DE112010002918B4 - Vorrichtung für einen Strahl geladener Teilchen und Abbildungsanzeigeverfahren - Google Patents

Vorrichtung für einen Strahl geladener Teilchen und Abbildungsanzeigeverfahren Download PDF

Info

Publication number
DE112010002918B4
DE112010002918B4 DE112010002918.0T DE112010002918T DE112010002918B4 DE 112010002918 B4 DE112010002918 B4 DE 112010002918B4 DE 112010002918 T DE112010002918 T DE 112010002918T DE 112010002918 B4 DE112010002918 B4 DE 112010002918B4
Authority
DE
Germany
Prior art keywords
sample
angle
image
state
incidence
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE112010002918.0T
Other languages
German (de)
English (en)
Other versions
DE112010002918T8 (de
DE112010002918T5 (de
Inventor
Tatsuya Hirato
Hiroyuki Komuro
Shigeru Kawamata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Hitachi High Tech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp, Hitachi High Tech Corp filed Critical Hitachi High Technologies Corp
Publication of DE112010002918T5 publication Critical patent/DE112010002918T5/de
Publication of DE112010002918T8 publication Critical patent/DE112010002918T8/de
Application granted granted Critical
Publication of DE112010002918B4 publication Critical patent/DE112010002918B4/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147Arrangements for directing or deflecting the discharge along a desired path
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147Arrangements for directing or deflecting the discharge along a desired path
    • H01J37/1478Beam tilting means, i.e. for stereoscopy or for beam channelling
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/22Optical, image processing or photographic arrangements associated with the tube
    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/022Stereoscopic imaging
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B30/00Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images
    • G02B30/20Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes
    • G02B30/22Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the stereoscopic type
    • G02B30/23Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the stereoscopic type using wavelength separation, e.g. using anaglyph techniques
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B30/00Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images
    • G02B30/20Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes
    • G02B30/26Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type
    • G02B30/27Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type involving lenticular arrays
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B30/00Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images
    • G02B30/20Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes
    • G02B30/26Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type
    • G02B30/30Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type involving parallax barriers
    • G02B30/31Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type involving parallax barriers involving active parallax barriers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26Electron or ion microscopes
    • H01J2237/2611Stereoscopic measurements and/or imaging
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/153Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
DE112010002918.0T 2009-08-10 2010-07-20 Vorrichtung für einen Strahl geladener Teilchen und Abbildungsanzeigeverfahren Active DE112010002918B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2009-185396 2009-08-10
JP2009185396A JP5350123B2 (ja) 2009-08-10 2009-08-10 荷電粒子線装置及び画像表示方法
PCT/JP2010/062173 WO2011018932A1 (ja) 2009-08-10 2010-07-20 荷電粒子線装置及び画像表示方法

Publications (3)

Publication Number Publication Date
DE112010002918T5 DE112010002918T5 (de) 2012-06-21
DE112010002918T8 DE112010002918T8 (de) 2012-08-23
DE112010002918B4 true DE112010002918B4 (de) 2017-05-04

Family

ID=43586111

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112010002918.0T Active DE112010002918B4 (de) 2009-08-10 2010-07-20 Vorrichtung für einen Strahl geladener Teilchen und Abbildungsanzeigeverfahren

Country Status (6)

Country Link
US (2) US20120132803A1 (enExample)
JP (1) JP5350123B2 (enExample)
KR (1) KR101436218B1 (enExample)
CN (1) CN102484025B (enExample)
DE (1) DE112010002918B4 (enExample)
WO (1) WO2011018932A1 (enExample)

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10298834B2 (en) 2006-12-01 2019-05-21 Google Llc Video refocusing
JP5581248B2 (ja) * 2011-03-08 2014-08-27 株式会社日立ハイテクノロジーズ 走査電子顕微鏡
JP5698157B2 (ja) 2012-01-06 2015-04-08 株式会社日立ハイテクノロジーズ 荷電粒子線装置および傾斜観察画像表示方法
US9858649B2 (en) 2015-09-30 2018-01-02 Lytro, Inc. Depth-based image blurring
US8997021B2 (en) * 2012-11-06 2015-03-31 Lytro, Inc. Parallax and/or three-dimensional effects for thumbnail image displays
EP2735866A1 (en) * 2012-11-27 2014-05-28 Fei Company Method of sampling a sample and displaying obtained information
US10334151B2 (en) 2013-04-22 2019-06-25 Google Llc Phase detection autofocus using subaperture images
JP5464535B1 (ja) * 2013-07-23 2014-04-09 株式会社日立ハイテクノロジーズ Ebsd検出器で所望箇所を容易に分析できる荷電粒子線装置およびその制御方法
JP6282076B2 (ja) * 2013-10-04 2018-02-21 株式会社日立ハイテクノロジーズ 荷電粒子線装置
JP6320186B2 (ja) * 2014-06-16 2018-05-09 株式会社日立ハイテクノロジーズ 荷電粒子線応用装置
US9767986B2 (en) * 2014-08-29 2017-09-19 Kla-Tencor Corporation Scanning electron microscope and methods of inspecting and reviewing samples
US10546424B2 (en) 2015-04-15 2020-01-28 Google Llc Layered content delivery for virtual and augmented reality experiences
US10275898B1 (en) 2015-04-15 2019-04-30 Google Llc Wedge-based light-field video capture
US10540818B2 (en) 2015-04-15 2020-01-21 Google Llc Stereo image generation and interactive playback
US10565734B2 (en) 2015-04-15 2020-02-18 Google Llc Video capture, processing, calibration, computational fiber artifact removal, and light-field pipeline
US10419737B2 (en) 2015-04-15 2019-09-17 Google Llc Data structures and delivery methods for expediting virtual reality playback
US10440407B2 (en) 2017-05-09 2019-10-08 Google Llc Adaptive control for immersive experience delivery
US10444931B2 (en) 2017-05-09 2019-10-15 Google Llc Vantage generation and interactive playback
US10341632B2 (en) 2015-04-15 2019-07-02 Google Llc. Spatial random access enabled video system with a three-dimensional viewing volume
US11328446B2 (en) 2015-04-15 2022-05-10 Google Llc Combining light-field data with active depth data for depth map generation
US10412373B2 (en) 2015-04-15 2019-09-10 Google Llc Image capture for virtual reality displays
US10567464B2 (en) 2015-04-15 2020-02-18 Google Llc Video compression with adaptive view-dependent lighting removal
US10469873B2 (en) 2015-04-15 2019-11-05 Google Llc Encoding and decoding virtual reality video
US9979909B2 (en) 2015-07-24 2018-05-22 Lytro, Inc. Automatic lens flare detection and correction for light-field images
GB201609995D0 (en) * 2016-06-08 2016-07-20 Aquasium Technology Ltd Shaped welding head
US10275892B2 (en) 2016-06-09 2019-04-30 Google Llc Multi-view scene segmentation and propagation
US11120967B2 (en) 2016-11-22 2021-09-14 Hitachi High-Tech Corporation Charged particle beam apparatus and sample observation method using superimposed comparison image display
US10679361B2 (en) 2016-12-05 2020-06-09 Google Llc Multi-view rotoscope contour propagation
US10594945B2 (en) 2017-04-03 2020-03-17 Google Llc Generating dolly zoom effect using light field image data
US10474227B2 (en) 2017-05-09 2019-11-12 Google Llc Generation of virtual reality with 6 degrees of freedom from limited viewer data
WO2018217646A1 (en) 2017-05-22 2018-11-29 Howmedica Osteonics Corp. Device for in-situ fabrication process monitoring and feedback control of an electron beam additive manufacturing process
US10354399B2 (en) 2017-05-25 2019-07-16 Google Llc Multi-view back-projection to a light-field
US10545215B2 (en) 2017-09-13 2020-01-28 Google Llc 4D camera tracking and optical stabilization
US11424099B2 (en) * 2017-12-21 2022-08-23 Hitachi High-Tech Corporation Charged particle beam device
US10965862B2 (en) 2018-01-18 2021-03-30 Google Llc Multi-camera navigation interface
DE102018202728B4 (de) * 2018-02-22 2019-11-21 Carl Zeiss Microscopy Gmbh Verfahren zum Betrieb eines Teilchenstrahlgeräts, Computerprogrammprodukt und Teilchenstrahlgerät zur Durchführung des Verfahrens
JP7022815B2 (ja) * 2018-03-29 2022-02-18 株式会社日立ハイテク 荷電粒子線装置
US11117195B2 (en) 2018-07-19 2021-09-14 The University Of Liverpool System and process for in-process electron beam profile and location analyses
US11094499B1 (en) * 2020-10-04 2021-08-17 Borries Pte. Ltd. Apparatus of charged-particle beam such as electron microscope comprising sliding specimen table within objective lens
CN113035675A (zh) * 2021-02-26 2021-06-25 中国科学院生物物理研究所 带电粒子束设备

