DE19780110T1 - Vergleichsschaltung für ein Halbleitertestsystem - Google Patents

Vergleichsschaltung für ein Halbleitertestsystem

Info

Publication number
DE19780110T1
DE19780110T1 DE19780110T DE19780110T DE19780110T1 DE 19780110 T1 DE19780110 T1 DE 19780110T1 DE 19780110 T DE19780110 T DE 19780110T DE 19780110 T DE19780110 T DE 19780110T DE 19780110 T1 DE19780110 T1 DE 19780110T1
Authority
DE
Germany
Prior art keywords
test system
comparison circuit
semiconductor test
semiconductor
comparison
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE19780110T
Other languages
English (en)
Other versions
DE19780110C2 (de
Inventor
Kenji Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE19780110T1 publication Critical patent/DE19780110T1/de
Application granted granted Critical
Publication of DE19780110C2 publication Critical patent/DE19780110C2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/003—Changing the DC level
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31703—Comparison aspects, e.g. signature analysis, comparators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31932—Comparators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2409—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using bipolar transistors
    • H03K5/2418—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using bipolar transistors with at least one differential stage

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Manipulation Of Pulses (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
DE19780110T 1996-01-23 1997-01-20 Vergleichsschaltung für ein Halbleitertestsystem Expired - Fee Related DE19780110C2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP02855296A JP3331109B2 (ja) 1996-01-23 1996-01-23 半導体試験装置の比較器
PCT/JP1997/000102 WO1997027493A1 (fr) 1996-01-23 1997-01-20 Comparateur pour dispositif testeur de semiconducteurs

Publications (2)

Publication Number Publication Date
DE19780110T1 true DE19780110T1 (de) 1998-02-12
DE19780110C2 DE19780110C2 (de) 2003-10-09

Family

ID=12251827

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19780110T Expired - Fee Related DE19780110C2 (de) 1996-01-23 1997-01-20 Vergleichsschaltung für ein Halbleitertestsystem

Country Status (8)

