DE69625038T2 - Dynamischer Direktzugriffsspeicher - Google Patents
Dynamischer DirektzugriffsspeicherInfo
- Publication number
- DE69625038T2 DE69625038T2 DE69625038T DE69625038T DE69625038T2 DE 69625038 T2 DE69625038 T2 DE 69625038T2 DE 69625038 T DE69625038 T DE 69625038T DE 69625038 T DE69625038 T DE 69625038T DE 69625038 T2 DE69625038 T2 DE 69625038T2
- Authority
- DE
- Germany
- Prior art keywords
- random access
- access memory
- dynamic random
- dynamic
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4094—Bit-line management or control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/409—Read-write [R-W] circuits
- G11C11/4091—Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/002—Isolation gates, i.e. gates coupling bit lines to the sense amplifier
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/005—Transfer gates, i.e. gates coupling the sense amplifier output to data lines, I/O lines or global bit lines
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/535,704 US5561630A (en) | 1995-09-28 | 1995-09-28 | Data sense circuit for dynamic random access memories |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69625038D1 DE69625038D1 (de) | 2003-01-09 |
DE69625038T2 true DE69625038T2 (de) | 2003-07-10 |
Family
ID=24135419
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69625038T Expired - Fee Related DE69625038T2 (de) | 1995-09-28 | 1996-09-06 | Dynamischer Direktzugriffsspeicher |
Country Status (6)
Country | Link |
---|---|
US (1) | US5561630A (de) |
EP (1) | EP0793237B1 (de) |
JP (1) | JP3798477B2 (de) |
KR (1) | KR100225245B1 (de) |
DE (1) | DE69625038T2 (de) |
TW (1) | TW286378B (de) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1994003901A1 (en) | 1992-08-10 | 1994-02-17 | Monolithic System Technology, Inc. | Fault-tolerant, high-speed bus system and bus interface for wafer-scale integration |
KR100271626B1 (ko) * | 1997-05-31 | 2000-12-01 | 김영환 | 비트라인 센스앰프의 오버드라이빙방법 |
KR100297708B1 (ko) * | 1997-11-17 | 2001-08-07 | 윤종용 | 클락동기프리차아지데이터입출력선을가지는반도체메모리장치및이를이용한데이터입출력선프리차아지방법 |
US6154386A (en) * | 1998-06-16 | 2000-11-28 | G-Link Technology | Memory device having a wide data path |
KR100297727B1 (ko) * | 1998-08-13 | 2001-09-26 | 윤종용 | 분리 제어라인의 큰 부하에 의한 스피드 손실을 방지할 수 있는반도체 메모리 장치 |
US6275435B1 (en) | 1999-03-31 | 2001-08-14 | Vanguard International Semiconductor Corp. | Bi-directional sense amplifier stage for memory datapath |
US6134164A (en) * | 1999-04-22 | 2000-10-17 | International Business Machines Corp. | Sensing circuit for a memory cell array |
US6466499B1 (en) | 2000-07-11 | 2002-10-15 | Micron Technology, Inc. | DRAM sense amplifier having pre-charged transistor body nodes |
US6836427B2 (en) * | 2002-06-05 | 2004-12-28 | Micron Technology, Inc. | System and method to counteract voltage disturbances in open digitline array dynamic random access memory systems |
US6721220B2 (en) * | 2002-07-05 | 2004-04-13 | T-Ram, Inc. | Bit line control and sense amplification for TCCT-based memory cells |
US8391094B2 (en) | 2009-02-10 | 2013-03-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory circuits, systems, and operating methods thereof |
US8279686B2 (en) * | 2009-02-10 | 2012-10-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Memory circuits, systems, and methods for providing bit line equalization voltages |
US10762953B2 (en) | 2018-12-13 | 2020-09-01 | International Business Machines Corporation | Memory array with reduced circuitry |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57198592A (en) * | 1981-05-29 | 1982-12-06 | Hitachi Ltd | Semiconductor memory device |
US4636987A (en) * | 1984-08-29 | 1987-01-13 | Texas Instruments | Semiconductor dynamic memory device with multiplexed sense amplifier and write-activated active loads |
JPH07118193B2 (ja) * | 1986-09-18 | 1995-12-18 | 富士通株式会社 | 半導体記憶装置 |
JPS63257994A (ja) * | 1987-04-15 | 1988-10-25 | Nec Corp | 半導体記憶装置 |
JPH07109702B2 (ja) * | 1988-09-12 | 1995-11-22 | 株式会社東芝 | ダイナミック型メモリ |
JPH02156497A (ja) * | 1988-12-07 | 1990-06-15 | Mitsubishi Electric Corp | 半導体記憶装置 |
JPH0713863B2 (ja) * | 1989-07-20 | 1995-02-15 | 株式会社東芝 | ダイナミック型ランダムアクセスメモリ |
JP2742719B2 (ja) * | 1990-02-16 | 1998-04-22 | 三菱電機株式会社 | 半導体記憶装置 |
JPH04186593A (ja) * | 1990-11-21 | 1992-07-03 | Mitsubishi Electric Corp | 半導体記憶装置 |
US5305266A (en) * | 1991-03-22 | 1994-04-19 | Texas Instruments Incorporated | High speed parallel test architecture |
KR940008296B1 (ko) * | 1991-06-19 | 1994-09-10 | 삼성전자 주식회사 | 고속 센싱동작을 수행하는 센스앰프 |
JPH0729373A (ja) * | 1993-07-08 | 1995-01-31 | Mitsubishi Electric Corp | 半導体記憶装置 |
-
1995
- 1995-09-28 US US08/535,704 patent/US5561630A/en not_active Expired - Lifetime
-
1996
- 1996-01-22 TW TW085100705A patent/TW286378B/zh not_active IP Right Cessation
- 1996-08-12 KR KR1019960033421A patent/KR100225245B1/ko not_active IP Right Cessation
- 1996-09-06 DE DE69625038T patent/DE69625038T2/de not_active Expired - Fee Related
- 1996-09-06 EP EP96306481A patent/EP0793237B1/de not_active Expired - Lifetime
- 1996-09-17 JP JP24436196A patent/JP3798477B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US5561630A (en) | 1996-10-01 |
KR100225245B1 (ko) | 1999-10-15 |
EP0793237A2 (de) | 1997-09-03 |
JP3798477B2 (ja) | 2006-07-19 |
EP0793237A3 (de) | 1998-05-27 |
TW286378B (en) | 1996-09-21 |
DE69625038D1 (de) | 2003-01-09 |
JPH09106683A (ja) | 1997-04-22 |
EP0793237B1 (de) | 2002-11-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |