CN1799292B - 基板制造方法 - Google Patents
基板制造方法 Download PDFInfo
- Publication number
- CN1799292B CN1799292B CN2004800152901A CN200480015290A CN1799292B CN 1799292 B CN1799292 B CN 1799292B CN 2004800152901 A CN2004800152901 A CN 2004800152901A CN 200480015290 A CN200480015290 A CN 200480015290A CN 1799292 B CN1799292 B CN 1799292B
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- wiring
- ditch
- substrate
- resin film
- wiring portion
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/107—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by filling grooves in the support with conductive material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0104—Properties and characteristics in general
- H05K2201/0108—Transparent
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0023—Etching of the substrate by chemical or physical means by exposure and development of a photosensitive insulating layer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/14—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using spraying techniques to apply the conductive material, e.g. vapour evaporation
- H05K3/143—Masks therefor
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Liquid Crystal (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
Description
Claims (9)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP159315/2003 | 2003-06-04 | ||
JP2003159315 | 2003-06-04 | ||
PCT/JP2004/007880 WO2004110117A1 (ja) | 2003-06-04 | 2004-06-01 | 基板及びその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1799292A CN1799292A (zh) | 2006-07-05 |
CN1799292B true CN1799292B (zh) | 2012-02-08 |
Family
ID=33508505
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2004800152901A Expired - Fee Related CN1799292B (zh) | 2003-06-04 | 2004-06-01 | 基板制造方法 |
Country Status (7)
Country | Link |
---|---|
US (2) | US20070024800A1 (zh) |
EP (1) | EP1651018A4 (zh) |
JP (1) | JP4858682B2 (zh) |
KR (1) | KR100803426B1 (zh) |
CN (1) | CN1799292B (zh) |
TW (1) | TWI241544B (zh) |
WO (1) | WO2004110117A1 (zh) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8064003B2 (en) | 2003-11-28 | 2011-11-22 | Tadahiro Ohmi | Thin film transistor integrated circuit device, active matrix display device, and manufacturing methods of the same |
EP1850374A3 (en) * | 2006-04-28 | 2007-11-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
AT503027B1 (de) | 2006-05-08 | 2007-07-15 | Austria Tech & System Tech | Leiterplattenelement mit optoelektronischem bauelement und licht-wellenleiter |
JP2008103653A (ja) | 2006-09-22 | 2008-05-01 | Tohoku Univ | 半導体装置及び半導体装置の製造方法 |
JP5329038B2 (ja) | 2006-12-21 | 2013-10-30 | 宇部日東化成株式会社 | 半導体装置及び半導体装置の製造方法 |
WO2009034926A1 (ja) * | 2007-09-11 | 2009-03-19 | National University Corporation Tohoku University | 電子装置の製造方法 |
JP4539786B2 (ja) * | 2008-06-24 | 2010-09-08 | コニカミノルタホールディングス株式会社 | 透明導電性基板の製造方法 |
WO2010024175A1 (ja) * | 2008-08-25 | 2010-03-04 | 株式会社関東学院大学表面工学研究所 | 積層体及びその製造方法 |
KR20120048590A (ko) | 2009-07-31 | 2012-05-15 | 고쿠리츠 다이가쿠 호진 도호쿠 다이가쿠 | 반도체 장치, 반도체 장치의 제조 방법, 및 표시 장치 |
KR20110052226A (ko) * | 2009-11-12 | 2011-05-18 | 삼성전자주식회사 | Rct 소자 및 그 rct 소자를 포함하는 디스플레이 장치 |
KR20120109856A (ko) | 2011-03-28 | 2012-10-09 | 삼성디스플레이 주식회사 | 표시 장치 및 그 제조 방법 |
JP6063766B2 (ja) * | 2013-02-20 | 2017-01-18 | 株式会社ジャパンディスプレイ | 半導体装置 |
KR101656452B1 (ko) * | 2013-09-06 | 2016-09-09 | 주식회사 잉크테크 | 전도성 패턴 형성 방법 및 전도성 패턴 |
JP2015053444A (ja) * | 2013-09-09 | 2015-03-19 | パナソニックIpマネジメント株式会社 | フレキシブル半導体装置およびその製造方法ならびに画像表示装置 |
CN106561070B (zh) * | 2015-10-06 | 2019-06-11 | 鹏鼎控股(深圳)股份有限公司 | 柔性电路板制作方法 |
JP7059932B2 (ja) * | 2016-09-21 | 2022-04-26 | 日産化学株式会社 | 硬化膜形成組成物 |
CN108575056A (zh) * | 2017-03-07 | 2018-09-25 | 宏启胜精密电子(秦皇岛)有限公司 | 柔性电路板制作方法 |
CN110944467B (zh) * | 2019-12-06 | 2021-06-15 | 北京万物皆媒科技有限公司 | 一种双层透明电路基板及其制备方法 |
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JPH0279308A (ja) * | 1988-09-14 | 1990-03-19 | Seiko Epson Corp | 電極形成方法 |
