DE60309892D1 - Trägersystem und prüfverfahren - Google Patents

Trägersystem und prüfverfahren

Info

Publication number
DE60309892D1
DE60309892D1 DE60309892T DE60309892T DE60309892D1 DE 60309892 D1 DE60309892 D1 DE 60309892D1 DE 60309892 T DE60309892 T DE 60309892T DE 60309892 T DE60309892 T DE 60309892T DE 60309892 D1 DE60309892 D1 DE 60309892D1
Authority
DE
Germany
Prior art keywords
stage
driving mechanism
elevating
test procedure
carrier system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60309892T
Other languages
English (en)
Other versions
DE60309892T2 (de
Inventor
Haruhiko Yoshioka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of DE60309892D1 publication Critical patent/DE60309892D1/de
Application granted granted Critical
Publication of DE60309892T2 publication Critical patent/DE60309892T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • General Electrical Machinery Utilizing Piezoelectricity, Electrostriction Or Magnetostriction (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
  • Liquid Crystal Substances (AREA)
DE60309892T 2002-08-07 2003-08-04 Trägersystem und prüfverfahren Expired - Lifetime DE60309892T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002230563 2002-08-07
JP2002230563A JP4300003B2 (ja) 2002-08-07 2002-08-07 載置台の駆動装置及びプローブ方法
PCT/JP2003/009879 WO2004015434A1 (ja) 2002-08-07 2003-08-04 載置台駆動装置及びプローブ方法

Publications (2)

Publication Number Publication Date
DE60309892D1 true DE60309892D1 (de) 2007-01-04
DE60309892T2 DE60309892T2 (de) 2007-06-21

Family

ID=31711688

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60309892T Expired - Lifetime DE60309892T2 (de) 2002-08-07 2003-08-04 Trägersystem und prüfverfahren

Country Status (9)

Country Link
US (1) US7106082B2 (de)
EP (1) EP1538452B1 (de)
JP (1) JP4300003B2 (de)
KR (1) KR100724169B1 (de)
CN (1) CN100397091C (de)
AT (1) ATE346311T1 (de)
DE (1) DE60309892T2 (de)
TW (1) TW200406865A (de)
WO (1) WO2004015434A1 (de)