Country Link
US (1) US6016566A (de)
JP (1) JP3331109B2 (de)
KR (1) KR100278259B1 (de)
CN (1) CN1081336C (de)
DE (1) DE19780110C2 (de)
GB (1) GB2314712B (de)
TW (1) TW312750B (de)
WO (1) WO1997027493A1 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100305678B1 (ko) * 1998-12-08 2001-11-30 윤종용 반도체장치의테스터
JP4488553B2 (ja) * 1999-07-14 2010-06-23 株式会社アドバンテスト 波形取得方法及びこの方法を用いて動作する波形取得装置
KR20010101713A (ko) * 1999-11-27 2001-11-14 롤페스 요하네스 게라투스 알베르투스 전기 회로를 테스트하는 방법 및 그 회로와 회로 설계 방법
US6392448B1 (en) 2000-02-03 2002-05-21 Teradyne, Inc. Common-mode detection circuit with cross-coupled compensation
US6300804B1 (en) 2000-02-09 2001-10-09 Teradyne, Inc. Differential comparator with dispersion reduction circuitry
US6281699B1 (en) 2000-03-15 2001-08-28 Teradyne, Inc. Detector with common mode comparator for automatic test equipment
US6414496B1 (en) 2000-06-16 2002-07-02 Analog Devices, Inc. Comparator structures and methods for automatic test equipment
EP1152530B1 (de) 2000-11-24 2003-04-02 Agilent Technologies, Inc. (a Delaware corporation) Schaltung zur Erzeugung eines logischen Ausgangssignals ,das mit Kreuzpunkten von differentiellen Signalen korrespondiert
DE60100109T2 (de) 2001-03-10 2003-10-16 Agilent Technologies, Inc. (N.D.Ges.D.Staates Delaware) Umschaltbare Testschaltung für asymmetrischen und differentiellen Abschluss
US6856158B2 (en) 2002-05-01 2005-02-15 Advantest Corp. Comparator circuit for semiconductor test system
US6593801B1 (en) 2002-06-07 2003-07-15 Pericom Semiconductor Corp. Power down mode signaled by differential transmitter's high-Z state detected by receiver sensing same voltage on differential lines
KR101035184B1 (ko) * 2002-06-10 2011-05-17 가부시키가이샤 어드밴티스트 반도체 시험 장치
US6791316B2 (en) * 2002-09-24 2004-09-14 Advantest Corp. High speed semiconductor test system using radially arranged pin cards
CN100424518C (zh) * 2002-12-20 2008-10-08 株式会社爱德万测试 半导体试验装置
DE10393879T5 (de) * 2002-12-27 2005-10-20 Advantest Corp. Halbleitertestgerät
US7673213B2 (en) * 2004-02-19 2010-03-02 Trellisware Technologies, Inc. Method and apparatus for communications using improved turbo like codes
US7151367B2 (en) * 2004-03-31 2006-12-19 Teradyne, Inc. Method of measuring duty cycle
ATE441120T1 (de) * 2004-07-07 2009-09-15 Verigy Pte Ltd Singapore Auswertung eines ausgangssignals eines gerade geprüften bausteins
US7363568B2 (en) * 2004-11-03 2008-04-22 Texas Instruments Incorporated System and method for testing differential signal crossover using undersampling
JP4956419B2 (ja) 2005-03-03 2012-06-20 株式会社アドバンテスト 電位比較器
CN101331405B (zh) * 2005-12-16 2011-04-06 爱德万测试株式会社 测试装置和插脚电子卡
US7398169B2 (en) * 2006-02-27 2008-07-08 Advantest Corporation Measuring apparatus, measuring method, testing apparatus, testing method, and electronics device
JP4924231B2 (ja) * 2007-06-22 2012-04-25 横河電機株式会社 半導体試験装置
US8305099B2 (en) * 2010-08-31 2012-11-06 Nxp B.V. High speed full duplex test interface
KR102409926B1 (ko) 2015-08-18 2022-06-16 삼성전자주식회사 테스트 장치 및 이를 포함하는 테스트 시스템

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0738013B2 (ja) * 1986-11-28 1995-04-26 日本電信電話株式会社 スキュー検出装置
US5210527A (en) * 1989-06-28 1993-05-11 Ceridian Corporation Programmable spike detector
JP2866750B2 (ja) * 1991-01-28 1999-03-08 三菱電機株式会社 半導体試験装置および半導体装置の試験方法
JPH06130124A (ja) * 1992-10-20 1994-05-13 Mitsubishi Electric Corp しきい値を有する信号入力回路のテスト回路
JP3181736B2 (ja) * 1992-12-25 2001-07-03 三菱電機株式会社 Ｉｃ機能試験装置及び試験方法
JP3346845B2 (ja) * 1993-08-23 2002-11-18 三菱電機株式会社 半導体メモリ装置
JP2904695B2 (ja) * 1993-12-01 1999-06-14 富士通テン株式会社 車両のエアバッグシステムにおけるスクイブ検査回路
JPH07270383A (ja) * 1994-03-30 1995-10-20 Mitsubishi Heavy Ind Ltd 渦流探傷装置

Also Published As

Publication number Publication date
DE19780110C2 (de) 2003-10-09
US6016566A (en) 2000-01-18
KR19980702990A (ko) 1998-09-05
CN1178008A (zh) 1998-04-01
TW312750B (de) 1997-08-11
GB2314712B (en) 2000-07-05
GB9719408D0 (en) 1997-11-12
JP3331109B2 (ja) 2002-10-07
WO1997027493A1 (fr) 1997-07-31
JPH09197018A (ja) 1997-07-31
GB2314712A (en) 1998-01-07
CN1081336C (zh) 2002-03-20
KR100278259B1 (ko) 2001-01-15

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8607 Notification of search results after publication
8304 Grant after examination procedure
8364 No opposition during term of opposition
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee

Effective date: 20110802