DE69828800D1 - Herstellungschnittstelle für ein integriertes schaltungsprüfsystem - Google Patents

Herstellungschnittstelle für ein integriertes schaltungsprüfsystem

Info

Publication number
DE69828800D1
DE69828800D1 DE69828800T DE69828800T DE69828800D1 DE 69828800 D1 DE69828800 D1 DE 69828800D1 DE 69828800 T DE69828800 T DE 69828800T DE 69828800 T DE69828800 T DE 69828800T DE 69828800 D1 DE69828800 D1 DE 69828800D1
Authority
DE
Germany
Prior art keywords
integrated circuit
probe system
circuit probe
manufacturing interface
interface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69828800T
Other languages
English (en)
Other versions
DE69828800T2 (de
Inventor
C Proskauer
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of DE69828800D1 publication Critical patent/DE69828800D1/de
Publication of DE69828800T2 publication Critical patent/DE69828800T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE69828800T 1997-09-16 1998-08-03 Herstellungschnittstelle für ein integriertes schaltungsprüfsystem Expired - Fee Related DE69828800T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US08/931,793 US5828674A (en) 1997-09-16 1997-09-16 Production interface for integrated circuit test system
US931793 1997-09-16
PCT/US1998/016171 WO1999014609A1 (en) 1997-09-16 1998-08-03 Production interface for an integrated circuit test system

Publications (2)

Publication Number Publication Date
DE69828800D1 true DE69828800D1 (de) 2005-03-03
DE69828800T2 DE69828800T2 (de) 2005-12-22

Family

ID=25461354

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69828800T Expired - Fee Related DE69828800T2 (de) 1997-09-16 1998-08-03 Herstellungschnittstelle für ein integriertes schaltungsprüfsystem

Country Status (7)

Country Link
US (2) US5828674A (de)
EP (1) EP1012614B1 (de)
JP (1) JP2001516885A (de)
KR (1) KR20010024015A (de)
CN (1) CN1192243C (de)
DE (1) DE69828800T2 (de)
WO (1) WO1999014609A1 (de)

Families Citing this family (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6047293A (en) * 1997-09-16 2000-04-04 Teradyne, Inc. System for storing and searching named device parameter data in a test system for testing an integrated circuit
US6035119A (en) * 1997-10-28 2000-03-07 Microsoft Corporation Method and apparatus for automatic generation of text and computer-executable code
US6834388B1 (en) 1998-03-13 2004-12-21 Iconics, Inc. Process control
SE9801295L (sv) * 1998-04-15 1999-10-16 Ericsson Telefon Ab L M Arkivsystem för datafiler
US6496203B1 (en) * 1998-05-27 2002-12-17 Microsoft Corporation Standardized and application-independent graphical user interface components implemented with web technology
US6732053B1 (en) * 1998-09-30 2004-05-04 Intel Corporation Method and apparatus for controlling a test cell
DE69915661T2 (de) 1998-10-16 2005-03-24 Iconics, Inc., Foxborough Prozesssteuerung
US6981215B1 (en) 1998-12-31 2005-12-27 Microsoft Corp. System for converting event-driven code into serially executed code
US6889379B1 (en) * 1998-12-31 2005-05-03 Microsoft Corporation Transporting objects between a client and a server
US7017116B2 (en) 1999-01-06 2006-03-21 Iconics, Inc. Graphical human-machine interface on a portable device
GB2351804B (en) * 1999-06-28 2003-09-24 Hyundai Electronics Ind Semiconductor factory automation system and method for controlling measurement equipment to measure semiconductor wafers
US6681351B1 (en) * 1999-10-12 2004-01-20 Teradyne, Inc. Easy to program automatic test equipment
US6675193B1 (en) * 1999-10-29 2004-01-06 Invensys Software Systems Method and system for remote control of a local system
US6487514B1 (en) * 1999-12-22 2002-11-26 Koninklijke Philips Electronics N.V. System and method for computer controlled interaction with integrated circuits
JP3327283B2 (ja) * 2000-03-10 2002-09-24 ヤマハ株式会社 ディジタルシグナルプロセッサ
US6880148B1 (en) * 2000-07-18 2005-04-12 Agilent Technologies, Inc. Active data type variable for use in software routines that facilitates customization of software routines and efficient triggering of variable processing
US20020170000A1 (en) * 2001-05-09 2002-11-14 Emanuel Gorodetsky Test and on-board programming station
US7996481B2 (en) * 2002-03-20 2011-08-09 At&T Intellectual Property I, L.P. Outbound notification using customer profile information
KR100445526B1 (ko) * 2002-04-09 2004-08-21 미래산업 주식회사 테스트 핸들러의 데이터 관리방법
US7143361B2 (en) * 2002-12-16 2006-11-28 National Instruments Corporation Operator interface controls for creating a run-time operator interface application for a test executive sequence
US20040225459A1 (en) 2003-02-14 2004-11-11 Advantest Corporation Method and structure to develop a test program for semiconductor integrated circuits
US7171587B2 (en) * 2003-04-28 2007-01-30 Teradyne, Inc. Automatic test system with easily modified software
US7567964B2 (en) * 2003-05-08 2009-07-28 Oracle International Corporation Configurable search graphical user interface and engine
JP2005009942A (ja) * 2003-06-18 2005-01-13 Matsushita Electric Ind Co Ltd 半導体集積回路の試験装置
US20050097548A1 (en) * 2003-10-31 2005-05-05 Dillenburg Brian J. Systems and methods for developing and distributing software components
US20050114066A1 (en) * 2003-11-24 2005-05-26 Kolman Robert S. Method and apparatus for detecting and correcting invalid test definition data
KR100640590B1 (ko) 2004-10-21 2006-11-01 삼성전자주식회사 핸들러 원격 제어가 가능한 반도체 소자의 검사 시스템 및그 작동방법
US7408339B2 (en) 2005-10-17 2008-08-05 Samsung Electronics Co., Ltd. Test system of semiconductor device having a handler remote control and method of operating the same
US8397207B2 (en) * 2007-11-26 2013-03-12 Microsoft Corporation Logical structure design surface
US20090224793A1 (en) * 2008-03-07 2009-09-10 Formfactor, Inc. Method And Apparatus For Designing A Custom Test System
JP2009063567A (ja) * 2008-08-22 2009-03-26 Advantest Corp 半導体試験システム
TWI394966B (zh) * 2009-02-11 2013-05-01 King Yuan Electronics Co Ltd A semiconductor test system with self - test for the electrical channel of the probe seat
TWI398649B (zh) * 2009-02-11 2013-06-11 King Yuan Electronics Co Ltd Semiconductor test system with self - test for electrical channel
JP2013250252A (ja) * 2012-06-04 2013-12-12 Advantest Corp テストプログラム
CN103969520A (zh) * 2013-01-30 2014-08-06 深圳伊欧陆微电子系统有限公司 一种硬件测试系统
JP2018141699A (ja) * 2017-02-28 2018-09-13 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
US11169203B1 (en) 2018-09-26 2021-11-09 Teradyne, Inc. Determining a configuration of a test system
US11461222B2 (en) 2020-04-16 2022-10-04 Teradyne, Inc. Determining the complexity of a test program

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5764908A (en) * 1996-07-12 1998-06-09 Sofmap Future Design, Inc. Network system containing program modules residing in different computers and executing commands without return results to calling modules

Also Published As

Publication number Publication date
CN1270672A (zh) 2000-10-18
EP1012614B1 (de) 2005-01-26
JP2001516885A (ja) 2001-10-02
US5828674A (en) 1998-10-27
EP1012614A1 (de) 2000-06-28
KR20010024015A (ko) 2001-03-26
CN1192243C (zh) 2005-03-09
US5938781A (en) 1999-08-17
DE69828800T2 (de) 2005-12-22
WO1999014609A1 (en) 1999-03-25

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee