DE3714598A1 - Integrierte halbleiterschaltung - Google Patents

Integrierte halbleiterschaltung

Info

Publication number
DE3714598A1
DE3714598A1 DE19873714598 DE3714598A DE3714598A1 DE 3714598 A1 DE3714598 A1 DE 3714598A1 DE 19873714598 DE19873714598 DE 19873714598 DE 3714598 A DE3714598 A DE 3714598A DE 3714598 A1 DE3714598 A1 DE 3714598A1
Authority
DE
Germany
Prior art keywords
mos transistor
type
sides
source
rows
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19873714598
Other languages
German (de)
English (en)
Other versions
DE3714598C2 (en:Method
Inventor
Takahiko Arakawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE3714598A1 publication Critical patent/DE3714598A1/de
Application granted granted Critical
Publication of DE3714598C2 publication Critical patent/DE3714598C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/90—Masterslice integrated circuits
    • H10D84/903—Masterslice integrated circuits comprising field effect technology
    • H10D84/907—CMOS gate arrays

Landscapes

  • Design And Manufacture Of Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
DE19873714598 1986-05-23 1987-04-29 Integrierte halbleiterschaltung Granted DE3714598A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61119758A JPS62276852A (ja) 1986-05-23 1986-05-23 半導体集積回路装置

Publications (2)

Publication Number Publication Date
DE3714598A1 true DE3714598A1 (de) 1987-11-26
DE3714598C2 DE3714598C2 (en:Method) 1992-01-09

Family

ID=14769439

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19873714598 Granted DE3714598A1 (de) 1986-05-23 1987-04-29 Integrierte halbleiterschaltung

Country Status (3)

Country Link
US (1) US4825273A (en:Method)
JP (1) JPS62276852A (en:Method)
DE (1) DE3714598A1 (en:Method)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0379330A3 (en) * 1989-01-17 1992-02-19 AT&T GLOBAL INFORMATION SOLUTIONS INTERNATIONAL INC. Integrated circuit gate array

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63102342A (ja) * 1986-10-20 1988-05-07 Mitsubishi Electric Corp 半導体集積回路装置の配線構造
JPH02198154A (ja) * 1989-01-27 1990-08-06 Hitachi Ltd 配線の形成方法及びこれを利用した半導体装置
EP0712164B1 (en) * 1989-04-19 2003-07-02 Seiko Epson Corporation Semiconductor device
US5250823A (en) * 1989-10-24 1993-10-05 U.S. Philips Corp. Integrated CMOS gate-array circuit
US5037771A (en) * 1989-11-28 1991-08-06 Cross-Check Technology, Inc. Method for implementing grid-based crosscheck test structures and the structures resulting therefrom
KR970008327B1 (ko) * 1992-10-20 1997-05-23 후지쓰 가부시끼가이샤 개선된 배치패턴을 갖는 반도체회로
JPH11145397A (ja) * 1997-11-11 1999-05-28 Mitsubishi Electric Corp 半導体集積回路装置
JP2007281147A (ja) * 2006-04-05 2007-10-25 Sanyo Electric Co Ltd Ｃｍｏｓ半導体集積回路装置
JP4609907B2 (ja) * 2008-05-22 2011-01-12 ルネサスエレクトロニクス株式会社 半導体集積回路

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0131464A2 (en) * 1983-07-09 1985-01-16 Fujitsu Limited Masterslice semiconductor device
EP0136880A1 (en) * 1983-09-30 1985-04-10 Fujitsu Limited Gate array type semiconductor integrated circuit device
WO1985002062A1 (en) * 1983-10-31 1985-05-09 Storage Technology Partners Cmos integrated circuit configuration for eliminating latchup
EP0177336A2 (en) * 1984-10-03 1986-04-09 Fujitsu Limited Gate array integrated device
JPH0674647A (ja) * 1992-08-28 1994-03-18 Sanyo Electric Co Ltd ショーケースの配線装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5937858B2 (ja) * 1976-08-11 1984-09-12 セイコーインスツルメンツ株式会社 半導体装置およびその製法
JPS57154869A (en) * 1981-03-20 1982-09-24 Hitachi Ltd Semiconductor device
JPS6074647A (ja) * 1983-09-30 1985-04-26 Fujitsu Ltd 半導体集積回路装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0131464A2 (en) * 1983-07-09 1985-01-16 Fujitsu Limited Masterslice semiconductor device
EP0136880A1 (en) * 1983-09-30 1985-04-10 Fujitsu Limited Gate array type semiconductor integrated circuit device
WO1985002062A1 (en) * 1983-10-31 1985-05-09 Storage Technology Partners Cmos integrated circuit configuration for eliminating latchup
EP0177336A2 (en) * 1984-10-03 1986-04-09 Fujitsu Limited Gate array integrated device
JPH0674647A (ja) * 1992-08-28 1994-03-18 Sanyo Electric Co Ltd ショーケースの配線装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0379330A3 (en) * 1989-01-17 1992-02-19 AT&T GLOBAL INFORMATION SOLUTIONS INTERNATIONAL INC. Integrated circuit gate array

Also Published As

Publication number Publication date
DE3714598C2 (en:Method) 1992-01-09
US4825273A (en) 1989-04-25
JPH0558582B2 (en:Method) 1993-08-26
JPS62276852A (ja) 1987-12-01

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)