DE112010002918T8 - Vorrichtung für einen Strahl geladener Teilchen und Abbildungsanzeigeverfahren - Google Patents
Vorrichtung für einen Strahl geladener Teilchen und Abbildungsanzeigeverfahren Download PDFInfo
- Publication number
- DE112010002918T8 DE112010002918T8 DE112010002918T DE112010002918T DE112010002918T8 DE 112010002918 T8 DE112010002918 T8 DE 112010002918T8 DE 112010002918 T DE112010002918 T DE 112010002918T DE 112010002918 T DE112010002918 T DE 112010002918T DE 112010002918 T8 DE112010002918 T8 DE 112010002918T8
- Authority
- DE
- Germany
- Prior art keywords
- image display
- charged particle
- particle beam
- display method
- beam apparatus
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000002245 particle Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
- H01J37/1478—Beam tilting means, i.e. for stereoscopy or for beam channelling
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
-
- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/022—Stereoscopic imaging
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B30/00—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images
- G02B30/20—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes
- G02B30/22—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the stereoscopic type
- G02B30/23—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the stereoscopic type using wavelength separation, e.g. using anaglyph techniques
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B30/00—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images
- G02B30/20—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes
- G02B30/26—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type
- G02B30/27—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type involving lenticular arrays
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B30/00—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images
- G02B30/20—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes
- G02B30/26—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type
- G02B30/30—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type involving parallax barriers
- G02B30/31—Optical systems or apparatus for producing three-dimensional [3D] effects, e.g. stereoscopic images by providing first and second parallax images to an observer's left and right eyes of the autostereoscopic type involving parallax barriers involving active parallax barriers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/2611—Stereoscopic measurements and/or imaging
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/153—Electron-optical or ion-optical arrangements for the correction of image defects, e.g. stigmators
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009-185396 | 2009-08-10 | ||
JP2009185396A JP5350123B2 (ja) | 2009-08-10 | 2009-08-10 | 荷電粒子線装置及び画像表示方法 |
PCT/JP2010/062173 WO2011018932A1 (ja) | 2009-08-10 | 2010-07-20 | 荷電粒子線装置及び画像表示方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
DE112010002918T5 DE112010002918T5 (de) | 2012-06-21 |
DE112010002918T8 true DE112010002918T8 (de) | 2012-08-23 |
DE112010002918B4 DE112010002918B4 (de) | 2017-05-04 |
Family
ID=43586111
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE112010002918.0T Active DE112010002918B4 (de) | 2009-08-10 | 2010-07-20 | Vorrichtung für einen Strahl geladener Teilchen und Abbildungsanzeigeverfahren |
Country Status (6)
Country | Link |
---|---|
US (2) | US20120132803A1 (de) |
JP (1) | JP5350123B2 (de) |
KR (1) | KR101436218B1 (de) |
CN (1) | CN102484025B (de) |
DE (1) | DE112010002918B4 (de) |
WO (1) | WO2011018932A1 (de) |
Families Citing this family (40)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10298834B2 (en) | 2006-12-01 | 2019-05-21 | Google Llc | Video refocusing |
