CN116803009A - 基于查找表的模数转换器 - Google Patents

基于查找表的模数转换器 Download PDF

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Publication number
CN116803009A
CN116803009A CN202280010337.3A CN202280010337A CN116803009A CN 116803009 A CN116803009 A CN 116803009A CN 202280010337 A CN202280010337 A CN 202280010337A CN 116803009 A CN116803009 A CN 116803009A
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CN
China
Prior art keywords
digital
analog
converter
output
digital converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280010337.3A
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English (en)
Chinese (zh)
Inventor
V·A·彭塔科塔
N·拉贾戈帕尔
C·C·谢蒂
普拉桑斯·K
N·什里瓦斯塔瓦
易莎恩·米格拉尼
约刚内森·文卡塔拉曼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of CN116803009A publication Critical patent/CN116803009A/zh
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/109—Measuring or testing for DC performance, i.e. static testing
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1019—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error by storing a corrected or correction value in a digital look-up table
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H03M1/1038—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables
    • H03M1/1042—Calibration over the full range of the converter, e.g. for correcting differential non-linearity by storing corrected or correction values in one or more digital look-up tables the look-up table containing corrected values for replacing the original digital values
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/50—Analogue/digital converters with intermediate conversion to time interval
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/66—Digital/analogue converters
    • H03M1/662—Multiplexed conversion systems

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Analogue/Digital Conversion (AREA)
CN202280010337.3A 2021-01-26 2022-01-26 基于查找表的模数转换器 Pending CN116803009A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US17/158,526 US11316525B1 (en) 2021-01-26 2021-01-26 Lookup-table-based analog-to-digital converter
US17/158,526 2021-01-26
PCT/US2022/013802 WO2022164841A1 (en) 2021-01-26 2022-01-26 Lookup-table-based analog-to-digital converter

Publications (1)

Publication Number Publication Date
CN116803009A true CN116803009A (zh) 2023-09-22

Family

ID=81259874

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280010337.3A Pending CN116803009A (zh) 2021-01-26 2022-01-26 基于查找表的模数转换器

Country Status (5)

Country Link
US (1) US11316525B1 (https=)
EP (1) EP4285488A4 (https=)
JP (1) JP2024505877A (https=)
CN (1) CN116803009A (https=)
WO (1) WO2022164841A1 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10673452B1 (en) 2018-12-12 2020-06-02 Texas Instruments Incorporated Analog-to-digital converter with interpolation
US11438001B2 (en) * 2020-12-24 2022-09-06 Texas Instruments Incorporated Gain mismatch correction for voltage-to-delay preamplifier array
US11962318B2 (en) 2021-01-12 2024-04-16 Texas Instruments Incorporated Calibration scheme for a non-linear ADC
US11881867B2 (en) * 2021-02-01 2024-01-23 Texas Instruments Incorporated Calibration scheme for filling lookup table in an ADC
CN116830462A (zh) 2021-02-01 2023-09-29 德州仪器公司 用于非线性系统的查找表
US12101096B2 (en) 2021-02-23 2024-09-24 Texas Instruments Incorporated Differential voltage-to-delay converter with improved CMRR
US12074607B2 (en) 2022-05-26 2024-08-27 Texas Instruments Incorporated Analog-to-digital converter (ADC) having linearization circuit with reconfigurable lookup table (LUT) memory and calibration options
US12191877B2 (en) 2022-08-30 2025-01-07 Texas Instruments Incorporated Multi-bit voltage-to-delay conversion in data converter circuitry
US12355460B2 (en) 2022-11-22 2025-07-08 Texas Instruments Incorporated Calibration in non-linear multi-stage delay-to-digital conversion circuits
US12273104B2 (en) * 2023-02-28 2025-04-08 Texas Instruments Incorporated Methods and apparatus to convert analog voltages to delay signals
US12445141B2 (en) 2023-10-31 2025-10-14 Texas Instruments Incorporated Voltage-to-delay converter
US12445119B2 (en) 2023-11-30 2025-10-14 Texas Instruments Incorporated Tuning of data interface timing between clock domains
US12542563B2 (en) 2024-03-28 2026-02-03 Texas Instruments Incorporated Linearization of delay domain analog-to-digital converters

