DE102017204654B4 - Integrierte schaltung - Google Patents
Integrierte schaltung Download PDFInfo
- Publication number
- DE102017204654B4 DE102017204654B4 DE102017204654.6A DE102017204654A DE102017204654B4 DE 102017204654 B4 DE102017204654 B4 DE 102017204654B4 DE 102017204654 A DE102017204654 A DE 102017204654A DE 102017204654 B4 DE102017204654 B4 DE 102017204654B4
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- Germany
- Prior art keywords
- integrated circuit
- ground
- line
- amplifier stage
- amplifier
- Prior art date
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/02—Modifications of amplifiers to raise the efficiency, e.g. gliding Class A stages, use of an auxiliary oscillation
- H03F1/0205—Modifications of amplifiers to raise the efficiency, e.g. gliding Class A stages, use of an auxiliary oscillation in transistor amplifiers
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/189—High-frequency amplifiers, e.g. radio frequency amplifiers
- H03F3/19—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only
- H03F3/195—High-frequency amplifiers, e.g. radio frequency amplifiers with semiconductor devices only in integrated circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/528—Layout of the interconnection structure
- H01L23/5286—Arrangements of power or ground buses
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/60—Amplifiers in which coupling networks have distributed constants, e.g. with waveguide resonators
- H03F3/602—Combinations of several amplifiers
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- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/5227—Inductive arrangements or effects of, or between, wiring layers
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- H01L23/00—Details of semiconductor or other solid state devices
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- H01L23/64—Impedance arrangements
- H01L23/645—Inductive arrangements
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- H01L23/64—Impedance arrangements
- H01L23/647—Resistive arrangements
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- H—ELECTRICITY
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/17—Structure, shape, material or disposition of the bump connectors after the connecting process of a plurality of bump connectors
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/08—Modifications of amplifiers to reduce detrimental influences of internal impedances of amplifying elements
- H03F1/083—Modifications of amplifiers to reduce detrimental influences of internal impedances of amplifying elements in transistor amplifiers
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/56—Modifications of input or output impedances, not otherwise provided for
- H03F1/565—Modifications of input or output impedances, not otherwise provided for using inductive elements
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- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/4508—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using bipolar transistors as the active amplifying circuit
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- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
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- H01L2223/66—High-frequency adaptations
- H01L2223/6605—High-frequency electrical connections
- H01L2223/6627—Waveguides, e.g. microstrip line, strip line, coplanar line
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- H01L2223/6644—Packaging aspects of high-frequency amplifiers
- H01L2223/6655—Matching arrangements, e.g. arrangement of inductive and capacitive components
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/0401—Bonding areas specifically adapted for bump connectors, e.g. under bump metallisation [UBM]
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- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0556—Disposition
- H01L2224/05571—Disposition the external layer being disposed in a recess of the surface
- H01L2224/05572—Disposition the external layer being disposed in a recess of the surface the external layer extending out of an opening
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/16227—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation the bump connector connecting to a bond pad of the item
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
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- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/102—Material of the semiconductor or solid state bodies
- H01L2924/1025—Semiconducting materials
- H01L2924/1026—Compound semiconductors
- H01L2924/1032—III-V
- H01L2924/10329—Gallium arsenide [GaAs]
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- H01L2924/1423—Monolithic Microwave Integrated Circuit [MMIC]
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- H01L2924/30111—Impedance matching
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
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- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/186—Indexing scheme relating to amplifiers the ground, reference potential being controlled
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/222—A circuit being added at the input of an amplifier to adapt the input impedance of the amplifier
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/387—A circuit being added at the output of an amplifier to adapt the output impedance of the amplifier
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/408—Indexing scheme relating to amplifiers the output amplifying stage of an amplifier comprising three power stages
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F2200/00—Indexing scheme relating to amplifiers
- H03F2200/451—Indexing scheme relating to amplifiers the amplifier being a radio frequency amplifier
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/181—Low-frequency amplifiers, e.g. audio preamplifiers
- H03F3/183—Low-frequency amplifiers, e.g. audio preamplifiers with semiconductor devices only
- H03F3/187—Low-frequency amplifiers, e.g. audio preamplifiers with semiconductor devices only in integrated circuits
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Geometry (AREA)
- Semiconductor Integrated Circuits (AREA)
- Amplifiers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2016-084659 | 2016-04-20 | ||
| JP2016084659A JP6620656B2 (ja) | 2016-04-20 | 2016-04-20 | 集積回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE102017204654A1 DE102017204654A1 (de) | 2017-10-26 |
| DE102017204654B4 true DE102017204654B4 (de) | 2022-05-12 |
Family
ID=60021410
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102017204654.6A Active DE102017204654B4 (de) | 2016-04-20 | 2017-03-21 | Integrierte schaltung |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10027282B2 (enExample) |
| JP (1) | JP6620656B2 (enExample) |
| KR (1) | KR101909815B1 (enExample) |
| CN (1) | CN107305880B (enExample) |
| DE (1) | DE102017204654B4 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2020088468A (ja) * | 2018-11-19 | 2020-06-04 | 富士通株式会社 | 増幅器及び増幅装置 |
| JP7424157B2 (ja) * | 2020-03-25 | 2024-01-30 | Tdk株式会社 | 電子部品及びその製造方法 |
| TW202533401A (zh) * | 2024-01-23 | 2025-08-16 | 美商谷歌有限責任公司 | 再分佈層(rdl)扇出封裝設計與小晶片晶粒至晶粒互連佈線 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001156242A (ja) | 1999-11-25 | 2001-06-08 | Mitsubishi Electric Corp | 多段増幅装置 |
| US20090206959A1 (en) | 2008-02-19 | 2009-08-20 | Hitachi Kokusai Electric Inc. | Rf module |
| JP2015080018A (ja) | 2013-10-15 | 2015-04-23 | 富士通株式会社 | 半導体装置 |
| JP2016084659A (ja) | 2014-10-28 | 2016-05-19 | 三協立山株式会社 | 手すり |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5632754A (en) * | 1979-08-24 | 1981-04-02 | Nec Corp | Hybrid integrated circuit |
| US5010588A (en) * | 1988-03-10 | 1991-04-23 | Bell Communications Research, Inc. | Ultrawide-bandwidth low-noise optical receiver |
| JPH11284401A (ja) * | 1998-03-30 | 1999-10-15 | Matsushita Electric Ind Co Ltd | 高周波回路装置 |
| JP4018312B2 (ja) * | 2000-02-21 | 2007-12-05 | 株式会社ルネサステクノロジ | 無線通信装置 |
| TW200518345A (en) * | 2003-08-08 | 2005-06-01 | Renesas Tech Corp | Semiconductor device |
| JP5170531B2 (ja) * | 2005-12-02 | 2013-03-27 | 国立大学法人東北大学 | 半導体装置 |
| JP2010273117A (ja) * | 2009-05-21 | 2010-12-02 | Nec Corp | 増幅器 |
| KR20190058711A (ko) * | 2012-06-14 | 2019-05-29 | 스카이워크스 솔루션즈, 인코포레이티드 | 고조파 종단 회로를 포함하는 전력 증폭기 모듈 및 관련된 시스템, 장치, 및 방법 |
| US9300260B2 (en) * | 2013-03-15 | 2016-03-29 | Rf Micro Devices, Inc. | Transformer-based power amplifier stabilization and reference distortion reduction |
-
2016
- 2016-04-20 JP JP2016084659A patent/JP6620656B2/ja active Active
- 2016-12-22 US US15/387,755 patent/US10027282B2/en active Active
-
2017
- 2017-03-21 DE DE102017204654.6A patent/DE102017204654B4/de active Active
- 2017-04-19 KR KR1020170050169A patent/KR101909815B1/ko active Active
- 2017-04-20 CN CN201710263586.4A patent/CN107305880B/zh active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001156242A (ja) | 1999-11-25 | 2001-06-08 | Mitsubishi Electric Corp | 多段増幅装置 |
| US20090206959A1 (en) | 2008-02-19 | 2009-08-20 | Hitachi Kokusai Electric Inc. | Rf module |
| JP2015080018A (ja) | 2013-10-15 | 2015-04-23 | 富士通株式会社 | 半導体装置 |
| JP2016084659A (ja) | 2014-10-28 | 2016-05-19 | 三協立山株式会社 | 手すり |
Also Published As
| Publication number | Publication date |
|---|---|
| US10027282B2 (en) | 2018-07-17 |
| CN107305880B (zh) | 2020-01-17 |
| KR101909815B1 (ko) | 2018-10-18 |
| CN107305880A (zh) | 2017-10-31 |
| KR20170120036A (ko) | 2017-10-30 |
| US20170310279A1 (en) | 2017-10-26 |
| JP2017195510A (ja) | 2017-10-26 |
| DE102017204654A1 (de) | 2017-10-26 |
| JP6620656B2 (ja) | 2019-12-18 |
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