DE69422349T2 - Dynamische Direktzugriffspeicher-Anordnung für schnellen sequentiellen Zugriff, mit Leseverstärkern, die unabhängig vom Zeilen-Adresspuffer sind und als Cache-Speicher dienen - Google Patents

Dynamische Direktzugriffspeicher-Anordnung für schnellen sequentiellen Zugriff, mit Leseverstärkern, die unabhängig vom Zeilen-Adresspuffer sind und als Cache-Speicher dienen

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Publication number
DE69422349T2
DE69422349T2 DE69422349T DE69422349T DE69422349T2 DE 69422349 T2 DE69422349 T2 DE 69422349T2 DE 69422349 T DE69422349 T DE 69422349T DE 69422349 T DE69422349 T DE 69422349T DE 69422349 T2 DE69422349 T2 DE 69422349T2
Authority
DE
Germany
Prior art keywords
serve
independent
dynamic random
row address
sense amplifiers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69422349T
Other languages
English (en)
Other versions
DE69422349D1 (de
Inventor
Sachiko Kamisaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micron Memory Japan Ltd
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Application granted granted Critical
Publication of DE69422349D1 publication Critical patent/DE69422349D1/de
Publication of DE69422349T2 publication Critical patent/DE69422349T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4096Input/output [I/O] data management or control circuits, e.g. reading or writing circuits, I/O drivers or bit-line switches 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408Address circuits
    • G11C11/4082Address Buffers; level conversion circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4091Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
DE69422349T 1993-08-18 1994-08-18 Dynamische Direktzugriffspeicher-Anordnung für schnellen sequentiellen Zugriff, mit Leseverstärkern, die unabhängig vom Zeilen-Adresspuffer sind und als Cache-Speicher dienen Expired - Lifetime DE69422349T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5225185A JP2894170B2 (ja) 1993-08-18 1993-08-18 メモリ装置

Publications (2)

Publication Number Publication Date
DE69422349D1 DE69422349D1 (de) 2000-02-03
DE69422349T2 true DE69422349T2 (de) 2000-08-24

Family

ID=16825300

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69422349T Expired - Lifetime DE69422349T2 (de) 1993-08-18 1994-08-18 Dynamische Direktzugriffspeicher-Anordnung für schnellen sequentiellen Zugriff, mit Leseverstärkern, die unabhängig vom Zeilen-Adresspuffer sind und als Cache-Speicher dienen

Country Status (5)

Country Link
US (1) US5528552A (de)
EP (1) EP0639835B1 (de)
JP (1) JP2894170B2 (de)
KR (1) KR0168464B1 (de)
DE (1) DE69422349T2 (de)