JP5581248B2 (ja) * | 2011-03-08 | 2014-08-27 | 株式会社日立ハイテクノロジーズ | 走査電子顕微鏡 |
JP5698157B2 (ja) | 2012-01-06 | 2015-04-08 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置および傾斜観察画像表示方法 |
US9858649B2 (en) | 2015-09-30 | 2018-01-02 | Lytro, Inc. | Depth-based image blurring |
US8997021B2 (en) * | 2012-11-06 | 2015-03-31 | Lytro, Inc. | Parallax and/or three-dimensional effects for thumbnail image displays |
EP2735866A1 (de) * | 2012-11-27 | 2014-05-28 | Fei Company | Verfahren zur Entnahme einer Probe und Anzeigen der erhaltenen Informationen |
US10334151B2 (en) | 2013-04-22 | 2019-06-25 | Google Llc | Phase detection autofocus using subaperture images |
JP5464535B1 (ja) * | 2013-07-23 | 2014-04-09 | 株式会社日立ハイテクノロジーズ | Ebsd検出器で所望箇所を容易に分析できる荷電粒子線装置およびその制御方法 |
JP6282076B2 (ja) * | 2013-10-04 | 2018-02-21 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
JP6320186B2 (ja) * | 2014-06-16 | 2018-05-09 | 株式会社日立ハイテクノロジーズ | 荷電粒子線応用装置 |
US9767986B2 (en) * | 2014-08-29 | 2017-09-19 | Kla-Tencor Corporation | Scanning electron microscope and methods of inspecting and reviewing samples |
US10444931B2 (en) | 2017-05-09 | 2019-10-15 | Google Llc | Vantage generation and interactive playback |
US10567464B2 (en) | 2015-04-15 | 2020-02-18 | Google Llc | Video compression with adaptive view-dependent lighting removal |
US10565734B2 (en) | 2015-04-15 | 2020-02-18 | Google Llc | Video capture, processing, calibration, computational fiber artifact removal, and light-field pipeline |
US10412373B2 (en) | 2015-04-15 | 2019-09-10 | Google Llc | Image capture for virtual reality displays |
US10546424B2 (en) | 2015-04-15 | 2020-01-28 | Google Llc | Layered content delivery for virtual and augmented reality experiences |
US10275898B1 (en) | 2015-04-15 | 2019-04-30 | Google Llc | Wedge-based light-field video capture |
US10419737B2 (en) | 2015-04-15 | 2019-09-17 | Google Llc | Data structures and delivery methods for expediting virtual reality playback |
US10440407B2 (en) | 2017-05-09 | 2019-10-08 | Google Llc | Adaptive control for immersive experience delivery |
US10469873B2 (en) | 2015-04-15 | 2019-11-05 | Google Llc | Encoding and decoding virtual reality video |
US10341632B2 (en) | 2015-04-15 | 2019-07-02 | Google Llc. | Spatial random access enabled video system with a three-dimensional viewing volume |
US11328446B2 (en) | 2015-04-15 | 2022-05-10 | Google Llc | Combining light-field data with active depth data for depth map generation |
US10540818B2 (en) | 2015-04-15 | 2020-01-21 | Google Llc | Stereo image generation and interactive playback |
US9979909B2 (en) | 2015-07-24 | 2018-05-22 | Lytro, Inc. | Automatic lens flare detection and correction for light-field images |
GB201609995D0 (en) * | 2016-06-08 | 2016-07-20 | Aquasium Technology Ltd | Shaped welding head |
US10275892B2 (en) | 2016-06-09 | 2019-04-30 | Google Llc | Multi-view scene segmentation and propagation |
US11120967B2 (en) | 2016-11-22 | 2021-09-14 | Hitachi High-Tech Corporation | Charged particle beam apparatus and sample observation method using superimposed comparison image display |
US10679361B2 (en) | 2016-12-05 | 2020-06-09 | Google Llc | Multi-view rotoscope contour propagation |
US10594945B2 (en) | 2017-04-03 | 2020-03-17 | Google Llc | Generating dolly zoom effect using light field image data |
US10474227B2 (en) | 2017-05-09 | 2019-11-12 | Google Llc | Generation of virtual reality with 6 degrees of freedom from limited viewer data |
AU2018273352B2 (en) | 2017-05-22 | 2023-07-27 | Howmedica Osteonics Corp. | Device for in-situ fabrication process monitoring and feedback control of an electron beam additive manufacturing process |
US10354399B2 (en) | 2017-05-25 | 2019-07-16 | Google Llc | Multi-view back-projection to a light-field |
US10545215B2 (en) | 2017-09-13 | 2020-01-28 | Google Llc | 4D camera tracking and optical stabilization |
WO2019123604A1 (ja) * | 2017-12-21 | 2019-06-27 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
US10965862B2 (en) | 2018-01-18 | 2021-03-30 | Google Llc | Multi-camera navigation interface |
DE102018202728B4 (de) * | 2018-02-22 | 2019-11-21 | Carl Zeiss Microscopy Gmbh | Verfahren zum Betrieb eines Teilchenstrahlgeräts, Computerprogrammprodukt und Teilchenstrahlgerät zur Durchführung des Verfahrens |
JP7022815B2 (ja) * | 2018-03-29 | 2022-02-18 | 株式会社日立ハイテク | 荷電粒子線装置 |
EP3597333A1 (de) | 2018-07-19 | 2020-01-22 | Howmedica Osteonics Corporation | System und verfahren für prozessinterne elektronenstrahlprofil- und positionsanalysen |
US11094499B1 (en) * | 2020-10-04 | 2021-08-17 | Borries Pte. Ltd. | Apparatus of charged-particle beam such as electron microscope comprising sliding specimen table within objective lens |
CN113035675A (zh) * | 2021-02-26 | 2021-06-25 | 中国科学院生物物理研究所 | 带电粒子束设备 |
Family Cites Families (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5136196B2 (de) * | 1972-05-22 | 1976-10-07 | ||
JPS5548610Y2 (de) * | 1975-10-08 | 1980-11-13 | ||
JPS5854784Y2 (ja) * | 1978-09-25 | 1983-12-14 | 株式会社日立製作所 | 立体走査電子顕微鏡 |
JPS57145259A (en) * | 1981-03-03 | 1982-09-08 | Akashi Seisakusho Co Ltd | Scanning type electron microscope and its similar device |
JPS5854784A (ja) * | 1981-09-29 | 1983-03-31 | Nec Corp | テレビジヨンカメラのシエ−デイング補正装置 |
JPS62198043A (ja) * | 1986-02-25 | 1987-09-01 | Sanyuu Denshi Kk | 立体観察装置 |
JPS63231856A (ja) * | 1987-03-19 | 1988-09-27 | Jeol Ltd | 電子顕微鏡等の制御方法 |
JPH0233843A (ja) | 1988-07-25 | 1990-02-05 | Hitachi Ltd | 走査電子顕微鏡 |
JPH052364U (ja) * | 1991-02-25 | 1993-01-14 | サンユー電子株式会社 | ステレオ表示装置 |
JP2000102037A (ja) * | 1998-09-25 | 2000-04-07 | Canon Inc | 撮像装置及び画像生成方法 |
JP2000284223A (ja) * | 1999-03-30 | 2000-10-13 | Idemitsu Kosan Co Ltd | 立体表示方法および立体表示装置 |
JP4069545B2 (ja) * | 1999-05-19 | 2008-04-02 | 株式会社日立製作所 | 電子顕微方法及びそれを用いた電子顕微鏡並び生体試料検査方法及び生体検査装置 |
JP2001357811A (ja) * | 2000-06-12 | 2001-12-26 | Hitachi Ltd | 走査形荷電粒子顕微鏡、並びに走査形荷電粒子顕微鏡の焦点合わせ方法及び非点収差補正方法 |
US6765568B2 (en) * | 2000-06-12 | 2004-07-20 | Vrex, Inc. | Electronic stereoscopic media delivery system |
US6852974B2 (en) * | 2001-03-06 | 2005-02-08 | Topcon Corporation | Electron beam device and method for stereoscopic measurements |
JP4627771B2 (ja) * | 2002-09-11 | 2011-02-09 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
JP3959379B2 (ja) * | 2003-08-27 | 2007-08-15 | 株式会社日立ハイテクノロジーズ | 形状測定装置及び形状測定方法 |
US7164128B2 (en) * | 2003-11-25 | 2007-01-16 | Hitachi High-Technologies Corporation | Method and apparatus for observing a specimen |
JP4620981B2 (ja) * | 2004-08-10 | 2011-01-26 | 株式会社日立ハイテクノロジーズ | 荷電粒子ビーム装置 |
JP4511303B2 (ja) * | 2004-10-05 | 2010-07-28 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置および寸法測定方法 |
US7462828B2 (en) * | 2005-04-28 | 2008-12-09 | Hitachi High-Technologies Corporation | Inspection method and inspection system using charged particle beam |
JP4855726B2 (ja) * | 2005-07-15 | 2012-01-18 | 株式会社キーエンス | 拡大観察装置、拡大観察装置の操作方法、拡大観察装置操作プログラムおよびコンピュータで読み取り可能な記録媒体並びに記録した機器 |
JP2007049598A (ja) * | 2005-08-12 | 2007-02-22 | Seiko Epson Corp | 画像処理コントローラ、電子機器及び画像処理方法 |
JP2007179753A (ja) * | 2005-12-27 | 2007-07-12 | Hitachi High-Technologies Corp | 走査透過電子顕微鏡、及び収差測定方法 |
JP5271491B2 (ja) * | 2006-10-26 | 2013-08-21 | 株式会社日立ハイテクノロジーズ | 電子線応用装置および試料検査方法 |
JP4857101B2 (ja) * | 2006-12-21 | 2012-01-18 | 株式会社日立ハイテクノロジーズ | プローブ評価方法 |
JP2008298480A (ja) * | 2007-05-29 | 2008-12-11 | Beamsense Co Ltd | ステレオ透視装置およびそれを用いたステレオ観察方法 |
JP5183318B2 (ja) * | 2008-06-26 | 2013-04-17 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
JP5302595B2 (ja) * | 2008-08-06 | 2013-10-02 | 株式会社日立ハイテクノロジーズ | 傾斜観察方法および観察装置 |
US8129693B2 (en) * | 2009-06-26 | 2012-03-06 | Carl Zeiss Nts Gmbh | Charged particle beam column and method of operating same |
-
2009
- 2009-08-10 JP JP2009185396A patent/JP5350123B2/ja active Active
-
2010
- 2010-07-20 CN CN201080035234.XA patent/CN102484025B/zh active Active
- 2010-07-20 KR KR1020127001764A patent/KR101436218B1/ko active IP Right Grant
- 2010-07-20 DE DE112010002918.0T patent/DE112010002918B4/de active Active
- 2010-07-20 US US13/389,285 patent/US20120132803A1/en not_active Abandoned
- 2010-07-20 WO PCT/JP2010/062173 patent/WO2011018932A1/ja active Application Filing
-
2013
- 2013-09-05 US US14/018,919 patent/US9202669B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
DE112010002918B4 (de) | 2017-05-04 |
WO2011018932A1 (ja) | 2011-02-17 |
CN102484025A (zh) | 2012-05-30 |
KR101436218B1 (ko) | 2014-09-01 |
US9202669B2 (en) | 2015-12-01 |
US20120132803A1 (en) | 2012-05-31 |
CN102484025B (zh) | 2015-11-25 |
KR20120040203A (ko) | 2012-04-26 |
DE112010002918T5 (de) | 2012-06-21 |
JP2011040240A (ja) | 2011-02-24 |
US20140001355A1 (en) | 2014-01-02 |
JP5350123B2 (ja) | 2013-11-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE112010002918T8 (de) | Vorrichtung für einen Strahl geladener Teilchen und Abbildungsanzeigeverfahren | |
GB2475315B (en) | Inspection apparatus and method | |
EP2499819A4 (de) | Bildanzeigevorrichtung und bildanzeigeverfahren dafür | |
EP2612493A4 (de) | Bildanzeigevorrichtung und verfahren zu deren betrieb | |
EP2599324A4 (de) | Bildanzeigevorrichtung und verfahren zu deren betrieb | |
EP2583470A4 (de) | Bildanzeigevorrichtung und verfahren zu deren betrieb | |
EP2556679A4 (de) | Bildanzeigevorrichtung und verfahren zu deren betrieb | |
EP2534622A4 (de) | Vorrichtung und verfahren für rechnungsausstellung und -bezahlung | |
EP2612504A4 (de) | Bildanzeigevorrichtung und verfahren zu deren betrieb | |
EP2568431A4 (de) | Verfahren und vorrichtung zur bereitstellung einer online-werbung | |
EP2475165A4 (de) | Bildanzeigevorrichtung und betriebsverfahren dafür | |
EP2328168A4 (de) | Vorrichtung für geladene teilchenstrahlen und darin angewendetes verfahren zur messung geometrischer abweichungen | |
GB0907987D0 (en) | Apparatus and method for particle size analysis | |
GB2478040B (en) | Image capture apparatus and method | |
EP2577223A4 (de) | Verfahren und vorrichtung für erweiterte augenmessung | |
EP2630575A4 (de) | Bildabgleichvorrichtung unf bildabgleichverfahren | |
IL218738A0 (en) | Inspection method and apparatus | |
EP2788195A4 (de) | Bildlöschvorrichtung und bildlöschverfahren | |
EP2698983A4 (de) | Bildaufnahmevorrichtung und bildaufnahmeverfahren | |
GB2485906B (en) | Methods and apparatus for generating a modified intensity projection image | |
HK1180773A1 (en) | Optical-path-switching apparatus and light signal optical-path-switching method | |
EP2731334A4 (de) | Bildaufnahmevorrichtung und bilderzeugungsverfahren | |
GB201000447D0 (en) | Method and apparatus for illuminating an object in a display case | |
SG10201508629SA (en) | Lithography method and apparatus | |
EP2896061C0 (de) | Integrierte optische inspektionsvorrichtung für geladene teilchen |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
R163 | Identified publications notified | ||
R012 | Request for examination validly filed | ||
R016 | Response to examination communication | ||
R016 | Response to examination communication | ||
R018 | Grant decision by examination section/examining division | ||
R020 | Patent grant now final | ||
R081 | Change of applicant/patentee |
Owner name: HITACHI HIGH-TECH CORPORATION, JP Free format text: FORMER OWNER: HITACHI HIGH-TECHNOLOGIES CORPORATION, TOKYO, JP |
|
R082 | Change of representative |
Representative=s name: STREHL SCHUEBEL-HOPF & PARTNER MBB PATENTANWAE, DE |