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3924605A1 (de) * 1988-07-25 1990-02-01 Hitachi Ltd Rasterelektronenmikroskop

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5136196B2 (enExample) * 1972-05-22 1976-10-07
JPS5548610Y2 (enExample) * 1975-10-08 1980-11-13
JPS5854784Y2 (ja) * 1978-09-25 1983-12-14 株式会社日立製作所 立体走査電子顕微鏡
JPS57145259A (en) * 1981-03-03 1982-09-08 Akashi Seisakusho Co Ltd Scanning type electron microscope and its similar device
JPS5854784A (ja) * 1981-09-29 1983-03-31 Nec Corp テレビジヨンカメラのシエ−デイング補正装置
JPS62198043A (ja) * 1986-02-25 1987-09-01 Sanyuu Denshi Kk 立体観察装置
JPS63231856A (ja) * 1987-03-19 1988-09-27 Jeol Ltd 電子顕微鏡等の制御方法
JPH052364U (ja) * 1991-02-25 1993-01-14 サンユー電子株式会社 ステレオ表示装置
JP2000102037A (ja) * 1998-09-25 2000-04-07 Canon Inc 撮像装置及び画像生成方法
JP2000284223A (ja) * 1999-03-30 2000-10-13 Idemitsu Kosan Co Ltd 立体表示方法および立体表示装置
JP4069545B2 (ja) * 1999-05-19 2008-04-02 株式会社日立製作所 電子顕微方法及びそれを用いた電子顕微鏡並び生体試料検査方法及び生体検査装置
AU2001266862A1 (en) * 2000-06-12 2001-12-24 Vrex, Inc. Electronic stereoscopic media delivery system
JP2001357811A (ja) * 2000-06-12 2001-12-26 Hitachi Ltd 走査形荷電粒子顕微鏡、並びに走査形荷電粒子顕微鏡の焦点合わせ方法及び非点収差補正方法
US6852974B2 (en) * 2001-03-06 2005-02-08 Topcon Corporation Electron beam device and method for stereoscopic measurements
JP4627771B2 (ja) * 2002-09-11 2011-02-09 株式会社日立ハイテクノロジーズ 荷電粒子線装置
JP3959379B2 (ja) * 2003-08-27 2007-08-15 株式会社日立ハイテクノロジーズ 形状測定装置及び形状測定方法
US7164128B2 (en) * 2003-11-25 2007-01-16 Hitachi High-Technologies Corporation Method and apparatus for observing a specimen
JP4620981B2 (ja) * 2004-08-10 2011-01-26 株式会社日立ハイテクノロジーズ 荷電粒子ビーム装置
JP4511303B2 (ja) * 2004-10-05 2010-07-28 株式会社日立ハイテクノロジーズ 荷電粒子線装置および寸法測定方法
US7462828B2 (en) * 2005-04-28 2008-12-09 Hitachi High-Technologies Corporation Inspection method and inspection system using charged particle beam
JP4855726B2 (ja) * 2005-07-15 2012-01-18 株式会社キーエンス 拡大観察装置、拡大観察装置の操作方法、拡大観察装置操作プログラムおよびコンピュータで読み取り可能な記録媒体並びに記録した機器
JP2007049598A (ja) * 2005-08-12 2007-02-22 Seiko Epson Corp 画像処理コントローラ、電子機器及び画像処理方法
JP2007179753A (ja) * 2005-12-27 2007-07-12 Hitachi High-Technologies Corp 走査透過電子顕微鏡、及び収差測定方法
JP5271491B2 (ja) * 2006-10-26 2013-08-21 株式会社日立ハイテクノロジーズ 電子線応用装置および試料検査方法
JP4857101B2 (ja) * 2006-12-21 2012-01-18 株式会社日立ハイテクノロジーズ プローブ評価方法
JP2008298480A (ja) * 2007-05-29 2008-12-11 Beamsense Co Ltd ステレオ透視装置およびそれを用いたステレオ観察方法
JP5183318B2 (ja) * 2008-06-26 2013-04-17 株式会社日立ハイテクノロジーズ 荷電粒子線装置
JP5302595B2 (ja) * 2008-08-06 2013-10-02 株式会社日立ハイテクノロジーズ 傾斜観察方法および観察装置
US8129693B2 (en) * 2009-06-26 2012-03-06 Carl Zeiss Nts Gmbh Charged particle beam column and method of operating same