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US5787267A (en) * 1995-06-07 1998-07-28 Monolithic System Technology, Inc. Caching method and circuit for a memory system with circuit module architecture
JP3252666B2 (ja) * 1995-08-14 2002-02-04 日本電気株式会社 半導体記憶装置
US5625790A (en) * 1995-09-14 1997-04-29 Micron Technology, Inc. Method and apparatus for reducing the access time of a memory device by decoding a row address during a precharge period of the memory device
US5654932A (en) * 1995-10-04 1997-08-05 Cirrus Logic, Inc. Memory devices with selectable access type and methods using the same
JP3169814B2 (ja) * 1995-10-13 2001-05-28 日本電気株式会社 半導体記憶装置
KR0172345B1 (ko) * 1995-11-27 1999-03-30 김광호 반도체 메모리 장치의 하이퍼 페이지 모드의 데이터 출력신호 제어회로
US5636174A (en) * 1996-01-11 1997-06-03 Cirrus Logic, Inc. Fast cycle time-low latency dynamic random access memories and systems and methods using the same
JP3531891B2 (ja) * 1996-01-26 2004-05-31 シャープ株式会社 半導体記憶装置
JP3184085B2 (ja) * 1996-03-01 2001-07-09 株式会社東芝 半導体記憶装置
US6094398A (en) * 1996-09-30 2000-07-25 Siemens Aktiengesellschaft DRAM including an address space divided into individual blocks having memory cells activated by row address signals
CN1158663C (zh) * 1996-09-30 2004-07-21 西门子公司 动态随机存储器
US6167486A (en) 1996-11-18 2000-12-26 Nec Electronics, Inc. Parallel access virtual channel memory system with cacheable channels
US5825710A (en) * 1997-02-26 1998-10-20 Powerchip Semiconductor Corp. Synchronous semiconductor memory device
US5881016A (en) * 1997-06-13 1999-03-09 Cirrus Logic, Inc. Method and apparatus for optimizing power consumption and memory bandwidth in a video controller using SGRAM and SDRAM power reduction modes
KR100300035B1 (ko) * 1998-02-07 2001-09-06 김영환 전하재활용센스앰프
KR100273293B1 (ko) * 1998-05-13 2001-01-15 김영환 리던던트 워드라인의 리프레쉬 구조
JP3786521B2 (ja) 1998-07-01 2006-06-14 株式会社日立製作所 半導体集積回路及びデータ処理システム
US6072746A (en) 1998-08-14 2000-06-06 International Business Machines Corporation Self-timed address decoder for register file and compare circuit of a multi-port CAM
US6708254B2 (en) 1999-11-10 2004-03-16 Nec Electronics America, Inc. Parallel access virtual channel memory system
JP4400999B2 (ja) * 2000-06-29 2010-01-20 株式会社ルネサステクノロジ 半導体記憶装置
US20020147884A1 (en) * 2001-04-05 2002-10-10 Michael Peters Method and circuit for increasing the memory access speed of an enhanced synchronous SDRAM
KR100401508B1 (ko) * 2001-05-25 2003-10-17 주식회사 하이닉스반도체 램버스 디램의 뱅크 제어회로
JP4544808B2 (ja) * 2002-04-09 2010-09-15 富士通セミコンダクター株式会社 半導体記憶装置の制御方法、および半導体記憶装置
JP2004171678A (ja) * 2002-11-20 2004-06-17 Sony Corp 情報記憶装置、情報記憶方法、及び情報記憶プログラム
WO2005004164A1 (ja) * 2003-06-30 2005-01-13 Fujitsu Limited 半導体記憶装置
US7215595B2 (en) * 2003-11-26 2007-05-08 Infineon Technologies Ag Memory device and method using a sense amplifier as a cache
KR100665408B1 (ko) * 2004-11-08 2007-01-04 주식회사 하이닉스반도체 반도체 메모리 장치의 차동 증폭기 제어회로
JP4299848B2 (ja) * 2006-08-09 2009-07-22 エルピーダメモリ株式会社 半導体記憶装置
KR20120005826A (ko) * 2010-07-09 2012-01-17 주식회사 하이닉스반도체 반도체 메모리 장치 및 이의 동작 방법
US9190147B2 (en) * 2013-02-06 2015-11-17 Kabushiki Kaisha Toshiba Resistance changing memory with a first driver closer than a second driver
KR102161278B1 (ko) * 2013-08-07 2020-09-29 에스케이하이닉스 주식회사 액티브 제어 장치 및 이를 포함하는 반도체 장치
US9135982B2 (en) * 2013-12-18 2015-09-15 Intel Corporation Techniques for accessing a dynamic random access memory array
DE102019128331A1 (de) 2019-08-29 2021-03-04 Taiwan Semiconductor Manufacturing Co., Ltd. Gemeinsam genutzter decodiererschaltkreis und verfahren
CN112447218A (zh) * 2019-08-29 2021-03-05 台湾积体电路制造股份有限公司 存储器电路和方法

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JPH0736269B2 (ja) * 1985-08-30 1995-04-19 株式会社日立製作所 半導体記憶装置
US5127739A (en) * 1987-04-27 1992-07-07 Texas Instruments Incorporated CMOS sense amplifier with bit line isolation
JP2714944B2 (ja) * 1987-08-05 1998-02-16 三菱電機株式会社 半導体記憶装置
JPH0697560B2 (ja) * 1987-11-19 1994-11-30 三菱電機株式会社 半導体記憶装置
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JP2962080B2 (ja) * 1991-12-27 1999-10-12 日本電気株式会社 ランダムアクセスメモリ
JPH06267275A (ja) * 1993-03-10 1994-09-22 Fujitsu Ltd センスアンプ制御回路及びセンスアンプ制御方法

Also Published As

Publication number Publication date
KR0168464B1 (ko) 1999-02-01
JP2894170B2 (ja) 1999-05-24
JPH0757457A (ja) 1995-03-03
KR950006608A (ko) 1995-03-21
DE69422349D1 (de) 2000-02-03
EP0639835A2 (de) 1995-02-22
EP0639835B1 (de) 1999-12-29
US5528552A (en) 1996-06-18
EP0639835A3 (de) 1996-11-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NEC CORP., TOKIO/TOKYO, JP

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP

8327 Change in the person/name/address of the patent owner

Owner name: ELPIDA MEMORY, INC., TOKYO, JP