DE60114051T2 - Selbstangleichende stromquelle und verfahren für einen daw mit geschalteten stromquellen - Google Patents

Selbstangleichende stromquelle und verfahren für einen daw mit geschalteten stromquellen Download PDF

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Publication number
DE60114051T2
DE60114051T2 DE60114051T DE60114051T DE60114051T2 DE 60114051 T2 DE60114051 T2 DE 60114051T2 DE 60114051 T DE60114051 T DE 60114051T DE 60114051 T DE60114051 T DE 60114051T DE 60114051 T2 DE60114051 T2 DE 60114051T2
Authority
DE
Germany
Prior art keywords
fet
source
circuit
current
current source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60114051T
Other languages
German (de)
English (en)
Other versions
DE60114051D1 (de
Inventor
Bang-Sup Song
Alex R. Bugeja
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OL Security LLC
Original Assignee
Teledyne Licensing LLC
Rockwell Scientific Licensing LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teledyne Licensing LLC, Rockwell Scientific Licensing LLC filed Critical Teledyne Licensing LLC
Publication of DE60114051D1 publication Critical patent/DE60114051D1/de
Application granted granted Critical
Publication of DE60114051T2 publication Critical patent/DE60114051T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1057—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by trimming, i.e. by individually adjusting at least part of the quantisation value generators or stages to their nominal values
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/74—Simultaneous conversion
    • H03M1/742—Simultaneous conversion using current sources as quantisation value generators

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Amplifiers (AREA)
  • Continuous-Control Power Sources That Use Transistors (AREA)
DE60114051T 2000-08-03 2001-07-31 Selbstangleichende stromquelle und verfahren für einen daw mit geschalteten stromquellen Expired - Lifetime DE60114051T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US631596 2000-08-03
US09/631,596 US6331830B1 (en) 2000-02-04 2000-08-03 Self-trimming current source and method for switched current source DAC
PCT/US2001/023952 WO2002013392A2 (en) 2000-08-03 2001-07-31 Self-trimming current source and method for switched current source dac

Publications (2)

Publication Number Publication Date
DE60114051D1 DE60114051D1 (de) 2005-11-17
DE60114051T2 true DE60114051T2 (de) 2006-04-27

Family

ID=24531901

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60114051T Expired - Lifetime DE60114051T2 (de) 2000-08-03 2001-07-31 Selbstangleichende stromquelle und verfahren für einen daw mit geschalteten stromquellen

Country Status (5)

Country Link
US (1) US6331830B1 (enExample)
EP (1) EP1388210B1 (enExample)
JP (1) JP3881622B2 (enExample)
DE (1) DE60114051T2 (enExample)
WO (1) WO2002013392A2 (enExample)

