DE602004010136D1 - Testvorrichtung mit einer einrichtung zur wellenform-formatierung - Google Patents
Testvorrichtung mit einer einrichtung zur wellenform-formatierungInfo
- Publication number
- DE602004010136D1 DE602004010136D1 DE602004010136T DE602004010136T DE602004010136D1 DE 602004010136 D1 DE602004010136 D1 DE 602004010136D1 DE 602004010136 T DE602004010136 T DE 602004010136T DE 602004010136 T DE602004010136 T DE 602004010136T DE 602004010136 D1 DE602004010136 D1 DE 602004010136D1
- Authority
- DE
- Germany
- Prior art keywords
- waveform formatting
- test
- test device
- waveform
- formatting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31928—Formatter
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003137553 | 2003-05-15 | ||
JP2003137553 | 2003-05-15 | ||
PCT/JP2004/006460 WO2004102217A1 (ja) | 2003-05-15 | 2004-05-13 | 試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE602004010136D1 true DE602004010136D1 (de) | 2007-12-27 |
DE602004010136T2 DE602004010136T2 (de) | 2008-09-11 |
Family
ID=33447260
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE602004010136T Expired - Lifetime DE602004010136T2 (de) | 2003-05-15 | 2004-05-13 | Testvorrichtung mit einer einrichtung zur wellenform-formatierung |
Country Status (7)
Country | Link |
---|---|
US (1) | US7135880B2 (de) |
EP (1) | EP1653239B1 (de) |
JP (1) | JP4241728B2 (de) |
KR (1) | KR20060007021A (de) |
CN (1) | CN100424519C (de) |
DE (1) | DE602004010136T2 (de) |
WO (1) | WO2004102217A1 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101137536B1 (ko) * | 2008-06-02 | 2012-04-23 | 가부시키가이샤 어드밴티스트 | 시험 장치 및 시험 방법 |
JP2010127692A (ja) * | 2008-11-26 | 2010-06-10 | Yokogawa Electric Corp | タイミング調整装置及び半導体試験装置 |
JPWO2012004833A1 (ja) * | 2010-07-07 | 2013-09-02 | 株式会社アドバンテスト | 試験装置 |
JP2014109453A (ja) * | 2012-11-30 | 2014-06-12 | Renesas Electronics Corp | 半導体装置 |
US10361795B2 (en) * | 2016-07-27 | 2019-07-23 | Skyworks Solutions, Inc. | Apparatus and methods for testing patch antennas |
TWI622779B (zh) * | 2017-05-16 | 2018-05-01 | 致茂電子股份有限公司 | 測試裝置以及波形產生方法 |
CN107769785B (zh) * | 2017-11-27 | 2020-04-07 | 北京华大九天软件有限公司 | 一种适用于高速模数转换器的时序控制电路 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0641967B2 (ja) * | 1984-03-14 | 1994-06-01 | 株式会社アドバンテスト | 論理波形生成装置 |
US4806852A (en) * | 1984-09-07 | 1989-02-21 | Megatest Corporation | Automatic test system with enhanced performance of timing generators |
JPH04191678A (ja) * | 1990-11-27 | 1992-07-09 | Toshiba Corp | 集積回路検査装置 |
JP3266374B2 (ja) | 1993-07-02 | 2002-03-18 | 株式会社リコー | 画像形成装置における照光装置 |
JP2590738Y2 (ja) * | 1993-09-21 | 1999-02-17 | 株式会社アドバンテスト | 半導体試験装置用波形整形回路 |
JP3039316B2 (ja) * | 1995-04-20 | 2000-05-08 | 横河電機株式会社 | 信号発生装置 |
JP4119015B2 (ja) * | 1998-03-06 | 2008-07-16 | 株式会社アドバンテスト | 半導体試験装置 |
JP4757365B2 (ja) * | 1999-09-28 | 2011-08-24 | 株式会社アドバンテスト | 波形フォーマッタ・この波形フォーマッタを搭載した半導体デバイス試験装置 |
JP2001311766A (ja) * | 2000-04-28 | 2001-11-09 | Advantest Corp | 半導体デバイス試験装置及び試験方法 |
US6907385B2 (en) * | 2000-10-19 | 2005-06-14 | Advantest Corporation | Memory defect redress analysis treating method, and memory testing apparatus performing the method |
-
2004
- 2004-05-13 DE DE602004010136T patent/DE602004010136T2/de not_active Expired - Lifetime
