DE602004020452D1 - Halbleiterbauelement und strahlungsdetektor damit - Google Patents

Halbleiterbauelement und strahlungsdetektor damit

Info

Publication number
DE602004020452D1
DE602004020452D1 DE602004020452T DE602004020452T DE602004020452D1 DE 602004020452 D1 DE602004020452 D1 DE 602004020452D1 DE 602004020452 T DE602004020452 T DE 602004020452T DE 602004020452 T DE602004020452 T DE 602004020452T DE 602004020452 D1 DE602004020452 D1 DE 602004020452D1
Authority
DE
Germany
Prior art keywords
semiconductor element
radiation detector
therewith
detector therewith
radiation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004020452T
Other languages
English (en)
Inventor
Katsumi Shibayama
Yutaka Kusuyama
Masahiro Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of DE602004020452D1 publication Critical patent/DE602004020452D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0017Etching of the substrate by chemical or physical means
    • H05K3/002Etching of the substrate by chemical or physical means by liquid chemical etching
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/13Mountings, e.g. non-detachable insulating substrates characterised by the shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14634Assemblies, i.e. Hybrid structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14643Photodiode arrays; MOS imagers
    • H01L27/14658X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14661X-ray, gamma-ray or corpuscular radiation imagers of the hybrid type
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14643Photodiode arrays; MOS imagers
    • H01L27/14658X-ray, gamma-ray or corpuscular radiation imagers
    • H01L27/14663Indirect radiation imagers, e.g. using luminescent members
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/16235Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a via metallisation of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/16237Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bonding area disposed in a recess of the surface of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/0102Calcium [Ca]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01046Palladium [Pd]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/049Nitrides composed of metals from groups of the periodic table
    • H01L2924/04944th Group
    • H01L2924/04941TiN
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12044OLED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/15165Monolayer substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15312Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a pin array, e.g. PGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/0306Inorganic insulating substrates, e.g. ceramic, glass
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/09Shape and layout
    • H05K2201/09818Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
    • H05K2201/09827Tapered, e.g. tapered hole, via or groove
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/02Details related to mechanical or acoustic processing, e.g. drilling, punching, cutting, using ultrasound
    • H05K2203/0235Laminating followed by cutting or slicing perpendicular to plane of the laminate; Embedding wires in an object and cutting or slicing the object perpendicular to direction of the wires
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components
    • H05K3/3436Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)
  • Wire Bonding (AREA)
DE602004020452T 2003-02-24 2004-02-24 Halbleiterbauelement und strahlungsdetektor damit Expired - Lifetime DE602004020452D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003046141A JP4138529B2 (ja) 2003-02-24 2003-02-24 半導体装置、及びそれを用いた放射線検出器
PCT/JP2004/002132 WO2004075281A1 (ja) 2003-02-24 2004-02-24 半導体装置、及びそれを用いた放射線検出器

Publications (1)

Publication Number Publication Date
DE602004020452D1 true DE602004020452D1 (de) 2009-05-20

Family

ID=32905541

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004020452T Expired - Lifetime DE602004020452D1 (de) 2003-02-24 2004-02-24 Halbleiterbauelement und strahlungsdetektor damit

Country Status (9)

Country Link
US (1) US7545044B2 (de)
EP (1) EP1598862B1 (de)
JP (1) JP4138529B2 (de)
KR (1) KR100997035B1 (de)
CN (1) CN100383942C (de)
DE (1) DE602004020452D1 (de)
IL (1) IL170456A (de)
TW (1) TW200428546A (de)
WO (1) WO2004075281A1 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6180426B1 (en) 1999-03-01 2001-01-30 Mou-Shiung Lin High performance sub-system design and assembly
TWI313507B (en) 2002-10-25 2009-08-11 Megica Corporatio Method for assembling chips
TW544882B (en) 2001-12-31 2003-08-01 Megic Corp Chip package structure and process thereof
TW503496B (en) 2001-12-31 2002-09-21 Megic Corp Chip packaging structure and manufacturing process of the same
US6673698B1 (en) 2002-01-19 2004-01-06 Megic Corporation Thin film semiconductor package utilizing a glass substrate with composite polymer/metal interconnect layers
TW584950B (en) * 2001-12-31 2004-04-21 Megic Corp Chip packaging structure and process thereof
JP4133429B2 (ja) 2003-02-24 2008-08-13 浜松ホトニクス株式会社 半導体装置
JP4364514B2 (ja) * 2003-01-08 2009-11-18 浜松ホトニクス株式会社 配線基板、及びそれを用いた放射線検出器
JP4379295B2 (ja) 2004-10-26 2009-12-09 ソニー株式会社 半導体イメージセンサー・モジュール及びその製造方法
TWI269420B (en) 2005-05-03 2006-12-21 Megica Corp Stacked chip package and process thereof
JP4916241B2 (ja) * 2006-07-28 2012-04-11 パナソニック株式会社 半導体装置及びその製造方法
SG166773A1 (en) * 2007-04-24 2010-12-29 United Test & Assembly Ct Lt Bump on via-packaging and methodologies
JP5032276B2 (ja) * 2007-11-19 2012-09-26 株式会社東芝 放射線検出装置
JPWO2010058503A1 (ja) * 2008-11-21 2012-04-19 パナソニック株式会社 半導体装置およびその製造方法
US20190157218A1 (en) * 2010-07-02 2019-05-23 Schott Ag Interposer and method for producing holes in an interposer
DE102010025966B4 (de) 2010-07-02 2012-03-08 Schott Ag Interposer und Verfahren zum Herstellen von Löchern in einem Interposer
FR2970598B1 (fr) * 2011-01-17 2013-08-16 Commissariat Energie Atomique Dispositif imageur a grande gamme dynamique
US20150268739A1 (en) * 2014-03-21 2015-09-24 Dell Products L.P. Projected Information Handling System Input Environment with Object Initiated Responses
JP6528376B2 (ja) * 2014-08-27 2019-06-12 富士通株式会社 撮像装置及びその製造方法
JP6478538B2 (ja) * 2014-09-10 2019-03-06 キヤノン株式会社 放射線撮像装置および放射線撮像システム
US9997554B2 (en) * 2014-12-24 2018-06-12 Stmicroelectronics Pte Ltd Chip scale package camera module with glass interposer having lateral conductive traces between a first and second glass layer and method for making the same
US9871073B1 (en) * 2016-11-22 2018-01-16 General Electric Company Scintillator sealing for solid state X-ray detector
TWI785052B (zh) * 2017-06-01 2022-12-01 美商康寧公司 包括穿透孔洞貫孔的組件基板及其製作方法
WO2019021705A1 (ja) * 2017-07-25 2019-01-31 ソニーセミコンダクタソリューションズ株式会社 固体撮像装置
WO2019025583A1 (en) * 2017-08-04 2019-02-07 Basell Poliolefine Italia S.R.L. BUTENE-1 POLYMER COMPOSITION WITH HIGH FLUIDITY INDEX
JP6747487B2 (ja) * 2018-10-26 2020-08-26 大日本印刷株式会社 放射線検出装置
JP7207192B2 (ja) * 2019-06-19 2023-01-18 Tdk株式会社 センサー用パッケージ基板及びこれを備えるセンサーモジュール、並びに、センサー用パッケージ基板の製造方法

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4153988A (en) * 1977-07-15 1979-05-15 International Business Machines Corporation High performance integrated circuit semiconductor package and method of making
JP2555720B2 (ja) 1988-12-19 1996-11-20 富士通株式会社 半田バンプ部品の実装方法
JPH0351477U (de) * 1989-09-26 1991-05-20
JPH03203341A (ja) 1989-12-29 1991-09-05 Hoya Corp 微小電極を有する基板およびその製造方法
JP2828116B2 (ja) * 1990-05-30 1998-11-25 オリンパス光学工業株式会社 固体撮像装置
US5699610A (en) * 1994-04-22 1997-12-23 Nec Corporation Process for connecting electronic devices
JPH07333348A (ja) 1994-06-03 1995-12-22 Toshiba Corp 放射線検出器およびこれを用いたx線ct装置
JPH08330469A (ja) 1995-05-30 1996-12-13 Hitachi Ltd 半導体装置用配線基板およびその製造方法
JPH0945805A (ja) * 1995-07-31 1997-02-14 Fujitsu Ltd 配線基板、半導体装置及び半導体装置を配線基板から取り外す方法並びに半導体装置の製造方法
JPH10275984A (ja) 1997-03-28 1998-10-13 Ibiden Co Ltd 多層プリント配線板
JPH11121648A (ja) * 1997-10-20 1999-04-30 Fuji Xerox Co Ltd 電子部品実装体およびこれを構成する基板
US6114240A (en) * 1997-12-18 2000-09-05 Micron Technology, Inc. Method for fabricating semiconductor components using focused laser beam
US5962922A (en) * 1998-03-18 1999-10-05 Wang; Bily Cavity grid array integrated circuit package
JP3582825B2 (ja) 1998-12-14 2004-10-27 浜松ホトニクス株式会社 光学素子及びこれを用いた放射線検出器
JP2001007468A (ja) * 1999-06-24 2001-01-12 Nec Kansai Ltd 配線基板,多層配線基板およびその製造方法
US6625036B1 (en) * 1999-08-31 2003-09-23 Rohm Co., Ltd. Infrared data communication module and method of making the same
JP2001099941A (ja) * 1999-09-30 2001-04-13 Hitachi Metals Ltd 放射線遮蔽板、放射線検出器及び放射線遮蔽板の製造方法
US6396898B1 (en) * 1999-12-24 2002-05-28 Kabushiki Kaisha Toshiba Radiation detector and x-ray CT apparatus
GB2364791B (en) 2000-07-14 2004-12-29 Evan Arkas Optical channel plates
US6800857B2 (en) * 2000-08-10 2004-10-05 Canon Kabushiki Kaisha Large-area fiber plate, radiation image pickup apparatus utilizing the same and producing method therefor
JP3785032B2 (ja) * 2000-08-22 2006-06-14 日本特殊陶業株式会社 プリント配線基板におけるスルーホール構造及びその製造方法
JP4092890B2 (ja) * 2001-05-31 2008-05-28 株式会社日立製作所 マルチチップモジュール
JPWO2003007370A1 (ja) * 2001-07-12 2004-11-04 株式会社日立製作所 配線ガラス基板およびその製造方法ならびに配線ガラス基板に用いられる導電性ペーストおよび半導体モジュールならびに配線基板および導体形成方法
US6510195B1 (en) 2001-07-18 2003-01-21 Koninklijke Philips Electronics, N.V. Solid state x-radiation detector modules and mosaics thereof, and an imaging method and apparatus employing the same
JP4237966B2 (ja) 2002-03-08 2009-03-11 浜松ホトニクス株式会社 検出器
JP4133429B2 (ja) * 2003-02-24 2008-08-13 浜松ホトニクス株式会社 半導体装置
JP4364514B2 (ja) 2003-01-08 2009-11-18 浜松ホトニクス株式会社 配線基板、及びそれを用いた放射線検出器
JP4365108B2 (ja) 2003-01-08 2009-11-18 浜松ホトニクス株式会社 配線基板、及びそれを用いた放射線検出器

Also Published As

Publication number Publication date
JP2004265948A (ja) 2004-09-24
IL170456A (en) 2010-05-17
CN100383942C (zh) 2008-04-23
EP1598862B1 (de) 2009-04-08
CN1754254A (zh) 2006-03-29
KR20050105241A (ko) 2005-11-03
EP1598862A4 (de) 2006-12-06
US20070029670A1 (en) 2007-02-08
KR100997035B1 (ko) 2010-11-26
EP1598862A1 (de) 2005-11-23
TW200428546A (en) 2004-12-16
JP4138529B2 (ja) 2008-08-27
WO2004075281A1 (ja) 2004-09-02
US7545044B2 (en) 2009-06-09

Similar Documents

Publication Publication Date Title
DE602004020452D1 (de) Halbleiterbauelement und strahlungsdetektor damit
DE60321694D1 (de) Fotodiodenarray und strahlungsdetektor
DE602004023179D1 (de) Halbleiter strahlungsbild-erfassungsvorrichtung
DE60330633D1 (de) Strahlungsdetektor
EP1677353A4 (de) Halbleiter-fotodetektionselement und strahlungsdetektor
DE602004027121D1 (de) Photodiodenarray, herstellungsverfahren dafür und strahlungsdetektor
DE60312055D1 (de) Polythiophene und damit hergestellte Vorrichtungen
DE60308738D1 (de) Polythiophene und damit hergestellte Vorrichtungen
DE60305541D1 (de) Polythiophene und damit hergestellte Vorrichtungen
DE60330402D1 (de) Polythiophene und damit hergestellte Vorrichtungen
DE60307333D1 (de) Polythiophene und damit hergestellte Vorrichtungen
DE60307687D1 (de) Polythiophene und damit hergestellte Vorrichtungen
DE602004024451D1 (de) Halbleiterlaser-bauelement und laserprojektor
DE60228908D1 (de) Strahlungsdetektor
DE60326611D1 (de) N und dergleichen
DE60227302D1 (de) Photovoltaisches Element und photovoltaische Vorrichtung
DE602004007865D1 (de) Integrierte Halbleiterschaltung mit Temperaturdetektor
DE60328764D1 (de) Halbleiterspeicherelement und integrierter Halbleiterschaltkreis
DE602004026137D1 (de) Strahlungsdetektionskassette
DE602004028707D1 (de) Halbleiterbauelement und strahlungsdetektor damit
DE602005010566D1 (de) Halbleiterbauelement und modul damit
DE602004016956D1 (de) Verdrahtungssubstrat und strahlungsdetektor damit
DE50212312D1 (de) Detektoranordnung und Detektionsverfahren
DE60314820D1 (de) Strahlungsdetektionskassette
DE602004027259D1 (de) Verriegelungsvorrichtung und damit versehenes leitungsanschlussstück

Legal Events

Date Code Title Description
8364 No opposition during term of opposition