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US7622847B2 (en) * 2004-05-20 2009-11-24 Japan Science And Technology Agency Method and device for precisely resisting and moving high load
KR100679317B1 (ko) 2004-09-01 2007-02-07 노우철 엘씨디구동 아이씨의 검사 보조장치
CN100360943C (zh) * 2004-11-29 2008-01-09 华硕电脑股份有限公司 具有防止压力过大的测试装置
JP4489639B2 (ja) * 2005-05-31 2010-06-23 住友重機械工業株式会社 Ｚ軸調整機構及び微動ステージ装置
JP2007147536A (ja) * 2005-11-30 2007-06-14 Tokyo Electron Ltd プローブカード移載補助装置及び検査設備
JP4878918B2 (ja) * 2006-05-30 2012-02-15 株式会社東京精密 プローバ及びプロービング方法
JP4965273B2 (ja) * 2007-02-02 2012-07-04 東京エレクトロン株式会社 載置装置
KR100807090B1 (ko) * 2007-03-28 2008-02-26 에스엔유 프리시젼 주식회사 기판 지지장치와 이를 이용한 엘씨디 셀의 씰패턴 검사장치
JP4999615B2 (ja) * 2007-08-31 2012-08-15 東京エレクトロン株式会社 検査装置及び検査方法
KR100936631B1 (ko) * 2007-11-22 2010-01-14 주식회사 쎄믹스 웨이퍼 프로버의 ｚ축 위치 제어 장치 및 방법
CA2646020C (en) * 2007-12-05 2011-06-07 Sumitomo Metal Industries, Ltd. Method for producing ultra thin wall metallic tube by cold rolling method
US8819743B2 (en) 2007-12-19 2014-08-26 Dish Network L.L.C. Transfer of data related to broadcast programming over a communication network
JP2009164298A (ja) * 2007-12-28 2009-07-23 Tokyo Electron Ltd 載置体の傾斜調整装置及びプローブ装置
CN101303532B (zh) * 2008-06-10 2010-06-09 上海微电子装备有限公司 可切换工位的六自由度精密定位台
US8907862B2 (en) 2011-04-12 2014-12-09 Dish Network L.L.C. Apparatus and systems for mounting an electrical switching device
US9337545B2 (en) 2008-06-20 2016-05-10 Dish Network L.L.C. Apparatus and systems for mounting an electrical switching device
WO2009157037A1 (ja) * 2008-06-24 2009-12-30 アキム株式会社 電子部品検査装置、電子部品検査システム
JP5406480B2 (ja) * 2008-08-08 2014-02-05 東京エレクトロン株式会社 プローブ方法及びプローブ用プログラム
CN101665923A (zh) * 2008-09-04 2010-03-10 东京毅力科创株式会社 成膜装置、基板处理装置及成膜方法
JP5280964B2 (ja) * 2008-09-04 2013-09-04 東京エレクトロン株式会社 成膜装置、基板処理装置、成膜方法及び記憶媒体
JP5289898B2 (ja) * 2008-11-07 2013-09-11 住友重機械工業株式会社 ステージ装置及びプローバ装置
CN101762755B (zh) * 2008-12-24 2012-03-21 深圳麦逊电子有限公司 高密度pcb测试机及其测试方法
KR101583000B1 (ko) * 2009-03-09 2016-01-19 삼성전자주식회사 반도체 디바이스 테스트 장치 및 방법
TWI384227B (zh) * 2009-09-01 2013-02-01 Advanced Semiconductor Eng 主動式非接觸之探針卡
JP5384270B2 (ja) * 2009-09-21 2014-01-08 東京エレクトロン株式会社 ローダ
US8462075B2 (en) * 2010-02-23 2013-06-11 Dish Network L.L.C. Apparatus for mounting an object to a railing
WO2011138938A1 (ja) * 2010-05-07 2011-11-10 Ｎｓｋテクノロジー株式会社 支持装置及び露光装置
JP5517350B2 (ja) * 2010-06-15 2014-06-11 東京エレクトロン株式会社 載置台駆動装置
KR101052506B1 (ko) * 2010-06-16 2011-07-29 주식회사 이노비즈 엘이디 검사장치 및 이를 이용한 엘이디 검사방법
JP5826466B2 (ja) * 2010-06-25 2015-12-02 東京エレクトロン株式会社 プローブカードの平行調整機構及び検査装置
US8646186B2 (en) 2010-12-16 2014-02-11 Dish Network L.L.C. Multi-angle levels and plumbing methods
US8802985B2 (en) 2011-09-07 2014-08-12 Dish Network L.L.C. In-wall extension apparatus
JP6040530B2 (ja) * 2012-01-17 2016-12-07 セイコーエプソン株式会社 ハンドラーおよび検査装置
US9123987B2 (en) 2012-07-31 2015-09-01 Dish Network L.L.C. Antenna mounting systems and methods
CN102944791A (zh) * 2012-11-15 2013-02-27 昆山迈致治具科技有限公司 具有自动标记功能的测试治具
JP5978992B2 (ja) * 2012-12-28 2016-08-24 株式会社ソシオネクスト 電子デバイス用試験装置及び試験方法
TW201334095A (zh) * 2013-04-18 2013-08-16 Hauman Technologies Corp 具三向運動之點測裝置
JP6293499B2 (ja) * 2014-01-27 2018-03-14 株式会社日立ハイテクノロジーズ 真空処理装置
CN103941117B (zh) * 2014-03-14 2016-04-06 上海交通大学 电输运特性测量装置及测量方法
EP2927948A1 (de) * 2014-04-04 2015-10-07 Nordson Corporation Röntgeninspektionsvorrichtung zum Prüfen von Halbleiter-Wafern
KR101611922B1 (ko) * 2014-05-12 2016-04-14 참엔지니어링(주) 기판 검사 장치 및 기판 검사 방법
CN105181157B (zh) * 2014-06-20 2017-07-28 沈阳芯源微电子设备有限公司 一种测温晶圆微调装置
TWI573700B (zh) * 2015-02-13 2017-03-11 rong-gui Deng Assembly equipment for loading equipment and its applications
JP6437884B2 (ja) * 2015-06-03 2018-12-12 旭化成エンジニアリング株式会社 平面移動装置
JP6652361B2 (ja) * 2015-09-30 2020-02-19 東京エレクトロン株式会社 ウエハ検査装置及びウエハ検査方法
KR102534364B1 (ko) * 2015-12-02 2023-05-18 세메스 주식회사 프로브 장치 및 상기 프로브 장치의 영점 설정 방법
TWI595865B (zh) * 2016-08-23 2017-08-21 Hiwin Tech Corp Equipped with a linear drive system inside the prosthesis
KR20190052533A (ko) 2017-11-08 2019-05-16 삼성전자주식회사 기판 지지 및 이송 장치, 기판 지지 및 이송 방법 및 이를 이용한 표시 장치의 제조 방법
US10510573B2 (en) * 2017-11-14 2019-12-17 Taiwan Semiconductor Manufacturing Co., Ltd. Loading apparatus and operating method thereof
KR102142881B1 (ko) 2018-01-19 2020-08-10 주식회사 쎄믹스 웨이퍼 프로버
CN108646395A (zh) * 2018-05-04 2018-10-12 江苏羿骏自动化科技有限公司 一种多工位移动型显微镜检测设备
TWI676031B (zh) * 2018-09-06 2019-11-01 致茂電子股份有限公司 滑移式電子元件測試裝置
US20210139314A1 (en) * 2019-11-07 2021-05-13 Innovative Interface Laboratory Corp. Linear actuator
CN110919697B (zh) * 2019-12-10 2024-09-20 江苏敦邦钢结构工程有限公司 一种装配式钢结构建筑用钢板切割纠偏装置
CN111208058B (zh) * 2020-03-05 2024-09-13 中华人民共和国吴江海关 蓄电池电解液保持能力检测装置及方法
JP2022079225A (ja) * 2020-11-16 2022-05-26 東京エレクトロン株式会社 基板保持機構、基板載置方法及び基板離脱方法
CN112763950A (zh) * 2020-12-22 2021-05-07 扬州京柏自动化科技有限公司 一种磁路测试装置
CN112873137B (zh) * 2020-12-29 2022-11-04 北京半导体专用设备研究所（中国电子科技集团公司第四十五研究所） 一种剥离工作台
CN112873227B (zh) * 2021-01-20 2022-11-15 北京半导体专用设备研究所（中国电子科技集团公司第四十五研究所） 搬运机械手及叠压装置
CN114720371B (zh) * 2022-04-12 2023-01-06 广东雷诺精密科技有限公司 一种表盘石仔粘接质量测试装置及测试方法
CN117583657B (zh) * 2024-01-19 2024-03-26 无锡七机机床有限公司 一种高精密刨削减薄机床调整装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100248569B1 (ko) * 1993-12-22 2000-03-15 히가시 데쓰로 프로우브장치
JP3094056B2 (ja) * 1994-05-24 2000-10-03 東京エレクトロン株式会社 プローブ装置
JPH09330960A (ja) * 1996-06-08 1997-12-22 Tokyo Electron Ltd 検査装置
JPH11111787A (ja) * 1997-10-03 1999-04-23 Eejingu Tesuta Kaihatsu Kyodo Kumiai ウエハ用検査装置
JPH11251379A (ja) * 1998-02-27 1999-09-17 Toshiba Microelectronics Corp ウエハプロービング装置
JP2000260852A (ja) * 1999-03-11 2000-09-22 Tokyo Electron Ltd 検査ステージ及び検査装置
JP2001358204A (ja) * 2000-06-15 2001-12-26 Tokyo Electron Ltd 検査ステージ
JP4659328B2 (ja) * 2002-10-21 2011-03-30 東京エレクトロン株式会社 被検査体を温度制御するプローブ装置

Also Published As

Publication number Publication date
EP1538452A1 (de) 2005-06-08
TWI302010B (de) 2008-10-11
KR20050004293A (ko) 2005-01-12
US20050127898A1 (en) 2005-06-16
CN100397091C (zh) 2008-06-25
JP2004071909A (ja) 2004-03-04
CN1662821A (zh) 2005-08-31
TW200406865A (en) 2004-05-01
JP4300003B2 (ja) 2009-07-22
DE60309892T2 (de) 2007-06-21
WO2004015434A1 (ja) 2004-02-19
EP1538452A4 (de) 2005-10-26
ATE346311T1 (de) 2006-12-15
KR100724169B1 (ko) 2007-05-31
US7106082B2 (en) 2006-09-12
EP1538452B1 (de) 2006-11-22

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Legal Events

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