CN1627059A - 玻璃基板的检查装置及检查方法 - Google Patents
玻璃基板的检查装置及检查方法 Download PDFInfo
- Publication number
- CN1627059A CN1627059A CNA2004100019856A CN200410001985A CN1627059A CN 1627059 A CN1627059 A CN 1627059A CN A2004100019856 A CNA2004100019856 A CN A2004100019856A CN 200410001985 A CN200410001985 A CN 200410001985A CN 1627059 A CN1627059 A CN 1627059A
- Authority
- CN
- China
- Prior art keywords
- glass substrate
- defective
- lead screw
- substrate
- video
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 256
- 239000011521 glass Substances 0.000 title claims abstract description 228
- 238000000034 method Methods 0.000 title claims description 30
- 238000007689 inspection Methods 0.000 claims abstract description 29
- 238000005286 illumination Methods 0.000 claims abstract description 11
- 238000012545 processing Methods 0.000 claims abstract description 11
- 238000012360 testing method Methods 0.000 claims description 46
- 230000002950 deficient Effects 0.000 claims description 40
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 238000004904 shortening Methods 0.000 abstract 1
- 238000012546 transfer Methods 0.000 description 18
- 230000007547 defect Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nonlinear Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (6)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR0088935/2003 | 2003-12-09 | ||
KR1020030088935A KR100582344B1 (ko) | 2003-12-09 | 2003-12-09 | 유리기판의 검사장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1627059A true CN1627059A (zh) | 2005-06-15 |
CN100587478C CN100587478C (zh) | 2010-02-03 |
Family
ID=34737864
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN200410001985A Expired - Lifetime CN100587478C (zh) | 2003-12-09 | 2004-01-16 | 玻璃基板的检查装置及检查方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4729699B2 (zh) |
KR (1) | KR100582344B1 (zh) |
CN (1) | CN100587478C (zh) |
TW (1) | TWI336397B (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101038260B (zh) * | 2006-03-16 | 2011-04-20 | 奥林巴斯株式会社 | 基板检查装置 |
CN101718828B (zh) * | 2008-12-24 | 2012-08-08 | 四川虹欧显示器件有限公司 | 用于平板显示器的缺陷确认装置及其操作方法 |
CN101889199B (zh) * | 2008-03-27 | 2014-04-16 | 日本电气硝子株式会社 | 玻璃基板检查装置及玻璃基板检查方法 |
CN108139336A (zh) * | 2015-12-17 | 2018-06-08 | 日本电气硝子株式会社 | 玻璃板的制造方法 |
CN113830558A (zh) * | 2021-09-18 | 2021-12-24 | 甘肃光轩高端装备产业有限公司 | 玻璃基板的传输装置 |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101139371B1 (ko) * | 2005-08-04 | 2012-06-28 | 엘아이지에이디피 주식회사 | 기판 클램핑 장치, 이송장치 및 그 검사장치 |
KR100803046B1 (ko) * | 2007-03-28 | 2008-02-18 | 에스엔유 프리시젼 주식회사 | 비전 검사 시스템 및 이것을 이용한 피검사체의 검사 방법 |
KR100868884B1 (ko) * | 2007-06-20 | 2008-11-14 | 삼성코닝정밀유리 주식회사 | 유리 기판 유리 불량 정보 시스템 및 분류 방법 |
KR101027042B1 (ko) * | 2008-12-09 | 2011-04-11 | 주식회사 엔시스 | 전해 제련된 금속 검사장치 |
WO2010138748A2 (en) | 2009-05-29 | 2010-12-02 | Arizona Technology Enterprises | Display bender and method of testing flexible display |
KR101121994B1 (ko) * | 2010-02-02 | 2012-03-09 | 주식회사 고영테크놀러지 | 검사 프로그램의 생성 방법 |
JP5652870B2 (ja) * | 2010-11-29 | 2015-01-14 | Nskテクノロジー株式会社 | 異物検出装置及び異物検出方法 |