Family Cites Families (74)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4612533A (en) * 1985-06-12 1986-09-16 The United States Of America As Represented By The Secretary Of The Air Force Harmonic distortion reduction technique for data acquistion
US4899071A (en) 1988-08-02 1990-02-06 Standard Microsystems Corporation Active delay line circuit
US4928103A (en) 1989-09-18 1990-05-22 Analog Devices, Inc. Parallel analog-to-digital converter using 2.sup.(n-1) comparators
US5317721A (en) 1989-11-06 1994-05-31 Zenith Data Systems Corporation Method and apparatus to disable ISA devices for EISA addresses outside the ISA range
JPH05206801A (ja) 1992-01-27 1993-08-13 Nippon Precision Circuits Kk 遅延回路
JPH0669800A (ja) 1992-08-20 1994-03-11 Fujitsu Ltd Ａ／ｄコンバータ
US5563533A (en) 1995-02-28 1996-10-08 Motorola, Inc. Method and apparatus for a high speed low power comparator using positive feedback
JP2865026B2 (ja) 1995-06-30 1999-03-08 日本電気株式会社 比較器
US6002352A (en) 1997-06-24 1999-12-14 International Business Machines Corporation Method of sampling, downconverting, and digitizing a bandpass signal using a digital predictive coder
FR2766993B1 (fr) 1997-07-31 1999-10-15 Sgs Thomson Microelectronics Circuit de retard reglable
JP3920443B2 (ja) 1998-02-27 2007-05-30 株式会社ルネサステクノロジ Ａ／ｄ変換回路
US6314149B1 (en) 1998-04-16 2001-11-06 Texas Instruments Incorporated Method and apparatus for rephasing a voltage controlled clock, or the like
US6046612A (en) 1998-07-27 2000-04-04 National Semiconductor Corporation Self-resetting comparator circuit and method
JP3144395B2 (ja) 1998-10-07 2001-03-12 日本電気株式会社 ディレイ回路
US6144231A (en) 1998-11-23 2000-11-07 Goldblatt; Jeremy Mark High speed dynamic latch comparator
KR100308193B1 (ko) 1999-06-16 2001-11-01 윤종용 플래시 아날로그-디지털 변환기
KR100366627B1 (ko) 2000-08-23 2003-01-09 삼성전자 주식회사 Ｄｔｃ 기반 플립플럽 회로 및 비교기
JP2002118467A (ja) * 2000-10-11 2002-04-19 Denso Corp Ａ／ｄ変換回路
KR20010044806A (ko) 2001-03-27 2001-06-05 강영대 곡물 운송용 적재함
US6661365B1 (en) * 2001-04-30 2003-12-09 Engim, Incorporated Circuit architectures and methods for A/D conversion
JP2002344304A (ja) 2001-05-15 2002-11-29 Fujitsu Ltd 差動アンプ回路および半導体集積回路装置
US6836127B2 (en) 2001-07-27 2004-12-28 Hewlett-Packard Development Company, L.P. Dual switching reference voltages
JP2003133954A (ja) * 2001-10-26 2003-05-09 Agilent Technologies Japan Ltd インターリーブａ／ｄ変換器の校正方法
DE10154249C1 (de) 2001-11-05 2003-05-22 Austriamicrosystems Ag Schloss Analog/Digital-Wandler
US6720895B2 (en) * 2002-02-01 2004-04-13 Agilent Technologies, Inc. Method of calibrating an analog-to-digital converter and a circuit implementing the same
JP4075777B2 (ja) 2003-11-19 2008-04-16 沖電気工業株式会社 コンパレータ回路
JP2005210480A (ja) * 2004-01-23 2005-08-04 Canon Inc Ａ／ｄ変換回路及びその出力補正方法、それを用いた撮像装置、放射線撮像装置、放射線撮像システム
US7046179B1 (en) * 2004-02-13 2006-05-16 National Semiconductor Corporation Apparatus and method for on-chip ADC calibration
US7405689B2 (en) 2005-01-05 2008-07-29 Exar Corporation Predictive analog to digital converters and methods of using
TWI249903B (en) * 2005-03-16 2006-02-21 Univ Tsinghua Multi-step analog/digital converter and on-line calibration method thereof
US7262724B2 (en) 2005-03-31 2007-08-28 Freescale Semiconductor, Inc. System and method for adjusting dynamic range of analog-to-digital converter
JP4684743B2 (ja) 2005-05-27 2011-05-18 ルネサスエレクトロニクス株式会社 Ａ／ｄ変換回路、ａ／ｄ変換器およびサンプリングクロックのスキュー調整方法
DE102005040876A1 (de) 2005-08-29 2007-03-01 Austriamicrosystems Ag Steuerungsanordnung für einen Spannungskonverter, Spannungskonverter sowie Verfahren zum Konvertieren einer ersten Gleichspannung in eine zweite Gleichspannung
US7525471B2 (en) 2007-02-28 2009-04-28 Exar Corporation Wide-input windowed nonlinear analog-to-digital converter for high-frequency digitally controlled SMPS
US7501862B2 (en) 2007-06-22 2009-03-10 Himax Technologies Limited Comparator with low offset voltage
US7737875B2 (en) 2007-12-13 2010-06-15 Nxp B.V. Time interpolation flash ADC having automatic feedback calibration
US7557746B1 (en) 2007-12-13 2009-07-07 Nxp B.V. Time domain interpolation scheme for flash A/D converters
US7777526B2 (en) 2008-06-06 2010-08-17 Altera Corporation Increased sensitivity and reduced offset variation in high data rate HSSI receiver
DE102008044147B4 (de) 2008-10-02 2021-02-11 Robert Bosch Gmbh Empfangskomparator für Signalmodulation auf Versorgungsleitung
TWI371926B (en) 2009-01-22 2012-09-01 Univ Nat Taiwan Voltage-to-digital converting device and voltage-to-time converter
US7847576B2 (en) 2009-02-26 2010-12-07 Advantest Corporation Comparator with latching function
US8058954B2 (en) 2009-03-05 2011-11-15 Apple Inc. Transmission line with a cross-hatched ground plane that is either filled with conductive paint or covered by a conductive foil
JP5439976B2 (ja) 2009-03-25 2014-03-12 富士通株式会社 比較回路、アナログデジタル変換装置
KR101081366B1 (ko) 2009-09-23 2011-11-08 포항공과대학교 산학협력단 아날로그 디지털 변환기의 시간영역 전압 비교기
JP2011103576A (ja) * 2009-11-11 2011-05-26 Renesas Electronics Corp アナログデジタル変換器
US8183903B2 (en) 2009-12-03 2012-05-22 Semtech Corporation Signal interpolation methods and circuits
KR101291803B1 (ko) 2010-01-28 2013-07-31 엘지디스플레이 주식회사 폴딩 아날로그 디지털 컨버터
JP2011211371A (ja) 2010-03-29 2011-10-20 Panasonic Corp 逐次比較型ａｄ変換器用クロック生成回路
US8773169B2 (en) 2010-10-22 2014-07-08 Analog Devices, Inc. High frequency signal comparator for SHA-less analog-to-digital converters
KR101199574B1 (ko) 2010-11-02 2012-11-12 한국과학기술원 아날로그 디지털 변환기
US8451152B2 (en) 2011-02-22 2013-05-28 Texas Instruments Incorporated Pipelined ADC inter-stage error calibration
US8537044B2 (en) * 2011-12-28 2013-09-17 Guzik Technical Enterprises Interleaved analog to digital converter with digital equalization
US8836375B2 (en) 2012-09-06 2014-09-16 Lsi Corporation Continuously self-calibrated latched comparator
US8896476B2 (en) 2013-01-25 2014-11-25 Technische Universiteit Eindhoven Data-driven noise reduction technique for analog to digital converters
US20140361917A1 (en) 2013-06-11 2014-12-11 Kabushiki Kaisha Toshiba Comparing circuit and a/d converter
US20150008894A1 (en) 2013-07-02 2015-01-08 Lsi Corporation Dynamic start-up circuit for hysteretic loop switched-capacitor voltage regulator
US9136856B1 (en) 2014-02-26 2015-09-15 Texas Instruments Incorporated Background DAC calibration for pipeline ADC
JP6032232B2 (ja) * 2014-03-14 2016-11-24 横河電機株式会社 測定装置
JP6333051B2 (ja) 2014-05-08 2018-05-30 オリンパス株式会社 逐次比較型ａ／ｄ変換回路
GB2529686A (en) 2014-08-29 2016-03-02 Ibm High-speed comparator for analog-to-digital converter
JP6488650B2 (ja) 2014-11-04 2019-03-27 株式会社ソシオネクスト クロック生成回路、逐次比較型ａｄ変換器および集積回路
US9467160B2 (en) 2014-11-11 2016-10-11 Mediatek Inc. Flash ADC with interpolators
WO2016196848A1 (en) 2015-06-03 2016-12-08 Marvell World Trade Ltd. Delay locked loop
US9742424B2 (en) 2016-01-07 2017-08-22 Nanyang Technological University Analog-to-digital converter
US10003353B2 (en) 2016-07-19 2018-06-19 Microchip Technology Incorporated Time-based delay line analog comparator
US10103753B1 (en) 2017-06-29 2018-10-16 Texas Instruments Incorporated Error correcting analog-to-digital converters
US10284188B1 (en) 2017-12-29 2019-05-07 Texas Instruments Incorporated Delay based comparator
US10541700B2 (en) 2018-03-12 2020-01-21 Texas Instruments Incorporated Gain and memory error estimation in a pipeline analog to digital converter
CN111064468B (zh) * 2018-10-17 2023-04-07 创意电子股份有限公司 校准方法和校准系统
US10673452B1 (en) 2018-12-12 2020-06-02 Texas Instruments Incorporated Analog-to-digital converter with interpolation
EP3672077B1 (en) 2018-12-19 2022-07-27 Socionext Inc. Comparator circuitry
US10673456B1 (en) 2018-12-31 2020-06-02 Texas Instruments Incorporated Conversion and folding circuit for delay-based analog-to-digital converter system
US10673453B1 (en) 2018-12-31 2020-06-02 Texas Instruments Incorporated Delay-based residue stage
TWI677195B (zh) * 2019-06-20 2019-11-11 瑞昱半導體股份有限公司 類比數位轉換器之校正電路及校正方法

Also Published As

Publication number Publication date
WO2022164841A1 (en) 2022-08-04
JP2024505877A (ja) 2024-02-08
US11316525B1 (en) 2022-04-26
EP4285488A1 (en) 2023-12-06
EP4285488A4 (en) 2024-04-10

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