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WO2004066248A1 (ja) * 2003-01-17 2004-08-05 Semiconductor Energy Laboratory Co., Ltd. 電流源回路、信号線駆動回路及びその駆動方法並びに発光装置
US7184799B1 (en) * 2003-05-14 2007-02-27 Marvell International Ltd. Method and apparatus for reducing wake up time of a powered down device
DE10325769B4 (de) * 2003-06-05 2007-01-04 Zentrum Mikroelektronik Dresden Ag Anordnung und Verfahren zum Abgleich einer kalibrierbaren Stromquelle
DE10350594B4 (de) * 2003-10-30 2009-07-30 Infineon Technologies Ag Verfahren zur Kalibrierung von Stromzellen für Digital-Analog-Wandlerschaltungen und Digital-Analog-Wandlerschaltung
US7106234B2 (en) * 2004-01-22 2006-09-12 University College Cork - National University Of Ireland Digital to analog converter with reduced output noise
US7498779B2 (en) * 2005-01-28 2009-03-03 Broadcom Corporation Voltage supply interface with improved current sensitivity and reduced series resistance
DE602005017260D1 (de) * 2005-07-27 2009-12-03 Verigy Pte Ltd Singapore Digital Analog Wandlung bei der die Ausgänge mehrerer Digital-Analog-Wandler aufsummiert werden
US7541953B2 (en) * 2005-12-23 2009-06-02 Alcatel-Lucent Usa Inc. Self-calibrating current source arrays
TWI287698B (en) * 2006-03-08 2007-10-01 Novatek Microelectronics Corp Apparatus for error compensation of self calibrating current source
CN100498637C (zh) * 2006-03-13 2009-06-10 联咏科技股份有限公司 自我校正电流源的误差补偿装置与方法
US7557743B2 (en) * 2006-12-08 2009-07-07 Kabushiki Kaisha Toshiba D/A converter
US7363186B1 (en) * 2006-12-22 2008-04-22 Kelsey-Haynes Company Apparatus and method for self calibration of current feedback
US9105673B2 (en) 2007-05-09 2015-08-11 Brooks Automation, Inc. Side opening unified pod
US7474243B1 (en) 2007-09-13 2009-01-06 Infineon Technologies Ag Semiconductor device including switch that conducts based on latched bit and next bit
US7545295B2 (en) * 2007-09-14 2009-06-09 Realtek Semiconductor Corp. Self-calibrating digital-to-analog converter and method thereof
US7514989B1 (en) * 2007-11-28 2009-04-07 Dialog Semiconductor Gmbh Dynamic matching of current sources
US7564385B2 (en) * 2007-12-18 2009-07-21 Atmel Corporation Current compensation for digital-to-analog converter
JP5233755B2 (ja) * 2009-03-05 2013-07-10 ヤマハ株式会社 Ｄ／ａ変換器の補正回路
US7804433B1 (en) * 2009-04-14 2010-09-28 Texas Instruments Incorporated Methods and apparatus for error cancelation in calibrated current sources
US8115519B2 (en) * 2010-02-12 2012-02-14 Bae Systems Information And Electronic Systems Integration Inc. Phase accumulator generating reference phase for phase coherent direct digital synthesis outputs
US7965212B1 (en) 2010-02-12 2011-06-21 Bae Systems Information And Electronic Systems Integration Inc. DAC circuit using summing junction delay compensation
US8583714B2 (en) * 2010-02-12 2013-11-12 Bae Systems Information And Electronic Systems Integration Inc. ROM-based direct digital synthesizer with pipeline delay circuit
US8125361B2 (en) 2010-07-12 2012-02-28 Teledyne Scientific & Imaging, Llc Digital-to-analog converter (DAC) calibration system
JP2012060618A (ja) * 2010-09-13 2012-03-22 Renesas Electronics Corp 半導体集積回路装置
JP6349759B2 (ja) * 2014-02-10 2018-07-04 株式会社ソシオネクスト デジタルアナログ変換回路、デジタルアナログ変換回路の補正方法
US9353017B2 (en) 2014-06-17 2016-05-31 Freescale Semiconductor, Inc. Method of trimming current source using on-chip ADC
US9035810B1 (en) * 2015-01-21 2015-05-19 IQ—Analog Corporation System and method for digital-to-analog converter calibration
US10116210B2 (en) 2015-09-04 2018-10-30 Dialog Semiconductor (Uk) Limited DAC servo
KR101794871B1 (ko) 2016-04-20 2017-11-08 울산과학기술원 트리밍 회로 및 그 제어 방법
US10468984B2 (en) 2016-07-01 2019-11-05 Dialog Semiconductor (Uk) Limited DC-DC switching converter with adaptive voltage positioning combined with digital-to-analog converter servo
US9960780B1 (en) * 2016-12-30 2018-05-01 Texas Instruments Incorporated Current source noise cancellation
US9985641B1 (en) 2017-05-26 2018-05-29 Keysight Technologies, Inc. Systems and methods for evaluating errors and impairments in a digital-to-analog converter
CN109391270B (zh) 2017-08-08 2023-09-26 恩智浦美国有限公司 具有含有电阻器阵列的子dac的数/模转换器（dac）
CN110557123A (zh) 2018-06-04 2019-12-10 恩智浦美国有限公司 分段式电阻型数模转换器
US10574247B1 (en) 2018-09-14 2020-02-25 Analog Devices Global Unlimited Company Digital-to-analog converter transfer function modification
US10340941B1 (en) * 2018-11-07 2019-07-02 Texas Instruments Incorporated Trim digital-to-analog converter (DAC) for an R2R ladder DAC
CN112583410A (zh) 2019-09-27 2021-03-30 恩智浦美国有限公司 分段式数模转换器
US11569838B2 (en) 2020-04-09 2023-01-31 Analog Devices International Unlimited Company High efficiency current source/sink DAC
US11563442B2 (en) * 2020-08-07 2023-01-24 Analog Devices International Unlimited Company Calibration of continuous-time residue generation systems for analog-to-digital converters
US11424752B2 (en) * 2020-11-06 2022-08-23 AyDeeKay LLC Interleaved analog-to-digital converter (ADC) gain calibration
CN115694507A (zh) 2021-07-29 2023-02-03 恩智浦美国有限公司 数模转换器
CN115733490A (zh) 2021-08-31 2023-03-03 恩智浦美国有限公司 自校准数模转换器
CN118199636A (zh) 2022-12-12 2024-06-14 恩智浦有限公司 自校准缓冲电压dac
US20250293695A1 (en) * 2024-03-14 2025-09-18 Qualcomm Incorporated Signal oscillation circuit with adaptive tuning for tail filters

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US4272760A (en) * 1979-04-10 1981-06-09 Burr-Brown Research Corporation Self-calibrating digital to analog conversion system and method
US4568917A (en) * 1983-06-27 1986-02-04 Motorola, Inc. Capacitive digital to analog converter which can be trimmed up and down
US5153592A (en) * 1991-04-30 1992-10-06 Texas Instruments Incorporated 16 bit error-correcting digital-to-analog converter
US5166641A (en) * 1992-03-17 1992-11-24 National Semiconductor Corporation Phase-locked loop with automatic phase offset calibration
US5642116A (en) * 1995-03-06 1997-06-24 International Business Machines Corporation Self calibrating segmented digital-to-analog converter
FR2754959B1 (fr) * 1996-10-22 1998-12-24 Sgs Thomson Microelectronics Comparateur de phase a tres faible offset
US5793231A (en) * 1997-04-18 1998-08-11 Northern Telecom Limited Current memory cell having bipolar transistor configured as a current source and using field effect transistor (FET) for current trimming
US5955980A (en) * 1997-10-03 1999-09-21 Motorola, Inc. Circuit and method for calibrating a digital-to-analog converter
US6181210B1 (en) * 1998-09-21 2001-01-30 Broadcom Corporation Low offset and low glitch energy charge pump for PLL-based timing recovery systems

Also Published As

Publication number Publication date
DE60114051D1 (de) 2005-11-17
EP1388210B1 (en) 2005-10-12
EP1388210A2 (en) 2004-02-11
WO2002013392A3 (en) 2003-08-21
US6331830B1 (en) 2001-12-18
WO2002013392A2 (en) 2002-02-14
JP3881622B2 (ja) 2007-02-14
JP2004506372A (ja) 2004-02-26

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: TELEDYNE LICENSING LLC,, THOUSAND OAKS, CALIF., US

8327 Change in the person/name/address of the patent owner

Owner name: OTROSANI ASSET MGMT. L.L.C., DOVER, DEL., US