JP6119398B2 (ja) * | 2013-04-22 | 2017-04-26 | 日本電気硝子株式会社 | 板ガラス搬送装置、及び板ガラス搬送方法、並びに板ガラス検査装置 |
CN104730217B (zh) * | 2015-04-16 | 2016-09-07 | 京东方科技集团股份有限公司 | 一种玻璃基板的缺陷分布显示方法及显示装置 |
CN106526922B (zh) * | 2017-01-04 | 2019-12-06 | 京东方科技集团股份有限公司 | 基板修复方法及装置、按压机构、基板修复设备 |
CN107957634B (zh) * | 2017-12-06 | 2020-04-17 | 苏州精濑光电有限公司 | 一种显示面板的检测方法及装置 |
CN107884417A (zh) * | 2017-12-11 | 2018-04-06 | 苏州精濑光电有限公司 | 一种基板边缘检查机及边缘检查方法 |
KR102148167B1 (ko) | 2019-08-26 | 2020-08-26 | 주식회사 윈텍오토메이션 | 직교로봇을 이용한 초경인서트 고속 검사장비의 mgt 및 밀링용 초경인서트 상면 검사 카메라 심도 자동 조절장치 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4138926B2 (ja) * | 1998-02-13 | 2008-08-27 | 株式会社アマダ | 板材加工装置のワーククランプ装置 |
JP2002014309A (ja) * | 2000-06-30 | 2002-01-18 | Minolta Co Ltd | フィルムホルダ、フィルム収容治具及びこれらを用いた液晶表示素子の製造方法 |
JP2002250701A (ja) * | 2001-02-26 | 2002-09-06 | Horiba Ltd | 平面表示パネルの欠陥検査装置 |
JP2003029657A (ja) * | 2001-07-19 | 2003-01-31 | Minolta Co Ltd | 表示素子の製造方法及びフィルム基板保持具 |
JP2003302346A (ja) * | 2002-04-12 | 2003-10-24 | Hitachi Electronics Eng Co Ltd | 薄板ワークの表面検査装置 |
-
2003
- 2003-12-09 KR KR1020030088935A patent/KR100582344B1/ko active IP Right Grant
- 2003-12-30 TW TW092137459A patent/TWI336397B/zh not_active IP Right Cessation
-
2004
- 2004-01-08 JP JP2004002979A patent/JP4729699B2/ja not_active Expired - Lifetime
- 2004-01-16 CN CN200410001985A patent/CN100587478C/zh not_active Expired - Lifetime
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101038260B (zh) * | 2006-03-16 | 2011-04-20 | 奥林巴斯株式会社 | 基板检查装置 |
CN101889199B (zh) * | 2008-03-27 | 2014-04-16 | 日本电气硝子株式会社 | 玻璃基板检查装置及玻璃基板检查方法 |
CN101718828B (zh) * | 2008-12-24 | 2012-08-08 | 四川虹欧显示器件有限公司 | 用于平板显示器的缺陷确认装置及其操作方法 |
CN108139336A (zh) * | 2015-12-17 | 2018-06-08 | 日本电气硝子株式会社 | 玻璃板的制造方法 |
CN108139336B (zh) * | 2015-12-17 | 2021-08-24 | 日本电气硝子株式会社 | 玻璃板的制造方法 |
CN113830558A (zh) * | 2021-09-18 | 2021-12-24 | 甘肃光轩高端装备产业有限公司 | 玻璃基板的传输装置 |
Also Published As
Publication number | Publication date |
---|---|
KR100582344B1 (ko) | 2006-05-22 |
TWI336397B (en) | 2011-01-21 |
JP2005172782A (ja) | 2005-06-30 |
JP4729699B2 (ja) | 2011-07-20 |
CN100587478C (zh) | 2010-02-03 |
TW200519372A (en) | 2005-06-16 |
KR20050055883A (ko) | 2005-06-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee |
Owner name: SUMSUNG KANGNING PRECISION MATERIAL CO., LTD. Free format text: FORMER NAME: SAMSUNG CORNING PRECISION GLASS |
|
CP01 | Change in the name or title of a patent holder |
Address after: Gyeongbuk, South Korea Patentee after: SAMSUNG CORNING PRECISION MATERIALS Co.,Ltd. Address before: Gyeongbuk, South Korea Patentee before: SAMSUNG CORNING PRECISION GLASS CO.,LTD. |
|
C56 | Change in the name or address of the patentee |
Owner name: KANGNING PRECISION MATERIAL CO., LTD. Free format text: FORMER NAME: SAMSUNG CORNING PRECISION MATERIALS CO., LTD. |
|
CP03 | Change of name, title or address |
Address after: Chungnam, South Korea Patentee after: CORNING PRECISION MATERIALS Co.,Ltd. Address before: Gyeongbuk, South Korea Patentee before: SAMSUNG CORNING PRECISION MATERIALS Co.,Ltd. |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20100203 |