US5163220A (en) * | 1991-10-09 | 1992-11-17 | The Unites States Of America As Represented By The Secretary Of The Army | Method of enhancing the electrical conductivity of indium-tin-oxide electrode stripes |
JPH07152024A (ja) * | 1993-05-17 | 1995-06-16 | Sharp Corp | 液晶表示素子 |
FR2708170B1 (fr) * | 1993-07-19 | 1995-09-08 | Innovation Dev Cie Gle | Circuits électroniques à très haute conductibilité et de grande finesse, leurs procédés de fabrication, et dispositifs les comprenant. |
JPH07333648A (ja) * | 1994-06-07 | 1995-12-22 | Mitsubishi Electric Corp | 液晶表示装置およびその製法 |
JPH07336017A (ja) * | 1994-06-08 | 1995-12-22 | Hitachi Ltd | 電流反転電解法による薄膜回路製造方法ならびにそれを用いた薄膜回路基板、薄膜多層回路基板および電子回路装置 |
EP0862156B1 (en) * | 1996-09-19 | 2005-04-20 | Seiko Epson Corporation | Method of production of a matrix type display device |
JPH10209463A (ja) | 1997-01-27 | 1998-08-07 | Matsushita Electric Ind Co Ltd | 表示装置の配線形成方法、表示装置の製造方法、および表示装置 |
JPH10268343A (ja) * | 1997-03-24 | 1998-10-09 | Sharp Corp | 液晶表示装置およびその製造方法 |
JP3299167B2 (ja) * | 1998-02-13 | 2002-07-08 | 日本板硝子株式会社 | 埋設電極付き基板の製造方法 |
KR100577903B1 (ko) * | 1998-03-17 | 2006-05-10 | 세이코 엡슨 가부시키가이샤 | 박막패터닝용 기판 및 그 표면처리 |
JP4526138B2 (ja) * | 1998-09-10 | 2010-08-18 | シャープ株式会社 | 電極基板の製造方法ならびに液晶表示素子 |
JP4074014B2 (ja) * | 1998-10-27 | 2008-04-09 | 株式会社東芝 | 半導体装置及びその製造方法 |
JP2000323276A (ja) * | 1999-05-14 | 2000-11-24 | Seiko Epson Corp | 有機el素子の製造方法、有機el素子およびインク組成物 |
JP2001188343A (ja) * | 1999-12-28 | 2001-07-10 | Nippon Zeon Co Ltd | 感光性樹脂組成物 |
JP2001251039A (ja) * | 2000-03-07 | 2001-09-14 | Seiko Epson Corp | ガラス基板およびその製造方法ならびに半導体装置 |
JP4360015B2 (ja) * | 2000-03-17 | 2009-11-11 | セイコーエプソン株式会社 | 有機el表示体の製造方法、半導体素子の配置方法、半導体装置の製造方法 |
US6723576B2 (en) * | 2000-06-30 | 2004-04-20 | Seiko Epson Corporation | Disposing method for semiconductor elements |
JP2003015548A (ja) * | 2001-06-29 | 2003-01-17 | Seiko Epson Corp | 有機el表示体の製造方法、半導体素子の配置方法、半導体装置の製造方法、電気光学装置の製造方法、電気光学装置、および電子機器 |
JP2002098948A (ja) * | 2000-09-20 | 2002-04-05 | Hitachi Ltd | 液晶表示装置の製造方法 |
US20040209190A1 (en) * | 2000-12-22 | 2004-10-21 | Yoshiaki Mori | Pattern forming method and apparatus used for semiconductor device, electric circuit, display module, and light emitting device |
CN100459163C (zh) * | 2001-02-19 | 2009-02-04 | 国际商业机器公司 | 薄膜晶体管结构及其制造方法和使用它的显示器件 |
KR100909414B1 (ko) * | 2002-12-18 | 2009-07-24 | 엘지디스플레이 주식회사 | 액정 표시 소자의 제조 방법 |
JP2004311530A (ja) * | 2003-04-02 | 2004-11-04 | Seiko Epson Corp | パターン形成方法、デバイスとその製造方法、液晶表示装置の製造方法、プラズマディスプレイパネルの製造方法、有機elデバイスの製造方法、フィールドエミッションディスプレイの製造方法及び電気光学装置並びに電子機器 |
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2004
- 2004-06-01 US US10/558,934 patent/US20070024800A1/en not_active Abandoned
- 2004-06-01 JP JP2005506802A patent/JP4858682B2/ja not_active Expired - Fee Related
- 2004-06-01 KR KR1020057023077A patent/KR100803426B1/ko not_active IP Right Cessation
- 2004-06-01 EP EP04735653A patent/EP1651018A4/en not_active Withdrawn
- 2004-06-01 CN CN2004800152901A patent/CN1799292B/zh not_active Expired - Fee Related
- 2004-06-01 WO PCT/JP2004/007880 patent/WO2004110117A1/ja active Application Filing
- 2004-06-04 TW TW093116152A patent/TWI241544B/zh not_active IP Right Cessation
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2010
- 2010-03-29 US US12/749,143 patent/US20100184289A1/en not_active Abandoned
Non-Patent Citations (4)
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JP特开2001-188343A 2001.07.10 |
JP特开2001-251039A 2001.09.14 |
JP特开平10-209463A 1998.08.07 |
JP特开平7-336017A 1995.12.22 |
Also Published As
Publication number | Publication date |
---|---|
TWI241544B (en) | 2005-10-11 |
US20070024800A1 (en) | 2007-02-01 |
TW200523828A (en) | 2005-07-16 |
JPWO2004110117A1 (ja) | 2006-07-20 |
EP1651018A1 (en) | 2006-04-26 |
KR20060030473A (ko) | 2006-04-10 |
WO2004110117A1 (ja) | 2004-12-16 |
KR100803426B1 (ko) | 2008-02-13 |
CN1799292A (zh) | 2006-07-05 |
EP1651018A4 (en) | 2009-11-11 |
US20100184289A1 (en) | 2010-07-22 |
JP4858682B2 (ja) | 2012-01-18 |
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