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3924605A1 (de) * 1988-07-25 1990-02-01 Hitachi Ltd Rasterelektronenmikroskop

Also Published As

Publication number Publication date
CN102484025B (zh) 2015-11-25
DE112010002918T8 (de) 2012-08-23
KR20120040203A (ko) 2012-04-26
US9202669B2 (en) 2015-12-01
WO2011018932A1 (ja) 2011-02-17
KR101436218B1 (ko) 2014-09-01
CN102484025A (zh) 2012-05-30
JP5350123B2 (ja) 2013-11-27
DE112010002918T5 (de) 2012-06-21
JP2011040240A (ja) 2011-02-24
US20120132803A1 (en) 2012-05-31
US20140001355A1 (en) 2014-01-02

Similar Documents

Publication Publication Date Title
DE112010002918B4 (de) Vorrichtung für einen Strahl geladener Teilchen und Abbildungsanzeigeverfahren
DE112011104595B4 (de) Vorrichtung mit einem geladenen Teilchenstrahl sowie Verfahren zur Steuerung
DE69224506T2 (de) Elektronenstrahlgerät
DE112014003760B4 (de) Elektronenmikroskop und Beobachtungsverfahren
DE102018202728B4 (de) Verfahren zum Betrieb eines Teilchenstrahlgeräts, Computerprogrammprodukt und Teilchenstrahlgerät zur Durchführung des Verfahrens
EP2461346B1 (de) Teilchenstrahlgerät mit Ablenksystem
DE3924605A1 (de) Rasterelektronenmikroskop
DE102013014976A1 (de) Teilchenoptisches System
DE112013001112B4 (de) Ladungsteilchenstrahlgerät und Probenobservationssystem
DE112012005293B4 (de) Ladungsteilchenstrahlvorrichtung und Anzeigeverfahren für eine geneigte Abbildung
DE102007026847A1 (de) Teilchenstrahlgerät und Verfahren zur Anwendung bei einem Teilchenstrahlgerät
DE112016005577B4 (de) Ladungsträgerstrahlvorrichtung und Verfahren zur Einstellung ihrer optischen Achse
DE69920182T2 (de) Korpuskularstrahloptisches gerät mit auger-elektronendetektion
DE112014004151T5 (de) Verfahren zur Korrektur der Neigung eines Strahls geladener Teilchen und mit einem Strahl geladener Teilchen arbeitende Vorrichtung
DE2335304B2 (de) Rasterelektronenmikroskop
DE112017007787T5 (de) Ladungsträgerstrahlvorrichtung
DE2930225A1 (de) Verfahren und vorrichtung zur kompensation des astigmatismus eines ladungstraegerstrahls
DE1927038A1 (de) Stereoskopisches Elektronenrastermikroskop
DE112010004145T5 (de) Vorrichtung zur Abtastung mit einem geladenen Teilchenstrahl und Vefahren zur Korrektur der chromatischen und sphärischen Aberration in Kombination
DE2418279C2 (de) Elektronenstrahl-Abtastinstrument
DE2246404B2 (de) Raster-Elektronenmikroskop
DE3032818A1 (de) Durchstrahlungsrasterelektronenmikroskop mit automatischer strahlkorrektur
EP2224464A1 (de) Korpuskulares optisches bilderzeugungssystem
DE112018007105B4 (de) Ladungsteilchenstrahlvorrichtung
DE112008002044T5 (de) Vorrichtung zur räumlichen Darstellung von Proben in Echtzeit

Legal Events

Date Code Title Description
R163 Identified publications notified
R012 Request for examination validly filed
R016 Response to examination communication
R016 Response to examination communication
R018 Grant decision by examination section/examining division
R020 Patent grant now final
R081 Change of applicant/patentee

Owner name: HITACHI HIGH-TECH CORPORATION, JP

Free format text: FORMER OWNER: HITACHI HIGH-TECHNOLOGIES CORPORATION, TOKYO, JP

R082 Change of representative

Representative=s name: STREHL SCHUEBEL-HOPF & PARTNER MBB PATENTANWAE, DE