DE60002760D1 - Verfahren zum korrigieren des ausgangssignals eines aus mehreren elementen bestehenden infrarotstrahlungsempfindlichen sensors - Google Patents

Verfahren zum korrigieren des ausgangssignals eines aus mehreren elementen bestehenden infrarotstrahlungsempfindlichen sensors

Info

Publication number
DE60002760D1
DE60002760D1 DE60002760T DE60002760T DE60002760D1 DE 60002760 D1 DE60002760 D1 DE 60002760D1 DE 60002760 T DE60002760 T DE 60002760T DE 60002760 T DE60002760 T DE 60002760T DE 60002760 D1 DE60002760 D1 DE 60002760D1
Authority
DE
Germany
Prior art keywords
sensor
output signal
parameter
correcting
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60002760T
Other languages
English (en)
Other versions
DE60002760T2 (de
Inventor
Joerg Schieferdecker
Karlheinz Storck
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Excelitas Technologies GmbH and Co KG
Original Assignee
PerkinElmer Optoelectronics GmbH and Co KG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Optoelectronics GmbH and Co KG filed Critical PerkinElmer Optoelectronics GmbH and Co KG
Priority to DE60002760T priority Critical patent/DE60002760T2/de
Application granted granted Critical
Publication of DE60002760D1 publication Critical patent/DE60002760D1/de
Publication of DE60002760T2 publication Critical patent/DE60002760T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/12—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using thermoelectric elements, e.g. thermocouples
    • G01J5/14—Electrical features thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22—Electrical features thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/11—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths for generating image signals from visible and infrared light wavelengths
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3025—Electromagnetic shielding

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Optics & Photonics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Radiation Pyrometers (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE60002760T 1999-12-24 2000-12-22 Verfahren zum korrigieren des ausgangssignals eines aus mehreren elementen bestehenden infrarotstrahlungsempfindlichen sensors Expired - Lifetime DE60002760T2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE60002760T DE60002760T2 (de) 1999-12-24 2000-12-22 Verfahren zum korrigieren des ausgangssignals eines aus mehreren elementen bestehenden infrarotstrahlungsempfindlichen sensors

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE19962938A DE19962938A1 (de) 1999-12-24 1999-12-24 Verfahren zum Korrigieren des Ausgangssignals eines Infrarotstrahlungsmehrelementsensors, Infrarotstrahlungsmehrelementsensor und Infrarotstrahlungsmehrelementsensorsystem
DE19962938 1999-12-24
PCT/EP2000/013185 WO2001048449A2 (en) 1999-12-24 2000-12-22 Method for the correction of the output signal of an infra red radiation multiple element sensor
DE60002760T DE60002760T2 (de) 1999-12-24 2000-12-22 Verfahren zum korrigieren des ausgangssignals eines aus mehreren elementen bestehenden infrarotstrahlungsempfindlichen sensors

Publications (2)

Publication Number Publication Date
DE60002760D1 true DE60002760D1 (de) 2003-06-18
DE60002760T2 DE60002760T2 (de) 2004-02-26

Family

ID=7934447

Family Applications (2)

Application Number Title Priority Date Filing Date
DE19962938A Ceased DE19962938A1 (de) 1999-12-24 1999-12-24 Verfahren zum Korrigieren des Ausgangssignals eines Infrarotstrahlungsmehrelementsensors, Infrarotstrahlungsmehrelementsensor und Infrarotstrahlungsmehrelementsensorsystem
DE60002760T Expired - Lifetime DE60002760T2 (de) 1999-12-24 2000-12-22 Verfahren zum korrigieren des ausgangssignals eines aus mehreren elementen bestehenden infrarotstrahlungsempfindlichen sensors

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE19962938A Ceased DE19962938A1 (de) 1999-12-24 1999-12-24 Verfahren zum Korrigieren des Ausgangssignals eines Infrarotstrahlungsmehrelementsensors, Infrarotstrahlungsmehrelementsensor und Infrarotstrahlungsmehrelementsensorsystem

Country Status (9)

Country Link
US (1) US6871999B2 (de)
EP (1) EP1240487B1 (de)
JP (1) JP2003518615A (de)
KR (1) KR100720796B1 (de)
CN (1) CN1293373C (de)
AT (1) ATE240509T1 (de)
DE (2) DE19962938A1 (de)
HK (1) HK1079564A1 (de)
WO (1) WO2001048449A2 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7324598B2 (en) * 2002-07-15 2008-01-29 Intel Corporation Apparatus and method to reduce quantization error
DE10240083A1 (de) 2002-08-30 2004-03-11 Austriamicrosystems Ag Verfahren zur Kalibrierung einer Fotodiode, Halbleiterchip und Betriebsverfahren
DE10321640B4 (de) * 2003-05-13 2016-12-22 Heimann Sensor Gmbh Infrarotsensor mit verbesserter Strahlungsausbeute
DE10322860B4 (de) * 2003-05-21 2005-11-03 X-Fab Semiconductor Foundries Ag Schaltungsanordnung zum Auslesen elektronischer Signale aus hochauflösenden thermischen Sensoren
DE10356508B4 (de) * 2003-12-03 2019-05-02 Robert Bosch Gmbh Mikromechanische Infrarotquelle
DE102004018923B4 (de) * 2004-04-20 2016-05-04 Behr-Hella Thermocontrol Gmbh Elektronische Schaltungsanordnung, insbesondere Lichtsensor, Verfahren zum Klassifizieren einer solchen Schaltungsanordnung, Anordnung aus einem Steuergerät und einem Lichtsensor und ein Verfahren zum Abgleich einer solchen Anordnung
US7186978B2 (en) * 2004-10-15 2007-03-06 Millennium Enginerring And Integration Company Compact emissivity and temperature measuring infrared detector
US20060178857A1 (en) * 2005-02-10 2006-08-10 Barajas Leandro G Quasi-redundant smart sensing topology
US20090083275A1 (en) * 2007-09-24 2009-03-26 Nokia Corporation Method, Apparatus and Computer Program Product for Performing a Visual Search Using Grid-Based Feature Organization
JP2011112509A (ja) * 2009-11-26 2011-06-09 Nippon Ceramic Co Ltd サーモパイル型赤外線検出装置
US9706138B2 (en) * 2010-04-23 2017-07-11 Flir Systems, Inc. Hybrid infrared sensor array having heterogeneous infrared sensors
JP5542090B2 (ja) * 2011-04-27 2014-07-09 旭化成エレクトロニクス株式会社 赤外線センサ信号の補正方法及び温度測定方法並びに温度測定装置
JP5890261B2 (ja) 2012-06-21 2016-03-22 アズビル株式会社 温度検出範囲特定装置および方法
WO2016185700A1 (ja) * 2015-05-21 2016-11-24 富士フイルム株式会社 赤外線撮像装置および赤外線撮像装置による信号補正方法
JP6795758B2 (ja) * 2016-09-29 2020-12-02 ミツミ電機株式会社 センサ回路及びセンサ装置

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS633231A (ja) * 1986-06-24 1988-01-08 Minolta Camera Co Ltd 放射温度計
US4752694A (en) * 1987-01-12 1988-06-21 Honeywell Inc. Array uniformity correction
JPH03103726A (ja) * 1989-09-18 1991-04-30 Fujitsu Ltd 赤外線検知器の感度補正方式
JP2932532B2 (ja) * 1989-10-19 1999-08-09 ミノルタ株式会社 赤外線撮像装置
US5150969A (en) * 1990-03-12 1992-09-29 Ivac Corporation System and method for temperature determination and calibration in a biomedical probe
JPH03270580A (ja) * 1990-03-20 1991-12-02 Fujitsu Ltd 赤外線撮像装置
DE4113266A1 (de) * 1990-04-23 1991-10-31 Keller Gmbh Temperatur-messgeraet zur beruehrungslosen bestimmung der temperatur
DE4114369C2 (de) * 1990-05-02 1996-04-11 Keller Gmbh Pyrometer
JPH04175626A (ja) * 1990-11-08 1992-06-23 Kubota Corp トルクセンサの特性補償方法
KR940004051B1 (ko) * 1991-10-12 1994-05-11 주식회사 금성사 소닉 디바이스 센서를 이용한 가열방법
DE4139122C1 (de) * 1991-11-28 1993-04-08 Fenzlein, Paul-Gerhard, 8500 Nuernberg, De
US5521708A (en) * 1992-11-25 1996-05-28 Canon Information & Systems, Inc. Correlated color temperature detector
JPH06333644A (ja) * 1993-05-20 1994-12-02 Otax Kk 測定装置用コネクタ装置
JP3119542B2 (ja) * 1993-05-25 2000-12-25 日本電気株式会社 半導体加速度センサおよび製造方法
TW230808B (en) * 1993-06-04 1994-09-21 Philips Electronics Nv A two-line mixed analog/digital bus system and a station for use in such a system
DE4331574C2 (de) * 1993-09-16 1997-07-10 Heimann Optoelectronics Gmbh Infrarot-Sensormodul
KR0133476B1 (ko) * 1994-03-18 1998-04-23 구자홍 마이크로 웨이브 오븐
US5695283A (en) * 1994-07-01 1997-12-09 Wahl Instruments, Inc. Compensating infrared thermopile detector
IL115332A0 (en) * 1994-09-30 1995-12-31 Honeywell Inc Compact thermal camera
JPH0965214A (ja) * 1995-08-25 1997-03-07 Fujitsu Ltd 受光素子特性補正方法及び装置並びにそれらを備えた撮像装置
SE505555C2 (sv) * 1995-12-21 1997-09-15 Whirlpool Europ Förfarande för styrning av ett uppvärmningsförlopp i en mikrovågsugn samt mikrovågsugn
JP3123919B2 (ja) * 1996-02-29 2001-01-15 三洋電機株式会社 電子レンジ
DE19619459C2 (de) * 1996-05-14 2000-06-08 Heimann Optoelectronics Gmbh Schaltung zur Erfassung elektromagnetischer Strahlung
JP2950796B2 (ja) 1996-06-11 1999-09-20 エルジー電子株式会社 電子レンジの温度測定装置及びその測定方法
US5811808A (en) 1996-09-12 1998-09-22 Amber Engineering, Inc. Infrared imaging system employing on-focal plane nonuniformity correction
US5857777A (en) * 1996-09-25 1999-01-12 Claud S. Gordon Company Smart temperature sensing device
WO1998020615A2 (en) * 1996-10-21 1998-05-14 Electronics Development Corporation Smart sensor module
JPH10253572A (ja) * 1997-03-07 1998-09-25 Toa Denpa Kogyo Kk メモリー付き電極を備えた計測装置
DE19735379B4 (de) 1997-08-14 2008-06-05 Perkinelmer Optoelectronics Gmbh Sensorsystem und Herstellungsverfahren
US6354733B2 (en) * 1999-01-15 2002-03-12 Ametex, Inc. System and method for determining combustion temperature using infrared emissions

Also Published As

Publication number Publication date
JP2003518615A (ja) 2003-06-10
EP1240487A2 (de) 2002-09-18
HK1079564A1 (en) 2006-04-07
DE19962938A1 (de) 2001-07-19
WO2001048449A3 (en) 2001-12-13
DE60002760T2 (de) 2004-02-26
US20030091090A1 (en) 2003-05-15
ATE240509T1 (de) 2003-05-15
EP1240487B1 (de) 2003-05-14
KR20020079759A (ko) 2002-10-19
WO2001048449A2 (en) 2001-07-05
KR100720796B1 (ko) 2007-05-22
CN1293373C (zh) 2007-01-03
US6871999B2 (en) 2005-03-29
CN1636129A (zh) 2005-07-06

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8327 Change in the person/name/address of the patent owner

Owner name: PERKINELMER TECHNOLOGIES GMBH & CO. KG, 65199 , DE