2022-03-25 | 에스케이실트론 주식회사 | 제1 세정 장치, 이를 포함하는 세정 장비 및 방법 |
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CN113263403A (zh) * | 2021-06-01 | 2021-08-17 | 贡觉县康巴石锅开发有限责任公司 | 一种基于人工智能的石锅生产工艺及设备 |
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JP3116619B2 (ja) * | 1993-01-11 | 2000-12-11 | 株式会社東京精密 | 半導体ウェーハの製造システム |
US5427644A (en) * | 1993-01-11 | 1995-06-27 | Tokyo Seimitsu Co., Ltd. | Method of manufacturing semiconductor wafer and system therefor |
US5427622A (en) * | 1993-02-12 | 1995-06-27 | International Business Machines Corporation | Method for uniform cleaning of wafers using megasonic energy |
JP2910507B2 (ja) * | 1993-06-08 | 1999-06-23 | 信越半導体株式会社 | 半導体ウエーハの製造方法 |
KR0183513B1 (ko) * | 1994-03-22 | 1999-04-15 | 오쯔보 히데오 | 웨이퍼 슬라이스 베이스 박리장치 |
JP4220580B2 (ja) * | 1995-02-10 | 2009-02-04 | 三菱電機株式会社 | 半導体装置の製造装置 |
US5593505A (en) * | 1995-04-19 | 1997-01-14 | Memc Electronic Materials, Inc. | Method for cleaning semiconductor wafers with sonic energy and passing through a gas-liquid-interface |
JP3658454B2 (ja) * | 1996-03-29 | 2005-06-08 | コマツ電子金属株式会社 | 半導体ウェハの製造方法 |
-
1996
- 1996-09-04 US US08/711,671 patent/US5950643A/en not_active Expired - Lifetime
- 1996-09-05 AT AT96114218T patent/ATE175520T1/de not_active IP Right Cessation
- 1996-09-05 DE DE69601292T patent/DE69601292T2/de not_active Expired - Fee Related
- 1996-09-05 EP EP96114218A patent/EP0762483B1/de not_active Expired - Lifetime
- 1996-09-06 KR KR1019960038628A patent/KR100230625B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR100230625B1 (ko) | 1999-11-15 |
ATE175520T1 (de) | 1999-01-15 |
KR970018169A (ko) | 1997-04-30 |
DE69601292T2 (de) | 1999-08-26 |
US5950643A (en) | 1999-09-14 |
EP0762483A1 (de) | 1997-03-12 |
EP0762483B1 (de) | 1999-01-07 |
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