- 2004-05-13 CN CNB2004800119176A patent/CN100424519C/zh not_active Expired - Lifetime
- 2004-05-13 EP EP04732732A patent/EP1653239B1/de not_active Expired - Fee Related
- 2004-05-13 KR KR1020057019717A patent/KR20060007021A/ko not_active Application Discontinuation
- 2004-05-13 JP JP2005506188A patent/JP4241728B2/ja not_active Expired - Fee Related
- 2004-05-13 WO PCT/JP2004/006460 patent/WO2004102217A1/ja active IP Right Grant
- 2004-08-20 US US10/922,587 patent/US7135880B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPWO2004102217A1 (ja) | 2006-07-13 |
EP1653239B1 (de) | 2007-11-14 |
CN1784608A (zh) | 2006-06-07 |
EP1653239A4 (de) | 2006-07-19 |
WO2004102217A1 (ja) | 2004-11-25 |
US20050024036A1 (en) | 2005-02-03 |
KR20060007021A (ko) | 2006-01-23 |
EP1653239A1 (de) | 2006-05-03 |
US7135880B2 (en) | 2006-11-14 |
JP4241728B2 (ja) | 2009-03-18 |
CN100424519C (zh) | 2008-10-08 |
DE602004010136T2 (de) | 2008-09-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE60310637D1 (de) | Nadelhalter zur Verwendung mit einer Sicherheitsvorrichtung | |
DE602005026285D1 (de) | Endoskop mit einer Einrichtung zum Aufrichten von Instrumenten | |
DE60324738D1 (de) | Messvorrichtung mit einem Biosensor | |
DE60333012D1 (de) | Vorrichtung zur anastomose mit einer verankernden hülse | |
DE60115916D1 (de) | Automatisches messgerät mit einer kardanische blasen-antriebsvorrichtung zur verwendung mit teststreifen | |
DE60328347D1 (de) | Vorrichtung zur Entnahme einer Körperprobe | |
DE60215819D1 (de) | Marker zur verwendung mit einem gewebemarkierungsgerät | |
DE60328920D1 (de) | Gerät zur Einführung einer Schliessvorrichtung | |
DE60335720D1 (de) | Vorrichtung für Anastomose mit einer verankernden Hülse | |
DE602004001252D1 (de) | Bürste und Vorrichtung zur Aufnahme und zum Auftrag mit einer solchen Bürste | |
DE60204335D1 (de) | Trennvorrichtung zur verwendung in einem bohrloch | |
DE502004002894D1 (de) | Einrichtung zur Konfektionierung eines Kabels | |
DE602004002205D1 (de) | Chirurgische klammervorrichtung mit dissektionsspitze | |
DE602004022252D1 (de) | Vorrichtung zur implantierung einer miniatur-herzleitung mit einer schraubwendel | |
DE602005024223D1 (de) | Kupplungseinrichtung und Motor mit einer solchen Einrichtung | |
DE602004030649D1 (de) | Einführbare Sonde zur Erfassung einer Form | |
DE60212054D1 (de) | Generator zur Verwendung in einer mikroelektromechanischen Vorrichtung | |
DE602005012187D1 (de) | Vorrichtung zur Überwachung einer optischen Wellenform und Oszilloskop | |
DE602004010950D1 (de) | Rohrförmige Vorrichtung und Leitungssystem mit einer derartigen Vorrichtung | |
FI20055406A (fi) | Menetelmä ja laitejärjestely palvelin-asiakaslaite-ympäristön hallitsemiseksi | |
FR2850163B1 (fr) | Instrument a aiguille avec aiguille double | |
DE602004010136D1 (de) | Testvorrichtung mit einer einrichtung zur wellenform-formatierung | |
DE60312679D1 (de) | Kupplungsvorrichtung und Fahrzeug mit einer solchen Vorrichtung | |
FI20031521A0 (fi) | Pipetin kärjen kiinnitysmenetelmä ja laite menetelmän toteuttamiseksi | |
DE602004021707D1 (de) | Vorrichtung zur trocknung einer tissuebahn |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |