CN113950626B - 自动分析装置以及异常检测方法 - Google Patents

自动分析装置以及异常检测方法 Download PDF

Info

Publication number
CN113950626B
CN113950626B CN202080040309.7A CN202080040309A CN113950626B CN 113950626 B CN113950626 B CN 113950626B CN 202080040309 A CN202080040309 A CN 202080040309A CN 113950626 B CN113950626 B CN 113950626B
Authority
CN
China
Prior art keywords
reagent
concentration
reagent container
sample
determination unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202080040309.7A
Other languages
English (en)
Chinese (zh)
Other versions
CN113950626A (zh
Inventor
盐畑博文
大田雄一郎
萩原孝明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi High Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi High Technologies Corp filed Critical Hitachi High Technologies Corp
Publication of CN113950626A publication Critical patent/CN113950626A/zh
Application granted granted Critical
Publication of CN113950626B publication Critical patent/CN113950626B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • G01N35/00613Quality control
    • G01N35/00663Quality control of consumables
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1002Reagent dispensers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00594Quality control, including calibration or testing of components of the analyser
    • G01N35/00613Quality control
    • G01N35/00663Quality control of consumables
    • G01N2035/00673Quality control of consumables of reagents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584Control arrangements for automatic analysers
    • G01N35/00722Communications; Identification
    • G01N2035/00891Displaying information to the operator
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04Details of the conveyor system
    • G01N2035/0474Details of actuating means for conveyors or pipettes
    • G01N2035/0491Position sensing, encoding; closed-loop control
    • G01N2035/0494Detecting or compensating piositioning errors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009Characterised by arrangements for controlling the aspiration or dispense of liquids
    • G01N35/1016Control of the volume dispensed or introduced
    • G01N2035/1018Detecting inhomogeneities, e.g. foam, bubbles, clots

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
CN202080040309.7A 2019-06-11 2020-03-03 自动分析装置以及异常检测方法 Active CN113950626B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019-109032 2019-06-11
JP2019109032 2019-06-11
PCT/JP2020/008937 WO2020250507A1 (ja) 2019-06-11 2020-03-03 自動分析装置、および異常検知方法

Publications (2)

Publication Number Publication Date
CN113950626A CN113950626A (zh) 2022-01-18
CN113950626B true CN113950626B (zh) 2025-06-13

Family

ID=73782160

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080040309.7A Active CN113950626B (zh) 2019-06-11 2020-03-03 自动分析装置以及异常检测方法

Country Status (5)

Country Link
US (1) US12163972B2 (https=)
EP (1) EP3985398B1 (https=)
JP (1) JP7270039B2 (https=)
CN (1) CN113950626B (https=)
WO (1) WO2020250507A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117501096A (zh) * 2021-12-31 2024-02-02 深圳迈瑞动物医疗科技股份有限公司 一种样本分析装置和样本分析方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104011547A (zh) * 2011-12-26 2014-08-27 株式会社日立高新技术 自动分析装置及测定值异常检测方法
JP2016057228A (ja) * 2014-09-11 2016-04-21 日本電子株式会社 自動分析装置及び異常判定方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0815265A (ja) * 1994-06-30 1996-01-19 Shimadzu Corp 自動化学分析装置
JP3866446B2 (ja) * 1999-05-07 2007-01-10 株式会社東芝 自動分析装置
JP2001124788A (ja) * 1999-10-25 2001-05-11 Hitachi Ltd 自動分析装置
JP4117181B2 (ja) 2002-11-21 2008-07-16 株式会社日立ハイテクノロジーズ 自動分析装置
JP2007303937A (ja) 2006-05-10 2007-11-22 Olympus Corp 自動分析装置
JP4991586B2 (ja) * 2008-01-31 2012-08-01 株式会社日立ハイテクノロジーズ 自動分析装置
GB0806771D0 (en) * 2008-04-12 2008-05-14 Spd Swiss Prec Diagnostics Gmb Assay devices comprising bubble-forming means
JP5618489B2 (ja) * 2009-02-17 2014-11-05 シスメックス株式会社 分析装置、分析方法及びコンピュータプログラム
JP5331551B2 (ja) 2009-04-16 2013-10-30 株式会社日立ハイテクノロジーズ 分析装置
JP5274436B2 (ja) * 2009-11-26 2013-08-28 ベックマン コールター, インコーポレイテッド 自動分析装置
JP5216051B2 (ja) * 2010-06-23 2013-06-19 株式会社日立ハイテクノロジーズ 自動分析装置および自動分析方法
JP5562421B2 (ja) * 2010-07-14 2014-07-30 株式会社日立ハイテクノロジーズ 自動分析装置、分析方法及び情報処理装置
JP2013217741A (ja) * 2012-04-06 2013-10-24 Hitachi High-Technologies Corp 自動分析装置
JP6013796B2 (ja) * 2012-06-25 2016-10-25 株式会社日立ハイテクノロジーズ 自動分析装置及び試料測定方法
US10768189B2 (en) * 2014-01-27 2020-09-08 Hitachi High-Tech Corporation Automatic analysis apparatus
EP3252476B1 (en) * 2015-01-28 2024-10-30 Hitachi High-Tech Corporation Liquid surface inspection device, automated analysis device, and processing device
JP6649942B2 (ja) * 2015-02-23 2020-02-19 株式会社日立ハイテクノロジーズ 自動分析装置
JP6466752B2 (ja) * 2015-03-19 2019-02-06 株式会社日立ハイテクノロジーズ 自動分析装置及び自動分析方法並びに自動分析システム
CN108780102B (zh) * 2016-03-25 2022-05-17 株式会社日立高新技术 自动分析装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104011547A (zh) * 2011-12-26 2014-08-27 株式会社日立高新技术 自动分析装置及测定值异常检测方法
JP2016057228A (ja) * 2014-09-11 2016-04-21 日本電子株式会社 自動分析装置及び異常判定方法

Also Published As

Publication number Publication date
JP7270039B2 (ja) 2023-05-09
EP3985398A4 (en) 2023-05-10
EP3985398A1 (en) 2022-04-20
US20220221477A1 (en) 2022-07-14
EP3985398B1 (en) 2024-07-10
JPWO2020250507A1 (https=) 2020-12-17
US12163972B2 (en) 2024-12-10
WO2020250507A1 (ja) 2020-12-17
CN113950626A (zh) 2022-01-18

Similar Documents

Publication Publication Date Title
CN102066949B (zh) 自动分析装置
JP7182614B2 (ja) 自動分析装置
JP5517467B2 (ja) 自動分析装置
JP4966913B2 (ja) 液体分注装置
CN103765222B (zh) 自动分析装置及其动作不良判定方法
JP6847200B2 (ja) 自動分析装置
CN104335051B (zh) 自动分析装置
JP6268288B2 (ja) 血液凝固検査装置
JP6526510B2 (ja) 自動分析装置
JP2016027309A (ja) 液採取装置及びその液採取装置を備えた自動分析装置
CN114556112B (zh) 自动分析装置以及试剂的分注方法
CN113950626B (zh) 自动分析装置以及异常检测方法
JP6224418B2 (ja) 自動分析装置
JP6863708B2 (ja) 自動分析装置
JP2007303937A (ja) 自動分析装置
JP4110082B2 (ja) 自動分析装置
JP2005017144A (ja) 自動分析装置
JP5487275B2 (ja) 自動分析装置
JP2015175783A (ja) 自動分析装置
JP2022103798A (ja) 反応容器及び自動分析装置
JP4713629B2 (ja) 自動分析装置
CN115867811A (zh) 自动分析装置
JP5174930B2 (ja) 自動分析装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant